SFR9024TM
Power MOSFET, P Channel, 60 V, 7.8 A, 0.28 ohm, TO-252 (DPAK), Surface Mount
- Manufacturer: ONSEMI
- Product type: Single MOSFETs
- Transistor Polarity:P Channel; Continuous Drain Current Id:-7.8A; Drain Source Voltage Vds:-60V; On Resistance Rds(on):0.28ohm; Rds(on) Test Voltage Vgs:-10V; Threshold Voltage Vgs:-4V; Power Dissip
- No. of Pins: 3Pins
- Channel Type: P Channel
- Product Range: -
- Qualification: -
- Power Dissipation: 32W
- Transistor Mounting: Surface Mount
- Rds(on) Test Voltage: 10V
- Transistor Case Style: TO-252 (DPAK)
- Drain Source Voltage Vds: 60V
- Operating Temperature Max: 150°C
- Continuous Drain Current Id: 7.8A
- Drain Source On State Resistance: 0.28ohm
- Gate Source Threshold Voltage Max: 4V
| Delivery and price | |
|---|---|
| Units per pack | 2500 |
| Price | 0.209 € |
| Current stock | 10+ |
| Lead time | 30 days |
## **Advanced Power MOSFET**
## **SFR/U9024**
## **FEATURES**
- n Avalanche Rugged Technology
- n Rugged Gate Oxide Technology
- n Lower Input Capacitance
- n Improved Gate Charge
- n Extended Safe Operating Area
- n Lower Leakage Current : 10 µA (Max.) @ VDS = -60V
- n Lower RDS(ON) : 0.206 Ω (Typ.)
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BVDSS = -60 V<br>R = 0.28 Ω<br>DS(on)<br>ID = -7.8 A<br>D-PAK I-PAK<br>2<br>1 1<br>3 23<br>1. Gate 2. Drain 3. Source<br>**----- End of picture text -----**<br>
## **Absolute Maximum Ratings**
|**Symbol**|**Characteristic**|**Value**|**Units**|
|---|---|---|---|
|**Symbol**<br>VDSS|Drain-to-Source Voltage|-60|V|
|ID|Continuous Drain Current (TC=25<br>oC)<br>Continuous Drain Current (TC=100<br>oC)|-7.8<br>-5.5|A|
|IDM|Drain Current-Pulsed<br>O1|31|A|
|VGS|Gate-to-Source Voltage|±30|V|
|EAS|Single Pulsed Avalanche Energy<br>O<br>2|155|mJ|
|IAR|Avalanche Current<br>O1|-7.8|A|
|EAR|Repetitive Avalanche Energy<br>O1|3.2|mJ|
|dv/dt|Peak Diode Recovery dv/dt<br>O<br>3|-5.5|V/ns|
|PD|Total Power Dissipation(TA=25<br>oC)<br>*|2.5|W|
||Total Power Dissipation (TC=25<br>oC)<br>Linear Derating Factor|32<br>0.26|W<br>W/<br>oC|
|TJ, TSTG<br>TL|Operating Junction and<br>Storage Temperature Range<br>Maximum Lead Temp. for Soldering<br>Purposes, 1/8” from case for 5-seconds|- 55 to +150<br>300|oC|
## **Thermal Resistance**
|RθJC<br>**Symbol**|Junction-to-Case<br>**Characteristic**|--<br>**Typ.**|3.91<br>**Max.**|oC/W<br>**Units**|
|---|---|---|---|---|
|RθJA|Junction-to-Ambient<br>*|--|50||
|RθJA|Junction-to-Ambient|--|110||
* When mounted on the minimum pad size recommended (PCB Mount).
Rev. C
**P-CHANNEL POWER MOSFET**
## **SFR/U9024**
## **Electrical Characteristics** (TC=25[o] C unless otherwise specified)
|**Electri**|**cal Characteristics**(TC=25oC|unle|ss ot|herwi|se sp|ecified)|
|---|---|---|---|---|---|---|
|**Symbol**|**Characteristic**|**Min.**|**Typ.**|**Max. **|**Units**|**Test Condition**|
|BVDSS|Drain-Source Breakdown Voltage|-60|--|--|V|VGS=0V,ID=-250µA|
|∆BV/∆TJ|<br>Breakdown Voltage Temp. Coeff.|--|-0.04|--|V/<br>oC|ID=-250µA**_See Fig 7_**|
|VGS(th)|Gate Threshold Voltage|-2.0|--|-4.0|V|VDS=-5V,ID=-250µA|
|IGSS|Gate-Source Leakage , Forward|--|--|-100|nA|VGS=-20V|
||<br>Gate-Source Leakage , Reverse|--|--|100||VGS=20V|
|IDSS|Drain-to-Source Leakage Current|--|--|-10|µA|VDS=-60V|
|||--|--|-100||VDS=-48V,TC=125<br>oC|
|RDS(on)|Static Drain-Source<br>On-State Resistance|--|--|0.28|Ω|VGS=-10V,ID=-3.9A<br>O<br>4|
|gfs|Forward Transconductance|--|3.7|--|S|VDS=-30V,ID=-3.9A<br>O<br>4|
|Ciss<br>Coss|Input Capacitance<br>Output Capacitance|--<br>--|140<br>465|600<br>215|pF|VGS=0V,VDS=-25V,f =1MHz<br>**_See Fig 5_**|
|Crss|Reverse Transfer Capacitance|--|40|60|||
|td(on)|Turn-On Delay Time|--|11|30|ns|VDD=-30V,ID=-9.7A,<br>RG=18<br>**_See Fig 13_**<br>Ω<br>O<br>5<br>O<br>4|
|tr|Rise Time|--|21|50|||
|td(off)|Turn-Off Delay Time|--|29|65|||
|tf|Fall Time|--|20|50|||
|Qg|Total Gate Charge|--|15|19|nC|VDS=-48V,VGS=-10V,<br>ID=-9.7A<br>**_See Fig 6 & Fig 12_**<br>O<br>5<br>O<br>4|
|Qgs|Gate-Source Charge|--|2.9|--|||
|Qgd|Gate-Drain(“Miller”) Charge|--|6.0|--|||
## **Source-Drain Diode Ratings and Characteristics**
|**Symbol**|**Characteristic**|**Min.**|**Typ.**|**Max. **|**Units**|**Test Condition**|
|---|---|---|---|---|---|---|
|IS|Continuous Source Current|--|--|-7.8|A|Integral reverse pn-diode<br>in the MOSFET|
|ISM|Pulsed-Source Current<br>O1|--|--|-31|||
|VSD|Diode Forward Voltage<br>O<br>4|--|--|-3.8|V|TJ=25<br>oC,IS=-7.8A,VGS=0V|
|trr|Reverse Recovery Time|--|80|--|ns|TJ=25<br>oC,IF=-9.7A<br>diF/dt=100A/µs<br>O<br>4|
|Qrr|Reverse Recovery Charge|--|0.22|--|µC||
## **Notes ;**
O[1] Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature O2 L=3.0mH, IAS=-7.8A, VDD=-25V, RG=27Ω*, Starting TJ =25[o] C O3 ISD _< -9.7A, di/dt _< 250A/µs, VDD _< BVDSS , Starting TJ =25[o] C O4 Pulse Test : Pulse Width = 250µs, Duty Cycle 2%_< O5 Essentially Independent of Operating Temperature
**SFR/U9024**
## **P-CHANNEL POWER MOSFET**
**Fig 1. Output Characteristics**
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VGS<br>Top : - 15 V<br> - 10 V<br> - 8.0 V<br>10 [1] - 7.0 V<br> - 6.0 V<br> - 5.5 V<br> - 5.0 V<br>Bottom : - 4.5 V<br>10 [0]<br>@ Notes :<br> 1. 250 µ s Pulse Test<br> 2. TC = 25 oC<br>10 [-1]<br>10 [-1] 10 [0] 10 [1]<br>-VDS , Drain-Source Voltage [V]<br> , Drain Current [A]-ID<br>**----- End of picture text -----**<br>
**Fig 2. Transfer Characteristics**
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10 [1]<br>150 oC<br>10 [0]<br>25 oC @ Notes :<br> 1. VGS = 0 V<br> 2. VDS = -30 V<br>- 55 oC 3. 250 µ s Pulse Test<br>10 [-1]<br>2 4 6 8 10<br>-VGS , Gate-Source Voltage [V]<br> , Drain Current [A]-ID<br>**----- End of picture text -----**<br>
**Fig 3. On-Resistance vs. Drain Current**
**Fig 4. Source-Drain Diode Forward Voltage**
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0.40<br>0.35<br>10 [[1]]<br>0.30<br>VGS = -10 V<br>0.25<br>10 [[0]]<br>0.20<br>150 oCoCC<br>@ Notes :<br>0.15 VGS = -20 V @ Note : TJ = 25 [o] C 25 oCoCC 1. V 2. 250 GS = 0 V 2. 250 GS = 0 V µ s Pulse Test<br>0.10 10 [[-1]]<br>0 5 10 15 20 25 30 35 40 0.5 1.0 1.5 2.0 2.5 3.0 3.5<br>-ID , Drain Current [A] -VSD , Source-Drain Voltage [V]SD , Source-Drain Voltage [V] , Source-Drain Voltage [V]<br>Fig 5. Capacitance vs. Drain-Source Voltage Fig 6. Gate Charge vs. Gate-Source Voltage<br>800<br>Ciss= Cgs+ Cgd ( Cds= shorted )<br>Coss= Cds+ Cgd 10 VDS = -12 V<br>600 C iss Crss= Cgd VDSV = -48 VDS = -30 V<br>C oss<br>400<br>@ Notes : 5<br> 1. VGS = 0 V<br> 2. f = 1 MHz<br>200 C rss<br>@ Notes : ID =-9.7 A<br>0 0<br>10 [0] 10 [1] 0 4 8 12 16<br>-VDS , Drain-Source Voltage [V] QG , Total Gate Charge [nC]<br>]<br>Ω<br> , [<br>DS(on)<br>R<br>Drain-Source On-Resistance<br> , Reverse Drain Current [A]<br>DR<br>-I<br>Capacitance [pF]<br> , Gate-Source Voltage [V]<br>GS<br>-V<br>**----- End of picture text -----**<br>
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10 [[1]]<br>10 [[0]]<br>150 oCoCC<br>@ Notes :<br>GS = 0 V = 0 V<br>25 oCoCC 1. V 2. 250 GS = 0 V 2. 250 GS = 0 V µ s Pulse Test<br>10 [[-1]]<br>0.5 1.0 1.5 2.0 2.5 3.0 3.5<br>-VSD , Source-Drain Voltage [V]SD , Source-Drain Voltage [V] , Source-Drain Voltage [V]<br> , Reverse Drain Current [A]<br>DR<br>-I<br>**----- End of picture text -----**<br>
**P-CHANNEL POWER MOSFET**
## **SFR/U9024**
**Fig 8. On-Resistance vs. Temperature**
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Fig 7. Breakdown Voltage vs. Temperature Fig 8. On-Resistance vs. Temperature<br>1.2 2.5<br>2.0<br>1.1<br>1.5<br>1.0<br>1.0<br>0.9 @ Notes : @ Notes :<br> 1. V 2. IGSD = -250 = 0 V µ A 0.5 1. V 2. IGSD = -4.9 A = -10 V<br>0.8 0.0<br>-75 -50 -25 0 25 50 75 100 125 150 175 -75 -50 -25 0 25 50 75 100 125 150 175 200<br>TJ , Junction Temperature [ [o] C] TJ , Junction Temperature [ [o] C]<br> , (Normalized) , (Normalized)<br>-BVDSS RDS(on)<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br>**----- End of picture text -----**<br>
**Fig 9. Max. Safe Operating Area**
**Fig 10. Max. Drain Current vs. Case Temperature**
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8<br>Operation in This Area<br>10 [2] is Limited by R DS(on)<br>6<br>0.1 ms<br>10 [1] 1 ms<br>4<br>10 ms<br>DC<br>@ Notes :<br>10 [0] 1. TC = 25 [o] C<br> 2. TJ = 150 [o] C 2<br> 3. Single Pulse<br>10 [-1] 0<br>10 [0] 10 [1] 10 [2] 25 50 75 100 125 150<br>-VDS , Drain-Source Voltage [V] Tc , Case Temperature [ [o] C]<br>Fig 11. Thermal Response<br>D=0.5<br>@ Notes :<br>10 [0] 0.2 1. Z θ JC (t)=3.91 o C/W Max.<br> 2. Duty Factor, D=t1 /t2<br>0.1 3. TJM -TC =PDM *Z θ JC (t)<br>0.05 P.DM<br>0.02<br>10 [-1] 0.01 t1.t2.<br>single pulse<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t1 , Square Wave Pulse Duration [sec]<br> , Drain Current [A]-ID<br> , Drain Current [A]-ID<br>(t) , Thermal Response<br>Z JC θ<br>**----- End of picture text -----**<br>
**SFR/U9024**
## **P-CHANNEL POWER MOSFET**
**Fig 12. Gate Charge Test Circuit & Waveform**
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“ Current Regulator ”<br>Same Type VGS<br>50K Ω as DUT<br>Qg<br>12V 200nF<br>300nF -10V<br>VDS<br>VGS Qgs Qgd<br>DUT<br>-3mA<br>R1 R2<br>Charge<br>Current Sampling (IG) Current Sampling (ID)<br>Resistor Resistor<br>**----- End of picture text -----**<br>
**Fig 13. Resistive Switching Test Circuit & Waveforms**
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RL<br>Vout td(on) t on tr td(off) t off tf<br>Vin VDD<br>( 0.5 rated VDS ) Vin<br>RG 10%<br>DUT<br>-10V<br>90%<br>Vout<br>Fig 14. Unclamped Inductive Switching Test Circuit & Waveforms<br>VDS LL EAS = ----12 LL IAS2 --------------------BVBVDSS -- VDSS DD<br>Vary tp to obtain ID t p Time<br>required peak ID<br>VDD VDS (t)<br>RG C VDD ID (t)<br>DUT<br>-10V IAS<br>t p BVDSS<br>**----- End of picture text -----**<br>
**P-CHANNEL POWER MOSFET**
## **SFR/U9024**
## **Fig 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms**
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+<br>VDS<br>DUT<br>--<br>I S<br>L<br>Driver<br>VGS<br>RG Compliment of DUT(N-Channel) VDD<br>VGS • dv/dt controlled by “RG”<br>• IS controlled by Duty Factor “D”<br>Gate Pulse Width<br>VGS D = --------------------------Gate Pulse Period 10V<br>( Driver )<br>Body Diode Reverse Current<br>I S IRM<br>( DUT )<br>di/dt<br>IFM , Body Diode Forward Current<br>Vf<br>VDS<br>( DUT )<br>Body Diode VDD<br>Forward Voltage Drop<br>Body Diode Recovery dv/dt<br>**----- End of picture text -----**<br>
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TRADEMARKS<br>**----- End of picture text -----**<br>
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The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is<br>not intended to be an exhaustive list of all such trademarks.<br>ACEx™ FACT™ ImpliedDisconnect™ PACMAN™ SPM™<br>ActiveArray™ FACT Quiet Series™ ISOPLANAR™ POP™ Stealth™<br>Bottomless™ FAST® LittlkeFET™ Power247™ SuperSOT™-3<br>CoolFET™ FASTr™ MicroFET™ PowerTrench® SuperSOT™-6<br>CROSSVOLT™ FRFET™ MicroPak™ QFET™ SuperSOT ™-8<br>DOME™ GlobalOptoisolator™ MICROWIRE™ qas™ SyncFET™<br>EcoSPARK™ GTOo™ MSX™ QT Optoelectronics™ TinyLogic™<br>E?CMOS™ HiSeC™ MSXPro™ Quiet Series™ TruTranslation™<br>EnSigna™ 2co™ OCX™ RapidConfigure™ UHC™<br>Across the board. Around the world.™ OCXPro™ RapidConnect™ UltraFET®<br>The Power Franchise™ OPTOLOGIC® SILENT SWITCHER® VCX™<br>Programmable Active Droop™ OPTOPLANAR™ SMART START™<br>DISCLAIMER<br>FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER<br>NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD<br>DOES NOTASSUMEANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT<br>OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT<br>RIGHTS, NOR THE RIGHTS OF OTHERS.<br>LIFE SUPPORT POLICY<br>FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT<br>DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTENAPPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.<br>As used herein:<br>1. Life support devices or systems are devices or 2. A critical component is any component of a life<br>systems which, (a) are intended for surgical implant into support device or system whose failure to perform can<br>the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life<br>failure to perform when properly used in accordance support device or system, or to affect its safety or<br>with instructions for use provided in the labeling, can be effectiveness.<br>reasonably expected to result in significant injury to the<br>user.<br>PRODUCT STATUS DEFINITIONS<br>Definition of Terms<br>Advance Information Formative or This datasheet contains the design specifications for<br>In Design product development. Specifications may change in<br>any manner without notice.<br>Preliminary First Production This datasheet contains preliminary data, and<br>supplementary data will be published at a later date.<br>Fairchild Semiconductor reserves the right to make<br>changes at any time without notice in order to improve<br>design.<br>No Identification Needed Full Production This datasheet contains final specifications. Fairchild<br>Semiconductor reserves the right to make changes at<br>any time without notice in order to improve design.<br>Obsolete Not In Production This datasheet contains specifications on a product<br>that has been discontinued by Fairchild semiconductor.<br>The datasheet is printed for reference information only.<br>Rev. I1<br>**----- End of picture text -----**<br>
Updated at March 10, 2026
onsemi is a premier global supplier of intelligent power and sensing technologies, driving disruptive innovations across the automotive, industrial, and cloud infrastructure markets. Recognized for their commitment to sustainability and reliable supply chains, the company accelerates advancements in vehicle electrification, industrial automation, and 5G networks by solving the industry's most complex design challenges. At the core of their portfolio is an industry-leading selection of discrete semiconductors. This extensive range features thousands of high-performance bipolar transistors, single and dual MOSFETs, and a comprehensive array of diodes, including Zener, Schottky, and fast-recovery rectifiers. Engineered for superior thermal performance and energy efficiency, these foundational components are critical for demanding power conversion, switching, and signal conditioning applications. Beyond essential discretes, onsemi provides a robust suite of advanced power management and circuit protection solutions. Their lineup includes intelligent power modules, single IGBTs, and transient voltage suppression (TVS) diodes designed to safeguard sensitive circuitry. Complimented by integrated passive filters, AC/DC LED driver ICs, and specialized sub-2.4GHz RF transceivers, onsemi equips engineers with the scalable, high-quality technologies needed to build a cleaner, smarter, and more connected world.
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