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RSE-32.768-12.5-H14-TR
Crystal, RSE Series, 32.768 kHz, 20 ppm, 12.5 pF
⚠️ Reference pricing provided. In case of supply shortages, we will connect you with our trusted procurement partners to ensure your project's continuity.
- Manufacturer: RALTRON
- Product type: Crystals
- SVHC: No SVHC (04-Feb-2026)
- Frequency Nom: 32.768kHz
- Product Range: RSE Series
- Load Capacitance: 12.5pF
- Crystal Frequency: 32.768kHz
- Crystal Case / Package: SMD, 6.9mm x 1.4mm
- Frequency Stability + / -: -
- Frequency Tolerance + / -: 20ppm
- Operating Temperature Max: 85°C
- Operating Temperature Min: -40°C
| Delivery and price | |
|---|---|
| Units per pack | 500 |
| Price | 0.221 € |
| Current stock | 1000+ |
| Lead time | 30 days |
Datasheet
## **SURFACE MOUNT MICROPROCESSOR CRYSTAL** Page 1 of 17 ## **RSE-32.768-12.5-H14-TR** ## • **SPECIFICATIONS** |**PARAMETER**|**VALUE**| |---|---| |NOMINAL FREQUENCY|32.768 KHz| |VIBRATION MODE|BT Cut| |FREQUENCY TOLERANCE AT 25°C|±20ppm max| |TEMPERATURE COEFFICIENT|-0.035 ±0.008ppm/°C2| |TURNOVER TEMPERATURE|25°C ±5°C| |OPERATING TEMPERATURE RANGE|-40°C to +85°C| |STORAGE TEMPERATURE RANGE|-40°C to +125°C| |AGING|±3 ppmperyear max| |LOADCAPACITANCE|12.5 pF| |EQUIVALENT SERIES RESISTANCE|65kmax| |SHUNTCAPACITANCE|1.5 pF max| |MOTIONALCAPACITANCE|1.9~ 2.3fF| |DRIVE LEVEL|1.0 µW max| |QUALITY FACTOR|50,000min| |INSULATION RESISTANCE|500 Mmin@DC 100V| ## • **MECHANICAL SPECIFICATION** ## • **CARRIER TAPE DIMENSIONS** **NOTE: REFER TO EIA-481 FOR DIMENSIONS** ## • **PACKAGING** 180 mm REEL DIAMETER 16 mm TAPE WIDTH, 4 mm PITCH QUANTITY: 3000 PIECES PER REEL IN ACCORDANCE WITH EIA-481 RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **SURFACE MOUNT MICROPROCESSOR CRYSTAL** Page 2 of 17 ## **RSE-32.768-12.5-H14-TR** ## • **REFLOW PROFILE** **==> picture [384 x 348] intentionally omitted <==** **----- Start of picture text -----**<br> |||| |---|---|---| |tP| |TP| |Critical Zone| |Ramp-up|TL to TP| |TL| |tL| |TSMAX| |Temp.| |[°C]|Ramp-down| |TSMIN| |tS Preheat| |—z|*| |Time [sec]| |t[25°C] to Peak| |Reflow profile| |Temperature Min Preheat|TSMIN|150°C| |Temperature Max Preheat|TSMAX|200°C| |Time (TSMIN to TSMAX)|tS|60-180 sec.| |Temperature|TL|217°C| |Peak Temperature|TP|260°C| |Ramp-up rate|RUP|3°C/sec max.| |Ramp-down rate|RDOWN|6°C/sec max.| |Time within 5°C of Peak Temperature|tP|10 sec.| |Time t[25°C] to Peak Temperature|t[25°C] to Peak|480 sec.| |Time|tL|60-150 sec.| **----- End of picture text -----**<br> ## • **ENVIRONMENTAL** **==> picture [275 x 74] intentionally omitted <==** **----- Start of picture text -----**<br> ||| |---|---| |PARAMETER|VALUE| |MOISTURE SENSITIVITY LEVEL|1| |RoHS|Compliant| |REACH SVHC|Compliant| |HALOGEN-FREE|Compliant| |ESD CLASSIFICATION LEVEL|N/A| |TERMINATION FINISH|Au| **----- End of picture text -----**<br> RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **SURFACE MOUNT MICROPROCESSOR CRYSTAL** Page 3 of 17 ## **RSE-32.768-12.5-H14-TR** ## • **MARKINGS** 1 ） 32.768 2 ） x3FmyR x – Internal Production ID code m – Month code y – Year code |MONTH CODE|MONTH CODE|MONTH CODE| |---|---|---| |MONTH||CODE| |JANUARY<br>A||| |FEBRUARY<br>B||| |MARCH<br>C||| |APRIL<br>D||| |MAY|E|| |JUNE<br>F||| |JULY|G|| |AUGUST<br>H||| |SEPTEMBER<br>J||| |OCTOBER<br>K||| |NOVEMBER<br>L||| |DECEMBER<br>M||| |**YEAR CODE**|**YEAR CODE**| |---|---| |**Year**|**Code**| |2019|9| |2020|0| |2021|1| |2022|2| |2023|3| |2024|4| |2025|5| |2026|6| |2027|7| |2029|8| |2029|9| 3 ） XXym XX – PID m – Month code y – Year code |MONTH CODE|MONTH CODE|MONTH CODE| |---|---|---| |MONTH||CODE| |JANUARY<br>A||| |FEBRUARY<br>B||| |MARCH<br>C||| |APRIL<br>D||| |MAY|E|| |JUNE<br>F||| |JULY|G|| |AUGUST<br>H||| |SEPTEMBER<br>J||| |OCTOBER<br>K||| |NOVEMBER<br>L||| |DECEMBER<br>M||| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **SURFACE MOUNT MICROPROCESSOR CRYSTAL** Page 4 of 17 ## **RSE-32.768-12.5-H14-TR** |||**YEAR CODE**||| |---|---|---|---|---| |||**Year**<br>**Code**||| |||2021<br>A or M||| |||2022<br>B or N||| |||2023<br>C or R||| |||2024<br>D or S||| |||2025<br>E or T||| |||2026<br>F or U||| |||2027<br>G or V||| |||2028<br>H or W||| |||2029<br>J or X||| |||2030<br>K or Z||| |**APPROVAL**||||| ||DRAWN BY|K. Jackson, June 19, 2016||| ||APPROVED BY|J. Ivens, June 19, 2016||| ||REVISION|A, Initial Release||| |||B. Updated to current spec levels, KJ, 3/7/17|B. Updated to current spec levels, KJ, 3/7/17|| |||C. Updated to current spec levels, JH 11/27/19||| |||D. Remove marking, AG 6/19/20||| |||E, Updated carrier tape dimensions & marking to current spec levels by||| |||XLiu, March 11, 2021||| |||F, Added insulation resistance by XLiu, December 17, 2021||| |||H, Updated to current spec levels by XLiu, April 21, 2022||| |||I, Updatedmarkingrule to current speclevels byXLiu, October 17,2022||| |Raltron Electronics / RAMI Technology USA, LLC, including its affiliates, employees, agents and other persons acting on its behalf (collectively Raltron/RAMI Tech), disclaim any and all liability for any errors or|||Raltron Electronics / RAMI Technology USA, LLC, including its affiliates, employees, agents and other persons acting on its behalf (collectively Raltron/RAMI Tech), disclaim any and all liability for any errors or|| |inaccuracies contained in this data sheet. While Raltron/RAMI Tech has made every reasonable effort ensure the accuracy of all product information, specifications and data contained herein, Raltron/RAMI Tech||||| |does not guarantee that the information is accurate, reliable or current. The product information is provided only for reference purposes only and is subject to change, correction or revision, at any time without||||| |notice. Raltron/RAMI Tech does not assume any liability arising out of an application or use of any product described herein and disclaims any warranties expressed or implied. The user of products in such||notice. Raltron/RAMI Tech does not assume any liability arising out of an application or use of any product described herein and disclaims any warranties expressed or implied. The user of products in such||| |applications shall assume all risks of such use and will agree to hold Raltron/RAMI Tech, harmless against all damages.||||| |Copyright © 2016, Raltron Electronics / RAMI Technology USA, LLC. All rights reserved. No part of this document may be reproduced in any form without the prior written permission of Raltron Electronics / RAMI||||| |Technology USA, LLC.||||| ## • **APPROVAL** RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **SURFACE MOUNT MICROPROCESSOR CRYSTAL** Page 5 of 17 **RSE-32.768-12.5-H14-TR** ## 可靠度实验报告 ## **RELIABILITY TEST REPORT** |**TYPE**|**RSE-H14**| |---|---| |**Frequency**|**32.768kHZ**| |**DATE**|**2020/12/26**| |**FL tolerance**|**±20ppm **| |**CL**|**12.5pF **| |**ESR**|**70k ohms**| 可 靠 度 实 验 室 **Reliabilit Laborator y y** RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|振动试验<br>Vibration|规 格<br>Type|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/9/16| |---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||RSE-32.768-12.5-H14-TR|||数 量<br>Quantity|10 PCS|结束日期<br>Finished<br>Date|2020/9/16| |实验设备<br>EQUIPMENT||三向变频电磁振动试验机、S&A 250B网络分析仪<br>Three-phase electromagnetic vibration test bench S&A 250B test system.<br>~~振动频率：10Hz~55Hz；振幅：1.5mm；振动方向：X.Y.Z；周期：1-2分钟（10-55-~~||||||| |实验方法<br>Test Method||~~振动频率：10Hz~55Hz；振幅：1.5mm；振动方向：X.Y.Z；周期：1-2分钟（10-55-~~<br>10Hz）；<br>振动时间：每个方向2小时，共6小时。<br>Frequency Range： 10Hz~55Hz；Amplitude：1.5mm；vibration direction：X.Y.Z<br>Cycle Time 1-2min（10-55-10Hz）；2Hours in each direction, total 6Hours；||||||| |判定标准<br>Accept level||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ||||||| |试验数据 Test Data||||||||| |NO.|BEFORE||AFTER||CHANGE||RESULT<br>）|REMARK| ||FL|RR（KΩ）|FL|RR（KΩ）|ΔFL<br>ΔRR|ΔRR（KΩ）||| |1|-3.7|39.6|-3.2|40.9|0.5|1.3|PASS|| |2|-2.5|44.3|-1.2|43.5|1.3|-0.8|PASS|| |3|-7.8|39.6|-8.4|40.3|-0.6|0.7|PASS|| |4|1.2|35.4|1.8|36.1|0.6|0.7|PASS|| |5|3.5|34.1|4.2|34.6|0.7|0.5|PASS|| |6|-4.8|34.8|-5.2|34.5|-0.4|-0.3|PASS|| |7|-6.3|32.1|-5.1|33.2|1.2|1.1|PASS|| |8|1.2|35.5|0.7|36.0|-0.5|0.5|PASS|| |9|3.7|37.4|2.7|37.7|-1.0|0.3|PASS|| |10|0.8|34.5|0.2|35.1|-0.6|0.6|PASS|| |MAX|MAX<br>3.7|44.3|4.2|43.5|1.3|1.3|MIL-STD-202 F-201A,<br>Method 204D,Test<br>condition D|| |MIN|MIN<br>-7.8|32.1|-8.4|33.2|-1.0|-0.8||| |AVE.|AVE.<br>-1.5|36.7|-1.4|37.2|0.1|0.5||| |STD.|STD.<br>4.1|3.6|4.0|3.3|0.8|0.6||| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** ||试验项目<br>Test Item|跌落试验<br>Drop Test<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01<br>开始日期<br>Begin Date<br>2020/9/15| |---|---|---| ||料<br>号<br>Part NO.|RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/9/15| ||实验设备<br>EQUIPMENT|BF-LD-TF震动台、CIM200和TTC-5组成的测试系统或S&A 250B测试仪。<br>BF-LD-TFvibration test bench、CIM200 & TTC-5Composed of test systems、S&A 250B<br>test system.| ||实验方法<br>Test Method|从75cm高的跌落台自由跌落3次到3cm厚的硬木板上，静置30分钟后，测其频率相对变化<br>值。3 Times Free Fall from 75cm height table to 3cm thickness hard wood board，After 30<br>minutes, the relative change value of frequency was measured.| ||判定标准|n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ| ||Accept level|| |试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|跌落试验<br>Drop Test|跌落试验<br>Drop Test|规 格<br>Type|规 格<br>Type|RSE-H14|RSE-H14|批 号<br>Lot NO.|批 号<br>Lot NO.|200908-01|200908-01|开始日期<br>Begin Date|2020/9/15| |---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.|||||RSE-32.768-12.5-H14-TR||||||数 量<br>Quantity||10 PCS||结束日期<br>Finished<br>Date|2020/9/15| |实验设备<br>EQUIPMENT|||||BF-LD-TF震动台、CIM200和TTC-5组成的测试系统或S&A 250B测试仪。<br>BF-LD-TFvibration test bench、CIM200 & TTC-5Composed of test systems、S&A 250B<br>test system.|||||||||||| |实验方法<br>Test Method|||||从75cm高的跌落台自由跌落3次到3cm厚的硬木板上，静置30分钟后，测其频率相对变化<br>值。3 Times Free Fall from 75cm height table to 3cm thickness hard wood board，After 30<br>minutes, the relative change value of frequency was measured.|||||||||||| |判定标准<br>Accept level|||||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ|||||||||||| ||||||||试验数据 Test Data|||||||||| |NO.|||BEFORE||||AFTER||||CHANGE||||RESULT<br>|REMARK| ||||FL||RR（KΩ）||FL||RR（KΩ）||ΔFL<br>||ΔRR（KΩ）|||| |1|||4.5|||36.2|3.7||36.7||-0.8||0.5||PASS|| |2|||2.1|||38.1|1.2||38.4||-0.9||0.3||PASS|| |3|||-3.5|||36.2|-2.8||36.7||0.7||0.5||PASS|| |4|||4.1|||34.5|3.7||35.3||-0.4||0.8||PASS|| |5|||2.5|||38.2|2.8||38.7||0.3||0.5||PASS|| |6|||-1.5|||35.1|-2.1||35.8||-0.6||0.7||PASS|| |7|||-3.7|||33.6|-4.2||34.2||-0.5||0.6||PASS|| |8|||-1.2|||36.2|-2.1||36.7||-0.9||0.5||PASS|| |9|||0.9|||39.7|1.3||40.1||0.4||0.4||PASS|| |10|||-3.8|||34.5|-2.7||35.2||1.1||0.7||PASS|| |MAX|||4.5|||39.7|3.7||40.1||1.1||0.8||MIL-STD-202 F-203B|| |MIN|||-3.8|||33.6|-4.2||34.2||-0.9||0.3|||| |AVE.|||0.0|||36.2|-0.1||36.8||-0.2||0.5|||| |STD.|||3.2|||1.9|3.0||1.8||0.7||0.2|||| |10.0FL<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>-2.0<br>-4.0<br>-6.0<br>-8.0<br>-10.0||||||||||||||||| ||.<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>|||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |||||||||||||||||| |RESULT||||||PASS|APPROVA<br>L||John||CHECK||YG||PREPARE|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|可焊性<br>Solderabilit<br>y|<br>规 格<br>Type|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin<br>Date|2020/9/22| |---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||RSE-32.768-12.5-H14-TR|||数 量<br>Quantity|20 PCS|结束日期<br>Finished<br>Time|2020/9/22| |实验设备<br>EQUIPMENT||JF-107A微电脑融锡炉、焊锡、助焊剂<br>JF-107AMicrocomputer tin melting furnace、Solder、Flux.||||||| |实验方法<br>Test Method||将引线浸入完全熔化的焊锡炉内3-5s，焊锡温度260℃±5℃<br>Dip in flux 3~5 seconds;Temperature: 260℃±5℃||||||| |判定标准<br>Accept level||n=20pcs、Ac=0、Re=1焊锡附着良好，锡附着95％以上||||||| |试验数据 Test Data||||||||| |NO.|沾锡量||||||RESULT|<br>REMARK| |1|沾锡量 95%以上||||||PASS|| |2|沾锡量 95%以上||||||PASS|| |3|沾锡量 95%以上||||||PASS|| |4|沾锡量 95%以上||||||PASS|| |5|沾锡量 95%以上||||||PASS|| |6|沾锡量 95%以上||||||PASS|| |7|沾锡量 95%以上||||||PASS|| |8|沾锡量 95%以上||||||PASS|| |9|沾锡量 95%以上||||||PASS|| |10|沾锡量 95%以上||||||PASS|| |11|沾锡量 95%以上||||||PASS|| |12|沾锡量 95%以上||||||PASS|| |13|沾锡量 95%以上||||||PASS|| |14|沾锡量 95%以上||||||PASS|| |15|沾锡量 95%以上||||||PASS|| |16|沾锡量 95%以上||||||PASS|| |17|沾锡量 95%以上||||||PASS|| |18|沾锡量 95%以上||||||PASS|| |19|沾锡量 95%以上||||||PASS|| |20|沾锡量 95%以上||||||PASS|| |MIL-STD-883 E<br>方法 2003||||||||| |||||||||| |RESULT||PASS|APPROVA<br>L|John|CHECK|YG|PREPAR<br>E|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|高温储存<br>High<br>Temp.storage|<br>规 格<br>Type|RSE-H14|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/9/18| |---|---|---|---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||||RSE-32.768-12.5-H14-TR||||数 量<br>Quantity|10 PCS|结束日期<br>Finished<br>Date|2020/9/21| |实验设备<br>EQUIPMENT||||BTH-80C可程式恒温恒湿试验箱、S&A 250B网络分析仪<br>BTH-80C Humidity Chamber、S&A 250B test system<br>|||||||| |实验方法<br>Test Method||||~~晶体放置于~~125~~℃±~~5~~℃环境中~~72 H~~小时后~~,~~常温静置~~1~~～~~2~~小时后测其频率相对变化量~~<br>Temperature: 125℃ ±5℃for 72 H, and the relative change in frequency was<br>measured after 1 ~ 2 hours at room temperature|||||||| |判定标准<br>Accept level||||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ|||||||| ||||||试验数据 Test Data||||||| |NO.|||BEFORE||AFTER|||CHANGE||RESULT<br>|REMAR~~K~~| ||||FL|RR（KΩ）|FL|RR（KΩ）||ΔFL<br>|ΔRR（KΩ）||| |1|||-5.6|41.9|-6.3|42.2||-0.7|0.3|PASS|| |2|||-4.8|39.3|-5.2|38.6||-0.4|-0.7|PASS|| |3|||-1.3|38.6|-1.8|39.2||-0.5|0.6|PASS|| |4|||1.4|44.0|1.2|43.5||-0.2|-0.5|PASS|| |5|||3.2|38.4|3.5|37.4||0.3|-1.0|PASS|| |6|||7.8|41.2|6.7|41.6||-1.1|0.4|PASS|| |7|||-10.5|43.6|-10.8|43.8||-0.3|0.2|PASS|| |8|||-9.7|42.8|-10.2|41.7||-0.5|-1.1|PASS|| |9|||5.3|40.7|4.3|40.5||-1.0|-0.2|PASS|| |10|||-2.4|44.6|-2.8|44.1||-0.4|-0.5|PASS|| |**MAX**|||7.8|44.6|6.7|44.1||0.3|0.6|MIL-STD-883 E-1016|| |**MIN**|||-10.5|38.4|-10.8|37.4||-1.1|-1.1||| |**AVE.**|||-1.7|41.5|-2.1|41.3||-0.5|-0.2||| |**STD.**|||6.1|2.3|6.1|2.3||0.4|0.6||| |10.0FL<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>-2.0<br>-4.0<br>-6.0<br>-8.0<br>-10.0|||||||FL/RR||RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0||| ||.<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>||||||||||| ||||||||||||| ||||||||||||| ||||||||||||| ||||||||||||| ||||||||||||| ||||||||||||| ||||||||||||| |||||~~F~~L|||||||| |RESULT||||PASS|APPROVA<br>L|John||CHECK|YG|PREPARE|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|低温储存<br>Low<br>Temp.storage|低温储存<br>Low<br>Temp.storage|<br>规 格<br>Type|RSE-H14|批 号<br>Lot NO.|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/9/26| |---|---|---|---|---|---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.|||||RSE-32.768-12.5-H14-TR||||数 量<br>Quantity||10 PCS|结束日期<br>Finished<br>Date|2020/9/29| |实验设备<br>EQUIPMENT|||||BST-50B冷热冲击试验箱 、CIM200和TTC-5组成的测试系统 、S&A 250B测试仪.<br>BST-50B Cold thermal shock experiment box、CIM200 & TTC-5Composed of test<br>systems、S&A 250B test system||||||||| |实验方法<br>Test Method|||||晶体放置于-45℃±5℃环境中72 H小时后,常温静置1～2小时后测其频率相对变化量<br>Temperature: -45℃±5℃ for 72 H, and the relative change in frequency was measured<br>after 1 ~ 2 hours at room temperature||||||||| |判定标准<br>Accept level|||||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ||||||||| ||||||||试验数据 Test Data||||||| |NO.|||BEFORE||||AFTER|||CHANGE||RESULT<br>|REMARK| ||||FL||RR（KΩ）||FL|RR（KΩ）||ΔFL|ΔRR（KΩ）||| |1|||-11.2|||42.7|-10.5|41.5||0.7|-1.2|PASS|| |2|||-7.8|||38.4|-8.4|37.8||-0.6|-0.6|PASS|| |3|||3.1|||37.4|3.8|37.1||0.7|-0.3|PASS|| |4|||4.5|||42.1|4.3|42.6||-0.2|0.5|PASS|| |5|||-3.5|||36.1|-3.8|36.3||-0.3|0.2|PASS|| |6|||-2.8|||35.8|-3.6|35.4||-0.8|-0.4|PASS|| |7|||-4.1|||37.6|-4.6|37.2||-0.5|-0.4|PASS|| |8|||2.7|||41.8|3.5|41.3||0.8|-0.5|PASS|| |9|||1.6|||39.1|1.3|38.7||-0.3|-0.4|PASS|| |10|||1.3|||40.3|2.1|40.1||0.8|-0.2|PASS|| |**MAX**|||4.5|||42.7|4.3|42.6||0.8|0.5|MIL-STD-883 C-<br>1008.2B TJR-2-<br>06-505|| |**MIN**|||-11.2|||35.8|-10.5|35.4||-0.8|-1.2||| |**AVE.**|||-1.6|||39.1|-1.6|38.8||0.0|-0.3||| |**STD.**|||5.1|||2.5|5.3|2.4||0.6|0.5||| |10.0FL<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>-2.0<br>-4.0<br>-6.0<br>-8.0<br>-10.0|||||||FL/RR||||RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0||| ||.<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| |||||||~~F~~L|||||||| |RESULT||||||PASS|APPROVA<br>L|John|CHECK||YG|PREPARE|Mr.Zhou| |试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|低温储存<br>Low<br>Temp.storage|低温储存<br>Low<br>Temp.storage|<br>规 格<br>Type|RSE-H14|批 号<br>Lot NO.|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/9/26| |---|---|---|---|---|---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.|||||RSE-32.768-12.5-H14-TR||||数 量<br>Quantity||10 PCS|结束日期<br>Finished<br>Date|2020/9/29| |实验设备<br>EQUIPMENT|||||BST-50B冷热冲击试验箱 、CIM200和TTC-5组成的测试系统 、S&A 250B测试仪.<br>BST-50B Cold thermal shock experiment box、CIM200 & TTC-5Composed of test<br>systems、S&A 250B test system||||||||| |实验方法<br>Test Method|||||晶体放置于-45℃±5℃环境中72 H小时后,常温静置1～2小时后测其频率相对变化量<br>Temperature: -45℃±5℃ for 72 H, and the relative change in frequency was measured<br>after 1 ~ 2 hours at room temperature||||||||| |判定标准<br>Accept level|||||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ||||||||| ||||||||试验数据 Test Data||||||| |NO.|||BEFORE||||AFTER|||CHANGE||RESULT<br>|REMARK| ||||FL||RR（KΩ）||FL|RR（KΩ）||ΔFL|ΔRR（KΩ）||| |1|||-11.2|||42.7|-10.5|41.5||0.7|-1.2|PASS|| |2|||-7.8|||38.4|-8.4|37.8||-0.6|-0.6|PASS|| |3|||3.1|||37.4|3.8|37.1||0.7|-0.3|PASS|| |4|||4.5|||42.1|4.3|42.6||-0.2|0.5|PASS|| |5|||-3.5|||36.1|-3.8|36.3||-0.3|0.2|PASS|| |6|||-2.8|||35.8|-3.6|35.4||-0.8|-0.4|PASS|| |7|||-4.1|||37.6|-4.6|37.2||-0.5|-0.4|PASS|| |8|||2.7|||41.8|3.5|41.3||0.8|-0.5|PASS|| |9|||1.6|||39.1|1.3|38.7||-0.3|-0.4|PASS|| |10|||1.3|||40.3|2.1|40.1||0.8|-0.2|PASS|| |**MAX**|||4.5|||42.7|4.3|42.6||0.8|0.5|MIL-STD-883 C-<br>1008.2B TJR-2-<br>06-505|| |**MIN**|||-11.2|||35.8|-10.5|35.4||-0.8|-1.2||| |**AVE.**|||-1.6|||39.1|-1.6|38.8||0.0|-0.3||| |**STD.**|||5.1|||2.5|5.3|2.4||0.6|0.5||| |10.0FL<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>-2.0<br>-4.0<br>-6.0<br>-8.0<br>-10.0|||||||FL/RR||||RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0||| ||.<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| |||||||~~F~~L|||||||| |RESULT||||||PASS|APPROVA<br>L|John|CHECK||YG|PREPARE|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|恒温恒湿<br>Humidity<br>Storage<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01<br>开始日期<br>Begin Date<br>2020/10/8| |---|---| |料<br>号<br>Part NO.|RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/11| |实验设备<br>Equipment|BTH-80C可程式恒温恒湿试验箱; CIM200和TTC-5组成的测试系统、S&A 250B网络分析仪<br>BTH-80C Humidity Chamber、CIM200 & TTC-5Composed of test systems、S&A 250B<br>test system| |实验方法<br>Test Method|晶体放置于80℃±5℃、相对湿度90-95%的环境中72小时后，测其频率相对变化量<br>Temperature: 80℃±5℃ , Relative Humidity:90-95% for 72 hours, and then the relative<br>change in frequencywas measured| |判定标准|n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ| |Accept level|| |||||||||||||||||试验数据|试验数据|试验数据|试验数据|Test Data|Test Data||||||||||||||||||| |---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---| |||||||BEFORE|||||||AFTER||||||||CHANGE||||||||||||||||||| |NO.|||||||||||||||||||||||||||||||RESULT|||||REMARK|||REMARK| |||||FL||||RR（KΩ）|||||FL|||RR（KΩ）|||||ΔFL||ΔRR（KΩ）||||||||||||||||| |1||||4.8|||||36.4||||5.1|||37.2|||||0.3||||||0.8|0.8|||PASS|||PASS|||||| |2||||2.4|||||40.5||||3.4|||40.1|||||1.0||||||-0.4||||PASS|||PASS|||||| |3||||-1.5|||||31.8||||-1.2|||32.3|||||0.3||||||0.5|0.5|||PASS|||PASS|||||| |4||||-7.9|||||36.6||||-6.4|||36.2|||||1.5||||||-0.4||||PASS|||PASS|||||| |5||||5.3|||||33.9||||5.9|||33.5|||||0.6||||||-0.4||||PASS|||PASS|||||| |6||||2.4|||||35.4||||2.7|||35.8|||||0.3||||||0.4|0.4|||PASS|||PASS|||||| |7||||-1.8|||||33.1||||-2.3|||33.4|||||-0.5||||||0.3|0.3|||PASS|||PASS|||||| |8||||-3.8|||||34.5||||-4.2|||35.1|||||-0.4||||||0.6|0.6|||PASS|||PASS|||||| |9||||-4.1|||||41.3||||-4.7|||41.5|||||-0.6||||||0.2|0.2|||PASS|||PASS|||||| |10||||8.4|||||38.0||||7.9|||39.2|||||-0.5||||||1.2|1.2|||PASS|||PASS|||||| |MAX||||8.4|||||41.3||||7.9|||41.5|||||1.5||||||1.2|1.2|||||||||||| ||||||||||||||||||||||||||||||||MIL-STD-202 F-103B||||||||| |MIN||||-7.9|||||31.8||||-6.4|||32.3|||||-0.6||||||-0.4||||||||||||| |AVE.||||0.4|||||36.1||||0.6|||36.4|||||0.2||||||0.3|0.3||||||方法|||D||| |STD.||||5.1||||||3.1|3.1||5.0|||3.1|||||0.7||||||0.5|0.5|||||||||||| |19.0 <br>BQ<br>a|FL<br>||~~eae~~||||||||||||||||||||||||||||||||||||| ||||||||||||||||||||||||||||||||||||||||| |“48<br>4-9<br>736~~Po~~|~~Po~~|~~Po~~|fr Oo<br>~~oo~~<br>oOo<br>oO<br>QO<br>Q ~~999]~~<br>0<br>0<br>0<br>0<br>~~Po~~<br>~~—e— ~~FL<br>~~—=— ~~RR|||||||||||||||||||||||||||||||||||710<br>uae<br>73.0<br>-5.0|| ||||||||||||||||||||||||||||||||||||||||| |RESULT|||||||||PASS||||APPROVA<br>John||||||||CHECK||||||YG||||PREPARE||||||Mr.Zhou||| ||||||||||||||L||||||||||||||||||||||||||| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|温度循环<br>Temp. cycle|Temp. cycle<br>规 格<br>Type|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/10/17| |---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||RSE-32.768-12.5-H14-TR|||数 量<br>Quantity|10 PCS|结束日期<br>Finished<br>Date|2020/10/17| |实验设备<br>EQUIPMENT||BTS-50B冷热冲击试验箱、S&A 250B网络分析仪<br>Cold thermal shock experiment box、S&A 250B test system<br>温度从~~-55~~℃±~~5~~℃~~(~~保持~~30~~分钟~~)~~升高到~~125~~℃±~~5~~℃~~(~~保持~~30~~分钟~~),~~再降~~-55~~℃±~~5~~℃~~(~~保持~~30~~分~~钟),~~||||||| |实验方法<br>Test Method||温度从~~-55~~℃±~~5~~℃~~(~~保持~~30~~分钟~~)~~升高到~~125~~℃±~~5~~℃~~(~~保持~~30~~分钟~~),~~再降~~-55~~℃±~~5~~℃~~(~~保持~~30~~分 ~~钟),~~<br>完成一个循环；共计5个循环.常温静置1～2小时后测其频率相对变化量Temperature1:-55<br>℃±5℃, Temperature 2:125℃±5℃,Temperature change between<br>from T1 to T2 to T1 ,Run 5 cycles,maintain T1 and T2 30minutes each in one cycle. and<br>the relative change in frequency was measured after 1 ~ 2 hours at room temperature||||||| |判定标准<br>Accept level||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ||||||| |试验数据 Test Data||||||||| |NO.|BEFORE||AFTER||CHANGE||RESULT<br>）|REMARK| ||FL|RR（KΩ）|FL|RR（KΩ）|ΔFL|ΔRR（KΩ）||| |1|-4.8|38.4|-5.4|38.9|-0.6|0.5|PASS|| |2|-3.2|33.7|-3.6|33.5|-0.4|-0.2|PASS|| |3|-5.5|38.1|-4.8|38.4|0.7|0.3|PASS|| |4|4.2|41.4|4.8|42.1|0.6|0.7|PASS|| |5|1.7|40.5|1.5|40.8|-0.2|0.3|PASS|| |6|2.5|38.3|2.8|38.4|0.3|0.1|PASS|| |7|-3.8|35.8|-3.4|35.3|0.4|-0.5|PASS|| |8|4.2|39.8|4.5|39.4|0.3|-0.4|PASS|| |9|-7.6|40.3|-8.2|40.7|-0.6|0.4|PASS|| |10|-2.8|43.6|-2.3|43.9|0.5|0.3|PASS|| |MAX|4.2|43.6|4.8|43.9|0.7|0.7|MIL-STD-883 E-<br>1011.9B|| |MIN|-7.6|33.7|-8.2|33.5|-0.6|-0.5||| |AVE.|AVE.<br>-1.5|39.0|-1.4|39.1|0.1|0.2||| |STD.|STD.<br>4.3|2.8|4.5|3.1|0.5|0.4||| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|盐雾实验<br>Salt Fog<br>Test|盐雾实验<br>Salt Fog<br>Test|规 格<br>Type|规 格<br>Type|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/10/9| |---|---|---|---|---|---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.|||||RSE-32.768-12.5-H14-TR|||||数 量<br>Quantity|10 PCS|结束日期<br>Finished<br>Date|2020/10/13| |实验设备<br>EQUIPMENT|||||BE-CS-60盐水喷雾试验机、S&A 250B网络分析仪||||||||| |实验方法<br>Test Method|||||将晶体置于盐雾浓度为5%，温度35℃的盐雾室中96小时，用水洗净擦干表面。<br>Put the crystal units in the salt spray room(salt density:5%)at the temperature<br>of 35℃for 96 hours.Then clean it with water and dry its surface.||||||||| |判定标准<br>Accept level|||||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ外观良好，可焊性良好。<br>The appearance shall has no abnormity and soldering is good.||||||||| |||||||||试验数据 Test Data|||||| |NO.|||BEFORE|||||AFTER||CHANGE||RESULT<br>|REMARK| ||||FL||RR（KΩ）||FL||RR（KΩ）|ΔFL|ΔRR（KΩ）||| |1|||2.8|||36.0|3.1||35.7|0.3|-0.3|PASS|| |2|||4.3|||31.8|4.5||32.1|0.2|0.3|PASS|| |3|||-3.1|||38.1|-3.2||38.2|-0.1|0.1|PASS|| |4|||-1.4|||36.3|-1.8||36.4|-0.4|0.1|PASS|| |5|||2.4|||34.7|2.6||34.5|0.2|-0.2|PASS|| |6|||7.6|||35.9|7.5||35.7|-0.1|-0.2|PASS|| |7|||2.6|||38.2|2.9||38.5|0.3|0.3|PASS|| |8|||-4.2|||31.2|-4.6||31.1|-0.4|-0.1|PASS|| |9|||-6.3|||35.6|-6.4||35.3|-0.1|-0.3|PASS|| |10|||-1.8|||39.0|-2.0||38.6|-0.2|-0.4|PASS|| |MAX|||7.6|||39.0|7.5||38.6|0.3|0.3|MIL-STD-883E<br>Method 1009.822|| |MIN|||-6.3|||31.2|-6.4||31.1|-0.4|-0.4||| |AVE.|||0.3|||35.7|0.3||35.6|0.0|-0.1||| |STD.|||4.3|||2.6|4.5||2.6|0.3|0.2||| |10.0FL<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>-2.0<br>-4.0<br>-6.0<br>-8.0<br>-10.0||||||||FL/RR|||RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0||| ||.<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||||||||| ||||||||~~F~~L||||||| |RESULT||||||PASS|APPROVA<br>L||John|CHECK|YG|PREPARE|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA** |试验项目<br>Test Item|试验项目<br>Test Item|回流焊<br>Reflow|规 格<br>Type|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin Date|2020/10/23| |---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||RSE-32.768-12.5-H14-TR|||数 量<br>Quantity|10 PCS|结束日期<br>Finished<br>Date|2020/10/23| |实验设备<br>EQUIPMENT||GSD-M6N回流焊机、S&A 250B网络分析仪<br>GSD-M6NReflow equipment、S&A 250B test system||||||| |实验方法<br>Test Method||预热 Preheating,150℃～180℃:60s≤t≤120s； T≥183℃:90s≤t≤120s； T≥230℃:20s≤t≤<br>40s；<br>T=260℃±10℃：5s≤t≤20s； T（max）=270℃||||||| |判定标准<br>Accept level||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ||||||| ||||试验数据 Test Data|||||| |NO.|BEFORE||AFTER||CHANGE||RESULT<br>|REMARK| ||FL|RR（KΩ）|FL|RR（KΩ）|ΔFL<br>|ΔRR（KΩ）||| |1|5.1|39.6|6.7|40.1|1.6|0.5|PASS|| |2|-3.5|34.9|-2.1|36.5|1.4|1.6|PASS|| |3|-1.8|36.8|-1.2|37.4|0.6|0.6|PASS|| |4|0.8|33.1|2.4|34.2|1.6|1.1|PASS|| |5|2.3|35.7|3.6|36.4|1.3|0.7|PASS|| |6|4.5|32.5|5.1|33.8|0.6|1.3|PASS|| |7|-6.7|34.0|-4.2|35.4|2.5|1.4|PASS|| |8|-8.2|37.8|-6.7|38.4|1.5|0.6|PASS|| |9|-4.2|33.2|-2.1|33.6|2.1|0.4|PASS|| |10|3.6|32.4|5.3|33.9|1.7|1.5|PASS|| |MAX|5.1|39.6|6.7|40.1|2.5|1.6|MIL-STD-202F方法<br>210E|| |MIN|-8.2|32.4|-6.7|33.6|0.6|0.4||| |AVE.|-0.8|35.0|0.7|36.0|1.5|1.0||| |STD.|4.8|2.4|4.5|2.2|0.6|0.5||| |100FL|||||FL/RR|FL/RR|RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0|RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0|RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0|RR<br>RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0| |---|---|---|---|---|---|---|---|---|---|---| |.<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>20||||||||||| |||||||||||| |||||||||||| |||||||||||| |||||||||||| |||||||||||| |||||||||||| |||||||||||| |-.<br>-4.0<br>-6.0<br>-8.0<br>-10.0|~~F~~L|||||||||| |RESULT||PASS|APPROVA<br>L|John|||CHECK|YG|PREPARE|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA LLC** |试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~|试验项目<br>Test Item<br>老化试验<br>Aging<br>规 格<br>Type<br>RSE-H14<br>批 号<br>Lot NO.<br>200908-01 开始日期<br>Begin Date<br>2020/9/9<br>料<br>号<br>Part NO.<br>RSE-32.768-12.5-H14-TR<br>数 量<br>Quantity<br>10 PCS<br>结束日期<br>Finished<br>Date<br>2020/10/21<br>实验设备<br>EQUIPMENT<br>BTH-80C可程式恒温恒湿试验箱、CIM200和TTC-5组成的测试系统、S&A 250B测试仪<br>BTH-80C Humidity Chamber、 CIM200 & TTC-5Composed of test systems、 S&A<br>250B test system<br>实验方法<br>Test Method<br>~~晶体放置于~~85~~℃±~~5~~℃环境中~~1000H~~小时后~~,~~常温静置~~1~~～２小时后测其频率相对变化量~~<br>Temperature:85℃±5℃for 1000H hours, then stood at room temperature for1 ~<br>2 hours, and the relative change in frequency was measured<br>~~a~~<br>~~esee~~<br>~~ee~~<br>~~pp~~| |---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---| ||判定标准||||n=10pcs、Ac=0、Re=1、ΔFL≤ ±10 ppm、ΔRR|||||||||||ΔRR≤ ± 15%RrMax||||||||||| ||Accept level|||||||||||||||||||||||||| |||||||||||试验数据 Test Data||||||||||||||||| ||NO.<br>BEFORE<br>FL<br>RR（Ω）||||||AFTER<br>FL<br>RR（Ω）|||||CHANGE<br>RESULT<br>ΔFL<br>ΔRR（Ω）|||||||||||REMARK|||| ||1<br>8.1||||49.6||8.7|||50.1||0.6||||0.5||PASS||||||||| ||2<br>-5.5||||34.9||-5.6|||35.5||-0.1|-0.1|||0.6||PASS||||||||| ||3<br>-1.8||||36.8||-2.2|||37.4||-0.4|-0.4|||0.6||PASS||||||||| ||4<br>2.8||||33.1||3.4|||34.2||0.6||||1.1||PASS||||||||| ||5<br>3.3||||45.7||3.6|||46.1||0.3||||0.4||PASS||||||||| ||6<br>4.7||||33.5||5.4|||33.8||0.7||||0.3||PASS||||||||| ||7<br>-5.5||||34.0||-4.9|||34.2||0.6||||0.2||PASS||||||||| ||8<br>-5.2||||47.8||-4.7|||48.2||0.5||||0.4||PASS||||||||| ||9<br>-4.2||||33.2||-3.6|||33.5||0.6||||0.3||PASS||||||||| ||10<br>6.6||||42.4||5.3|||43.9||-1.3|-1.3|||1.5||PASS||||||||| |MAX<br>8.1|||||49.6||8.7|||50.1||0.7||||1.5||||||||||| ||MIN<br>-5.5||||33.1||-5.6|||33.5||-1.3|-1.3|||0.2||||||||||| |AVE.<br>0.3|||||39.1||0.5|||39.7||0.2||||0.6||||||||||| |STD.<br>5.3|||||6.6|6.6|5.3|||6.6||0.6||||0.4||||||||||| |**8**<br>**4**|FL<br>FL/RR<br>10<br>6<br>~~[a~~|||||||||||||||||||||||||5<br>3| ||2|||||||||||||||||||||||||1| |**0**||||||||||||||||||||||||||| ||-2|||||||||||||||||||||||||-1| ||**-4**|||||||||||||||||||||||||| ||-6|||||||||||||||||||||||||-3| ||**-8**|||||||||||||||||||||||||| ||-10|||||||||||||||||||||||||-5| ||||||||FL<br>~~-~~|||FL||||||RR<br>~~-~~||||||||||| ||RESULT||||PASS||APPROVA|||John||CHECK||||YG||PREPARE|||||Mr.Zhou|||| ||||||||L|||||||||||||||||||| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com ## **RAMI TECHNOLOGY USA LLC** |试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|试验项目<br>Test Item|耐焊接热<br>Solder Heat<br>Resistance|规 格<br>Type|RSE-H14|RSE-H14|批 号<br>Lot NO.|200908-01|200908-01|<br>开始日期<br>Begin Date|2020/10/10| |---|---|---|---|---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||||RSE-32.768-12.5-H14-TR||||数 量<br>Quantity|10 PCS||结束日期<br>Finished<br>Date|2020/10/10| |实验设备<br>EQUIPMENT||||融锡炉、S&A 250B网络分析仪<br>Tin melting furnace、S&A 250B test system||||||||| |实验方法<br>Test Method||||预热：125℃60~120秒，焊接温度：260℃±10℃； 焊接时间：5秒<br>Pre-heat: 125℃60~120 Seconds；Solder Temperature: 260℃±10℃；Time: 5 Seconds||||||||| |判定标准<br>Accept level||||n=10pcs、Ac=0、Re=1、ΔF < 10 ppm、ΔRR < 5 KΩ||||||||| ||||||试验数据 Test Data|||||||| |NO.||BEFORE|||AFTER|||CHANGE|||RESULT<br>|REMARK| |||FL||RR（KΩ）|FL|RR（KΩ）||ΔFL<br>|ΔRR（KΩ）|||| |1||5.6||34.5|5.8|35.4||0.2|0.9||PASS|| |2||-4.2||37.7|-3.2|38.1||1.0|0.4||PASS|| |3||-3.8||35.6|-2.4|36.7||1.4|1.1||PASS|| |4||1.2||32.8|1.8|33.6||0.6|0.8||PASS|| |5||-4.6||32.2|-3.5|33.4||1.1|1.2||PASS|| |6||3.5||38.6|3.9|39.1||0.4|0.5||PASS|| |7||-1.5||41.0|-0.7|42.3||0.8|1.3||PASS|| |8||0.6||36.6|2.1|36.5||1.5|-0.1||PASS|| |9||5.3||35.1|5.7|35.7||0.4|0.6||PASS|| |10||-2.1||32.7|-1.3|33.1||0.8|0.4||PASS|| |MAX||5.6||41.0|5.8|42.3||1.5|1.3||MIL-STD-202F方法<br>210E|| |MIN||-4.6||32.2|-3.5|33.1||0.2|-0.1|||| |AVE.||0.0||35.7|0.8|36.4||0.8|0.7|||| |STD.||3.8||2.8|3.5|2.9||0.4|0.4|||| |10.0FL<br>8.0<br>6.0<br>4.0<br>2.0<br>0.0<br>20|||||||FL/RR||||RR<br>5.0<br>3.0<br>1.0<br>-1.0<br>-3.0<br>-5.0|| |||||||||||||| |||||||||||||| |||||||||||||| |||||||||||||| |||||||||||||| |||||||||||||| |||||||||||||| |||||||||||||| |-.<br>-4.0<br>-6.0<br>-8.0<br>-10.0|||FL||||RR|||||| |RESULT||||PASS|APPROVA<br>L|John||CHECK|YG||PREPARE|Mr.Zhou| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com Page 17 of 17 ## **SURFACE MOUNT MICROPROCESSOR CRYSTAL** ## **RSE-32.768-12.5-H14-TR** ## **RAMI TECHNOLOGY USA LLC** |试验项目<br>Test Item|试验项目<br>Test Item|绝缘性能<br>Insulation<br>Resistanc<br>e|规 格<br>Type|RSE-H14|批 号<br>Lot NO.|200908-01|开始日期<br>Begin<br>Date<br>结束期|2020/10/23| |---|---|---|---|---|---|---|---|---| |料<br>号<br>Part NO.||RSE-32.768-12.5-H14-TR|||数 量<br>Quantity|20 PCS|结束日期<br>Finished<br>Date|2020/10/23| |实验设备<br>EQUIPMENT||TH2681A型绝缘阻抗机<br>TH2681A Insulation Resistance machine||||||| |实验方法<br>Test Method||DC/100V±15V||||||| |判定标准<br>Accept level||n=20pcs、Ac=0、Re=1、绝缘阻抗Insulation Resistance≧500MΩ||||||| |试验数据 Test Data<br>~~pt~~||||||||| |NO.|绝缘阻抗Insulation Impedance||||||RESULT REMARK|RESULT REMARK| |1<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|~~a~~| |2<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |3<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |4<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |5<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |6<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |7<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |8<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |9<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |10<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |11<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |12<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |13<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |14<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |15<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ||||||PASS|| |16<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ<br>~~a~~||||||PASS<br>~~a~~|| |17<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ<br>~~a~~<br>~~a~~||||||PASS<br>~~a~~<br>~~a~~|| |18<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ<br>~~a~~||||||PASS<br>~~a~~|| |19<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ<br>~~a~~||||||PASS<br>~~a~~|| |20<br>~~a~~|绝缘阻抗Insulation Resistance≧500MΩ<br>~~a~~||||||PASS<br>~~a~~|| |~~pe~~||||||||| |RESULT|PASS|APPROVA|John|CHECK|YG|PREPARE Mr.Zhou|PREPARE Mr.Zhou| |---|---|---|---|---|---|---|---| |||L|||||| RALTRON ELECTRONICS ▪ 10400 N.W. 33[r d ] STREET ▪ Miami, Florida 33172 ▪ U.S.A. Telephone: 305-593-6033 ▪ Fax: 305-594-3973 ▪ e-mail: sales@raltron.com ▪ web site: http://www.raltron.com
Updated at April 20, 2026
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