NTTFD4D0N04HLTWG
Dual MOSFET, N Channel, 40 V, 40 V, 60 A, 60 A, 0.0045 ohm
- Manufacturer: ONSEMI
- Product type: Dual MOSFETs
- MSL: MSL 1 - Unlimited
- SVHC: Lead (25-Jun-2025)
- No. of Pins: 12Pins
- Channel Type: N Channel
- Product Range: -
- Qualification: -
- Transistor Case Style: WQFN
- Operating Temperature Max: 150°C
- Power Dissipation N Channel: 26W
- Power Dissipation P Channel: 26W
- Drain Source Voltage Vds N Channel: 40V
- Drain Source Voltage Vds P Channel: 40V
- Continuous Drain Current Id N Channel: 60A
- Continuous Drain Current Id P Channel: 60A
- Drain Source On State Resistance N Channel: 0.0045ohm
- Drain Source On State Resistance P Channel: -
| Delivery and price | |
|---|---|
| Units per pack | 5000 |
| Price | 0.663 € |
| Current stock | 10+ |
| Lead time | 30 days |
MOSFET - Symmetrical Dual N-Channel 40 V, 4.5 m 60 A ## NTTFD4D0N04HL ## **General Description** This device includes two specialized N−Channel MOSFETs in a dual package. The switch node has been internally connected to enable easy placement and routing of synchronous buck converters. The control MOSFET (Q2) and synchronous (Q1) have been designed to provide optimal power efficiency. ## **Features** ## **www.onsemi.com** |**V(BR)DSS**|**RDS(ON) MAX**|**ID MAX**| |---|---|---| |40 V|4.5 m @ 10 V|60 A| ||7 m @ 4.5 V|| ## Q1: N−Channel - Max rDS(on) = 4.5 m Q at VGS = 10 V, ID = 10 A - Max rDS(on) = 7 m Q at VGS = 4.5, ID = 8.0 A - Q2: N−Channel - Max rDS(on) = 4.5 m at VGS = 10 V, ID = 10 A - Max rDS(on) = 7 m Q at VGS = 4.5, ID = 8.0 A - Low Inductance Packaging Shortens Rise/Fall Times, Resulting in Lower Switching Losses ## **ELECTRICAL CONNECTION** **==> picture [186 x 44] intentionally omitted <==** **----- Start of picture text -----**<br> GND SW GND SW<br> GND<br>LSG SW LSG SW<br>V+ 3s}r77 V+ 77 8 SW V+ 3 i8 SW<br>V+ HSG V+ HSG<br>**----- End of picture text -----**<br> **Dual N-Channel MOSFET** - RoHS Compliant ## **Typical Applications** - Computing - Communications - General Purpose Point of Load ## **PIN DESCRIPTION** |**Pin**|**Name**|**Description**| |---|---|---| |1, 11, 12|GND (LSS)|Low Side Source| |2|LSG|Low Side Gate| |3, 4, 5, 6|V + (HSD)|High Side Drain| |7|HSG|High Side Gate| |8, 9, 10|SW|Switching Node, Low Side Drain| **==> picture [123 x 88] intentionally omitted <==** **----- Start of picture text -----**<br> PIN1<br>PIN1<br>Top Bottom<br>WQFN12, 3x3<br>CASE 510CJ<br>**----- End of picture text -----**<br> ## **MARKING DIAGRAM** **==> picture [156 x 90] intentionally omitted <==** **----- Start of picture text -----**<br> &Z&3&K<br>NTTFD<br>4D0N04HL<br>&Z = Assembly Plant Code<br>&3 = Numeric Date Code<br>&K = Lot Code<br>NTTFD4D0N04HL = Specific Device Code<br>**----- End of picture text -----**<br> ## **ORDERING INFORMATION** |**Device**|**Package**|**Shipping**†| |---|---|---| |NTTFD4D0N04HLTWG|WQFN12<br>(Pb−Free)|3000 /<br>Tape & Reel| - †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. Publication Order Number: **NTTFD4D0N04HL/D** **1** © Semiconductor Components Industries, LLC, 2018 **April, 2020 − Rev. 1** **NTTFD4D0N04HL** **MOSFET MAXIMUM RATINGS** (TA = 25 ° C, Unless otherwise specified) |**MOSFET M**|**AXIMUM RATINGS**(TA= 25°C, Unless otherwise specified)|||| |---|---|---|---|---| |**Symbol**|**Parameter**|**Q1**|**Q2**|**Units**| |VDS|Drain−to−Source Voltage|40|40|V| |VGS|Gate−to−Source Voltage|±20|±20|V| |ID|Drain Current<br>−Continuous<br>TC= 25°C<br>(Note 4)|60|60|A| ||−Continuous<br>TC= 100°C<br>(Note 4)|37|37|| ||−Continuous<br>TA= 25°C|15 (Note 1a)|15 (Note 1b)|| ||−Pulsed<br>TA= 25°C|349|349|| |EAS|Single Pulse Avalanche Energy<br>(Note 3)|67|67|mJ| |PD|Power Dissipation for Single Operation<br>TC= 25°C|26|26|W| ||Power Dissipation for Single Operation<br>TA= 25°C|1.7 (Note 1a)|1.7 (Note 1b)|| |TJ, TSTG|Operating and Storage Junction Temperature Range|−55 to +150||°C| Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. ## **THERMAL CHARACTERISTICS** |**THERMAL**|**CHARACTERISTICS**|||| |---|---|---|---|---| |**Symbol**|**Parameter**|**Q1**|**Q2**|**Units**| |R�JC|Thermal Resistance, Junction−to−Case|4.8|4.8|°C/W| |R�JA|Thermal Resistance, Junction−to−Ambient (Note 1a), max copper|70 (Note 1a)|70 (Note 1b)|| |R�JA|Thermal Resistance, Junction−to−Ambient (Note 1c), min copper|135 (Note 1a)|135 (Note 1b)|| **ELECTRICAL CHARACTERISTICS** (TJ = 25 ° C unless otherwise noted) |**ELECTRI**|**CAL CHARACTERISTICS**(TJ= 25°C|unless otherwise noted)|||||| |---|---|---|---|---|---|---|---| |**Symbol**|**Parameter**|**Test Conditions**|**Type**|**Min**|**Typ**|**Max**|**Units**| |**OFF CHARACTERISTICS**|||||||| |BVDSS|Drain−to−Source Breakdown Voltage|ID= 250�A, VGS= 0 V|Q1|40|||V| |||ID= 250�A, VGS= 0 V|Q2|40|||| |�BVDSS<br>�TJ|Breakdown Voltage Temperature<br>Coefficient|ID= 250�A, referenced to 25°C|Q1||16.63||mV/°C| |||ID= 250�A, referenced to 25°C|Q2||16.63||| |IDSS|Zero Gate Voltage Drain Current|VDS= 40 V, VGS= 0 V|Q1|||10|�A| |||VDS= 40 V, VGS= 0 V|Q2|||10|| |IGSS|Gate−to−Source Leakage Current,<br>Forward|VGS= +20/−16 V, VDS= 0 V|Q1|||±100|nA| |||VGS= +20/−16 V, VDS= 0 V|Q2|||±100|| |**ON CHARACTERISTICS**|||||||| |VGS(th)|Gate−to−Source Threshold Voltage|VGS= VDS, ID= 50�A|Q1|1.2|1.5|2.0|V| |||VGS= VDS, ID= 50�A|Q2|1.2|1.5|2.0|| |�VGS(th)<br>�TJ|Gate−to−Source Threshold Voltage<br>Temperature Coefficient|ID= 50�A, referenced to 25°C|Q1||−5.75||mV/°C| |||ID= 50�A, referenced to 25°C|Q2||−5.75||| |rDS(on)|Drain−to−Source On Resistance|VGS= 10 V, ID= 10 A|Q1||3.7|4.5|m�| |||VGS= 4.5 V, ID= 8 A|||5.8|7|| |||VGS= 10 V, ID= 10 A, TJ= 125°C|||6.4||| |rDS(on)|Drain−to−Source On Resistance|VGS= 10 V, ID= 10 A|Q2||3.7|4.5|m�| |||VGS= 4.5 V, ID= 8 A|||5.8|7|| |||VGS= 10 V, ID= 10 A, TJ= 125°C|||6.4||| |gFS|Forward Transconductance|VDS= 15 V, ID= 10 A|Q1||61||S| |||VDS= 15 V, ID= 10 A|Q2||61||| **www.onsemi.com** **2** ## **NTTFD4D0N04HL** **ELECTRICAL CHARACTERISTICS** (TJ = 25 ° C unless otherwise noted) |**ELECTRI**|**CAL CHARACTERISTICS**(TJ= 25°C|unless otherwise noted)|||||| |---|---|---|---|---|---|---|---| |**Symbol**|**Parameter**|**Test Conditions**|**Type**|**Min**|**Typ**|**Max**|**Units**| |**DYNAMIC**|**CHARACTERISTICS**||||||| |CISS|Input Capacitance|Q1:<br>VDS= 20 V, VGS= 0 V, f = 1 Mhz<br>Q2:<br>VDS= 20 V, VGS= 0 V, f = 1 MHz|Q1||1100||pF| ||||Q2||1100||| |COSS|Output Capacitance||Q1||271||pF| ||||Q2||271||| |CRSS|Reverse Transfer Capacitance||Q1||22||pF| ||||Q2||22||| |RG|Gate Resistance|TA= 25°C|Q1||2.0||�| ||||Q2||2.0||| |**SWITCHING CHARACTERISTICS**|||||||| |td(ON)|Turn−On Delay Time|Q1:<br>VDD= 32 V, ID= 30.5 A,<br>VGS= 4.5 V, RGEN= 2.5�<br>Q2:<br>VDD= 32 V, ID= 30.5 A,<br>VGS= 4.5 V, RGEN= 2.5�|Q1||9.5||ns| ||||Q2||9.5||| |tr|Rise Time||Q1||5.6||ns| ||||Q2||5.6||| |tD(OFF)|Turn−Off Delay Time||Q1||1.7||ns| ||||Q2||1.7||| |tf|Fall Time||Q1||5.8||ns| ||||Q2||5.8||| |Qg|Total Gate Charge|VGS= 0 V to 10 V<br>VGS= 0 V to 4.5 V<br>Q1:<br>VDD= 32 V,<br>ID= 30.5 A<br>Q2:<br>VDD= 32 V,<br>ID= 30.5 A|Q1||18||nC| ||||Q2||18||| |Qg|Total Gate Charge||Q1||8.6||nC| ||||Q2||8.6||| |Qgs|Gate−to−Source Gate Charge||Q1||3.1||nC| ||||Q2||3.1||| |Qgd|Gate−to−Drain “Miller” Charge||Q1||3.2||nC| ||||Q2||3.2||| |**DRAIN−SOURCE DIODE CHARACTERISTICS**|||||||| |VSD|Source to Drain Diode Forward Voltage|VGS= 0 V, IS= 10 A<br>(Note 2)|Q1||0.78|1.2|V| |||VGS= 0 V, IS= 10 A<br>(Note 2)|Q2||0.78|1.2|| |trr|Reverse Recovery Time|Q1:<br>IF= 30.5 A, di/dt = 100 A/�s<br>Q2:<br>IF= 30.5 A, di/dt = 100 A/�s|Q1||26||ns| ||||Q2||26||| |Qrr|Reverse Recovery Charge||Q1||9||nC| ||||Q2||9||| Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 1. R � JA is determined with the device mounted on a 1 in[2] pad 2 oz copper pad on a 1.5 × 1.5 in. board of FR−4 material. R � CA is determined by the user’s board design. **www.onsemi.com** **3** **NTTFD4D0N04HL** **==> picture [40 x 12] intentionally omitted <==** **----- Start of picture text -----**<br> G DF DS SF SS<br>**----- End of picture text -----**<br> **==> picture [44 x 12] intentionally omitted <==** **----- Start of picture text -----**<br> G DF DS SF SS<br>**----- End of picture text -----**<br> **==> picture [363 x 162] intentionally omitted <==** **----- Start of picture text -----**<br> a) 70 ° C/W when mounted on b) 70 ° C/W when mounted on<br>a 1 in [2] pad of 2 oz copper. a 1 in [2] pad of 2 oz copper.<br>c) 135 ° C/W when mounted on d) 135 ° C/W when mounted on<br>a minimum pad of 2 oz copper. -W a minimum pad of 2 oz copper.<br>G DF DS SF SS<br>**----- End of picture text -----**<br> **==> picture [53 x 153] intentionally omitted <==** **----- Start of picture text -----**<br> -W<br>if<br>060000<br>G DF DS SF SS<br>G DF DS SF SS<br>**----- End of picture text -----**<br> 2. Pulse Test: Pulse Width < 300 s, Duty cycle < 2.0%. 0 3. Q1: EAS of 67 mJ is based on starting TJ = 25 ° C; N−ch: L = 1 mH, IAS = 11.6 A, VDD = 40 V, VGS = 10 V. 100% test at L = 1 mH, IAS = 11.6 A. Q2: EAS of 67 mJ is based on starting TJ = 25 C; N−ch: L = 1 mH, IAS = 11.6 A, VDD = 40 V, VGS = 10 V. 100% test at L = 1 mH, IAS = 11.6 A. 4. Computed continuous current limited to Max Junction Temperature only, actual continuous current will be limited by thermal & electro−mechanical application board design. POWERTRENCH is registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. **www.onsemi.com** **4** **NTTFD4D0N04HL** ## **TYPICAL CHARACTERISTICS** **==> picture [490 x 591] intentionally omitted <==** **----- Start of picture text -----**<br> 60 60<br>54 VGSto 3.2 V = 10 V 3.0 V VDS = 5 V<br>50<br>48<br>42<br>2.8 V 40<br>36<br>30 30<br>24<br>2.6 V 20 TJ = 25 ° C<br>18<br>12<br>2.4 V 10<br>60 2.2 V 0 TJ = 150 ° C TJ = −55 ° C<br>0 1 2 3 4 5 0 1 2 3 4 5<br>VDS, DRAIN−TO−SOURCE VOLTAGE (V) VGS, GATE−TO−SOURCE VOLTAGE (V)<br>Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics<br>300 10<br>250 TIDJ = 25= 10 A ° C 988 TJ = 25J = 25 = 25 ° C<br>7<br>200<br>VGS = 4.5 VGS = 4.5 V = 4.5 V<br>6<br>150 5<br>4 V GS = 10 V<br>100<br>3<br>2<br>50<br>1<br>0 0<br>2 3 4 5 6 7 8 9 10 0 10 20 30 40 50 60<br>VGS, GATE−TO−SOURCE VOLTAGE (V) ID, DRAIN CURRENT (A)D, DRAIN CURRENT (A), DRAIN CURRENT (A)<br>Figure 3. On−Resistance vs. Gate−to−Source Figure 4. On−Resistance vs. Drain Current and<br>Voltage Gate Voltage<br>2.0 100K<br>1.8 V GS = 10 V VGS = 0 V<br>ID = 10 A TJ = 150 ° C<br>10K<br>1.6<br>1.4 TJ = 125 ° C<br>1K<br>1.2<br>TJ = 85 ° C<br>1.0<br>100<br>0.8<br>0.6 10<br>−50 −25 0 25 50 75 100 125 150 0 5 10 15 20 25 30 35 40<br>TJ, JUNCTION TEMPERATURE ( ° C) VDS, DRAIN−TO−SOURCE VOLTAGE (V)<br>, DRAIN CURRENT (A) , DRAIN CURRENT (A)<br>ID ID<br>) � ) �<br>, DRAIN−TO−SOURCE RESISTANCE (m , DRAIN−TO−SOURCE−RESISTANCE (m<br>DS(on)<br>R DS(on)<br>R<br>, LEAKAGE (nA)<br>, NORMALIZED DRAIN−TO− IDSS<br>SOURCE RESISTANCE<br>DS(on)<br>R<br>**----- End of picture text -----**<br> **==> picture [238 x 189] intentionally omitted <==** **----- Start of picture text -----**<br> 10<br>TJ = 25J = 25 = 25 ° C<br>988<br>7<br>VGS = 4.5 VGS = 4.5 V = 4.5 V<br>6<br>5<br>4 V GS = 10 V<br>3<br>2<br>1<br>0<br>0 10 20 30 40 50 60<br>ID, DRAIN CURRENT (A)D, DRAIN CURRENT (A), DRAIN CURRENT (A)<br>) �<br>, DRAIN−TO−SOURCE−RESISTANCE (m<br>DS(on)<br>R<br>**----- End of picture text -----**<br> **==> picture [187 x 20] intentionally omitted <==** **----- Start of picture text -----**<br> Figure 6. Drain−to−Source Leakage Current<br>vs. Voltage<br>**----- End of picture text -----**<br> **Figure 5. On−Resistance Variation with Temperature** **www.onsemi.com** **5** **NTTFD4D0N04HL** ## **TYPICAL CHARACTERISTICS** **==> picture [240 x 173] intentionally omitted <==** **----- Start of picture text -----**<br> 10K<br>C ISS<br>1K<br>COSS<br>100<br>C RSS<br>10 f = 1 MHz<br>VGS = 0 V<br>TJ = 25 ° C<br>1<br>0 5 10 15 20 25 30 35 40<br>VDS, DRAIN−TO−SOURCE VOLTAGE (V)<br>C, CAPACITANCE (pF)<br>**----- End of picture text -----**<br> **Figure 7. Capacitance Variation** **==> picture [238 x 173] intentionally omitted <==** **----- Start of picture text -----**<br> 10<br>QG(TOT)<br>9<br>8<br>7<br>6<br>5<br>4 Q GS Q GD<br>3<br>2 V DS = 32 V<br>ID = 30.5 A<br>1 T J = 25 ° C<br>0<br>0 2 4 6 8 10 12 14 16 18<br>QG, TOTAL GATE CHARGE (nC)<br>, GATE−TO−SOURCE VOLTAGE (V)<br>GS<br>V<br>**----- End of picture text -----**<br> **Figure 8. Gate−to−Source vs. Total Charge** **==> picture [490 x 383] intentionally omitted <==** **----- Start of picture text -----**<br> 1000 1000<br>VGS = 4.5 V VGS = 0 V<br>VDS = 32 V<br>100 ID = 30.5 A 100<br>td(on)<br>10 10<br>tf<br>tr<br>1 1<br>td(off) T J = 150 ° C T J = 25 ° C T J = −55 ° C<br>0.1 0.1<br>1 10 100 0 0.2 0.4 0.6 0.8 1.0 1.2 1.4<br>RG, GATE RESISTANCE ( � ) VSD, SOURCE−TO−DRAIN VOLTAGE (V)<br>Figure 9. Resistive Switching Time Variation Figure 10. Diode Forward Voltage vs. Current<br>vs. Gate Resistance<br>1000<br>TA = 25 ° C, VGS ≤ 10 V<br>Single Pulse<br>R � JA = 135 ° C/W 10 � s<br>100 100<br>T J(initial) = 25 ° C 100 � s<br>10<br>10<br>1 1 ms<br>TJ(initial) = 125 ° C RDS(on) Limit 10 ms<br>Thermal Limit 100 ms<br>Package Limit 1 sec<br>1 0.1<br>0.000001 0.0001 0.001 0.01 0.1 1 0.1 1 10 100<br>tAV, TIME IN AVALANCHE (sec) VDS, DRAIN−TO−SOURCE VOLTAGE (V)<br>t, TIME (ns)<br>, SOURCE CURRENT (A)<br>IS<br> (A)<br>IPEAK<br>, DRAIN CURRENT (A)<br>ID<br>**----- End of picture text -----**<br> **Figure 11. Unclamped Inductive Switching Capability** **Figure 12. Forward Bias Safe Operating Area** **www.onsemi.com** **6** **NTTFD4D0N04HL** ## **TYPICAL CHARACTERISTICS** **==> picture [490 x 173] intentionally omitted <==** **----- Start of picture text -----**<br> 1000<br>100 Duty Cycle = 0.5<br>0.2<br>0.1<br>10<br>0.05<br>0.02<br>1 0.01<br>0.1<br>0.01<br>Single Pulse<br>0.001<br>0.000001 0.00001 0.0001 0.001 0.01 0.1 1 10 100 1000<br>PULSE TIME (sec)<br>C/W)<br>°<br>, (<br>JA<br>�<br>Z<br>**----- End of picture text -----**<br> **Figure 13. Transient Thermal Impedance** **www.onsemi.com** **7** **NTTFD4D0N04HL** ## **PACKAGE DIMENSIONS** **WQFN12 3.3X3.3, 0.65P** CASE 510CJ ISSUE O **==> picture [177 x 136] intentionally omitted <==** **==> picture [53 x 75] intentionally omitted <==** **==> picture [65 x 53] intentionally omitted <==** **==> picture [37 x 40] intentionally omitted <==** **==> picture [31 x 83] intentionally omitted <==** **==> picture [74 x 86] intentionally omitted <==** **==> picture [226 x 104] intentionally omitted <==** **www.onsemi.com** **8** **NTTFD4D0N04HL** ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. 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This literature is subject to all applicable copyright laws and is not for resale in any manner. ## **PUBLICATION ORDERING INFORMATION** **LITERATURE FULFILLMENT** : **Email Requests to:** orderlit@onsemi.com **ON Semiconductor Website:** www.onsemi.com ◊ **TECHNICAL SUPPORT North American Technical Support:** Voice Mail: 1 800−282−9855 Toll Free USA/Canada Phone: 011 421 33 790 2910 **www.onsemi.com** **Europe, Middle East and Africa Technical Support:** Phone: 00421 33 790 2910 For additional information, please contact your local Sales Representative **9**
Updated at June 9, 2026
onsemi is a premier global supplier of intelligent power and sensing technologies, driving disruptive innovations across the automotive, industrial, and cloud infrastructure markets. Recognized for their commitment to sustainability and reliable supply chains, the company accelerates advancements in vehicle electrification, industrial automation, and 5G networks by solving the industry's most complex design challenges. At the core of their portfolio is an industry-leading selection of discrete semiconductors. This extensive range features thousands of high-performance bipolar transistors, single and dual MOSFETs, and a comprehensive array of diodes, including Zener, Schottky, and fast-recovery rectifiers. Engineered for superior thermal performance and energy efficiency, these foundational components are critical for demanding power conversion, switching, and signal conditioning applications. Beyond essential discretes, onsemi provides a robust suite of advanced power management and circuit protection solutions. Their lineup includes intelligent power modules, single IGBTs, and transient voltage suppression (TVS) diodes designed to safeguard sensitive circuitry. Complimented by integrated passive filters, AC/DC LED driver ICs, and specialized sub-2.4GHz RF transceivers, onsemi equips engineers with the scalable, high-quality technologies needed to build a cleaner, smarter, and more connected world.
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