IKP40N65F5XKSA1
IGBT, 40 A, 1.6 V, 255 W, 650 V, TO-220, 3 Pins
- Manufacturer: INFINEON
- Product type: Single IGBTs
- DC Collector Current:40A; Collector Emitter Saturation Voltage Vce(on):1.6V; Power Dissipation Pd:255W; Collector Emitter Voltage V(br)ceo:650V; Transistor Case Style:TO-220; No. of Pins:3Pins;
- MSL: -
- SVHC: No SVHC (25-Jun-2025)
- No. of Pins: 3Pins
- Product Range: TRENCHSTOP 5
- Power Dissipation: 255W
- Transistor Mounting: Through Hole
- Transistor Case Style: TO-220
- Operating Temperature Max: 175°C
- Continuous Collector Current: 40A
- Collector Emitter Voltage Max: 650V
- Collector Emitter Saturation Voltage: 1.6V
| Delivery and price | |
|---|---|
| Units per pack | 1000 |
| Price | 1.02 € |
| Current stock | 10+ |
| Lead time | 30 days |
## IGBT
High speed 5 FAST IGBT in TRENCHSTOP _ TM 5 technology copacked with RAPID 1
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High speed 5 FAST IGBT in TRENCHSTOP_ TM 5 technology copacked with<br>**----- End of picture text -----**<br>
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Features and Benefits: C<br>High speed F5 technology offering<br>* Best-in-Class efficiency in hard switching and resonant<br>topologies<br>¢ 650V breakdown voltage<br>G<br>* Low gate charge Q G<br>E<br>¢ IGBT copacked with RAPID 1 fast and soft antiparallel diode<br>* Maximum junction temperature 175°C :<br>*¢ QualifiedPb-free lead accordingplating;toROHS JEDECcompliant for target applications a gay<br>*« Complete product spectrum and PSpice Models: 1 2 3 f<br>http://www.infineon.com/igbt/<br>Applications:<br>**----- End of picture text -----**<br>
|**Type**|**_V_CE**|**_I_C**|**_V_CEsat** **_T_vj=25°C**|**_T_vjmax**|**Marking**|**Package**|
|---|---|---|---|---|---|---|
|IKP40N65F5|650V|40A|1.6V|175°C|K40EF5|PG-TO220-3|
|IKW40N65F5|650V|40A|1.6V|175°C|K40EF5|PG-TO247-3|
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## IKP40N65F5,�IKW40N65F5
High�speed�switching�series�fifth�generation
## **Table�of�Contents**
Description . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2 Table of Contents . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3 Maximum Ratings . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Thermal Resistance . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Electrical Characteristics . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Electrical Characteristics Diagrams . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8 Package Drawing PG-TO220-3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .15 Package Drawing PG-TO247-3 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .16 Testing Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .17 Revision History . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18 Disclaimer . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .18
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Rev.�1.3,��2014-12-04
IKP40N65F5,�IKW40N65F5
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## High�speed�switching�series�fifth�generation
## **Maximum�Ratings**
**For�optimum�lifetime�and�reliability,�Infineon�recommends�operating�conditions�that�do�not�exceed�80%�of�the�maximum�ratings�stated�in�this�datasheet.**
|**Parameter**|**Symbol**||**Value**|**Unit**|
|---|---|---|---|---|
|Collector-emittervoltage,_T_vj≥25°C|_V_CE||650|V|
|DCcollectorcurrent,limitedby_T_vjmax<br>_T_C=25°C<br>_T_C=100°C|_I_C||74.0<br>46.0|A|
|Pulsedcollectorcurrent,_t_plimitedby_T_vjmax|_I_Cpuls||120.0|A|
|Turn off safe operating area<br>_V_CE≤650V,_T_vj≤175°C,_t_p=1µs|-||120.0|A|
|Diodeforwardcurrent,limitedby_T_vjmax<br>_T_C=25°C<br>_T_C=100°C|_I_F||36.0<br>21.0|A|
|Diodepulsedcurrent,_t_plimitedby_T_vjmax|_I_Fpuls||120.0|A|
|Gate-emitter voltage<br>TransientGate-emittervoltage(_t_p≤10µs,D<0.010)|_V_GE||±20<br>±30|V|
|Powerdissipation_T_C=25°C<br>Powerdissipation_T_C=100°C|_P_tot||250.0<br>125.0|W|
|Operating junction temperature|_T_vj|-40...+175||°C|
|Storage temperature|_T_stg|-55...+150||°C|
|Soldering temperature,<br>wave soldering 1.6mm (0.063in.) from case for 10s|PG-TO220-3<br>PG-TO247-3||260<br>260|°C|
|Mounting torque, M3 screw<br>Maximum of mounting processes: 3|_M_||0.6|Nm|
## **Thermal�Resistance**
|**ThermalResistance**||||||
|---|---|---|---|---|---|
|**Parameter**|**Symbol **|**Conditions**|**Max.Value**||**Unit**|
|**Characteristic**||||||
|IGBT thermal resistance,<br>junction - case|_R_th(j-c)|||0.60|K/W|
|Diode thermal resistance,<br>junction - case|_R_th(j-c)|||1.80|K/W|
|Thermal resistance<br>junction - ambient|_R_th(j-a)|PG-TO220-3<br>PG-TO247-3||62<br>40|K/W|
Rev.�1.3,��2014-12-04
4
IKP40N65F5,�IKW40N65F5
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## High�speed�switching�series�fifth�generation
## **Electrical�Characteristic,�at�** _**T**_ **vj�=�25°C,�unless�otherwise�specified**
|**Parameter**|**Symbol **|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ.**|**max.**||
|**StaticCharacteristic**|||||||
|Collector-emitter breakdown voltage|_V_(BR)CES|_V_GE=0V,_I_C=0.20mA|650|-|-|V|
|Collector-emitter saturation voltage|_V_CEsat|_V_GE=15.0V,_I_C=40.0A<br>_T_vj=25°C<br>_T_vj=125°C<br>_T_vj=175°C|-<br>-<br>-|1.60<br>1.80<br>1.90|2.10<br>-<br>-|V|
|Diode forward voltage|_V_F|_V_GE=0V,_I_F=20.0A<br>_T_vj=25°C<br>_T_vj=125°C<br>_T_vj=175°C|-<br>-<br>-|1.45<br>1.40<br>1.40|1.80<br>-<br>-|V|
|Gate-emitter threshold voltage|_V_GE(th)|_I_C=0.40mA,_V_CE=_V_GE|3.2|4.0|4.8|V|
|Zero gate voltage collector current|_I_CES|_V_CE=650V,_V_GE=0V<br>_T_vj=25°C<br>_T_vj=175°C|-<br>-|-<br>-|40.0<br>4000.0|µA|
|Gate-emitter leakage current|_I_GES|_V_CE=0V,_V_GE=20V|-|-|100|nA|
|Transconductance|_g_fs|_V_CE=20V,_I_C=40.0A|-|50.0|-|S|
## **Electrical�Characteristic,�at�** _**T**_ **vj�=�25°C,�unless�otherwise�specified**
|**Parameter**|**Symbol **|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ.**|**max.**||
|**DynamicCharacteristic**|||||||
|Input capacitance|_C_ies|_V_CE=25V,_V_GE=0V,f=1MHz|-|2500|-|pF|
|Output capacitance|_C_oes||-|50|-||
|Reverse transfer capacitance|_C_res||-|9|-||
|Gate charge|_Q_G|_V_CC=520V,_I_C=40.0A,<br>_V_GE=15V|-|95.0|-|nC|
|Internal emitter inductance<br>measured 5mm (0.197 in.) from<br>case|_L_E|PG-TO220-3<br>PG-TO247-3|-|7.0<br>13.0|-|nH|
## **Switching�Characteristic,�Inductive�Load**
|**Parameter**|**Symbol **|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ.**|**max.**||
|**IGBTCharacteristic,at****_T_vj=25°C**|||||||
|Turn-on delaytime|_t_d(on)|_T_vj=25°C,<br>_V_CC=400V,_I_C=20.0A,<br>_V_GE=0.0/15.0V,<br>_R_G(on)=15.0Ω,_R_G(off)=15.0Ω,<br>_L_σ=30nH,_C_σ=30pF<br>_L_σ,_C_σfromFig.E<br>Energy losses include “tail” and<br>diode reverse recovery.|-|19|-|ns|
|Rise time|_t_r||-|13|-|ns|
|Turn-off delaytime|_t_d(off)||-|160|-|ns|
|Fall time|_t_f||-|16|-|ns|
|Turn-on energy|_E_on||-|0.36|-|mJ|
|Turn-off energy|_E_off||-|0.10|-|mJ|
|Total switchingenergy|_E_ts||-|0.46|-|mJ|
Rev.�1.3,��2014-12-04
5
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## IKP40N65F5,�IKW40N65F5
## High�speed�switching�series�fifth�generation
|Turn-on delaytime|_t_d(on)|_T_vj=25°C,<br>_V_CC=400V,_I_C=5.0A,<br>_V_GE=0.0/15.0V,<br>_R_G(on)=15.0Ω,_R_G(off)=15.0Ω,<br>_L_σ=30nH,_C_σ=30pF<br>_L_σ,_C_σfromFig.E<br>Energy losses include “tail” and<br>diode reverse recovery.|-|20|-|ns|
|---|---|---|---|---|---|---|
|Rise time|_t_r||-|4|-|ns|
|Turn-off delaytime|_t_d(off)||-|175|-|ns|
|Fall time|_t_f||-|10|-|ns|
|Turn-on energy|_E_on||-|0.07|-|mJ|
|Turn-off energy|_E_off||-|0.03|-|mJ|
|Total switchingenergy|_E_ts||-|0.10|-|mJ|
|**DiodeCharacteristic,at****_T_vj=25°C**|||||||
|Diode reverse recoverytime|_t_rr|_T_vj=25°C,<br>_V_R=400V,<br>_I_F=20.0A,<br>_di_F_/dt_=1000A/µs|-|60|-|ns|
|Diode reverse recoverycharge|_Q_rr||-|0.45|-|µC|
|Diodepeak reverse recoverycurrent|_I_rrm||-|12.4|-|A|
|Diode peak rate of fall of reverse<br>recoverycurrentduring_t_b|_di_rr_/dt_||-|-280|-|A/µs|
||||||||
|Diode reverse recoverytime|_t_rr|_T_vj=25°C,<br>_V_R=400V,<br>_I_F=5.0A,<br>_di_F_/dt_=1000A/µs|-|33|-|ns|
|Diode reverse recoverycharge|_Q_rr||-|0.22|-|µC|
|Diodepeak reverse recoverycurrent|_I_rrm||-|10.6|-|A|
|Diode peak rate of fall of reverse<br>recoverycurrentduring_t_b|_di_rr_/dt_||-|-1030|-|A/µs|
## **Switching�Characteristic,�Inductive�Load**
|**Parameter**|**Symbol **|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ.**|**max.**||
|**IGBTCharacteristic,at****_T_vj=150°C**|||||||
|Turn-on delaytime|_t_d(on)|_T_vj=150°C,<br>_V_CC=400V,_I_C=20.0A,<br>_V_GE=0.0/15.0V,<br>_R_G(on)=15.0Ω,_R_G(off)=15.0Ω,<br>_L_σ=30nH,_C_σ=30pF<br>_L_σ,_C_σfromFig.E<br>Energy losses include “tail” and<br>diode reverse recovery.|-|20|-|ns|
|Rise time|_t_r||-|14|-|ns|
|Turn-off delaytime|_t_d(off)||-|185|-|ns|
|Fall time|_t_f||-|15|-|ns|
|Turn-on energy|_E_on||-|0.50|-|mJ|
|Turn-off energy|_E_off||-|0.16|-|mJ|
|Total switchingenergy|_E_ts||-|0.66|-|mJ|
||||||||
|Turn-on delaytime|_t_d(on)|_T_vj=150°C,<br>_V_CC=400V,_I_C=5.0A,<br>_V_GE=0.0/15.0V,<br>_R_G(on)=15.0Ω,_R_G(off)=15.0Ω,<br>_L_σ=30nH,_C_σ=30pF<br>_L_σ,_C_σfromFig.E<br>Energy losses include “tail” and<br>diode reverse recovery.|-|18|-|ns|
|Rise time|_t_r||-|5|-|ns|
|Turn-off delaytime|_t_d(off)||-|220|-|ns|
|Fall time|_t_f||-|12|-|ns|
|Turn-on energy|_E_on||-|0.14|-|mJ|
|Turn-off energy|_E_off||-|0.05|-|mJ|
|Total switchingenergy|_E_ts||-|0.19|-|mJ|
6
Rev.�1.3,��2014-12-04
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## IKP40N65F5,�IKW40N65F5
## High�speed�switching�series�fifth�generation
**Diode�Characteristic,�at�** _**T**_ **vj�=�150°C**
|Diode reverse recoverytime|_t_rr|_T_vj=150°C,<br>_V_R=400V,<br>_I_F=20.0A,<br>_di_F_/dt_=1000A/µs|-|85|-|ns|
|---|---|---|---|---|---|---|
|Diode reverse recoverycharge|_Q_rr||-|1.00|-|µC|
|Diodepeak reverse recoverycurrent|_I_rrm||-|17.0|-|A|
|Diode peak rate of fall of reverse<br>recoverycurrentduring_t_b|_di_rr_/dt_||-|-220|-|A/µs|
||||||||
|Diode reverse recoverytime|_t_rr|_T_vj=150°C,<br>_V_R=400V,<br>_I_F=5.0A,<br>_di_F_/dt_=1000A/µs|-|50|-|ns|
|Diode reverse recoverycharge|_Q_rr||-|0.50|-|µC|
|Diodepeak reverse recoverycurrent|_I_rrm||-|14.0|-|A|
|Diode peak rate of fall of reverse<br>recoverycurrentduring_t_b|_di_rr_/dt_||-|-500|-|A/µs|
Rev.�1.3,��2014-12-04
7
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275<br>100 US 250 Le<br>_ PAS are 225200 rN TT TF<br>< aeaa ee<br>175<br>10<br>| SF MBNIINSCAD tp=1µs EL ISICRSENTIII 2 ee ee<br>pee Ss | 150<br>10µs<br>a PPT ear es ST ) 125 Pf ENG}<br>50µs<br>O a a<br>100µs 100<br>p Pode eK<br>6 1 200µs ee NT<br>75<br>500µs<br>See NT<br>50<br>Po DC \<br>25<br>FH nH EEE<br>0.1 0<br>1 10 100 1000 25 50 75 100 125 150 S S 175<br>V CE , COLLECTOR-EMITTER VOLTAGE [V] T C , CASE TEMPERATURE [°C]<br>Figure 1. Forward bias safe operating area Figure 2. Power dissipation as a function of case<br>( D =0, T C =25°C, T vj 175°C; V GE=15V. temperature<br>Recommended use at V GE ≥ 7.5V) ( T vj ≤ 175°C)<br>80 120<br>70<br>CTL ETT] 100 AOA<br>VGE=20V<br>60<br>~ PS)tN ee//)\ev7eenAfi 18V<br>80<br>LONE Rae 15V<br>50<br>12V<br>BNE 40 \ 8 60 EB [eee] 10V Yq<br>8V<br>BACT 30 EF eg<br>7V<br>40<br>° 6V<br>BN 8 ope<br>20<br>ff SL AW<br>5V<br>20<br>po<br>10<br>AY BR<br>PE) GSS<br>0 0 | AT NT TT<br>25 50 75 100 125 150 175 0 1 2 3 4 5<br>T C , CASE TEMPERATURE [°C] V CE , COLLECTOR-EMITTER VOLTAGE [V]<br>Figure 3. Collector current as a function of case Figure 4. Typical output characteristic<br>temperature ( T vj=25°C)<br>( V GE ≥ 15V, T vj ≤ 175°C)<br>I C P tot<br>I C I C<br>**----- End of picture text -----**<br>
8
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120 120<br>Tj=25°C<br>Tj=150°C<br>Ty EaCOTe<br>100 100<br>R20) (ee ee e ee<br>VGE=20V<br>2 eee. 18V<br>80 80<br>eee) 15V<br>PC tee 12V ae bEee ee<br>ed) 60 10V SAREE 60 eee<br>8V<br>i ee<br>7V<br>4 40 e/a 40<br>S | 6V Lipset tts | ie<br>LAA PS EL<br>5V<br>20 20<br>NWN a<br>pLYeerosEd<br>EVANS eee<br>0 0<br>0 1 2 3 4 5 4.5 5.0 5.5 6.0 6.5 7.0 7.5 8.0 8.5<br>V CE , COLLECTOR-EMITTER VOLTAGE [V] V GE , GATE-EMITTER VOLTAGE [V]<br>Figure 5. Typical output characteristic Figure 6. Typical transfer characteristic<br>( T vj=150°C) ( V CE=20V)<br>2.50 1000<br>IC=10A I td(off) ——— E<br>IC=20A tf<br>-—& 2.25 J IC=40A o td(on)<br>tr<br>S | ER<br>pt ) a<br>2.00<br>100<br>B T<br>1.75<br>| er) 2 Lee<br>bu - ase<br>peerE 1.50 UEoO esee ee ee ee ee<br>POLST), Ep<br>1.25<br>° ee ae<br>a 10<br>ee 1.00<br>O a es ee ee<br>2S<br>0.75<br>PPP) eee<br>0.50 1<br>0 25 50 75 100 125 150 175 0 20 40 60 80 100 120<br>T vj , JUNCTION TEMPERATURE [°C] I C , COLLECTOR CURRENT [A]<br>Figure 7. Typical collector-emitter saturation voltage as Figure 8. Typical switching times as a function of<br>I C I C<br>t<br>CEsat<br>V<br>**----- End of picture text -----**<br>
Figure 7. Typical a function ( _V_ GE=15V)
(inductive load, _T_ vj =150°C, _V_ CE=400V, _V_ GE =15/0V, _r_ G=15 Ω , Dynamic test Figure E)
9
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1000 a SS ES ES eS 1000 a a<br>1 t td(off) a he a t td(off) a<br>| tf tf<br>td(on) td(on)<br>tr tr<br>fs | i ee ee eee eee | fe a A ee ee<br>| o e rea| | eee| po| eeee ee<br>e 100 kell 100<br>o | Tite L i]|<br>uw= e a eeeeeeec ee esosee ccaee oGe)= aesa ess e e eeee ee<br>F a a ee ee ee a eeee<br>O a ee ee ee a ee<br>= ceco<br>E=” 10 a a aUo ssvi’ ‘ ee Ee = ” 10 a7 rte es<br>—— — ee<br>po a ee<br>po PP a eeee<br>P T a a<br>1 1<br>5 15 25 35 45 55 65 75 85 25 50 75 100 125 150 175<br>r G , GATE RESISTOR [ Ω ] T vj , JUNCTION TEMPERATURE [°C]<br>Figure 9. Typical switching times as a function of gate Figure 10. Typical switching times as a function of<br>resistor junction temperature<br>(inductive load, T vj =150°C, V CE=400V, (inductive load, V CE =400V, V GE=15/0V,<br>V GE =15/0V, I C =20A,Dynamic test circuit in I C =20A, r G=15 ,Dynamic test circuit in<br>Figure E) Figure E)<br>5.5 8<br>typ. Eoff<br>min. Eon<br>7Ww 5.0 iE max. |) | | 7 a, Ets<br>4.5<br>PA f s ee£ F e<br>6<br>oe<br>4.0<br>5<br>3.5<br>4<br>3.0<br>a _— —~_ m7 a a<br>= . = 3 7 7<br>S 2.5 ~O Tr ao , va<br>2<br>xt 2.0 ~S ep) a 7<br>ee 1 ee<br>1.5<br>1.0 0<br>0 25 50 75 100 125 150 0 20 40 60 80 100 120<br>T vj , JUNCTION TEMPERATURE [°C] I C , COLLECTOR CURRENT [A]<br>t t<br>E<br>GE(th)<br>V<br>**----- End of picture text -----**<br>
Figure 11. Gate-emitter of junction ( _I_ C=0.4mA)
Figure 12.
(inductive load, _T_ vj =150°C, _V_ CE=400V, _V_ GE =15/0V, _r_ G=15 Ω ,Dynamic test Figure E)
10
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1.6<br>Eoff<br>Eon<br>1.4 Ets<br>a] 1.2<br>ep) “<br>e) 1.0 “<br>— ”<br>ow cece<br>im 0.8 > =<br>Zz je a<br>Ww ae oa<br>Zz 0.6 a =<br>= , pea<br>0.4<br>Se<br>0.2<br>PTT<br>0.0<br>ET ity}<br>5 15 25 35 45 55 65 75 85<br>r G , GATE RESISTOR [ Ω ]<br>Figure 13. Typical switching energy losses as a<br>function of gate resistor<br>(inductive load, T vj =150°C, V CE=400V,<br>V GE =15/0V, I C =20A, Dynamic test circuit in<br>Figure E)<br>E<br>**----- End of picture text -----**<br>
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0.8<br>Eoff<br>Eon<br>0.7 Ets<br>e e<br>0.6<br>n<br>e) 0.5 =<br>— weer<br>wv --<br>uw 0.4<br>Zz wece<br>Ww -<br>Zz 0.3<br>=<br>0.2<br>Le<br>0.1<br>0.0<br>LET<br>25 50 75 100 125 150 175<br>T vj , JUNCTION TEMPERATURE [°C]<br>Figure 14. Typical switching energy losses as a<br>function of junction temperature<br>(inductive load, V CE =400V, V GE=15/0V,<br>I C =20A, r G=15 ,Dynamic test circuit in<br>Figure E)<br>E<br>**----- End of picture text -----**<br>
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1.0 16<br>Eoff 130V<br>0.9 Eon 520V<br>e 0.8 Ets ee 14 ;<br>12<br>e f oe<br>0.7<br>a | mm<br>ep) a E<br>fe}aPpp7” Fae 10 fe/<br>> 0.6 a 5 fo)> ’ ,<br>:<br>0.5 8<br>ffpf-* a= K| ey<br>0.4<br>pee a 6 Pp<br>poeO aa a<x ee r<br>— 0.3 se Oo<br>4<br>a -<br>Bb<br>0.2<br>2<br>0.1<br>Fe<br>0.0 0<br>200 250 300 350 400 450 500 0 20 40 60 80 100<br>V CE , COLLECTOR-EMITTER VOLTAGE [V] Q GE , GATE CHARGE [nC]<br>Figure 15. Typical switching energy losses as a Figure 16. Typical gate charge<br>function of collector emitter voltage ( I C=40A)<br>(inductive load, T vj =150°C, V GE=15/0V,<br>GE<br>V<br>E<br>**----- End of picture text -----**<br>
_I_ C =20A, _r_ G=15 Figure E)
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1E+4 1<br>Cies<br>Coes<br>\ FE. Cres a a ...Ud . (SSEA<br>a \ a e s es LLpee Lepee IT<br>D=0.5<br>1000<br>0.2<br>——————————— ed Bill Pe uleczall<br>0.1 0.1<br>—Q ( ER es eses Wwop) eeEw) aa Seer a 0.05 Chear<br>0.02<br>¢ 4 pe _| | Lert<br>100 0.01<br>Oo ————es ar single pulse<br>a fy<br>BS? TET Im<br>0.01<br>a —~__| |<br>10 i ee ee ecteei e mi<br>_$SSSpt Sespt t+ -5 AIMFLUTE AP LTTE Tene, GH contetRe il|<br>— a ee FATT TTT<br>ee i: 1 2 3 4<br>ri[K/W]: 0.08245484 0.144197 0.2151774 0.1581708<br>τ i[s]: 7.3E-5 7.0E-4 0.01235548 0.08020881<br>1 PF | | ee | eeff ee| ee 0.001 || | TT<br>0 5 10 15 20 25 30 1E-6 1E-5 1E-4 0.001 0.01 0.1 1<br>V CE , COLLECTOR-EMITTER VOLTAGE [V] t p , PULSE WIDTH [s]<br>Figure 17. Typical capacitance as a function of Figure 18. IGBT transient thermal resistance<br>collector-emitter voltage ( D = t p/T)<br>C<br>c)th(j-<br>Z<br>**----- End of picture text -----**<br>
( _V_ GE
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130<br>Tj=25°C, IF = 20A<br>Tj=150°C, IF = 20A<br>120<br>=<br>& 110 .<br>ef== 100 StPy. dd<br>_—<br>Lu>> 90 SS SL oa<br>oO 80 PPP | pet<br>W&& ~N<br>70<br>é& NS.<br>S NN<br>Ww©© 60 oN<br>- a<br>—|| |<br>50 | |<br>40<br>500 700 900 1100 1300 1500<br>di F /dt , DIODE CURRENT SLOPE [A/us]<br>t rr<br>**----- End of picture text -----**<br>
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—= 1 ETI ac Il<br>A<br>x,W Seen oe eS?ci<br>D=0.5<br>S ade eeoe<br>0.2<br>- cectTaos7/0 HO<br>0.1 cM<br>0.05<br>0.1<br>8 | AMI ILA TTT ef==<br>oc Aer =o<br>alx SS|a A a 0.02 || Lu>><br>0.01<br>=Y Coeeea<br>single pulse<br>Wi eT 0 oO<br>= CICAFHA Cae T A 00 i) W&&<br>eI é&<br>0.01<br>o UN LIAN AE a ETUC S<br>©Z FAHOnoCe Ro--{i}nit} Ww©©<br>F onto ill<br>° Con oe oe, ote, Ul<br>I ALT? TT T coo ooo<br>TTT Laan |] ] ]f i: SP 1 2 3<br>ri[K/W]: 0.6701584 0.775759 0.3540826<br>τ i[s]: 3.4E-4 4.7E-3 0.04680901<br>iil a A<br>0.001<br>1E-7 1E-6 1E-5 1E-4 0.001 0.01 0.1 1<br>t p , PULSE WIDTH [s]<br>t rr<br>c)th(j-<br>Z<br>**----- End of picture text -----**<br>
Figure 19. Diode function ( _D_ = _t_ p/T)
Figure 20. Typical of diode ( _V_ R=400V)
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1.2 20<br>Tj=25°C, IF = 20A 19 Tj=25°C, IF = 20A<br>Tj=150°C, IF = 20A Tj=150°C, IF = 20A<br>[en (es ee<br>18<br>es 1.0 | i os 17<br>16<br>g CERSETTTT<br>15<br>SFO TE] s FCEEeEEroe<br>5 0.8 ||TTT TLL ees 14 POPC Pele<br>13<br>e COCO 6 Pepe<br>12<br>3By 0.6 Ty TTT 3B 11 AGPP a e<br>10<br>p CDOs Ee<br>9<br>wu Saes> ee a ASR<br>0.4 8<br>7<br>* EPPEEEECrg © 6 ERE<br>PE TTT COEFt tt ET tteeeTt<br>0.2 5<br>500 700 900 1100 1300 1500 500 700 900 1100 1300 1500<br>di F /dt , DIODE CURRENT SLOPE [A/us] di F /dt , DIODE CURRENT SLOPE [A/us]<br>Figure 21. Typical reverse recovery charge as a Figure 22. Typical reverse recovery current as a<br>function of diode current slope function of diode current slope<br>( V R=400V) ( V R=400V)<br>0 60<br>Tj=25°C, IF = 20A Tj=25°C<br>Tj=150°C, IF = 20A Tj=150°C<br>-50<br>a a<br>50<br>:z -100 SRRRRRneee pot ft tTA<br>ef<br>40<br>-150<br>e2 [PeSs LyO yp<br>-200 30<br>My a <<br>a PXeu? Fe<br>-250<br>P|3 —~ RRLe 20 | | | /fe<br>-300<br>10<br>-350<br>Su) eer<br>-400 0<br>500 700 900 1100 1300 1500 0.0 0.5 1.0 1.5 2.0 2.5 3.0<br>di F /dt , DIODE CURRENT SLOPE [A/us] V F , FORWARD VOLTAGE [V]<br>Q rr I rr<br>I rr<br>/dt I F<br>rr<br>dI<br>**----- End of picture text -----**<br>
Figure 23.
Figure 24.
( _V_ R=400V)
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2.0<br>IF=10A<br>IF=20A<br>IF=40A<br>pe<br>1.8<br>po |<br>keekeee e<br>—ee 1.6 e e<br>fe 1.4 fo | |<br>1.2<br>2.oe<br>es eeee<br>1.0<br>pot ft |<br>ee ee<br>0.8<br>P|<br>25 50 75 100 125 150 175<br>T vj , JUNCTION TEMPERATURE [°C]<br>F<br>V<br>**----- End of picture text -----**<br>
Figure 25.
14
IKP40N65F5,�IKW40N65F5
**==> picture [146 x 65] intentionally omitted <==**
High�speed�switching�series�fifth�generation
## PG-TO220-3
15
Rev.�1.3,��2014-12-04
IKP40N65F5,�IKW40N65F5
**==> picture [146 x 65] intentionally omitted <==**
High�speed�switching�series�fifth�generation
## PG-TO247-3
16
Rev.�1.3,��2014-12-04
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## IKP40N65F5,�IKW40N65F5
High�speed�switching�series�fifth�generation
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v GE (t) I,V<br>90% V GE<br>dI F /dt a b<br>10% V GE t a b<br>I C (t)<br>dI<br>90% I C 90% I C<br>10% I C 10% I C t Figure C. Definition of diode switching<br>characteristics<br>v CE (t)<br>t<br>t<br>t d(off) t f t d(on) t r<br>Figure A.<br>v GE (t)<br>**----- End of picture text -----**<br>
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**----- Start of picture text -----**<br>
v GE (t)<br>90% V GE<br>10% V GE<br>t<br>I C (t)<br>2% I C t<br>v CE (t)<br>t 2 t 4<br>E off [=] V CE x I C x d t E on [=] V CE x I C x d t<br>t 1 t 3 2% V CE t<br>t 1 t 2 t 3 t 4<br>Figure B.<br>**----- End of picture text -----**<br>
Figure D.
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CC<br>**----- End of picture text -----**<br>
Figure E. **Dynamic test circuit** Parasitic inductance Ls, parasitic capacitor Ls, relief capacitor C ,r (only for ZVT switching)
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## IKP40N65F5, IKW40N65F5
## High speed switching series fifth generation
## Revision History
IKP40N65F5, IKW40N65F5
Revision: 2014-12-04, Rev. 1.3
## Previous Revision
|Revision|Date|Subjects(major changes since last revision)|
|---|---|---|
|1.1|2012-11-09|Preliminarydata sheet|
|1.2|2013-12-18|New MarkingPattern|
|1.3|2014-12-04|Minor changes Fig.1 and Fig.14|
## We Listen to Your Comments
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Published by Infineon Technologies AG 81726 Munich, Germany 81726 München, Germany © 2014 Infineon Technologies AG All Rights Reserved.
## Legal Disclaimer
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## Information
For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com).
## Warnings
Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office.
The Infineon Technologies component described in this Data Sheet may be used in life-support devices or systems and/or automotive, aviation and aerospace applications or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support, automotive, aviation and aerospace device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered.
Rev. 1.3, 2014-12-04
18
Updated at June 9, 2026
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