FCP380N60
Power MOSFET, N Channel, 600 V, 10.2 A, 0.38 ohm, TO-220, Through Hole
- Manufacturer: ONSEMI
- Product type: Single MOSFETs
- Transistor Polarity:N Channel; Continuous Drain Current Id:10.2A; Drain Source Voltage Vds:600V; On Resistance Rds(on):0.33oh; Available until stocks are exhausted Alternative available
- MSL: -
- SVHC: Lead (27-Jun-2024)
- No. of Pins: 3Pins
- Channel Type: N Channel
- Product Range: SuperFET II
- Qualification: -
- Power Dissipation: 106W
- Transistor Mounting: Through Hole
- Rds(on) Test Voltage: 10V
- Transistor Case Style: TO-220
- Drain Source Voltage Vds: 600V
- Operating Temperature Max: 150°C
- Continuous Drain Current Id: 10.2A
- Drain Source On State Resistance: 0.38ohm
- Gate Source Threshold Voltage Max: 2.5V
| Delivery and price | |
|---|---|
| Units per pack | 100 |
| Price | 1.67 € |
| Current stock | 200+ |
| Lead time | 7 days |
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Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. 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This literature is subject to all applicable copyright laws and is not for resale in any manner. **==> picture [74 x 8] intentionally omitted <==** **----- Start of picture text -----**<br> November 2013<br>**----- End of picture text -----**<br> ## **FCP380N60 / FCPF380N60 N-Channel SuperFET[® ] II MOSFET** **600 V, 10.2 A, 380 m** Ω ## **Features** - 650 V @ TJ = 150°C - Typ. RDS(on) = 330 m Ω - Ultra Low Gate Charge (Typ. Qg = 30 nC) - Low Effective Output Capacitance (Typ. Coss(eff.) = 95 pF) - 100% Avalanche Tested - RoHS Compliant ## **Applications** - LCD / LED / PDP TV Lighting ## **Description** SuperFET[®] II MOSFET is Fairchild Semiconductor’s brand-new high voltage super-junction (SJ) MOSFET family that is utilizing charge balance technology for outstanding low on-resistance and lower gate charge performance. This technology is tailored to minimize conduction loss, provide superior switching performance, dv/dt rate and higher avalanche energy. Consequently, SuperFET II MOSFET is very suitable for the switching power applications such as PFC, server/telecom power, FPD TV power, ATX power and industrial power applications. - Solar Inverter - AC-DC Power Supply **D G GDS TO-220 GDS TO-220F S Absolute Maximum Ratings** TC = 25[o] C unless otherwise noted. ~~OT~~ **Symbol Parameter FCP380N60 FCPF380N60 Unit** ~~a~~ VDSS Drain to Source Voltage ~~E—Eee~~ 600 V VGSS Gate to Source Voltage ~~pfpO~~ - DC- AC (f > 1 Hz) ±20±30 V ID Drain Current ~~ee~~ - Continuous - Continuous ((TTCC = 25 = 100[o] C[o] C) ) 10.26.4 10.2*6.4* A ~~aI:~~ IDM Drain Current ~~a~~ - Pulsed ~~ce~~ (Note 1) 30.6 ~~ee~~ 30.6* A EAS ~~Ay~~ Single Pulsed Avalanche Energy (Note 2) 211.6 mJ ~~OT ~~ ama” | ~6§6 |~~ IAR Avalanche Current (Note 1) 2.3 A ~~CO | § |~~ EAR ~~OO~~ Repetitive Avalanche Energy (Note 1) 1.06 mJ ~~es |~~ dv/dt ~~|OO~~ MOSFET dv/dt 100 V/ns ~~_~~ Peak Diode Recovery dv/dt (Note 3) 20 ~~| § 4~~ PD Power Dissipation - Derate Above 25(TC = 25[o] C)[o] C 0.85106 0.2531 W/W[o] C ~~rr —eEEEE eee§«§«=—fC a~~ TJ, TSTG ~~C~~ Operating and Storage Temperature Range ~~=~]~~ -55 to +150 oC ~~A~~ TL ~~(Re~~ Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds 300 oC *Drain current limited by maximum junction temperature. ## **Thermal Characteristics** |**Symbol**|**Parameter**|**FCP380N60**|**FCPF380N60**|**Unit**| |---|---|---|---|---| |RθJC|Thermal Resistance, Junction to Case, Max.|1.18|4|oC/W| |RθJA|Thermal Resistance, Junction to Ambient, Max.|62.5|62.5|| www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **1** **Package Marking and Ordering Information Part Number Top Mark Package Packing Method Reel Size Tape Width Quantity** FCP380N60 FCP380N60 TO-220 Tube N/A N/A 50 units FCPF380N60 FCPF380N60 TO-220F Tube N/A N/A 50 units **Electrical Characteristics** TC = 25[o] C unless otherwise noted. ~~OC~~ **Symbol Parameter Test Conditions Min. Typ. Max. Unit Off Characteristics** BVDSS Drain to Source Breakdown Voltage VVGSGS = 0 V, I = 0 V, IDD = 10 mA, T = 10 mA, TJJ = 25 = 150 ° C ° C 600650-V Δ / BV Δ TDSSJ Breakdown Voltage Temperature Coefficient ID = 10 mA, Referenced to 25[o] C - 0.6 - V/[o] C Drain to Source Avalanche Breakdown BVDS Voltage VGS = 0 V, ID = 10 A - 700 - V IDSS Zero Gate Voltage Drain Current VVDSDS = 480 V, V = 480 V, TC GS = 125= 0 V[o] C -- -- 101 μ A IGSS Gate to Body Leakage Current VGS = ±20 V, VDS = 0 V - - ±100 nA ~~Se~~ **On Characteristics** ~~Seeeee~~ VGS(th) Gate Threshold Voltage VGS = VDS, ID = 250 μ A 2.5 - 3.5 V RDS(on) Static Drain to Source On Resistance VGS = 10 V, ID = 5 A - 0.33 0.38 Ω ~~——————————~~ gFS Forward Transconductance VDS = 20 V, ID = 5 A - 11 - S **Dynamic Characteristics** CCiossss Input CapacitanceOutput Capacitance Vf = 1 MHzDS = 25 V, VGS = 0 V, -- 1250905 12051665 pFpF Crss Reverse Transfer Capacitance - 45 60 pF Coss Output Capacitance VDS = 380 V, VGS = 0 V, f = 1 MHz - 23 - pF Coss(eff.) Effective Output Capacitance VDS = 0 V to 480 V, VGS = 0V - 95 - pF Qg(tot) Total Gate Charge at 10V VDS = 380 V, ID = 5 A, - 30 40 nC Qgs Gate to Source Gate Charge VGS = 10 V - 5 - nC Qgd Gate to Drain “Miller” Charge (Note 4) - 10 - nC ~~=)—————~~ ESR Equivalent Series Resistance f = 1 MHz - 1 - Ω **Switching Characteristics** td(on) Turn-On Delay Time - 14 38 ns tr Turn-On Rise Time VDD = 380 V, ID = 5 A, - 7 24 ns td(off) Turn-Off Delay Time VGS = 10 V, RG = 4.7 Ω - 45 100 ns tf Turn-Off Fall Time (Note 4) - 6 22 ns ~~SS EEF =~~ **Drain-Source Diode Characteristics** IS Maximum Continuous Drain to Source Diode Forward Current - - 10.2 A ISM Maximum Pulsed Drain to Source Diode Forward Current - - 30.6 A VSD Drain to Source Diode Forward Voltage VGS = 0 V, ISD = 5 A - - 1.2 V trr Reverse Recovery Time VGS = 0 V, ISD = 5 A, - 240 - ns ~~a~~ Qrr Reverse Recovery Charge dIF/dt = 100 A/ μ s - 2.7 - μ C **Notes:** 1. Repetitive rating: pulse-width limited by maximum junction temperature. 2. IAS = 2.3 A, VDD = 50 V, RG = 25 Ω , starting TJ = 25 ° C. 3. ISD ≤ 5.1 A, di/dt ≤ 200 A/ μ s, VDD ≤ BVDSS, starting TJ = 25 ° C. 4. Essentially independent of operating temperature typical characteristics. www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **2** ## **Typical Performance Characteristics** **Figure 1. On-Region Characteristics** **==> picture [161 x 10] intentionally omitted <==** **----- Start of picture text -----**<br> Figure 2. Transfer Characteristics<br>**----- End of picture text -----**<br> **==> picture [446 x 593] intentionally omitted <==** **----- Start of picture text -----**<br> 50 50<br>V GS = 15.0V *Notes:<br> 10.0V 1. V DS = 20V<br> 8.0V 2. 250 μ s Pulse Test<br> 7.0V<br>10<br> 6.0V<br> 5.5V<br> 5.0V 10 150 o C<br> 4.5V<br>25 o C<br>1<br>ma<br>-55 o C<br>* Notes:<br> 1. 250 μ s Pulse Test<br> 2. TC = 25 [o] C<br>0.1 1<br>0.1 ca 1 aa) 10 3 4 5 6 7 8<br>VDS, Drain to Source Voltage[V] VGS, Gate to Source Voltage[V]<br>Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage<br> Drain Current and Gate Voltage Variation vs. Source Current<br> and Temperature<br>1.2 100<br>1.0<br> 150 [o] C<br>0.8<br>25 [o] C<br>Gaeeeeeeenee 10 Pre =a<br>0.6<br>VGS = 10V<br>0.4 V GS = 20V *Notes:<br>1. VGS = 0V<br>*Note: TC = 25 [o] C 2. 250 μ s Pulse Test<br>0.2 1<br>0 5 10 15 20 25 30 0.3 0.6 0.9 1.2 1.5<br>ID, Drain Current [A] VSD, Body Diode Forward Voltage [V]<br>Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics<br>10000 10<br>Ciss<br>VDS = 120V<br>1000 8 VDS = 300V<br>VDS = 480V<br>100 6<br>Coss<br>=—]| |<br>10 *Note: 4<br> 1. VGS = 0V<br> 2. f = 1MHz<br>C rss<br>1 S| Ciss = Cgs + Cgd (Cds = shorted) 2 pe<br>Coss = Cds + Cgd<br>Crss = Cgd *Note: ID = 5A<br>0.1 ee 0 / | ft tf<br>0.1 1 10 100 1000 0 9 18 27 36<br>VDS, Drain to Source Voltage [V] Qg, Total Gate Charge [nC]<br>, Drain Current[A] , Drain Current[A]<br>ID ID<br>],<br>Ω<br> [<br>DS(ON)<br>R<br>, Reverse Drain Current [A]<br>IS<br>Drain to Source On-Resistance<br>, Gate-Source Voltage [V]<br>Capacitances [pF] , Gate to Source Voltage [V]GS<br>VGS<br>V<br>**----- End of picture text -----**<br> **Figure 4. Body Diode Forward Voltage Variation vs. Source Current** www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **3** ## **Typical Performance Characteristics** (Continued) **Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation vs. Temperature vs. Temperature** **==> picture [443 x 586] intentionally omitted <==** **----- Start of picture text -----**<br> 1.20 3.0<br>1.15 ee eee ee 2.5<br>1.10<br>1.05 SERSSBE 2.0 HG<br>1.5<br>0 D7 4002 I oon Sy<br>1.00 A<br>1.0<br>0.95<br>Guay 4eeeeeee a<br>*Notes: 0.5 *Notes:<br>0.90 1. VGS = 0V 1. VGS = 10V<br> 2. ID = 10mA 2. ID = 5A<br>0.85 BREE 0.0 cer<br>EaGeeeee Pp<br>-100 -50 0 50 100 150 200 -100 -50 0 50 100 150 200<br>TJ, Junction Temperature [ [o] C] TJ, Junction Temperature [ [o] C]<br> Figure 9. Maximum Safe Operating Area Figure 10. Maximum Safe Operating Area<br> for FCP380N60 for FCPF380N60<br>50 SEE STC ame STET ESTEE 50 EET 7<br>10 μ s 10 μ s<br>10 100 μ s 10 100 μ s<br>1ms 1ms<br>10ms 10ms<br>DC<br>1 a 1 RS DC<br>Operation in This Area Operation in This Area<br>is Limited by R DS(on) is Limited by R DS(on)<br>0.1 *Notes: 0.1 *Notes:<br> 1. TC = 25 [o] C 1. TC = 25 [o] C<br> 2. T J = 150 [o] C 2. T J = 150 [o] C<br> 3. Single Pulse 3. Single Pulse<br>0.01 pa 0.01 -<br>0.1 1 10 100 1000 0.1 1 10 100 1000<br>VDS, Drain to Source Voltage [V] VDS, Drain to Source Voltage [V]<br> Figure 11. Maximum Drain Current Figure 12. Eoss vs. Drain to Source Voltage<br> vs. Case Temperature<br>12 6<br>5<br>9 me] OR<br>4<br>caue EEE<br>6 3<br>PEEEFRRSECH 9 FEEEESEEE ZF<br>2<br>3 PEPPER) FRA<br>1<br>0 0<br>25 PPE 50 75 100 ERY 125 \ 150 ) =6 0 eepf 100 200 300 400 500 600<br>TC, Case Temperature [ [o] C ] VDS, Drain to Source Voltage [V]<br>, [Normalized] , [Normalized]<br>DSS DS(on)<br>BV R<br>Drain to Source On-Resistance<br>Drain to Source Breakdown Voltage<br>, Drain Current [A] , Drain Current [A]<br>ID ID<br>J]<br>μ<br>, [<br>OSS<br>E<br>, Drain Current [A]<br>ID<br>**----- End of picture text -----**<br> **Figure 9. Maximum Safe Operating Area Figure 10. Maximum Safe Operating Area for FCP380N60 for FCPF380N60** **Figure 11. Maximum Drain Current Figure 12. Eoss vs. Drain to Source Voltage vs. Case Temperature** www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **4** ## **Typical Performance Characteristics** (Continued) ## **Figure 13. Transient Thermal Response Curve for FCP380N60** **==> picture [301 x 344] intentionally omitted <==** **----- Start of picture text -----**<br> 2<br>1<br>0.5<br>Sees<br>0.2<br>0.1<br>0.1 Ea PDM<br>0.05 t1<br>0.02 *Notes: t2<br>0.01 1. Z θ JC(t) = 1.18 [o] C/W Max.<br>Single pulse 2. Duty Factor, D= t1/t2<br> 3. TJM - TC = PDM * Z θ JC(t)<br>0.01<br>10-5 10-4 10-3 10-2 10-1 100<br> tRectangular Pulse Duration [sec]1, Rectangular Pulse Duration [sec]<br>Figure 14. Transient Thermal Response Curve for FCPF380N60<br>5<br>0.5<br>1<br>0.2<br>0.1<br>0.05 P DM<br>t1<br>0.1 0.02 t2<br>0.01 *Notes:<br>Single pulse 1. Z θ JC (t) = 4 [o] C/W Max.<br> 2. Duty Factor, D= t1/t2<br> 3. TJM - TC = PDM * Z θ JC(t)<br>0.01<br>10-5 10-4 10-3 10-2 10-1 1 10 100<br> tRectangular Pulse Duration [sec]1, Rectangular Pulse Duration [sec]<br>oC/W] ]JC θ<br>(t), Thermal Response [<br>ZThermal Response [ZJC θ<br>oC/W] ] ZJC θ<br>[<br>(t), Thermal Response [<br>ZJC θ Thermal Response<br>**----- End of picture text -----**<br> **Figure 14. Transient Thermal Response Curve for FCPF380N60** www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **5** **==> picture [392 x 401] intentionally omitted <==** **----- Start of picture text -----**<br> IG = const.<br>F<br>Charge<br> Figure 15. Gate Charge Test Circuit & Waveform<br>VDS RL VDS 90%<br>VGS VDD<br>RG<br>10%<br>V 10V GS DUT VGS<br>td(on) tr td(off) tf<br>=n wa t on 4S t off<br> Figure 16. Resistive Switching Test Circuit & Waveforms<br>Vos oy5 EASa“a Las?LIAS<br>lo oy} BVpss<br>of las<br>>in (ad) =F Von Ip (t)<br>VGS TL DUT Vop<br>**----- End of picture text -----**<br> **Figure 17. Unclamped Inductive Switching Test Circuit & Waveforms** www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **6** **==> picture [335 x 545] intentionally omitted <==** **----- Start of picture text -----**<br> DUT +<br>VDS<br>_<br>I SD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT VDD<br>VGS • dv/dt controlled by RG<br>• ISD controlled by pulse period<br>Gate Pulse Width<br>VGS D = --------------------------<br>Gate Pulse Period 10V<br>( Driver )<br>ff}<br>IFM , Body Diode Forward Current<br>I SD<br>( DUT ) di/dt<br>IRM<br>4 Ne<br>Body Diode Reverse Current<br>VDS<br>( DUT ) Body Diode Recovery dv/dt<br>VSD VDD<br>eerie<br>Body Diode<br>Forward Voltage Drop<br> Figure 18. Peak Diode Recovery dv/dt Test Circuit & Waveforms<br>**----- End of picture text -----**<br> www.fairchildsemi.com ©2012 Fairchild Semiconductor Corporation FCP380N60 / FCPF380N60 Rev. C6 **7** **==> picture [592 x 749] intentionally omitted <==** **----- Start of picture text -----**<br> SUPPLIER "B" PACKAGE<br>SHAPE �����<br> 3.50<br>10.67<br>SUPPLIER "A" PACKAGE 9.65 E<br>SHAPE<br>3.40<br>2.50<br>16.30<br>IF PRESENT, SEE NOTE "D" 13.90<br>E<br>16.51 9.40<br>15.42<br>8.13 E<br>1 2 3<br>[2.46] C 2.704.10<br>14.04<br>2.13 12.70<br>2.06<br>FRONT VIEWS<br>4.70 1.62 1.62<br>4.00 1.42 [ H] 2.67 1.10<br>2.40<br>"A1" 8.65 1.00<br>SEE NOTE "F" 7.59 0.55<br>�� ��<br>OPTIONAL 6.69 �� ��<br>6.06<br>CHAMFER<br>E<br>14.30<br>11.50<br>NOTE "I" BOTTOM VIEW<br>NOTES:<br> A) REFERENCE JEDEC, TO-220, VARIATION AB<br> B) ALL DIMENSIONS ARE IN MILLIMETERS.<br> C) DIMENSIONS COMMON TO ALL PACKAGE<br>SUPPLIERS EXCEPT WHERE NOTED [ ].<br>3 2 1 D) LOCATION OF MOLDED FEATURE MAY VARY<br> (LOWER LEFT CORNER, LOWER CENTER<br> AND CENTER OF THE PACKAGE)<br> E DOES NOT COMPLY JEDEC STANDARD VALUE.<br> F) "A1" DIMENSIONS AS BELOW:<br>SINGLE GAUGE = 0.51 - 0.61<br>DUAL GAUGE = 1.10 - 1.45<br> G) DRAWING FILE NAME: TO220B03REV9<br> H PRESENCE IS SUPPLIER DEPENDENT<br> I) SUPPLIER DEPENDENT MOLD LOCKING HOLES<br> IN HEATSINK.<br>0.60<br>0.36 2.85 BACK VIEW<br>2.10<br>SIDE VIEW<br>**----- End of picture text -----**<br> **==> picture [566 x 759] intentionally omitted <==** **----- Start of picture text -----**<br> 10.36 2.66<br>A B B<br>9.96 2.42<br>3.28<br>3.40 7.00 3.08<br>0.70<br>3.20<br>SEE NOTE "F" SEE NOTE "F"<br>6.88<br>6.48<br>1 X 45°<br>16.07<br>B<br>15.67<br>16.00<br>15.60<br> (3.23) B<br>3<br>1<br>1.47<br>2.96<br>2.14 1.24<br>2.56<br>0.90<br>10.05 0.70<br>9.45 0.50 [M] A<br>30°<br>0.45<br>0.60<br>0.25 B<br>0.45<br> 2.54 2.54<br>4.90<br>B<br>4.50<br>NOTES:<br> A. EXCEPT WHERE NOTED CONFORMS TO<br>EIAJ SC91A.<br>B DOES NOT COMPLY EIAJ STD. VALUE.<br> C. ALL DIMENSIONS ARE IN MILLIMETERS.<br> D. DIMENSIONS ARE EXCLUSIVE OF BURRS,<br> MOLD FLASH AND TIE BAR PROTRUSIONS.<br> E. DIMENSION AND TOLERANCE AS PER ASME<br>Y14.5-1994.<br> F. OPTION 1 - WITH SUPPORT PIN HOLE.<br> OPTION 2 - NO SUPPORT PIN HOLE.<br> G. DRAWING FILE NAME: TO220M03REV5<br>**----- End of picture text -----**<br> ON Semiconductor and are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. ## **PUBLICATION ORDERING INFORMATION** **N. American Technical Support** : 800−282−9855 Toll Free **ON Semiconductor Website** : **www.onsemi.com** USA/Canada ## **LITERATURE FULFILLMENT** : Literature Distribution Center for ON Semiconductor **Order Literature** : http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative 19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA **Europe, Middle East and Africa Technical Support: Phone** : 303−675−2175 or 800−344−3860 Toll Free USA/Canada Phone: 421 33 790 2910 **Fax** : 303−675−2176 or 800−344−3867 Toll Free USA/Canada **Japan Customer Focus Center Email** : orderlit@onsemi.com Phone: 81−3−5817−1050 © Semiconductor Components Industries, LLC www.onsemi.com **www.onsemi.com** **1**
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