# IGBT, NPT, 30 A, 3.1 V, 198 W, 1.2 kV, TO-220, 3 Pins

![Product image](https://novapart.co/image/farnell:2803434/)

**URL**: https://novapart.co/products/SGP15N120XKSA1/igbt-npt-30-a-31-v-198-w-12-kv-to-220-3-pins
**SKU**: SGP15N120XKSA1
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || IGBTs || Single IGBTs
**Price**: €1.6000
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Power Dissipation | 198W |
| Transistor Mounting | Through Hole |
| Transistor Case Style | TO-220 |
| Operating Temperature Max | 150°C |
| Continuous Collector Current | 30A |
| Collector Emitter Voltage Max | 1.2kV |
| Collector Emitter Saturation Voltage | 3.1V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2803434/)

## SGP15N120 SGW15N120 Go ~~fineon~~ Fast IGBT in NPT-technology C • 40% lower _E_ off compared to previous generation 

C G & E PG-TO-220-3-1 PG-TO-247-3 

- Short circuit withstand time – 10 μs 

- Designed for: 

   - Motor controls 

   - Inverter 

   - SMPS 

- NPT-Technology offers: 

   - very tight parameter distribution 

   - high ruggedness, temperature stable behaviour 

   - parallel switching capability 

- Qualified according to JEDEC[1] for target applications 

- Pb-free lead plating; RoHS compliant 

- Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/ 

|**Type**|**_V_CE**|**_I_C**|**_E_off**|**_T_j**|**Marking**|**Package**|
|---|---|---|---|---|---|---|
|SGP15N120|1200V|15A|1.5mJ|150°C|GP15N120|PG-TO-220-3-1|
|SGW15N120|1200V|15A|1.5mJ|150°C|SGW15N120 PG-TO-247-3|SGW15N120 PG-TO-247-3|



## **Maximum Ratings** 

|**Parameter**|**Symbol**<br>~~——~~|**Value**<br>~~——~~|**Unit**|
|---|---|---|---|
|Collector-emitter voltage|_V_C E<br>~~——~~|1200<br>~~——~~|V|
|DC collector current<br>_T_C= 25°C<br>_T_C= 100°C|_I_C<br>~~|~~|30<br>15<br>~~|~~|A|
|Pulsed collector current,_t_plimited by _T_jmax|_I_Cpu l s<br>~~|~~|52<br>~~|~~||
|Turn off safe operating area<br>_V_CE≤1200V,_T_j ≤150°C|_-_<br>~~pp~~|52<br>~~pp~~||
|Gate-emitter voltage|_V_G E<br>~~ee~~|±20<br>~~ee~~|V|
|Avalanche energy, single pulse<br>_I_C= 15A,_V_CC= 50V,_R_GE= 25Ω, start at_T_j= 25°C|_E_A S<br>~~pf~~|85<br>~~pf~~|mJ|
|Short circuit withstand time2<br>_V_GE= 15V, 100V≤ _V_CC≤1200V,_T_j ≤150°C|_t_S C<br>~~pf~~|10<br>~~pf~~|μs|
|Power dissipation<br>_T_C= 25°C|_P_t o t<br>~~pp~~|198<br>~~pp~~|W|
|Operating junction and storage temperature|_T_ j ,_T_s tg<br>~~—p——~~|-55...+150<br>~~—p——~~|°C|
|Solderingtemperature, 1.6mm(0.063 in.)from case for 10s|-<br>~~—p——~~|260<br>~~—p——~~||



> 1 J-STD-020 and JESD-022 

> 2 Allowed number of short circuits: <1000; time between short circuits: >1s. 

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## **Thermal Resistance** 

|**Thermal Resistance**|||||
|---|---|---|---|---|
|**Parameter**|**Symbol**|**Conditions**|**Max. Value**|**Unit**|
|**Characteristic**|||||
|IGBT thermal resistance,<br>junction – case|_R_t h JC||0.63|K/W|
|Thermal resistance,<br>junction – ambient|_R_t h JA|PG-TO-220-3-1<br>PG-TO-247-3|62<br>40||



## **Electrical Characteristic,** at _T_ j = 25 °C, unless otherwise specified 

|**Electrical Characteristic,**at_T_j= 25°|C, unless ot|herwise specified|||||
|---|---|---|---|---|---|---|
|**Parameter**|**Symbol**|**Conditions**||**Value**||**Unit**|
||||**min.**|**typ. **|**max.**||
|**Static Characteristic**|||||||
|Collector-emitter breakdown voltage|_V_( B R ) C E S|_V_G E=0V,<br>_I_C=1000μA|1200|-|-|V|
|Collector-emitter saturation voltage|_V_C E ( s a t )|_V_G E= 15V,_I_C=15A<br>_T_j=25°C<br>_T_ j=150°C|2.5<br>-|3.1<br>3.7|3.6<br>4.3||
|Gate-emitter threshold voltage|_V_G E ( t h )|_I_C=600μA,_V_C E=_V_G E|3|4|5||
|Zero gate voltage collector current|_I_C E S|_V_CE=1200V,VGE=0V<br>_T_j=25°C<br>_T_ j=150°C|-<br>-|-<br>-|200<br>800|μA|
|Gate-emitter leakage current|_I_G E S|_V_CE=0V,_V_GE=20V|-|-|100|nA|
|Transconductance|_g_f s|_V_C E=20V,_I_C=15A||11|-|S|
|**Dynamic Characteristic**|||||||
|Input capacitance|_C_i ss|_V_C E=25V,<br>_V_G E=0V,<br>_f_=1MHz|-|1250|1500|pF|
|Output capacitance|_C_o s s||-|100|120||
|Reverse transfer capacitance|_C_r ss||-|65|80||
|Gate charge|_Q_G a t e|_V_C C=960V,_I_C=15A<br>_V_G E=15V|-|130|175|nC|
|Internal emitter inductance<br>measured 5mm(0.197 in.)from case|_L_E|PG-TO-220-3-1<br>PG-TO-247-3|-|7<br>13|-|nH|
|Short circuit collector current2)|_I_C ( S C )|_V_G E=15V,_t_SC≤5μs<br>100V≤_V_C C≤1200V,<br>_T_ j ≤150°C|-|145|-|A|



2) Allowed number of short circuits: <1000; time between short circuits: >1s. 

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## **Switching Characteristic, Inductive Load,** at _T_ j=25 °C 

|**Parameter**|**Symbol**|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ. **|**max.**||
|**IGBT Characteristic**|||||||
|Turn-on delaytime|_t_d ( o n )|_T_j=25°C,<br>_V_C C=800V,_I_C=15A,<br>_V_G E=15V/0V,<br>_R_G=33Ω,<br>Lσ<br>1 )=180nH,<br>Cσ<br>1 )=40pF<br>Energy losses include<br>“tail” and  diode<br>reverse recovery.|-|18|24|ns|
|Rise time|_t_r||-|23|30||
|Turn-off delaytime|_t_d ( o f f )||-|580|750||
|Fall time|_t_f||-|22|29||
|Turn-on energy|_E_o n||-|1.1|1.5|mJ|
|Turn-off energy|_E_o f f||-|0.8|1.1||
|Total switching energy|_E_t s||-|1.9|2.6||



## **Switching Characteristic, Inductive Load,** at _T_ j=150 °C 

|**Parameter**|**Symbol**|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ. **|**max.**||
|**IGBT Characteristic**|||||||
|Turn-on delay time|_t_d ( o n )|_T_j=150°C<br>_V_C C=800V,<br>_I_C=15A,<br>_V_G E=15V/0V,<br>_R_G=33Ω,<br>Lσ<br>1 )=180nH,<br>Cσ<br>1 )=40pF<br>Energy losses include<br>“tail” and diode<br>reverse recovery.|-|38|46|ns|
|Rise time|_t_r||-|30|36||
|Turn-off delay time|_t_d ( o f f )||-|652|780||
|Fall time|_t_f||-|31|37||
|Turn-on energy|_E_o n||-|1.9|2.3|mJ|
|Turn-off energy|_E_o f f||-|1.5|2.0||
|Total switching energy|_E_t s||-|3.4|4.3||



> 1) Leakage inductance Lσ and stray capacity Cσ due to dynamic test circuit in figure E. 

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**==> picture [469 x 244] intentionally omitted <==**

**----- Start of picture text -----**<br>
70A<br>100A<br>Ic t p=2μs<br>60A<br>15μs<br>50A<br>10A 50μs<br>40A<br>T C=80°C<br>200μs<br>30A<br>20A T C=110°C 1A 1ms<br>10A Ic<br>DC<br>0A 0.1A<br>10Hz 100Hz 1kHz 10kHz 100kHz 1V 10V 100V 1000V<br>f , SWITCHING FREQUENCY V CE, COLLECTOR-EMITTER VOLTAGE, COLLECTOR-EMITTER VOLTAGECOLLECTOR-EMITTER VOLTAGE-EMITTER VOLTAGEEMITTER VOLTAGE<br>COLLECTOR CURRENT COLLECTOR CURRENT<br>,  ,<br>I C I C<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
V CE, COLLECTOR-EMITTER VOLTAGE, COLLECTOR-EMITTER VOLTAGECOLLECTOR-EMITTER VOLTAGE-EMITTER VOLTAGEEMITTER VOLTAGE<br>**----- End of picture text -----**<br>


**Figure 2. Safe operating area** 

**Figure 1. Collector current as a function of switching frequency** ( _T_ j ≤ 150°C, _D =_ 0.5, _V_ CE = 800V, 

( _D =_ 0, _T_ C = 25°C, _T_ j ≤ 150°C) 

_V_ GE = +15V/0V, _R_ G = 33Ω) 

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**----- Start of picture text -----**<br>
200W<br>175W<br>150W<br>125W<br>100W<br>75W<br>50W<br>25W<br>0W<br>25°C 50°C 75°C 100°C 125°C<br>T C, CASE TEMPERATURE<br>POWER DISSIPATION<br>tot,<br>P<br>**----- End of picture text -----**<br>


**Figure 3. Power dissipation as a function of case temperature** ( _T_ j ≤ 150°C) 

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**----- Start of picture text -----**<br>
35A<br>30A<br>25A<br>20A<br>15A<br>10A<br>5A<br>0A<br>25°C 50°C 75°C 100°C 125°C<br>T C, CASE TEMPERATURE<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**Figure 4. Collector current as a function of case temperature** ( _V_ GE ≤ 15V, _T_ j ≤ 150°C) 

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**==> picture [229 x 225] intentionally omitted <==**

**----- Start of picture text -----**<br>
50A<br>40A<br>V =17V<br>GE<br>15V<br>30A<br>13V<br>11V<br> 9V<br>20A<br> 7V<br>10A<br>0A<br>0V 1V 2V 3V 4V 5V 6V 7V<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


_V_ CE, COLLECTOR-EMITTER VOLTAGE 

**Figure 5. Typical output characteristics** ( _T_ j = 25°C) 

**==> picture [231 x 270] intentionally omitted <==**

**----- Start of picture text -----**<br>
50A<br>40A<br>30A<br>T J=+150°C<br>20A T J=+25°C<br>T J=-40°C<br>10A<br>0A<br>3V 5V 7V 9V 11V<br>V GE, GATE-EMITTER VOLTAGE<br>Figure 7. Typical transfer characteristics<br>( V CE = 20V)<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
50A<br>40A<br>V =17V<br>GE<br>15V<br>30A<br>13V<br>11V<br> 9V<br>20A<br> 7V<br>10A<br>0A<br>0V 1V 2V 3V 4V 5V 6V 7V<br>V CE, COLLECTOR-EMITTER VOLTAGE<br>Figure 6. Typical output characteristics<br>( T j = 150°C)<br>6V<br>5V<br>IC=30A<br>4V<br>IC=15A<br>3V<br>IC=7.5A<br>2V<br>1V<br>0V<br>-50°C 0°C 50°C 100°C 150°C<br>T j, JUNCTION TEMPERATURE<br>COLLECTOR CURRENT<br>,<br>I C<br>EMITTER SATURATION VOLTAGE<br>-<br>COLLECTOR<br>,<br>CE(sat)<br>V<br>**----- End of picture text -----**<br>


**Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature** ( _V_ GE = 15V) 

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**==> picture [222 x 237] intentionally omitted <==**

**----- Start of picture text -----**<br>
1000ns<br>t<br>d(off)<br>100ns<br>t f t d(on)<br>t r<br>10ns<br>0A 10A 20A 30A 40A<br>I C, COLLECTOR CURRENT<br>SWITCHING TIMES<br>t ,<br>**----- End of picture text -----**<br>


**Figure 9. Typical switching times as a function of collector current** (inductive load, _T_ j = 150°C, _V_ CE = 800V, _V_ GE = +15V/0V, _R_ G = 33 Ω, dynamic test circuit in Fig.E ) 

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**----- Start of picture text -----**<br>
1000ns<br>t<br>d(off)<br>100ns<br>t<br>d(on)<br>t r<br>t f<br>10ns<br>-50°C 0°C 50°C 100°C 150°C<br>SWITCHING TIMES<br>t ,<br>**----- End of picture text -----**<br>


_T_ j, JUNCTION TEMPERATURE 

**Figure 11. Typical switching times as a function of junction temperature** (inductive load, _V_ CE = 800V, _V_ GE = +15V/0V, _I_ C = 15A, _R_ G = 33 Ω, dynamic test circuit in Fig.E ) 

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**----- Start of picture text -----**<br>
1000ns<br>t<br>d(off)<br>100ns<br>t<br>d(on)<br>t f<br>t r<br>10ns<br>0Ω 25Ω 50Ω<br>R G, GATE RESISTOR<br>SWITCHING TIMES<br>t ,<br>**----- End of picture text -----**<br>


**Figure 10. Typical switching times as a function of gate resistor** 

(inductive load, _T_ j = 150°C, 

_V_ CE = 800V, _V_ GE = +15V/0V, _I_ C = 15A, dynamic test circuit in Fig.E ) 

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**----- Start of picture text -----**<br>
6V<br>5V<br>max.<br>4V<br>typ.<br>3V<br>min.<br>2V<br>1V<br>0V<br>-50°C 0°C 50°C 100°C 150°C<br>T j, JUNCTION TEMPERATURE<br>EMITTER THRESHOLD VOLTAGE<br>-<br>GATE<br>,<br>GE(th)<br>V<br>**----- End of picture text -----**<br>


**Figure 12. Gate-emitter threshold voltage as a function of junction temperature** ( _I_ C = 0.3mA) 

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**==> picture [227 x 238] intentionally omitted <==**

**----- Start of picture text -----**<br>
14mJ<br>*)  E on and  E ts include losses<br>due to  diode recovery.<br>12mJ<br>E *<br>ts<br>10mJ<br>8mJ<br>E *<br>on<br>6mJ<br>4mJ E<br>off<br>2mJ<br>0mJ<br>0A 10A 20A 30A 40A 50A<br>I C, COLLECTOR CURRENT<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>**----- End of picture text -----**<br>


**Figure 13. Typical switching energy losses as a function of collector current** (inductive load, _T_ j = 150°C, _V_ CE = 800V, _V_ GE = +15V/0V, _R_ G = 33 Ω, dynamic test circuit in Fig.E ) 

**==> picture [222 x 244] intentionally omitted <==**

**----- Start of picture text -----**<br>
4mJ<br>due to  diode recovery. *)  E on and  E ts include losses  E ts*<br>3mJ<br>E *<br>2mJ on<br>E<br>off<br>1mJ<br>0mJ<br>-50°C 0°C 50°C 100°C 150°C<br>T j, JUNCTION TEMPERATURE<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>**----- End of picture text -----**<br>


**Figure 15. Typical switching energy losses as a function of junction temperature** (inductive load, _V_ CE = 800V, _V_ GE = +15V/0V, _I_ C = 15A, _R_ G = 33 Ω, dynamic test circuit in Fig.E ) 

**==> picture [227 x 238] intentionally omitted <==**

**----- Start of picture text -----**<br>
5mJ<br>*)  E on and  E ts include losses<br>due to diode recovery.<br>E *<br>ts<br>4mJ<br>3mJ<br>E *<br>on<br>2mJ<br>E<br>off<br>1mJ<br>0mJ<br>0Ω 25Ω 50Ω 75Ω<br>R G, GATE RESISTOR<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>**----- End of picture text -----**<br>


**Figure 14. Typical switching energy losses as a function of gate resistor** (inductive load, _T_ j = 150°C, 

_V_ CE = 800V, _V_ GE = +15V/0V, _I_ C = 15A, dynamic test circuit in Fig.E ) 

**==> picture [234 x 239] intentionally omitted <==**

**----- Start of picture text -----**<br>
D =0.5<br>0.2<br>10-1K/W<br>0.1<br>0.05<br>R , ( K / W ) τ , ( s )<br>0.02<br>0.09751  0.67774<br>-2 0.29508 0.11191<br>10 K/W 0.01<br>0.13241  0.00656<br>0.10485  0.00069<br>R 1 R 2<br>10-3K/W<br>single pulse<br>C 1=τ1/ R 1 C 2=τ2/ R 2<br>1µs 10µs 100µs 1ms 10ms 100ms 1s<br>t p, PULSE WIDTH<br>TRANSIENT THERMAL IMPEDANCE<br>,<br>thJC<br>Z<br>**----- End of picture text -----**<br>


**Figure 16. IGBT transient thermal impedance as a function of pulse width** ( _D_ = _t_ p / _T_ ) 

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**==> picture [222 x 236] intentionally omitted <==**

**----- Start of picture text -----**<br>
20V<br>15V<br>UCE=960V<br>10V<br>5V<br>0V<br>0nC 50nC 100nC 150nC<br>Q GE, GATE CHARGE<br>EMITTER VOLTAGE<br>-<br>GATE<br>,<br>GE<br>V<br>**----- End of picture text -----**<br>


**Figure 17. Typical gate charge** ( _I_ C = 15A) 

**==> picture [226 x 235] intentionally omitted <==**

**----- Start of picture text -----**<br>
30μs<br>20μs<br>10μs<br>0μs<br>10V 11V 12V 13V 14V 15V<br>V GE, GATE-EMITTER VOLTAGE<br>SHORT CIRCUIT WITHSTAND TIME<br>,<br>t sc<br>**----- End of picture text -----**<br>


**Figure 19. Short circuit withstand time as a function of gate-emitter voltage** ( _V_ CE = 1200V, start at _T_ j = 25°C) 

**==> picture [228 x 534] intentionally omitted <==**

**----- Start of picture text -----**<br>
C iss<br>1nF<br>100pF<br>C oss<br>C rss<br>0V 10V 20V 30V<br>V CE, COLLECTOR-EMITTER VOLTAGE<br>Figure 18. Typical capacitance as a<br>function of collector-emitter voltage<br>( V GE = 0V,  f  = 1MHz)<br>300A<br>250A<br>200A<br>150A<br>100A<br>50A<br>0A<br>10V 12V 14V 16V 18V 20V<br>V GE, GATE-EMITTER VOLTAGE<br>CAPACITANCE<br>,<br>C<br>SHORT CIRCUIT COLLECTOR CURRENT<br>,<br>I C(sc)<br>**----- End of picture text -----**<br>


**Figure 20. Typical short circuit collector current as a function of gate-emitter voltage** (100V≤ _V_ CE ≤1200V, _T_ C = 25°C, _T_ j ≤ 150°C) 

Rev. 2.5     Febr. 08 

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## SGP15N120 SGW15N120 

**==> picture [67 x 9] intentionally omitted <==**

**----- Start of picture text -----**<br>
PG-TO220-3-1<br>**----- End of picture text -----**<br>


Rev. 2.5     Febr. 08 

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PG-TO247-3 

Rev. 2.5     Febr. 08 

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**==> picture [285 x 284] intentionally omitted <==**

**Figure A. Definition of switching times** 

**==> picture [286 x 284] intentionally omitted <==**

**Figure B. Definition of switching losses** 

**==> picture [189 x 328] intentionally omitted <==**

**----- Start of picture text -----**<br>
i,v<br>di F /dt t r r =t S + t F<br>Q r r =Q S + Q F<br>t<br>r r<br>I F t S t F<br>I Q S Q F 10%  I r r m t<br>r r m 90%  I di r r /dt V R<br>r r m<br>Figure C. Definition of diodes<br>switching characteristics<br>τ1 τ2 τn<br>r1 r 2 r n<br>Tj (t)<br>p(t) r1 r 2 r n<br>TC<br>**----- End of picture text -----**<br>


**Figure D. Thermal equivalent circuit** 

**==> picture [170 x 194] intentionally omitted <==**

**Figure E. Dynamic test circuit** Leakage inductance Lσ=180nH, and stray capacity  Cσ =40pF. 

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## **Edition 2006-01** 

## **Published by Infineon Technologies AG 81726 München, Germany** 

## **© Infineon Technologies AG 2/14/08. All Rights Reserved.** 

## **Attention please!** 

The information given in this data sheet shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

## **Information** 

For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office ( **www.infineon.com** ). 

## **Warnings** 

Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. 

Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. 

Rev. 2.5     Febr. 08 

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