# Power MOSFET, P Channel, 60 V, 7.8 A, 0.28 ohm, TO-252 (DPAK), Surface Mount

![Product image](https://novapart.co/image/farnell:1505547/)

**URL**: https://novapart.co/products/SFR9024TM/power-mosfet-p-channel-60-v-78-a-028-ohm-to-252
**SKU**: SFR9024TM
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.2090
**Stock**: 10+

## Description

Transistor Polarity:P Channel; Continuous Drain Current Id:-7.8A; Drain Source Voltage Vds:-60V; On Resistance Rds(on):0.28ohm; Rds(on) Test Voltage Vgs:-10V; Threshold Voltage Vgs:-4V; Power Dissip

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | P Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 32W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-252 (DPAK) |
| Drain Source Voltage Vds | 60V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 7.8A |
| Drain Source On State Resistance | 0.28ohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:1505547/)

## **Advanced  Power  MOSFET** 

## **SFR/U9024** 

## **FEATURES** 

- n Avalanche  Rugged  Technology 

- n Rugged  Gate  Oxide  Technology 

- n Lower  Input  Capacitance 

- n Improved  Gate  Charge 

- n Extended  Safe  Operating  Area 

- n Lower  Leakage  Current  :  10 µA (Max.)  @  VDS = -60V 

- n Lower  RDS(ON) :  0.206 Ω (Typ.) 

**==> picture [93 x 145] intentionally omitted <==**

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BVDSS =  -60 V<br>R =  0.28 Ω<br>DS(on)<br>ID =  -7.8 A<br>D-PAK I-PAK<br>2<br>1 1<br>3 23<br>1. Gate  2. Drain  3. Source<br>**----- End of picture text -----**<br>


## **Absolute  Maximum  Ratings** 

|**Symbol**|**Characteristic**|**Value**|**Units**|
|---|---|---|---|
|**Symbol**<br>VDSS|Drain-to-Source Voltage|-60|V|
|ID|Continuous  Drain  Current  (TC=25<br>oC)<br>Continuous  Drain  Current  (TC=100<br>oC)|-7.8<br>-5.5|A|
|IDM|Drain  Current-Pulsed<br>O1|31|A|
|VGS|Gate-to-Source  Voltage|±30|V|
|EAS|Single  Pulsed  Avalanche  Energy<br>O<br>2|155|mJ|
|IAR|Avalanche  Current<br>O1|-7.8|A|
|EAR|Repetitive  Avalanche  Energy<br>O1|3.2|mJ|
|dv/dt|Peak  Diode  Recovery dv/dt<br>O<br>3|-5.5|V/ns|
|PD|Total  Power  Dissipation(TA=25<br>oC)<br>*|2.5|W|
||Total  Power  Dissipation  (TC=25<br>oC)<br>Linear Derating Factor|32<br>0.26|W<br>W/<br>oC|
|TJ, TSTG<br>TL|Operating  Junction  and<br>Storage  Temperature  Range<br>Maximum  Lead  Temp.  for  Soldering<br>Purposes,  1/8” from  case  for  5-seconds|- 55  to  +150<br>300|oC|



## **Thermal  Resistance** 

|RθJC<br>**Symbol**|Junction-to-Case<br>**Characteristic**|--<br>**Typ.**|3.91<br>**Max.**|oC/W<br>**Units**|
|---|---|---|---|---|
|RθJA|Junction-to-Ambient<br>*|--|50||
|RθJA|Junction-to-Ambient|--|110||



* When  mounted  on  the  minimum  pad  size  recommended (PCB  Mount). 

Rev. C 

**P-CHANNEL POWER MOSFET** 

## **SFR/U9024** 

## **Electrical Characteristics** (TC=25[o] C  unless  otherwise  specified) 

|**Electri**|**cal Characteristics**(TC=25oC|unle|ss  ot|herwi|se  sp|ecified)|
|---|---|---|---|---|---|---|
|**Symbol**|**Characteristic**|**Min.**|**Typ.**|**Max. **|**Units**|**Test  Condition**|
|BVDSS|Drain-Source  Breakdown  Voltage|-60|--|--|V|VGS=0V,ID=-250µA|
|∆BV/∆TJ|<br>Breakdown  Voltage  Temp. Coeff.|--|-0.04|--|V/<br>oC|ID=-250µA**_See Fig 7_**|
|VGS(th)|Gate  Threshold  Voltage|-2.0|--|-4.0|V|VDS=-5V,ID=-250µA|
|IGSS|Gate-Source  Leakage ,  Forward|--|--|-100|nA|VGS=-20V|
||<br>Gate-Source  Leakage ,  Reverse|--|--|100||VGS=20V|
|IDSS|Drain-to-Source  Leakage  Current|--|--|-10|µA|VDS=-60V|
|||--|--|-100||VDS=-48V,TC=125<br>oC|
|RDS(on)|Static  Drain-Source<br>On-State  Resistance|--|--|0.28|Ω|VGS=-10V,ID=-3.9A<br>O<br>4|
|gfs|Forward  Transconductance|--|3.7|--|S|VDS=-30V,ID=-3.9A<br>O<br>4|
|Ciss<br>Coss|Input  Capacitance<br>Output  Capacitance|--<br>--|140<br>465|600<br>215|pF|VGS=0V,VDS=-25V,f =1MHz<br>**_See Fig 5_**|
|Crss|Reverse  Transfer  Capacitance|--|40|60|||
|td(on)|Turn-On  Delay  Time|--|11|30|ns|VDD=-30V,ID=-9.7A,<br>RG=18<br>**_See Fig 13_**<br>Ω<br>O<br>5<br>O<br>4|
|tr|Rise  Time|--|21|50|||
|td(off)|Turn-Off  Delay  Time|--|29|65|||
|tf|Fall  Time|--|20|50|||
|Qg|Total  Gate  Charge|--|15|19|nC|VDS=-48V,VGS=-10V,<br>ID=-9.7A<br>**_See Fig 6 & Fig 12_**<br>O<br>5<br>O<br>4|
|Qgs|Gate-Source  Charge|--|2.9|--|||
|Qgd|Gate-Drain(“Miller”) Charge|--|6.0|--|||



## **Source-Drain  Diode  Ratings  and  Characteristics** 

|**Symbol**|**Characteristic**|**Min.**|**Typ.**|**Max. **|**Units**|**Test  Condition**|
|---|---|---|---|---|---|---|
|IS|Continuous  Source  Current|--|--|-7.8|A|Integral reverse pn-diode<br>in the MOSFET|
|ISM|Pulsed-Source  Current<br>O1|--|--|-31|||
|VSD|Diode  Forward  Voltage<br>O<br>4|--|--|-3.8|V|TJ=25<br>oC,IS=-7.8A,VGS=0V|
|trr|Reverse  Recovery  Time|--|80|--|ns|TJ=25<br>oC,IF=-9.7A<br>diF/dt=100A/µs<br>O<br>4|
|Qrr|Reverse  Recovery  Charge|--|0.22|--|µC||



## **Notes ;** 

O[1] Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature O2 L=3.0mH, IAS=-7.8A, VDD=-25V, RG=27Ω*, Starting TJ =25[o] C O3 ISD      _< -9.7A, di/dt _< 250A/µs, VDD _< BVDSS , Starting TJ =25[o] C O4 Pulse Test : Pulse Width = 250µs, Duty Cycle    2%_< O5 Essentially Independent of Operating Temperature 

**SFR/U9024** 

## **P-CHANNEL POWER MOSFET** 

**Fig 1.  Output Characteristics** 

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                     VGS<br>Top  :          - 15 V<br>                   - 10 V<br>                  - 8.0 V<br>10 [1]                   - 7.0 V<br>                  - 6.0 V<br>                  - 5.5 V<br>                  - 5.0 V<br>Bottom  :   -  4.5 V<br>10 [0]<br>@ Notes :<br>  1. 250  µ s Pulse Test<br>  2. TC = 25 oC<br>10 [-1]<br>10 [-1] 10 [0] 10 [1]<br>-VDS , Drain-Source Voltage  [V]<br> , Drain Current  [A]-ID<br>**----- End of picture text -----**<br>


**Fig 2.  Transfer Characteristics** 

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**----- Start of picture text -----**<br>
10 [1]<br>150 oC<br>10 [0]<br>25 oC @ Notes :<br>  1. VGS = 0 V<br>  2. VDS = -30 V<br>- 55 oC   3. 250  µ s Pulse Test<br>10 [-1]<br>2 4 6 8 10<br>-VGS , Gate-Source Voltage  [V]<br> , Drain Current  [A]-ID<br>**----- End of picture text -----**<br>


**Fig 3.  On-Resistance vs. Drain Current** 

**Fig 4.  Source-Drain Diode Forward Voltage** 

**==> picture [431 x 340] intentionally omitted <==**

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0.40<br>0.35<br>10 [[1]]<br>0.30<br>VGS = -10 V<br>0.25<br>10 [[0]]<br>0.20<br>150 oCoCC<br>@ Notes :<br>0.15 VGS = -20 V @ Note : TJ = 25  [o] C 25 oCoCC   1. V  2. 250 GS = 0 V  2. 250 GS = 0 V µ s Pulse Test<br>0.10 10 [[-1]]<br>0 5 10 15 20 25 30 35 40 0.5 1.0 1.5 2.0 2.5 3.0 3.5<br>-ID , Drain Current  [A] -VSD , Source-Drain Voltage  [V]SD , Source-Drain Voltage  [V] , Source-Drain Voltage  [V]<br>Fig 5.  Capacitance vs. Drain-Source Voltage Fig 6.  Gate Charge vs. Gate-Source Voltage<br>800<br>Ciss= Cgs+ Cgd ( Cds= shorted )<br>Coss= Cds+ Cgd 10 VDS = -12 V<br>600 C iss Crss= Cgd VDSV = -48 VDS = -30 V<br>C oss<br>400<br>@ Notes : 5<br>  1. VGS = 0 V<br>  2. f = 1 MHz<br>200 C rss<br>@ Notes : ID =-9.7 A<br>0 0<br>10 [0] 10 [1] 0 4 8 12 16<br>-VDS , Drain-Source Voltage [V] QG , Total Gate Charge  [nC]<br>]<br>Ω<br> , [<br>DS(on)<br>R<br>Drain-Source On-Resistance<br> , Reverse Drain Current  [A]<br>DR<br>-I<br>Capacitance  [pF]<br> , Gate-Source Voltage  [V]<br>GS<br>-V<br>**----- End of picture text -----**<br>


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10 [[1]]<br>10 [[0]]<br>150 oCoCC<br>@ Notes :<br>GS = 0 V = 0 V<br>25 oCoCC   1. V  2. 250 GS = 0 V  2. 250 GS = 0 V µ s Pulse Test<br>10 [[-1]]<br>0.5 1.0 1.5 2.0 2.5 3.0 3.5<br>-VSD , Source-Drain Voltage  [V]SD , Source-Drain Voltage  [V] , Source-Drain Voltage  [V]<br> , Reverse Drain Current  [A]<br>DR<br>-I<br>**----- End of picture text -----**<br>


**P-CHANNEL POWER MOSFET** 

## **SFR/U9024** 

**Fig 8.  On-Resistance vs. Temperature** 

**==> picture [432 x 160] intentionally omitted <==**

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Fig 7.  Breakdown Voltage vs. Temperature Fig 8.  On-Resistance vs. Temperature<br>1.2 2.5<br>2.0<br>1.1<br>1.5<br>1.0<br>1.0<br>0.9 @ Notes : @ Notes :<br>  1. V  2. IGSD = -250  = 0 V µ A 0.5   1. V  2. IGSD = -4.9 A = -10 V<br>0.8 0.0<br>-75 -50 -25 0 25 50 75 100 125 150 175 -75 -50 -25 0 25 50 75 100 125 150 175 200<br>TJ , Junction Temperature  [ [o] C] TJ , Junction Temperature  [ [o] C]<br> , (Normalized)  , (Normalized)<br>-BVDSS RDS(on)<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br>**----- End of picture text -----**<br>


**Fig 9.  Max. Safe Operating Area** 

**Fig 10.  Max. Drain Current vs. Case Temperature** 

**==> picture [425 x 335] intentionally omitted <==**

**----- Start of picture text -----**<br>
8<br>Operation in This Area<br>10 [2] is Limited by R DS(on)<br>6<br>0.1 ms<br>10 [1] 1 ms<br>4<br>10 ms<br>DC<br>@ Notes :<br>10 [0]   1. TC = 25  [o] C<br>  2. TJ = 150  [o] C 2<br>  3. Single Pulse<br>10 [-1] 0<br>10 [0] 10 [1] 10 [2] 25 50 75 100 125 150<br>-VDS , Drain-Source Voltage  [V] Tc , Case Temperature  [ [o] C]<br>Fig 11.  Thermal Response<br>D=0.5<br>@ Notes :<br>10 [0] 0.2   1. Z θ JC (t)=3.91 o C/W Max.<br>  2. Duty Factor, D=t1 /t2<br>0.1   3. TJM -TC =PDM *Z θ JC (t)<br>0.05 P.DM<br>0.02<br>10 [-1] 0.01 t1.t2.<br>single pulse<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t1 , Square Wave Pulse Duration  [sec]<br> , Drain Current  [A]-ID<br> , Drain Current  [A]-ID<br>(t) ,  Thermal Response<br>Z JC θ<br>**----- End of picture text -----**<br>


**SFR/U9024** 

## **P-CHANNEL POWER MOSFET** 

**Fig 12.  Gate Charge Test Circuit  &  Waveform** 

**==> picture [385 x 177] intentionally omitted <==**

**----- Start of picture text -----**<br>
“ Current Regulator ”<br>Same Type VGS<br>50K Ω as DUT<br>Qg<br>12V 200nF<br>300nF -10V<br>VDS<br>VGS Qgs Qgd<br>DUT<br>-3mA<br>R1 R2<br>Charge<br>Current Sampling (IG) Current Sampling (ID)<br>Resistor Resistor<br>**----- End of picture text -----**<br>


**Fig 13.  Resistive Switching Test Circuit  &  Waveforms** 

**==> picture [439 x 290] intentionally omitted <==**

**----- Start of picture text -----**<br>
RL<br>Vout td(on) t on tr td(off) t off tf<br>Vin VDD<br>( 0.5 rated VDS ) Vin<br>RG 10%<br>DUT<br>-10V<br>90%<br>Vout<br>Fig 14.  Unclamped Inductive Switching Test Circuit  &  Waveforms<br>VDS LL EAS = ----12 LL IAS2 --------------------BVBVDSS -- VDSS DD<br>Vary tp to obtain ID t p Time<br>required peak ID<br>VDD VDS (t)<br>RG C VDD ID (t)<br>DUT<br>-10V IAS<br>t p BVDSS<br>**----- End of picture text -----**<br>


**P-CHANNEL POWER MOSFET** 

## **SFR/U9024** 

## **Fig 15.  Peak Diode Recovery dv/dt Test Circuit  &  Waveforms** 

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+<br>VDS<br>DUT<br>--<br>I S<br>L<br>Driver<br>VGS<br>RG Compliment of DUT(N-Channel) VDD<br>VGS • dv/dt controlled by “RG”<br>• IS controlled by Duty Factor “D”<br>Gate Pulse Width<br>VGS D = --------------------------Gate Pulse Period 10V<br>( Driver )<br>Body Diode Reverse Current<br>I S IRM<br>( DUT )<br>di/dt<br>IFM , Body Diode Forward Current<br>Vf<br>VDS<br>( DUT )<br>Body Diode VDD<br>Forward Voltage Drop<br>Body Diode Recovery dv/dt<br>**----- End of picture text -----**<br>


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TRADEMARKS<br>**----- End of picture text -----**<br>


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The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is<br>not intended to be an exhaustive list of all such trademarks.<br>ACEx™ FACT™ ImpliedDisconnect™ PACMAN™ SPM™<br>ActiveArray™ FACT Quiet Series™ ISOPLANAR™ POP™ Stealth™<br>Bottomless™ FAST® LittlkeFET™ Power247™ SuperSOT™-3<br>CoolFET™ FASTr™ MicroFET™ PowerTrench® SuperSOT™-6<br>CROSSVOLT™ FRFET™ MicroPak™ QFET™ SuperSOT ™-8<br>DOME™ GlobalOptoisolator™ MICROWIRE™ qas™ SyncFET™<br>EcoSPARK™ GTOo™ MSX™ QT Optoelectronics™ TinyLogic™<br>E?CMOS™ HiSeC™ MSXPro™ Quiet Series™ TruTranslation™<br>EnSigna™ 2co™ OCX™ RapidConfigure™ UHC™<br>Across the board. Around the world.™ OCXPro™ RapidConnect™ UltraFET®<br>The Power Franchise™ OPTOLOGIC® SILENT SWITCHER® VCX™<br>Programmable Active Droop™ OPTOPLANAR™ SMART START™<br>DISCLAIMER<br>FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER<br>NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD<br>DOES NOTASSUMEANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT<br>OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT<br>RIGHTS, NOR THE RIGHTS OF OTHERS.<br>LIFE SUPPORT POLICY<br>FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT<br>DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTENAPPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.<br>As used herein:<br>1. Life support devices or systems are devices or 2. A critical component is any component of a life<br>systems which, (a) are intended for surgical implant into support device or system whose failure to perform can<br>the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life<br>failure to perform when properly used in accordance support device or system, or to affect its safety or<br>with instructions for use provided in the labeling, can be effectiveness.<br>reasonably expected to result in significant injury to the<br>user.<br>PRODUCT STATUS DEFINITIONS<br>Definition of Terms<br>Advance Information Formative or This datasheet contains the design specifications for<br>In Design product development. Specifications may change in<br>any manner without notice.<br>Preliminary First Production This datasheet contains preliminary data, and<br>supplementary data will be published at a later date.<br>Fairchild Semiconductor reserves the right to make<br>changes at any time without notice in order to improve<br>design.<br>No Identification Needed Full Production This datasheet contains final specifications. Fairchild<br>Semiconductor reserves the right to make changes at<br>any time without notice in order to improve design.<br>Obsolete Not In Production This datasheet contains specifications on a product<br>that has been discontinued by Fairchild semiconductor.<br>The datasheet is printed for reference information only.<br>Rev. I1<br>**----- End of picture text -----**<br>




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