# Power MOSFET, P Channel, 100 V, 17 A, 0.2 ohm, TO-220, Through Hole

![Product image](https://novapart.co/image/farnell:1505544/)

**URL**: https://novapart.co/products/SFP9540/power-mosfet-p-channel-100-v-17-a-02-ohm-to-220
**SKU**: SFP9540
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.3480
**Stock**: 10+

## Description

Transistor Polarity:P Channel; Continuous Drain Current Id:-17A; Drain Source Voltage Vds:-100V; On Resistance Rds(on):0.2ohm; Rds(on) Test Voltage Vgs:-10V; Threshold Voltage Vgs:-4V; Power Dissipa

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | P Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 132W |
| Transistor Mounting | Through Hole |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-220 |
| Drain Source Voltage Vds | 100V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 17A |
| Drain Source On State Resistance | 0.2ohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:1505544/)

**SFP9540** 

## **Advanced  Power  MOSFET** 

## **FEATURES** 

- n Avalanche  Rugged  Technology 

- n Rugged  Gate  Oxide  Technology 

- n Lower  Input  Capacitance 

- n Improved  Gate  Charge 

- n 175oC Opereting Temperature 

- n Extended  Safe  Operating  Area 

- n Lower  Leakage  Current  :  -10 µA (Max.)  @  VDS = -100V 

- n Low RDS(ON) :  0.161 Ω (Typ.) 

|BVDSS =  -100 V|
|---|
|RDS(on)=  0.2<br>Ω|
|ID =  -17 A|
|**TO-220**<br>**2**<br>**1**<br>Ee|
|**3**|
|**1.Gate  2. Drain  3. Source**|



## **Absolute  Maximum  Ratings** 

|**Symbol**<br>SS|**Characteristic**<br>++_§__+—<br>po|**Value**<br>++_§__+—|**Units**<br>++_§__+—<br>ee|
|---|---|---|---|
|VDSS<br>SS|Drain-to-Source Voltage<br>++_§__+—<br>po|-100<br>++_§__+—<br>ee|V<br>++_§__+—<br>ee<br>ee|
|ID<br>SS<br>ee|Continuous  Drain  Current  (TC=25<br>oC)<br>++_§__+—<br>po<br>ee|-17<br>++_§__+—<br>ee|A<br>++_§__+—<br>ee|
||Continuous  Drain  Current  (TC=100<br>oC)<br>ee|-12<br>ee||
|IDM<br>ee<br>——|Drain  Current-Pulsed<br>O1<br>ee|-68<br>ee<br>re|A|
|VGS<br>ee<br>—<br>——<br>—__—_______|Gate-to-Source  Voltage<br>ee<br>—__—_______ee|±30<br>ee<br>re<br>ee|V|
|EAS<br>—<br>——<br>—__—_______<br>—}—________|Single  Pulsed  Avalanche  Energy<br>O<br>2<br>—__—_______ee<br>—}—________ee|578<br>re<br>ee<br>ee|mJ<br>ee|
|IAR<br>——<br>—__—_______<br>—}—________<br>nn|Avalanche  Current<br>O1<br>—__—_______ee<br>—}—________ee|-17<br>re<br>ee<br>ee<br>ee|A<br>ee|
|EAR<br>——<br>—__—_______<br>—}—________<br>nn|Repetitive  Avalanche  Energy<br>O1<br>—__—_______ee<br>—}—________ee|13.2<br>re<br>ee<br>ee<br>ee|mJ<br>ee|
|dv/dt<br>—__—_______<br>—}—________<br>nn|Peak  Diode  Recovery dv/dt<br>O<br>3<br>—__—_______ee<br>—}—________ee|-6.5<br>ee<br>ee<br>ee<br>ee|V/ns<br>ee<br>ee|
|PD<br>—}—________<br>nn|Total  Power  Dissipation  (TC=25<br>oC)<br>Linear Derating Factor<br>—}—________ee<br>es|132<br>0.88<br>ee <br>ee<br>es<br>ee|W<br>W/<br>oC<br> ee<br>es<br>ee|
|TJ, TSTG<br>TL<br>nn|Operating  Junction  and<br>Storage  Temperature  Range<br>Maximum  Lead  Temp.  for  Soldering<br>Purposes,<br>from  case  for  5-seconds<br>1/8”|- 55  to  +175<br>300<br>ee<br>ee|oC<br> ee|



## **Thermal  Resistance** 

|RθJC<br>**Symbol**|Junction-to-Case<br>**Characteristic**|--<br>**Typ.**|1.14<br>**Max.**|oC/W<br>**Units**|
|---|---|---|---|---|
|RθCS|Case-to-Sink|0.5|--||
|RθJA|Junction-to-Ambient|--|62.5||



Rev. C 

**P-CHANNEL POWER MOSFET** 

## **SFP9540** 

## **Electrical Characteristics** (TC=25[o] C  unless  otherwise  specified) 

|ee|eesGs|Gs|esCs|Cs|es||
|---|---|---|---|---|---|---|
|**Symbol**<br>ee<br>ee<br>ee|**Characteristic**<br>eesGs<br>es|**Min.**<br>Gs<br>es<br>es|**Typ.**<br>esCs<br>es<br>es|**Max. **<br>Cs<br>es<br>esGs|**Units**<br>es<br>es<br>Gs|**Test  Condition**<br>es|
|BVDSS<br>ee<br>ee<br>ee<br>ee|Drain-Source  Breakdown  Voltage<br>eesGs<br>es<br>es|-100<br>Gs <br>es<br>es<br>ee|--<br> esCs<br>es<br>es<br>**G**sGe|--<br>Cs <br>es<br>esGs<br>GeGs|V<br> es<br>es<br>Gs<br>Gs|VGS=0V,ID=-250µA<br>es|
|∆BV/∆TJ<br>ee<br>ee<br>ee|Drain-Source  Breakdown  Voltage<br>Breakdown  Voltage  Temp. Coeff.<br>es<br>es<br>esOs|--<br>es<br>es<br>ee<br>Os|-0.11<br>es<br>es<br>**G**sGe<br>e|--<br>es<br>esGs<br>GeGs<br>ee|V/<br>oC<br>es<br>Gs<br>Gs|ID=-250µA**_See Fig 7_**<br>es|
|VGS(th)<br>ee<br>ee|Gate  Threshold  Voltage<br>es<br>esOs|-2.0<br>es <br>ee<br>Os|--<br> es <br>**G**sGe<br>e|-4.0<br> esGs<br>GeGs<br>ee|V<br>Gs<br>Gs|VDS=-5V,ID=-250µA|
|IGSS<br>ee<br>ee|Gate-Source  Leakage ,  Forward<br>es <br>esOs<br>ee<br>ee|--<br> ee <br>Os <br>ee<br>ee|--<br> **G**sGe<br> e <br>ee<br>ee|-100<br>GeGs<br> ee<br>ee|nA<br>Gs<br>ee|VGS=-20V<br>ee<br>Po|
||Gate-Source  Leakage ,  Forward<br>Gate-Source  Leakage ,  Reverse<br>ee<br>ee|--<br>ee<br>ee|--<br>ee<br>ee|100<br>ee||VGS=20V<br>ee<br>Po|
|IDSS<br>~~a~~<br>~~ee~~<br>a|Drain-to-Source  Leakage  Current<br>ee <br>~~a~~<br>~~ee~~<br>|--<br> ee <br>~~a~~<br>|--<br> ee<br>~~a~~<br>es<br>|-10<br>~~a~~<br>es<br>|µA<br>~~a~~<br>~~ee~~<br>es<br>|VDS=-100V<br>Po<br>~~a~~<br>|
|||--<br>~~a~~<br>~~ee~~<br>|--<br>~~a~~<br>~~ee~~<br>es<br>|-100<br>~~a~~<br>~~ee~~<br>es<br>||VDS=-80V,TC=150<br>oC<br>~~a~~<br>~~ee~~<br>|
|RDS(on)<br>~~ee~~<br>a<br>a|Static  Drain-Source<br>On-State  Resistance<br>~~ee~~<br><br>|--<br>~~ee~~<br><br>Gs<br>|--<br>~~ee~~<br>es<br><br>Gs<br>|0.2<br>~~ee~~<br>es<br><br>GO<br>|Ω<br>~~ee~~<br>es<br><br>GO|VGS=-10V,ID=-8.5A<br>O<br>4<br>~~ee~~<br>|
|gfs<br>aes<br>a<br>a|Forward  Transconductance<br>es<br><br>|--<br>es<br>Gs<br><br>ee<br>|9.5<br>es<br>es<br>Gs<br><br>ee<br>|--<br>es<br>es<br>GO<br><br>ee<br>|S<br>es<br>es<br>GO<br>ee|VDS=-40V,ID=-8.5A<br>O<br>4<br>es|
|Ciss<br>Coss<br>a <br>a <br>ae<br>a|Input  Capacitance<br>Output  Capacitance<br> ee<br> ee<br><br>|--<br>--<br>Gs<br>ee<br>ee <br>ee<br>ee<br><br>es<br>|240<br>1180<br>Gs <br>ee<br> ee <br>ee<br>ee<br><br>es<br>|1535<br>360<br> GO<br>ee<br> ee<br>ee<br><br>|pF<br>GO<br>ee|VGS=0V,VDS=-25V,f =1MHz<br>**_See Fig 5_**|
|Crss<br>ae<br>a<br>ae|Reverse  Transfer  Capacitance<br>ee<br><br>|--<br>ee<br>ee<br>es<br><br>Geee<br>|83<br>ee<br>ee<br>es<br><br>ee<br>|125<br>ee<br><br>|||
|td(on)<br>ae<br>a <br>ae<br>ae|Turn-On  Delay  Time<br><br> es<br><br>|--<br>ee <br><br>es <br>es<br>Geee<br><br>Gs<br>|14<br> ee<br><br> es<br>es<br>ee<br><br>es<br>|40<br><br>es<br><br>|ns|VDD=-50V,ID=-17A,<br>RG=12<br>**_See Fig 13_**<br>O<br>4<br>O<br>5<br>Ω|
|tr<br>ae<br>ae<br>a|Rise  Time<br>ee<br><br>|--<br>Geee<br>ee<br>Gs<br><br>Gs<br>|22<br>ee<br>ee<br>es<br><br>es<br>|55<br>ee<br><br>|||
|td(off)<br>ae<br>ae<br>a<br>a|Turn-Off  Delay  Time<br><br>ee<br><br>|--<br>Geee<br><br>Gs<br>ee<br>Gs<br><br>Geee<br>|45<br>ee<br><br>es<br>ee<br>es<br><br>ee<br>|100<br><br>ee<br>|||
|tf<br>ae<br>a <br>a<br>a|Fall  Time<br><br> es<br><br>|--<br>Gs <br><br>Gs <br>es<br>Geee<br><br>ee<br>|26<br> es<br><br> es<br>es<br>ee<br><br>ee<br>|60<br><br>es|||
|Qg<br>a <br>a<br>~~a~~|Total  Gate  Charge<br> ee<br><br>|--<br>Geee<br>ee<br>ee<br><br>~~ee~~<br>|43<br>ee<br>ee<br>ee<br><br>|54|nC|VDS=-80V,VGS=-10V,<br>ID=-17A<br>**_See Fig 6 & Fig 12_**<br>O<br>4<br>O<br>5|
|Qgs<br>a <br>~~a~~|Gate-Source  Charge<br> ee<br>|--<br>ee <br>ee<br>~~ee~~<br><br>ee|7.4<br> ee<br>ee<br>|--|||
|Qgd<br>~~a ~~|Gate-Drain( “Miller “ )  Charge<br> ~~ee~~|--<br>~~ee~~<br>~~ee~~<br>ee|17.8<br>~~ee~~|--|||



## **Notes ;** 

O[1] Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature O2 L=3.0mH, IAS=-17A, VDD=-25V, RG=27Ω*, Starting TJ =25[o] C O3 ISD <_-17A, di/dt <_ 450A/µs, VDD <_BVDSS , Starting TJ =25[o] C O4 Pulse Test : Pulse Width = 250µs, Duty Cycle <_ 2% O5 Essentially Independent of Operating Temperature 

**SFP9540** 

## **P-CHANNEL POWER MOSFET** 

**==> picture [430 x 531] intentionally omitted <==**

**----- Start of picture text -----**<br>
Fig 1.  Output Characteristics Fig 2.  Transfer Characteristics<br>                     VGS<br>Top  :          - 15 V<br>                   - 10 V<br>                  - 8.0 V<br>                  - 7.0 V<br>                  - 6.0 V 10 [1]<br>10 [1]                   - 5.5 V<br>                  - 5.0 V<br>Bottom  :   -  4.5 V<br>175 oC<br>25 oC<br>10 [0]<br>@ Notes :<br>10 [0]   1. VGS = 0 V<br>@ Notes :   2. VDS = -40 V<br>  1. 250   2. TC = 25  µ s Pulse TestoC - 55 oC   3. 250  µ s Pulse Test<br>| 10 [-1] OER<br>10 Yr [-1] 10 [0] 10 [1] 2 4 6 8 10<br>-VDS , Drain-Source Voltage  [V] -VGS , Gate-Source Voltage  [V]<br>Fig 3.  On-Resistance vs. Drain Current  Fig 4.  Source-Drain Diode Forward Voltage<br>0.6<br>0.5<br>10 [1]<br>0.4<br>VGS = -10 V<br>0.3<br>0.2 10 [0] 175 oC<br>@ Notes :<br>0.1 =) a [A] 25 oC   1. VGS = 0 V<br>VGS = -20 V @ Note : TJ = 25  [o] C   2. 250  µ s Pulse Test<br>0.0 10 [-1]<br>0 8 16 24 32 40 48 56 64 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5<br>-ID , Drain Current  [A] -VSD , Source-Drain Voltage  [V]<br>Fig 5.  Capacitance vs. Drain-Source Voltage Fig 6.  Gate Charge vs. Gate-Source Voltage<br>2000<br>Ciss= Cgs+ Cgd ( Cds= shorted )<br>1500 C iss CCossrss= C= Cdsgd+ Cgd 10 VDS = -80 VVDSV = -50 VDS = -20 V<br>1000 C oss<br>@ Notes : 5<br>  1. VGS = 0 V<br>  2. f = 1 MHz<br>500 C rss<br>@ Notes : ID =-17 A<br>0 0<br>10 [0] 10 | [1] / 0 10 20 30 40 50<br>-VDS , Drain-Source Voltage [V] QG , Total Gate Charge  [nC]<br> , Drain Current  [A]-ID  , Drain Current  [A]-ID<br>]<br>Ω<br> , [<br>DS(on)<br>R<br>Drain-Source On-Resistance<br> , Reverse Drain Current  [A]<br>DR<br>-I<br>Capacitance  [pF]<br> , Gate-Source Voltage  [V]<br>GS<br>-V<br>**----- End of picture text -----**<br>


**P-CHANNEL POWER MOSFET** 

## **SFP9540** 

**Fig 8.  On-Resistance vs. Temperature** 

**==> picture [431 x 531] intentionally omitted <==**

**----- Start of picture text -----**<br>
Fig 7.  Breakdown Voltage vs. Temperature Fig 8.  On-Resistance vs. Temperature<br>1.2 2.5<br>2.0<br>1.1<br>1.5<br>1.0<br>1.0<br>0.9 @ Notes : @ Notes :<br>  1. V  2. IGSD = -250  = 0 V µ A 0.5   1. V  2. IGSD = -8.5 A = -10 V<br>0.8 0.0<br>-75 -50 -25 0 25 50 75 100 125 150 175 200 -75 -50 -25 0 25 50 75 100 125 150 175 200<br>TJ , Junction Temperature  [ [o] C] TJ , Junction Temperature  [ [o] C]<br>Fig 9.  Max. Safe Operating Area  Fig 10.  Max. Drain Current vs. Case Temperature<br>20<br>Operation in This Area<br>is Limited by R DS(on)<br>10 [2] 16<br>ico neae<br>0.1 ms<br>1 ms<br>12<br>10 [1] 10 ms<br>DC<br>@ Notes : 8<br>  1. TC = 25  [o] C<br>10 [0] Pa   2. T  3. Single PulseJ = 175  [o] C 4<br>10 [-1] aBe e 0<br>10 [0] 10 [1] 10 [2] 25 50 75 100 125 150 175<br>-VDS , Drain-Source Voltage  [V] Tc , Case Temperature  [ [o] C]<br>Fig 11.  Thermal Response<br>10 [0]<br>D=0.5<br>@ Notes :<br>0.2   1. Z θ JC (t)=1.14 o C/W Max.<br>  2. Duty Factor, D=t1 /t2<br>10 [-1] 0.1   3. TJM -TC =PDM *Z θ JC (t)<br>0.05 P.DM<br>0.02 t1.<br>0.01 t2.<br>single pulse<br>10 [-2] AAPA ‘a!<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t1 , Square Wave Pulse Duration  [sec]<br> , (Normalized)  , (Normalized)<br>-BVDSS RDS(on)<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br> , Drain Current  [A]D<br>-I  , Drain Current  [A]-ID<br>(t) ,  Thermal Response<br>Z JC θ<br>**----- End of picture text -----**<br>


**Fig 10.  Max. Drain Current vs. Case Temperature** 

**SFP9540** 

## **P-CHANNEL POWER MOSFET** 

**Fig 12.  Gate Charge Test Circuit  &  Waveform** 

**==> picture [439 x 496] intentionally omitted <==**

**----- Start of picture text -----**<br>
“ Current Regulator ”<br>Same Type VGS<br>50K Ω as DUT<br>Qg<br>12V 200nF<br>300nF -10V<br>VDS<br>VGS Qgs Qgd<br>DUT<br>-3mA<br>U— R1 R2 ,<br>Charge<br>Current Sampling (IG) Current Sampling (ID)<br>Resistor Resistor<br>Fig 13.  Resistive Switching Test Circuit  &  Waveforms<br>RL<br>Vout td(on) t on tr td(off) t off tf<br>Vin VDD<br>( 0.5 rated VDS ) Vin<br>RG 10%<br>DUT<br>-10V<br>90%<br>a Vout fea SS<br>Fig 14.  Unclamped Inductive Switching Test Circuit  &  Waveforms<br>VDS LL EAS = ----12 LL IAS2 --------------------BVBVDSS -- VDSS DD<br>Vary tp to obtain ID t p Time<br>required peak ID<br>VDD VDS (t)<br>RG C VDD ID (t)<br>DUT<br>-10V IAS<br>a t p BVDSS |<br>**----- End of picture text -----**<br>


**P-CHANNEL POWER MOSFET** 

## **SFP9540** 

**Fig 15.  Peak Diode Recovery dv/dt Test Circuit  &  Waveforms** 

**==> picture [309 x 464] intentionally omitted <==**

**----- Start of picture text -----**<br>
+<br>VDS<br>DUT<br>--<br>I S<br>L<br>Driver<br>VGS<br>RG Compliment of DUT(N-Channel) VDD<br>VGS • dv/dt controlled by “RG”<br>• IS controlled by Duty Factor “D”<br>4<br>Gate Pulse Width<br>VGS D = --------------------------Gate Pulse Period 10V<br>( Driver )<br>aey<br>Body Diode Reverse Current<br>I S IRM<br>( DUT )<br>di/dt<br>Ae<br>IFM , Body Diode Forward Current<br>Vf<br>VDS t t<br>( DUT )<br>Body Diode VDD<br>Forward Voltage Drop TT<br>Body Diode Recovery dv/dt<br>**----- End of picture text -----**<br>


**==> picture [64 x 7] intentionally omitted <==**

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TRADEMARKS<br>**----- End of picture text -----**<br>


**==> picture [439 x 623] intentionally omitted <==**

**----- Start of picture text -----**<br>
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is<br>not intended to be an exhaustive list of all such trademarks.<br>ACEx™ FACT™ ImpliedDisconnect™ PACMAN™ SPM™<br>ActiveArray™ FACT Quiet Series™ ISOPLANAR™ POP™ Stealth™<br>Bottomless™ FAST® LittlkeFET™ Power247™ SuperSOT™-3<br>CoolFET™ FASTr™ MicroFET™ PowerTrench® SuperSOT™-6<br>CROSSVOLT™ FRFET™ MicroPak™ QFET™ SuperSOT ™-8<br>DOME™ GlobalOptoisolator™ MICROWIRE™ qas™ SyncFET™<br>EcoSPARK™ GTOo™ MSX™ QT Optoelectronics™ TinyLogic™<br>E?CMOS™ HiSeC™ MSXPro™ Quiet Series™ TruTranslation™<br>EnSigna™ 2co™ OCX™ RapidConfigure™ UHC™<br>Across the board. Around the world.™ OCXPro™ RapidConnect™ UltraFET®<br>The Power Franchise™ OPTOLOGIC® SILENT SWITCHER® VCX™<br>Programmable Active Droop™ OPTOPLANAR™ SMART START™<br>DISCLAIMER<br>FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER<br>NOTICE TOANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD<br>DOES NOTASSUMEANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT<br>OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT<br>RIGHTS, NOR THE RIGHTS OF OTHERS.<br>LIFE SUPPORT POLICY<br>FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT<br>DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTENAPPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.<br>As used herein:<br>1. Life support devices or systems are devices or 2. A critical component is any component of a life<br>systems which, (a) are intended for surgical implant into support device or system whose failure to perform can<br>the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life<br>failure to perform when properly used in accordance support device or system, or to affect its safety or<br>with instructions for use provided in the labeling, can be effectiveness.<br>reasonably expected to result in significant injury to the<br>user.<br>PRODUCT STATUS DEFINITIONS<br>Definition of Terms<br>Advance Information Formative or This datasheet contains the design specifications for<br>In Design product development. Specifications may change in<br>any manner without notice.<br>Preliminary First Production This datasheet contains preliminary data, and<br>supplementary data will be published at a later date.<br>Fairchild Semiconductor reserves the right to make<br>changes at any time without notice in order to improve<br>design.<br>No Identification Needed Full Production This datasheet contains final specifications. Fairchild<br>Semiconductor reserves the right to make changes at<br>any time without notice in order to improve design.<br>Obsolete Not In Production This datasheet contains specifications on a product<br>that has been discontinued by Fairchild semiconductor.<br>The datasheet is printed for reference information only.<br>Rev. I1<br>**----- End of picture text -----**<br>




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