# Power MOSFET, N Channel, 60 V, 12 A, 0.094 ohm, TO-252 (DPAK), Surface Mount

![Product image](https://novapart.co/image/farnell:1653676RL/)

**URL**: https://novapart.co/products/NTD3055-094T4G/power-mosfet-n-channel-60-v-12-a-0094-ohm-to-252
**SKU**: NTD3055-094T4G
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.3430
**Stock**: 1000+
**Lead Time**: 148 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:12A; Drain Source Voltage Vds:60V; On Resistance Rds(on):0.084ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:2.9V; Power Dissipatio

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 48W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-252 (DPAK) |
| Drain Source Voltage Vds | 60V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 12A |
| Drain Source On State Resistance | 0.094ohm |
| Gate Source Threshold Voltage Max | 2.9V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:1653676RL/)

NTD3055-094, NVD3055-094 

## MOSFET – Power, N-Channel, DPAK/IPAK 

## 12 A, 60 V 

Designed for low voltage, high speed switching applications in power supplies, converters and power motor controls and bridge circuits. 

## **http://onsemi.com** 

## **Features** 

- Lower RDS(on)DS(on) 

 Lower RDS(on)DS(on) **V(BR)DSS RDS(on) TYP ID MAX** • Lower VDS(on)DS(on) 60 V 94 m 12 A ~~ee~~ • Lower and Tighter VSDSD • Lower Diode Reverse Recovery Time D • Lower Reverse Recovery Stored Charge • NVD Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 **N−Channel** G Qualified and PPAP Capable • These Devices are Pb−Free and are RoHS Compliant S **Typical Applications** 4 • Power Supplies • Converters 4 • Power Motor Controls • Bridge Circuits 1 1 ~~»~~[2] * **MAXIMUM RATINGS** (TJ = 25 ° C unless otherwise noted) 3 2 3 **DPAK IPAK Rating Symbol Value Unit CASE 369C CASE 369D** ~~ee~~ Drain−to−Source Voltage VDSS 60 Vdc **STYLE 2 STYLE 2** ~~po~~ Drain−to−Gate Voltage (RGS = 10 M ) V ~~eo~~ DGR 60 Vdc Gate−to−Source Voltage Vdc **MARKING DIAGRAM** − Continuous VGS 20 **& PIN ASSIGNMENTS** ~~poe~~ − Non−Repetitive (tp 10 ms) VGS 30 4 4 Drain Current Drain Drain − Continuous @ TA = 25 ° C ID 12 Adc − Continuous @ TA = 100 ° C ID 10 − Single Pulse (tp 10 s) IDM 45 Apk Total Power Dissipation @ TA = 25 ° C PD 48 W ~~po~~ Derate above 25 ° C ~~|~~ 0.32 W/ ° C Total Power Dissipation @ TA = 25 ° C (Note 1) 2.1 W 2 Total Power Dissipation @ TA = 25 ° C (Note 2) 1.5 W 1 Drain 3 ~~po~~ Operating and Storage Temperature Range ~~fT~~ TJ, Tstg −55 to ° C Gate ~~7~~ Source oO 1 2 3 +175 Gate Drain Source ~~Oe~~ Fit Single Pulse Drain−to−Source Avalanche EAS 61 mJ Energy − Starting TJ = 25 ° C A = Assembly Location* 55094 = Device Code (VDD = 25 Vdc, VGS = 10 Vdc, L = 1.0 mH Y = Year ~~Po~~ IL(pk) = 11 A, VDS = 60 Vdc) WW = Work Week Thermal Resistance− Junction−to−Case R JC 3.13 ° C/W G = Pb−Free Package − Junction−to−Ambient (Note 1) R JA 71.4 * The Assembly Location code (A) is front side − Junction−to−Ambient (Note 2) R JA 100 optional. In cases where the Assembly Location is ~~pT~~ Maximum Lead Temperature for Soldering TL 260 ° C stamped in the package, the front side assembly ~~a~~ Purposes, 1/8 ″ from case for 10 seconds code may be blank. 

- Lower VDS(on)DS(on) 

- Lower and Tighter VSDSD 

- Lower Diode Reverse Recovery Time 

- Lower Reverse Recovery Stored Charge 

- NVD Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP Capable 

- These Devices are Pb−Free and are RoHS Compliant 

## **Typical Applications** 

- Power Supplies 

- Converters 

- Power Motor Controls 

- Bridge Circuits 

Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 

## **ORDERING INFORMATION** 

See detailed ordering and shipping information in the package dimensions section on page 8 of this data sheet. 

1. When surface mounted to an FR4 board using 0.5 sq in. pad size. 

Publication Order Number: **NTD3055−094/D** 

**1** 

© Semiconductor Components Industries, LLC, 2014 **May, 2019 − Rev. 9** 

**NTD3055−094, NVD3055−094** 

2. When surface mounted to an FR4 board using the minimum recommended pad size. 

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**NTD3055−094, NVD3055−094** 

## **ELECTRICAL CHARACTERISTICS** (TJ = 25 ° C unless otherwise noted) 

|**ELECTRICAL CHARACTERISTICS **(TJ= 25°C unless otherwise noted)|**ELECTRICAL CHARACTERISTICS **(TJ= 25°C unless otherwise noted)||||||
|---|---|---|---|---|---|---|
|**Characteristic**||**Symbol**|**Min**|**Typ**|**Max**|**Unit**|
|**OFF CHARACTERISTICS**|||||||
|Drain−to−Source Breakdown Voltage (Note 3)<br>(VGS= 0 Vdc, ID= 250�Adc)<br>Temperature Coefficient (Positive)||V(BR)DSS|60<br>−|68<br>54.4|−<br>−|Vdc<br>mV/°C|
|Zero Gate Voltage Drain Current<br>(VDS= 60 Vdc, VGS= 0 Vdc)<br>(VDS= 60 Vdc, VGS= 0 Vdc, TJ= 150°C)||IDSS|−<br>−|−<br>−|1.0<br>10|�Adc|
|Gate−Body Leakage Current (VGS=±20 Vdc, VDS= 0 Vdc)||IGSS|−|−|±100|nAdc|
|**ON CHARACTERISTICS**(Note 3)|||||||
|Gate Threshold Voltage (Note 3)<br>(VDS= VGS, ID= 250�Adc)<br>Threshold Temperature Coefficient (Negative)||VGS(th)|2.0<br>−|2.9<br>6.3|4.0<br>−|Vdc<br>mV/°C|
|Static Drain−to−Source On−Resistance (Note 3)<br>(VGS= 10 Vdc, ID= 6.0 Adc)||RDS(on)|−|84|94|m�|
|Static Drain−to−Source On−Voltage (Note 3)<br>(VGS= 10 Vdc, ID= 12 Adc)<br>(VGS= 10 Vdc, ID= 6.0 Adc, TJ= 150°C)||VDS(on)|−<br>−|0.85<br>0.77|1.35<br>−|Vdc|
|Forward Transconductance (Note 3) (VDS= 7.0 Vdc, ID= 6.0 Adc)||gFS|−|6.7|−|mhos|
|**DYNAMIC CHARACTERISTICS**|||||||
|Input Capacitance|(VDS= 25 Vdc, VGS= 0 Vdc,<br>f = 1.0 MHz)|Ciss|−|323|450|pF|
|Output Capacitance||Coss|−|107|150||
|Transfer Capacitance||Crss|−|34|70||
|**SWITCHING CHARACTERISTICS**(Note 4)|||||||
|Turn−On Delay Time|(VDD= 48 Vdc, ID= 12 Adc,<br>VGS= 10 Vdc, RG= 9.1�) (Note 3)|td(on)|−|7.7|15|ns|
|Rise Time||tr|−|32.3|70||
|Turn−Off Delay Time||td(off)|−|25.2|50||
|Fall Time||tf|−|23.9|50||
|Gate Charge|(VDS= 48 Vdc, ID= 12 Adc,<br>VGS= 10 Vdc) (Note 3)|QT|−|10.9|20|nC|
|||Q1|−|3.1|−||
|||Q2|−|4.2|−||
|**SOURCE−DRAIN DIODE CHARACTERISTICS**|||||||
|Forward On−Voltage|(IS= 12 Adc, VGS= 0 Vdc) (Note 3)<br>(IS= 12 Adc, VGS= 0 Vdc, TJ= 150°C)|VSD|−<br>−|0.94<br>0.82|1.15<br>−|Vdc|
|Reverse Recovery Time|(IS= 12 Adc, VGS= 0 Vdc,<br>dIS/dt = 100 A/�s) (Note 3)|trr|−|33.1|−|ns|
|||ta|−|24|−||
|||tb|−|8.9|−||
|Reverse Recovery Stored Charge||QRR|−|0.047|−|�C|



Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 3. Pulse Test: Pulse Width ≤ 300 � s, Duty Cycle ≤ 2%. 

4. Switching characteristics are independent of operating junction temperatures. 

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**3** 

**NTD3055−094, NVD3055−094** 

## **TYPICAL CHARACTERISTICS** 

**==> picture [489 x 632] intentionally omitted <==**

**----- Start of picture text -----**<br>
24 24<br>VGS = 10 V 7 V VDS ≥  10 V<br>20 9 V 6.5 V 20<br>8 V<br>16 16<br>6 V<br>12 12<br>5.5 V<br>8 8<br>5 V TJ = 25 ° C<br>4 4.5 V 4 TJ = 100 ° C<br>TJ = −55 ° C<br>0 0<br>0 1 2 3 4 5 3 3.5 4 4.5 5 5.5 6 6.5 7 7.5 8<br>VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)<br>Figure 1. On−Region Characteristics Figure 2. Transfer Characteristics<br>0.20 0.20<br>0.18 VGS = 10 V 0.18 VGS = 15 V<br>0.16 0.16<br>TJ = 100 ° C<br>0.14 0.14<br>0.12 0.12 TJ = 100 ° C<br>0.10 0.10<br>0.08 TJ = 25 ° C 0.08 TJ = 25 ° C<br>0.06 TJ = −55 ° C 0.06 TJ = −55 ° C<br>0.04 0.04<br>0.02 0.02<br>0 0<br>0 4 8 12 16 20 24 0 4 8 12 16 20 24<br>ID, DRAIN CURRENT (AMPS) ID, DRAIN CURRENT (AMPS)<br>Figure 3. On−Resistance versus Figure 4. On−Resistance versus Drain Current<br>Gate−to−Source Voltage and Gate Voltage<br>2 1000<br>1.8 ID = 6 A VGS = 0 V TJ = 150 ° C<br>VGS = 10 V<br>1.6<br>100<br>1.4<br>1.2<br>10 TJ = 100 ° C<br>1<br>0.8<br>0.6 1<br>−50 −25 0 25 50 75 100 125 150 175 0 10 20 30 40 50 60<br>TJ, JUNCTION TEMPERATURE ( ° C) VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS)<br>Figure 5. On−Resistance Variation with Figure 6. Drain−to−Source Leakage Current<br>Temperature versus Voltage<br>, DRAIN CURRENT (AMPS) , DRAIN CURRENT (AMPS)<br>ID ID<br>) � ) �<br>, DRAIN−TO−SOURCE RESISTANCE ( , DRAIN−TO−SOURCE RESISTANCE (<br>DS(on) DS(on)<br>R R<br>, LEAKAGE (nA)<br>(NORMALIZED) IDSS<br>, DRAIN−TO−SOURCE RESISTANCE<br>DS(on)<br>R<br>**----- End of picture text -----**<br>


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**NTD3055−094, NVD3055−094** 

## **POWER MOSFET SWITCHING** 

Switching behavior is most easily modeled and predicted by recognizing that the power MOSFET is charge controlled. The lengths of various switching intervals (�t) are determined by how fast the FET input capacitance can be charged by current from the generator. 

The published capacitance data is difficult to use for calculating rise and fall because drain−gate capacitance varies greatly with applied voltage. Accordingly, gate charge data is used.  In most cases, a satisfactory estimate of average input current (IG(AV)) can be made from a rudimentary analysis of the drive circuit so that 

t = Q/IG(AV) 

During the rise and fall time interval when switching a resistive load, VGS remains virtually constant at a level known as the plateau voltage, VSGP.  Therefore, rise and fall times may be approximated by the following: 

tr = Q2 x RG/(VGG − VGSP) 

tf = Q2 x RG/VGSP 

## where 

VGG = the gate drive voltage, which varies from zero to VGG RG = the gate drive resistance 

and Q2 and VGSP are read from the gate charge curve. 

During the turn−on and turn−off delay times, gate current is not constant.  The simplest calculation uses appropriate values from the capacitance curves in a standard equation for voltage change in an RC network.  The equations are: 

The capacitance (Ciss) is read from the capacitance curve at a voltage corresponding to the off−state condition when calculating td(on) and is read at a voltage corresponding to the on−state when calculating td(off). 

At high switching speeds, parasitic circuit elements complicate the analysis. The inductance of the MOSFET source lead, inside the package and in the circuit wiring which is common to both the drain and gate current paths, produces a voltage at the source which reduces the gate drive current. The voltage is determined by Ldi/dt, but since di/dt is a function of drain current, the mathematical solution is complex. The MOSFET output capacitance also complicates the mathematics. And finally, MOSFETs have finite internal gate resistance which effectively adds to the resistance of the driving source, but the internal resistance is difficult to measure and, consequently, is not specified. 

The resistive switching time variation versus gate resistance (Figure 9) shows how typical switching performance is affected by the parasitic circuit elements.  If the parasitics were not present, the slope of the curves would maintain a value of unity regardless of the switching speed. The circuit used to obtain the data is constructed to minimize common inductance in the drain and gate circuit loops and is believed readily achievable with board mounted components.  Most power electronic loads are inductive; the data in the figure is taken with a resistive load, which approximates an optimally snubbed inductive load.  Power MOSFETs may be safely operated into an inductive load; however, snubbing reduces switching losses. 

td(on) = RG Ciss In [VGG/(VGG − VGSP)] 

td(off) = RG Ciss In (VGG/VGSP) 

**==> picture [253 x 187] intentionally omitted <==**

**----- Start of picture text -----**<br>
800<br>VDS = 0 V VGS = 0 V<br>Ciss TJ = 25 ° C<br>600<br>400 Crss<br>Ciss<br>200<br>Coss<br>0 Crss<br>10 5 0 5 10 15 20 25<br>VGS VDS<br>GATE−TO−SOURCE OR DRAIN−TO−SOURCE VOLTAGE (VOLTS)<br>C, CAPACITANCE (pF)<br>**----- End of picture text -----**<br>


**Figure 7. Capacitance Variation** 

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**==> picture [490 x 172] intentionally omitted <==**

**----- Start of picture text -----**<br>
12 100<br>Q T<br>10<br>VGS<br>8 tr<br>Q 1 Q 2 td(off)<br>6 10 tf<br>td(on)<br>4<br>2 TIDJ = 12 A = 25 ° C VVIDDSGS = 12 A = 30 V = 10 V<br>0 1<br>0 2 4 6 8 10 12 1 10 100<br>QG, TOTAL GATE CHARGE (nC) RG, GATE RESISTANCE (OHMS)<br>t, TIME (ns)<br>VGS, GATE−TO−SOURCE VOLTAGE (VOLTS)<br>**----- End of picture text -----**<br>


**Figure 8. Gate−To−Source and Drain−To−Source Voltage versus Total Charge** 

**Figure 9. Resistive Switching Time Variation versus Gate Resistance** 

## **DRAIN−TO−SOURCE DIODE CHARACTERISTICS** 

**==> picture [232 x 171] intentionally omitted <==**

**----- Start of picture text -----**<br>
16<br>14 VTJGS = 25= 0 V ° C<br>12<br>10<br>8<br>6<br>4<br>2<br>0<br>0.6 0.68 0.76 0.84 0.92 1<br>VSD, SOURCE−TO−DRAIN VOLTAGE (VOLTS)<br>IS, SOURCE CURRENT (AMPS)<br>**----- End of picture text -----**<br>


**Figure 10. Diode Forward Voltage versus Current** 

## **SAFE OPERATING AREA** 

The Forward Biased Safe Operating Area curves define the maximum simultaneous drain−to−source voltage and drain current that a transistor can handle safely when it is forward biased. Curves are based upon maximum peak junction temperature and a case temperature (TC) of 25°C. Peak repetitive pulsed power limits are determined by using the thermal response data in conjunction with the procedures discussed in AN569, “Transient Thermal Resistance − General Data and Its Use.” 

Switching between the off−state and the on−state may traverse any load line provided neither rated peak current (IDM) nor rated voltage (VDSS) is exceeded and the transition time (tr,tf) do not exceed 10 �s. In addition the total power averaged over a complete switching cycle must not exceed (TJ(MAX) − TC)/(R�JC). 

A Power MOSFET designated E−FET can be safely used in switching circuits with unclamped inductive loads. For 

reliable operation, the stored energy from circuit inductance dissipated in the transistor while in avalanche must be less than the rated limit and adjusted for operating conditions differing from those specified. Although industry practice is to rate in terms of energy, avalanche energy capability is not a constant. The energy rating decreases non−linearly with an increase of peak current in avalanche and peak junction temperature. 

Although many E−FETs can withstand the stress of drain−to−source avalanche at currents up to rated pulsed current (IDM), the energy rating is specified at rated continuous current (ID), in accordance with industry custom. The energy rating must be derated for temperature as shown in the accompanying graph (Figure 12). Maximum energy at currents below rated continuous ID can safely be assumed to equal the values indicated. 

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**NTD3055−094, NVD3055−094** 

## **SAFE OPERATING AREA** 

**==> picture [490 x 394] intentionally omitted <==**

**----- Start of picture text -----**<br>
100 70<br>V GS  = 20 V  10  � s ID = 11 A<br>SINGLE PULSE 60<br>TC = 25 ° C<br>50<br>10<br>40<br>100  � s<br>30<br>1 ms<br>1<br>10 ms dc 20<br>RDS(on) LIMIT<br>THERMAL LIMIT<br>10<br>PACKAGE LIMIT<br>0.1 0<br>0.1 1 10 100 25 50 75 100 125 150 175<br>VDS, DRAIN−TO−SOURCE VOLTAGE (VOLTS) TJ, STARTING JUNCTION TEMPERATURE ( ° C)<br>Figure 11. Maximum Rated Forward Biased Figure 12. Maximum Avalanche Energy versus<br>Safe Operating Area Starting Junction Temperature<br>1.0<br>D = 0.5<br>0.2<br>0.1<br>0.1 0.05 P(pk)<br>R�JC(t) = r(t) R�JC<br>0.02 D CURVES APPLY FOR POWER<br>PULSE TRAIN SHOWN<br>0.01 t 1 READ TIME AT t1<br>SINGLE PULSE t2 TJ(pk) - TC = P(pk) R�JC(t)<br>DUTY CYCLE, D = t1/t2<br>0.01<br>0.00001 0.0001 0.001 0.01 0.1 1 10<br>t, TIME ( � s)<br>ID, DRAIN CURRENT (AMPS)<br>AVALANCHE ENERGY (mJ)<br>EAS, SINGLE PULSE DRAIN−TO−SOURCE<br>(NORMALIZED)<br>r(t), EFFECTIVE TRANSIENT THERMAL RESISTANCE<br>**----- End of picture text -----**<br>


**Figure 13. Thermal Response** 

**==> picture [204 x 99] intentionally omitted <==**

**----- Start of picture text -----**<br>
di/dt<br>IS<br>t rr<br>ta t b<br>TIME<br>t p 0.25 IS<br>IS<br>**----- End of picture text -----**<br>


**Figure 14. Diode Reverse Recovery Waveform** 

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**7** 

**NTD3055−094, NVD3055−094** 

## **ORDERING INFORMATION** 

|**ORDERING INFORMATION**|||
|---|---|---|
|**Device**|**Package**|**Shipping**†|
|NTD3055−094−1G|IPAK<br>(Pb−Free)|75 Units / Rail|
|NTD3055−094T4G|DPAK<br>(Pb−Free)|2500 / Tape & Reel|
|NVD3055−094T4G*|DPAK<br>(Pb−Free)|2500 / Tape & Reel|



†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. 

*NVD Prefix for Automotive and Other Applications Requiring Unique Site and Control Change Requirements; AEC−Q101 Qualified and PPAP Capable. 

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**8** 

MECHANICAL CASE OUTLINE **PACKAGE DIMENSIONS** 

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**----- Start of picture text -----**<br>
IPAK<br>CASE 369D−01<br>ISSUE C<br>,<br>B C NOTES:<br>SCALE 1:1 1. DIMENSIONING AND TOLERANCING PER<br>V R E ANSI Y14.5M, 1982.<br>2. CONTROLLING DIMENSION: INCH.<br>INCHES MILLIMETERS<br>4 Z DIM MIN MAX MIN MAX<br>A 0.235 0.245 5.97 6.35<br>S i s A q leo B 0.250 0.265 6.35 6.73<br>1 2 3 C 0.086 0.094 2.19 2.38<br>D 0.027 0.035 0.69 0.88<br>E 0.018 0.023 0.46 0.58<br>−T− F 0.037 0.045 0.94 1.14<br>SEATING G 0.090 BSC 2.29 BSC<br>PLANE K H 0.034 0.040 0.87 1.01<br>J 0.018 0.023 0.46 0.58<br>K 0.350 0.380 8.89 9.65<br>R 0.180 0.215 4.45 5.45<br>J S 0.025 0.040 0.63 1.01<br>F<br>H V 0.035 0.050 0.89 1.27<br>Z 0.155 −−− 3.93 −−−<br>D 3 PL<br>aE G 0.13 (0.005) M 1 T<br>MARKING<br>DIAGRAMS<br>STYLE 1:PIN 1. BASE STYLE 2:PIN 1. GATE STYLE 3:PIN 1. ANODE STYLE 4:PIN 1. CATHODE Integrated<br>2. COLLECTOR 2. DRAIN 2. CATHODE 2. ANODE Discrete Circuits<br>3. EMITTER 3. SOURCE 3. ANODE 3. GATE<br>4. COLLECTOR 4. DRAIN 4. CATHODE 4. ANODE<br>YWW xxxxx<br>STYLE 5: STYLE 6: STYLE 7: xxxxxxxx ALYWW<br>PIN 1. GATE PIN 1. MT1 PIN 1. GATE<br>2. ANODE 2. MT2 2. COLLECTOR x<br>3. CATHODE 3. GATE 3. EMITTER<br>4. ANODE 4. MT2 4. COLLECTOR<br>4 00<br>xxxxxxxxx = Device Code<br>A = Assembly Location<br>lL = Wafer Lot<br>Y =  Year<br>WW = Work Week<br>**----- End of picture text -----**<br>


DATE 15 DEC 2010 

Electronic versions are uncontrolled except when accessed directly from the Document Repository. **DOCUMENT NUMBER: 98AON10528D** Printed  versions are uncontrolled  except when stamped  “CONTROLLED COPY” in red. **DESCRIPTION: IPAK (DPAK INSERTION MOUNT) PAGE 1 OF 1** ~~—~~ ON Semiconductor and          are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ~~ee~~ ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. 

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© Semiconductor Components Industries, LLC, 2019 

MECHANICAL CASE OUTLINE **PACKAGE DIMENSIONS** 

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4 DPAK (SINGLE GAUGE)<br>CASE 369C<br>ISSUE F<br>1 ® [2]<br>DATE 21 JUL 2015<br>3<br>SCALE 1:1<br>NOTES:<br>A 1. DIMENSIONING AND TOLERANCING PER ASME<br>Y14.5M, 1994.<br>E C 2. CONTROLLING DIMENSION: INCHES.<br>A 3. THERMAL PAD CONTOUR OPTIONAL WITHIN DI-<br>b3 B c2 4. DIMENSIONS D AND E DO NOT INCLUDE MOLDMENSIONS b3, L3 and Z.<br>FLASH, PROTRUSIONS, OR BURRS. MOLD<br>FLASH, PROTRUSIONS, OR GATE BURRS SHALL<br>4 NOT EXCEED 0.006 INCHES PER SIDE.<br>L3 Ele 4| Of Z 5. DIMENSIONS D AND E ARE DETERMINED AT THE<br>D DETAIL A H OUTERMOST EXTREMES OF THE PLASTIC BODY.<br>6. DATUMS A AND B ARE DETERMINED AT DATUM<br>1 2 3 PLANE H.<br>7. OPTIONAL MOLD FEATURE.<br>L4 NOTE 7 DIM MININCHESMAX MILLIMETERSMIN MAX<br>b2 c BOTTOM VIEW A 0.086 0.094 2.18 2.38<br>e SIDE VIEW A1 0.000 0.005 0.00 0.13<br>b b 0.025 0.035 0.63 0.89<br>TOP VIEW 0.005 (0.13) M C b2b3 0.0280.180 0.0450.215 0.724.57 1.145.46<br>c 0.018 0.024 0.46 0.61<br>c2 0.018 0.024 0.46 0.61<br>H Z Z D 0.235 0.245 5.97 6.22<br>E 0.250 0.265 6.35 6.73<br>e 0.090 BSC 2.29 BSC<br>L2 [GAUGE] PLANE C SEATINGPLANE H 0.370 0.410 9.40 10.41<br>L 0.055 0.070 1.40 1.78<br>L1 0.114 REF 2.90 REF<br>L2 0.020 BSC 0.51 BSC<br>L L3 0.035 0.050 0.89 1.27<br>A1 BOTTOM VIEW L4 −−− 0.040 −−− 1.01<br>wat L1 h GF CONSTRUCTIONSALTERNATE Z 0.155 −−− 3.93 −−−<br>DETAIL A<br>ROTATED 9  CW GENERIC<br>MARKING DIAGRAM*<br>STYLE 1: STYLE 2: STYLE 3: STYLE 4: STYLE 5:<br>PIN 1. BASE PIN 1. GATE PIN 1. ANODE PIN 1. CATHODE PIN 1. GATE<br>2. COLLECTOR 2. DRAIN 2. CATHODE 2. ANODE 2. ANODE<br>3. EMITTER 3. SOURCE 3. ANODE 3. GATE 3. CATHODE<br>4. COLLECTOR 4. DRAIN 4. CATHODE 4. ANODE 4. ANODE XXXXXXG AYWW<br>ALYWW XXX<br>STYLE 6: STYLE 7: STYLE 8: STYLE 9: STYLE 10: XXXXXG<br>PIN 1. MT1 PIN 1. GATE PIN 1. N/C PIN 1. ANODE PIN 1. CATHODE<br>2. MT2 2. COLLECTOR 2. CATHODE 2. CATHODE 2. ANODE<br>3. GATE 3. EMITTER 3. ANODE 3. RESISTOR ADJUST 3. CATHODE a d<br>4. MT2 4. COLLECTOR 4. CATHODE 4. CATHODE 4. ANODE<br>IC Discrete<br>SOLDERING FOOTPRINT* XXXXXX = Device Code<br>A = Assembly Location<br>6.20 3.00<br>L = Wafer Lot<br>0.244 0.118<br>2.58 Y =  Year<br>0.102 WW = Work Week<br>G = Pb−Free Package<br>5.80 *This information is generic. Please refer<br>0.228 1.60 6.17 to device data sheet for actual part<br>0.063 0.243 marking.<br>Ts.<br>SCALE 3:1 mm<br>inches<br>**----- End of picture text -----**<br>


*For additional information on our Pb−Free strategy and soldering details, please download the ON Semiconductor Soldering and Mounting Techniques Reference Manual, SOLDERRM/D. 

Electronic versions are uncontrolled except when accessed directly from the Document Repository. **DOCUMENT NUMBER: 98AON10527D** Printed  versions are uncontrolled  except when stamped  “CONTROLLED COPY” in red. **DESCRIPTION: DPAK (SINGLE GAUGE) PAGE 1 OF 1** ~~ee~~ ON Semiconductor and          are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. 

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