# Power MOSFET, N Channel, 60 V, 50 A, 6800 µohm, TO-252AA, Surface Mount

![Product image](https://novapart.co/image/farnell:2617412RL/)

**URL**: https://novapart.co/products/IRLR3636TRPBF/power-mosfet-n-channel-60-v-50-a-6800-ohm-to-252aa
**SKU**: IRLR3636TRPBF
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.6190
**Stock**: 1000+
**Lead Time**: 190 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:50A; Drain Source Voltage Vds:60V; On Resistance Rds(on):0.0054ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:2.5V;

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | HEXFET |
| Qualification | - |
| Power Dissipation | 143W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-252AA |
| Drain Source Voltage Vds | 60V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 50A |
| Drain Source On State Resistance | 6800µohm |
| Gate Source Threshold Voltage Max | 2.5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2617412RL/)

PD - 96224 

## IRLR3636PbF IRLU3636PbF 

## **Applications** 

DC Motor Drive HEXFET : High Efficiency Synchronous Rectification in SMPS Uninterruptible Power Supply D **V** High Speed Power Switching **DSS** ~~:~~ Hard Switched and High Frequency Circuits **RDS(on)   typ.** 

HEXFET Power MOSFET 

|:|:|:|:|:|HEXFET<br>:®|Power MOSFET<br>®|Power MOSFET<br>®|
|---|---|---|---|---|---|---|---|
|~~:~~|~~:~~|~~:~~|D<br>~~:~~|~~:~~|**VDSS**<br>**RDS(on)   typ.DS(on)   typ.   typ.**<br>~~:~~||**60V**<br>**5.4m**|
||||||**max.**||**6.8m**<br>Q|
|G|||S||**ID (Silicon Limited)**<br>**ID (Package Limited)**||**99A**<br>**50A**<br>~~on~~<br>~~je~~|
||||||D-Pak<br>I-Pak<br>JN<br>c<br>“ce|||
|||||IRLR3636PbF<br>IRLU3636PbF||||
|||||||||
|||**G**|||**D**||**S**|
|||Gate|||Drain||Source|



## **Benefits** 

Optimized for Logic Level Drive : Very Low RDS(ON) at 4.5V VGS Superior R*Q at 4.5V VGS 

Improved  Gate, Avalanche and Dynamic  dV/dt Ruggedness Fully Characterized Capacitance and Avalanche SOA . e Enhanced body diode dV/dt and dI/dt Capability Lead-Free 

## **Absolute Maximum Ratings** 

|**Symbol**<br>**Parameter**<br>**Units**<br>ID@ TC= 25°C<br>Continuous Drain Current, VGS@ 10V(Silicon Limited)<br>ID@ TC= 100°C<br>Continuous Drain Current, VGS@ 10V(Silicon Limited)<br>A<br>ID@ TC= 25°C<br>Continuous Drain Current, VGS@ 10V(Package Limited)<br>IDM<br>Pulsed Drain Current<br>PD@TC= 25°C<br>Maximum Power Dissipation<br>W<br>Linear DeratingFactor<br>W/°C<br>VGS<br>Gate-to-Source Voltage<br>V<br>dv/dt<br>Peak Diode Recovery<br>V/ns<br>TJ<br>Operating Junction and<br>TSTG<br>Storage Temperature Range<br>SolderingTemperature,for 10 seconds<br>**Avalanche Characteristics**<br>EAS(Thermallylimited)<br>Single Pulse Avalanche Energy<br>mJ<br>IAR<br>Avalanche Current<br>A<br>EAR<br>Repetitive Avalanche Energy<br>mJ<br>See Fig.14, 15, 22a, 22b<br>°C<br>170<br>143<br>22<br>±16<br>0.95<br>-55  to + 175<br>300(1.6mm from case)<br>**Max.**<br>99<br>70<br>396<br>50<br>~~TO~~<br>~~-vrnvN-"--—2—"9—"_©~~<br>~~a~~<br>~~To~~<br>~~-...-O0,8-NvrNV''-]_~~<br>~~|~~<br>~~I  (~~<br>~~nn~~<br>~~(I~~<br>~~I~~<br>~~(R~~<br>~~I~~<br>~~(I~~<br>~~I~~<br>~~(I~~<br>~~po~~<br>~~OOes eee~~|
|---|
|**Thermal Resistance**|
|**Symbol**<br>**Parameter**<br>**Typ.**<br>**Max.**<br>**Units**|
|RθJC<br>Junction-to-Case<br>–––<br>1.05<br>RθJA<br>Junction-to-Ambient(PCB Mount)<br>–––<br>50<br>°C/W<br>RθJA<br>Junction-to-Ambient<br>–––<br>110<br>~~———~~<br>~~eeooi~~<br>~~tL~~|



www.irf.com 

1 

02/06/09 

**Static @ TJ = 25°C (unless otherwise specified)** 

|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**|
|---|---|
|V(BR)DSS<br>∆V(BR)DSS/∆TJ|Drain-to-Source Breakdown Voltage<br>60<br>–––<br>–––<br>V<br>Breakdown Voltage Temp. Coefficient<br>–––<br>0.07<br>–––<br>V/°C<br>VGS= 0V, ID= 250µA<br>Reference to 25°C, ID= 5mA<br>~~GN~~<br>~~QO~~<br>~~GGG~~|
|VGS(th)<br>IDSS<br>IGSS<br>RG(int)<br>RDS(on)|–––<br>5.4<br>6.8<br>–––<br>6.6<br>8.3<br>Gate Threshold Voltage<br>1.0<br>–––<br>2.5<br>V<br>Drain-to-Source Leakage Current<br>–––<br>–––<br>20<br>–––<br>–––<br>250<br>Gate-to-Source Forward Leakage<br>–––<br>–––<br>100<br>Gate-to-Source Reverse Leakage<br>–––<br>–––<br>-100<br>Internal Gate Resistance<br>–––<br>0.6<br>–––<br>Ω<br>VGS= -16V<br>VGS= 10V, ID= 50A<br>VDS= VGS, ID= 100µA<br>VDS= 60V, VGS= 0V<br>VDS= 60V, VGS= 0V, TJ= 125°C<br>VGS= 16V<br>µA<br>nA<br>Static Drain-to-Source On-Resistance<br>VGS= 4.5V, ID= 50A<br>mΩ<br>~~| |~~<br>~~@~~<br>~~GGG~~<br>~~a~~<br>~~———~~<br>~~||~~<br>~~ee~~<br>~~_~~<br>~~ee~~<br>~~GG Gf~~|
|**Dynamic @ TJ = 25°C (unless otherwise specified)**||
|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**|
|gfs<br>Qg|Forward Transconductance<br>31<br>–––<br>–––<br>S<br>Total Gate Charge<br>–––<br>33<br>49<br>VDS= 25V, ID= 50A<br>ID= 50A<br>~~GN~~<br>~~QO OO~~<br>~~a~~|
|Qgs<br>Qgd<br>Qsync|Gate-to-Source Charge<br>–––<br>11<br>–––<br>Gate-to-Drain("Miller")Charge<br>–––<br>15<br>–––<br>Total Gate Charge Sync. (Qg- Qgd)<br>–––<br>18<br>–––<br>VDS= 30V<br>nC<br>VGS= 4.5V<br>ID= 50A, VDS=0V, VGS= 4.5V<br>~~ee~~<br>~~ee~~<br>~~®~~<br>~~a~~|
|td(on)|Turn-On DelayTime<br>–––<br>45<br>–––<br>VDD= 39V<br>~~Re~~|
|tr<br>td(off)|Rise Time<br>–––<br>216<br>–––<br>Turn-Off DelayTime<br>–––<br>43<br>–––<br>ns<br>ID= 50A<br>RG= 7.5Ω<br>~~a~~<br>~~a~~|
|tf|Fall Time<br>–––<br>69<br>–––<br>VGS= 4.5V<br>~~a~~<br>®|
|Ciss|Input Capacitance<br>–––<br>3779<br>–––<br>VGS= 0V<br>~~a~~|
|Coss|Output Capacitance<br>–––<br>332<br>–––<br>VDS= 50V<br>~~a~~|
|Crss<br>Cosseff. (ER)<br>Cosseff. (TR)|Reverse Transfer Capacitance<br>–––<br>163<br>–––<br>Effective Output Capacitance(EnergyRelated)<br>–––<br>437<br>–––<br>Effective Output Capacitance(Time Related)<br>–––<br>636<br>–––<br>ƒ= 1.0MHz<br>VGS= 0V, VDS= 0V to 48V<br>See Fig.11<br>VGS= 0V, VDS= 0V to 48V<br>pF<br>~~a~~<br>~~a)~~<br>~~@~~<br>~~©~~<br>©|



## **Diode Characteristics** 

|**Symbol**|**Parameter**|**Min. **|**Typ. **|**Max. **|**Units**|**Units**<br>**Conditions**|
|---|---|---|---|---|---|---|
|IS|Continuous Source Current<br>(BodyDiode)<br>~~ee~~<br>~~ee~~|–––<br>~~ee~~<br>~~ee~~|–––<br>~~ee~~<br>~~ee~~|99<br>~~ee~~<br>~~ee~~|A<br>~~QO~~|S<br>D<br>G<br>showing  the<br>MOSFET symbol<br>integral reverse<br>p-njunction diode.<br>~~QO~~<br>~~©~~|
|ISM|Pulsed Source Current<br>(BodyDiode)<br>~~ee~~|–––<br>~~ee~~|–––<br>~~ee~~|396<br>~~ee~~<br>~~QO~~|||
|VSD|Diode Forward Voltage<br>~~ee ~~<br>~~RG~~|–––<br> ~~ee~~<br>~~RG~~|–––<br>~~ee~~<br>~~RG~~|1.3<br>~~ee~~<br>~~RG~~<br>~~QO~~|V<br>~~RG~~<br>~~QO~~|TJ= 25°C, IS= 50A, VGS= 0V<br>~~RG~~<br>~~QO~~<br>~~©~~|
|trr|Reverse Recovery Time<br>~~ee!~~|–––<br>~~ee!~~<br>~~|~~|27<br>~~ee!~~<br>~~|~~|–––<br>~~QO~~<br>~~ee!~~<br>|ns<br>~~QO~~<br>~~ee!~~|TJ= 25°C<br>VR= 51V,<br>TJ= 125°C<br>IF= 50A<br>TJ= 25°C<br>di/dt = 100A/µs<br>TJ= 125°C<br>TJ= 25°C<br>~~QO~~<br>~~©~~<br>~~ee!~~<br>;|
|||–––<br>~~ee!~~<br>~~|~~|32<br>~~ee!~~<br>~~||~~|–––<br>~~ee!~~<br>~~|~~|||
|Qrr|Reverse Recovery Charge<br>~~ee~~|–––<br>~~|~~<br>~~ee~~<br>~~**|**~~|31<br>~~|~~<br>~~ee~~<br>~~**|**~~|–––<br><br>~~ee~~|nC||
|||–––<br>~~ee~~<br>~~**|**~~|43<br>~~ee~~<br>~~**|**~~|–––<br>~~ee~~|||
|IRRM|Reverse RecoveryCurrent<br>~~a~~|–––<br>~~**|**~~<br>~~a~~|2.1<br>~~**|**~~<br>~~a~~|–––<br>~~a~~|A<br>~~a~~||
|ton|Forward Turn-On Time<br>~~a~~<br>~~a~~|Intrinsic turn-on time is negligible(turn-on is dominated byLS+LD)<br>~~a~~<br>~~a~~|||||



Calcuted continuous current based on maximum allowable junction temperature Bond wire current limit is 50A. Note that current limitation arising from heating of the device leds may occur with some lead mounting arrangements. 

- Repetitive rating;  pulse width limited by max. junction temperature. 

Limited by TJmax, starting TJ = 25°C, L = 0.136 mH 

- RG = 25Ω, IAS = 50A, VGS =10V. Part not recommended for use above this value . 

Pulse width ≤ 400µs; duty cycle ≤ 2%. 

© Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS. 

Coss eff. (ER) is a fixed capacitance that gives the same energy as 

Coss while VDS is rising from 0 to 80% VDSS. 

When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended   footprint and soldering techniquea refer to applocation note # AN-  994 echniques refer to application note #AN-994. 

θ 

- ISD ≤ 50A, di/dt ≤ 1109 A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. 

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1000<br>VGS<br>TOP           15V<br>10V<br>4.5V<br>4.0V<br>100 3.5V<br>3.3V<br>3.0V<br>_ BOTTOM 2.7V<br>10<br>2.7V<br>1<br>P e<br>≤60µs PULSE WIDTH<br>0.1 lll Tj = 25°C ll<br>0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 1.   Typical Output Characteristics<br>1000<br>100 pf pe<br>T = 175°C<br>J<br>a e (ae<br>Ee eee 4), TJ = 25°C rT<br>10<br>1 Se<br>p y ft V | DS = 25V t t<br>≤60µs PULSE WIDTH<br>0.1 |FArt|] |<br>1 2 3 4 5 6 7<br>VGS, Gate-to-Source Voltage (V)<br>Fig 3.   Typical Transfer Characteristics<br>100000<br>VGS   = 0V,       f = 1 MHZ<br>F; ——t—“‘*zdT:SSSY Ciss    = C gs + Cgd,  C ds SHORTED<br>C  = C<br>rss   gd<br>C = C + C<br>10000 P | oss   oo ds  gd d<br>C<br>iss<br>ee |<br>1000 e sd Coss<br>I tt<br>C<br>rss<br>ee ee S|<br>PEE EST<br>100<br>1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>ID, Drain-to-Source Current (A)<br>C, Capacitance (pF)<br>ID, Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 5.** Typical Capacitance vs. Drain-to-Source Voltage 

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1000<br>VGS<br>TOP           15V<br>10V<br>4.5V<br>4.0V<br>3.5V<br>3.3V<br>100 3.0V<br>BOTTOM 2.7V<br>ASSsss6s esas<br>2.7V<br>10<br>7 ≤60µs PULSE WIDTH CH<br>Tj = 175°C<br>1<br>0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 2.   Typical Output Characteristics<br>2.5<br>ID = 50A<br>VGS = 10V<br>HE LL<br>2.0<br>PY LLL LA.<br>i/<br>1.5<br>SEREDZAGGnne<br>1.0<br>S EPasaannaae<br>a tte<br>0.5<br>-60 -40 -20 0 20 40 60 80 100120140160180<br>TJ , Junction Temperature (°C)<br>ID, Drain-to-Source Current (A)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>**----- End of picture text -----**<br>


**Fig 4.** Normalized On-Resistance vs. Temperature 

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5.0<br>4.5 ID= 50A VDS= 48V Fo |A |A |<br>VDS= 30V<br>4.0 VDS= 12V<br>3.5<br>| | AL<br>3.0<br>2.5 T T<br>2.0<br>1.5 oT oT<br>P fr<br>1.0<br>0.5<br>A n<br>0.0<br>0 5 10 15 20 25 30 35 40<br> QG,  Total Gate Charge (nC)<br>VGS, Gate-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 6.** Typical Gate Charge vs. Gate-to-Source Voltage 

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1000<br>ee ee ee<br>TJ = 175°C<br>100<br>|<br>gz |<br>TJ = 25°C<br>10<br>[ fy | |<br>1<br>VGS = 0V<br>PEE tt<br>0.1<br>0.1 0.4 0.7 1 1.3 1.6 1.9<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


**Fig 7.** Typical Source-Drain Diode Forward Voltage 

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110<br>100 Limited By Package<br>90 R eto/<br>80<br>e n<br>70 f e A<br>60 i y<br>50 es<br>a<br>40<br>ee<br>30<br>20 FSET EN<br>10<br>e e eeeAe<br>0<br>25 50 75 100 125 150 175<br> TC , Case Temperature (°C)<br>ID,  Drain Current (A)<br>**----- End of picture text -----**<br>


**Fig 9.** Maximum Drain Current vs. Case Temperature 

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0.8<br>0.6 ALLL<br>0.4 L EE LA<br>0.2 ||] nil<br>0.0 LLpa L<br>0 5 10 15 20 25 30 35 40 45 50 55 60 65<br>Energy (µJ)<br>**----- End of picture text -----**<br>


VDS, Drain-to-Source Voltage (V) 

**Fig 11.** Typical COSS Stored Energy 

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1000<br>OPERATION IN THIS AREA LIMITED BY RDS(on)<br>ret<br>100 1 0 0µsec<br>L L te d<br>M A SO NU<br>LIMITED BY PACKAGE<br>10<br>eee e a e ll<br>1 m sec<br>10msec<br>1<br>Tc = 25°C DC<br>Tj = 175°C<br>Single Pulse SSE St h<br>0.1<br>0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 8.   Maximum Safe Operating Area<br>80<br>Id = 5mA<br>75 L LLLE<br>2<br>70<br>T TT aT<br>ara<br>65<br>S y} LTT ELT]<br>a<br>60<br>L UT Lyd.<br>P ELLET<br>55<br>T HAT<br>50<br>-60 -40 -20 0 20 40 60 80 100120140160180<br>TJ , Temperature ( °C )<br>Fig 10.   Drain-to-Source Breakdown Voltage<br>800<br>ID<br>700<br>TOP         5.69A<br>10.64A<br>S CE<br>600<br>BOTTOM  50A<br>500<br>P ND<br>N EGSEE<br>400<br>300<br>IN NGLEINE TT T LT<br>200<br>100<br>0 BPp SSBNGEEEEEEELLCESESS<br>25 50 75 100 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>EAS , Single Pulse Avalanche Energy (mJ)<br>V(BR)DSS, Drain-to-Source Breakdown Voltage (V)<br>ID,  Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 12.** Maximum Avalanche Energy vs. DrainCurrent 

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10<br>a 0 ODDD<br>1 S arree ee<br>D = 0.50<br>0.20<br>0.1 _a _ 0.100.050.020.01 === 2EE ao” τJ τJτ1τ1 R1 R1 τ2 τR22 R2 Rτ33 R τ3 3 τ et R4τ4R4 4 τCτ of Ri (°C/W)   0.02028      0.0000110.29406      0.0001580.49179     0.001393 τi (sec)<br>0.01 op ra | || Ci=  T τi/Ri T T T |pf 0.24336     0.00725<br>e n eee: Ci i/Ri ee<br>SINGLE PULSE Notes:<br>( THERMAL RESPONSE ) 1. Duty Factor D = t1/t2<br>PAAAT E HE E P EA Hy<br>0.001 FE TT SE TEE EEE 2. Peak Tj = P dm x Zthjc + Tc ll<br>1E-006 1E-005 0.0001 0.001 0.01 0.1<br>t1 , Rectangular Pulse Duration (sec)<br>Fig 13.   Maximum Effective Transient Thermal Impedance, Junction-to-Case<br>1000<br>Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche<br>ee ee 22 ee ee ee ee ee Ii<br>pulsewidth, tav, assuming ∆Tj = 150°C and<br>Tstart =25°C (Single Pulse)<br>100 aa 0 epe|<br>PT 0.01 SNESNEE<br>10 N 0.05 SU ee e ll<br>0.10<br>aa<br>1 | |,<br>Allowed avalanche Current vs avalanche<br>pulsewidth, tav, assuming ∆Τ j = 25°C and  FFE<br>0.1 Pe Tstart = 150°C. EE ETe EE Es<br>1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Thermal Response ( Z thJC ) °C/W<br>Avalanche Current (A)<br>**----- End of picture text -----**<br>


**Fig 14.** Typical Avalanche Current vs.Pulsewidth 

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200<br>TOP          Single Pulse<br>BOTTOM   1.0% Duty Cycle<br>ID = 50A<br>150<br>100<br>P ANU<br>50<br>BRANES<br>0<br>25 50 75 100 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>EAR , Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.irf.com)** 

1. Avalanche failures assumption: 

- Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 

2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 

3. Equation below based on circuit and waveforms shown in Figures 16a, 16b. 

4. PD (ave) = Average power dissipation per single avalanche pulse. 

5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 

6. Iav = Allowable avalanche current. 

7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 14, 15). 

- tav = Average time in avalanche. 

- D = Duty cycle in avalanche =  tav ·f 

- ZthJC(D, tav) = Transient thermal resistance, see Figures 13) 

**PD (ave) = 1/2 ( 1.3·BV·Iav) =** A **T/ ZthJC Iav = 2** A **T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav** 

**Fig 15.** Maximum Avalanche Energy vs. Temperature 

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3.0<br>H OTT<br>2.5<br>P P Pee EP<br>PRECETRSEEE<br>2.0 f a >~ SEEPS<br>T ESST<br>1.5<br>B RR<br>ID = 100µA<br>PAW [NN]<br>1.0 ID = 250µA<br>ID = 1.0mA ZaEexN<br>ID = 1.0A VT TLN<br>0.5<br>P EPERptt Et<br>0.0 | tT tT | | tt<br>PEt  EE EEE<br>-75 -50 -25 0 25 50 75 100 125 150 175<br>TJ , Temperature ( °C )<br>VGS(th), Gate threshold Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 16.** Threshold Voltage vs. Temperature 

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16<br>IF = 30A<br>14<br>VR = 51V<br>12 TJ = 25°C PLdl<br>TJ = 125°C<br>10<br>ee<br>8<br>6<br>4 y r | OT sd<br>T IT<br>2<br>0<br>P T tT tt<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>IRRM (A)<br>**----- End of picture text -----**<br>


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14<br>IF = 20A<br>T=<br>12 V R = 51V<br>me<br>TJ = 25°C<br>10<br>mtv<br>TJ = 125°C p<br>8 |A<br>T ae<br>6 VA<br>|<br>e an<br>4<br>e<br>2<br>f | t| |<br>0<br>| {| | | | |<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>Fig. 17 - Typical Recovery Current vs. di;/dt<br>350<br>IF = 20A<br>300 V R = 51V<br>TJ = 25°C<br>250 Py7]<br>TJ = 125°C<br>eA<br>200<br>Ty<br>150<br>100<br>| ey |<br>50 4<br>0<br>( “T| | | |<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>IRRM (A)<br>QRR (A)<br>**----- End of picture text -----**<br>


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350<br>IF = 30A a<br>300 V R = 51V et sl<br>TJ = 25°C<br>am<br>250<br>y4<br>TJ = 125°C<br>== .<br>200<br>150<br>| ee¢<br>100<br>|<br>P ee<br>50<br>| |<br>( “tT<br>0<br>| | | |<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>QRR (A)<br>**----- End of picture text -----**<br>


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Driver Gate Drive<br>P.W.<br>D.U.T + {+ P.W. Period ——— — D = —— Period<br>) [©)]    •  CircuitLow  LayoutStray ConsiderationsInduct | t V t GS=10<br> •<br>- •   Low Leakage Inductance @ D.U.T. ISD Waveform<br>+<br>Reverse<br>Recovery Body Diode Forward<br>oi - [1] Current Transformer - ® + Current r Current di/dt AN<br>® D.U.T. VDS Waveform Diode Recoverydv/dt ‘<br>00 a VDD<br>ma<br>•   Re-Applied<br>•   Driver same type as D.U.T. + Voltage Body Diode  Forward Drop<br>Re ( 4 •   dv/dt controlled by Rg Vpp -<br>•<br>D.U.T. - Device Under Test SOO |<br>Ripple  ≤ 5% ISD<br>Isp controlled by Duty Factor "D" @| t<br>* Vg = 5V for Logic Level Devices<br>Fig 21.  Peak Diode Recovery dv/dt Test Circuit for N-Channel<br>HEXFET ® Power MOSFETs<br>V(BR)DSS(BR)DSS<br>15V —_ tp -><br>VDS L DRIVER<br>RG D.U.T +<br>- [V][DD]<br>IAS A<br>¢ 20VVGS dt<br>tp 0.01Ω<br>**----- End of picture text -----**<br>


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V(BR)DSS(BR)DSS<br>—_ tp -><br>IAS<br>**----- End of picture text -----**<br>


**Fig 22b.** Unclamped Inductive Waveforms 

**Fig 22a.** Unclamped Inductive Test Circuit 

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VDS<br>90%<br>\<br>10% /\<br>VGS |«le ys| |<br>td(on) tr td(off) tf<br>**----- End of picture text -----**<br>


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+<br>-<br>≤ 1  ys<br>≤ 0.1 %<br>**----- End of picture text -----**<br>


## **Fig 23a.** Switching Time Test Circuit 

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Fig 23b.   Switching Time Waveforms<br>**----- End of picture text -----**<br>


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Id<br>**----- End of picture text -----**<br>


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Current Regulator<br>Same Type as D.U.T. Vds<br>|<br>| 12V .2µF 50KΩ.3µF || i<br>+<br>D.U.T. -VDS<br>Vgs(th)<br>VGS<br>3mA<br>NN IG ID a p p i e w i e » !<br>Current Sampling Resistors Qgs1 Qgs2 Qgd Qgodr<br>**----- End of picture text -----**<br>


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Vds<br>Vgs<br>i<br>Vgs(th)<br>a p p i e w i e » !<br>Qgs1 Qgs2 Qgd Qgodr<br>**----- End of picture text -----**<br>


**Fig 24a.** Gate Charge Test Circuit 

**Fig 24b.** Gate Charge Waveform 

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**Note: For the most current drawing please refer to IR website at http://www.irf.com/package/** 

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**----- Start of picture text -----**<br>
TR TRR TRL<br>Oooo oo © : oe © ©<br>16.3 ( .641 ) 16.3 ( .641 )<br>15.7 ( .619 ) 15.7 ( .619 )<br>12.1 ( .476 ) 8.1 ( .318 )<br>FEED DIRECTION FEED DIRECTION<br>11.9 ( .469 ) 7.9 ( .312 )<br>NOTES :<br>1.  CONTROLLING DIMENSION : MILLIMETER.<br>2.  ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).<br>3.  OUTLINE CONFORMS TO EIA-481 & EIA-541.<br>  13 INCH<br>Z OSLY/ :<br>16 mm =| -<br>**----- End of picture text -----**<br>


NOTES : 

1.  CONTROLLING DIMENSION : MILLIMETER. 

2.  ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 

3.  OUTLINE CONFORMS TO EIA-481 & EIA-541. 

NOTES : 

1. OUTLINE CONFORMS TO EIA-481. 

Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. 

**IR WORLD HEADQUARTERS:** 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information **.** 02/2009 

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## **IMPORTANT NOTICE** 

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”) . 

With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 

The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. 

For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office ( **www.infineon.com** ). 

## **WARNINGS** 

Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. 

Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 



## Links

- [View this product on Novapart](https://novapart.co/products/IRLR3636TRPBF/power-mosfet-n-channel-60-v-50-a-6800-ohm-to-252aa)
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---

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