# Power MOSFET, N Channel, 80 V, 30 A, 0.028 ohm, TO-252AA, Surface Mount

![Product image](https://novapart.co/image/farnell:2468056/)

**URL**: https://novapart.co/products/IRLR2908TRPBF/power-mosfet-n-channel-80-v-30-a-0028-ohm-to-252aa
**SKU**: IRLR2908TRPBF
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.5960
**Stock**: 1000+
**Lead Time**: 190 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:30A; Drain Source Voltage Vds:80V; On Resistance Rds(on):0.0225ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:2.5V;

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 120W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-252AA |
| Drain Source Voltage Vds | 80V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 30A |
| Drain Source On State Resistance | 0.028ohm |
| Gate Source Threshold Voltage Max | 2.5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2468056/)

PD - 95552B 

## **Features** 

## IRLR2908PbF IRLU2908PbF HEXFET[®] Power MOSFET 

Advanced Process Technology D Ultra Low On-Resistance VDSS = 80V Dynamic dv/dt Rating 175°C Operating Temperature R = 28m Ω Fast Switching G DS(on) Repetitive Avalanche Allowed up to Tjmax Lead-Free ID = 30A S 

## **Description** 

This HEXFET ® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this HEXFET power MOSFET are a 175°C junction operating temperature, low R θ JC, fast switching speed and improved repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable device for use in a wide variety of applications. The D-Pak is designed for surface mounting using vapor  phase, infrared, or wave soldering techniques.  The straight lead version (IRFU series) is for through-hole mounting applications.  Power dissipation levels up to 1.5 watts are possible in typical surface mount applications. 

D-Pak I-Pak IRLR2908PbF IRLU2908PbF 

## **Absolute Maximum Ratings** 

||**Parameter**|**Max.**|**Units**|
|---|---|---|---|
|ID@ TC= 25°C|Continuous Drain Current, VGS@ 10V (Silicon Limited)<br>~~—_CTFTeoeOoRoON-~~<br>~~ee~~|39<br>~~—_CTFTeoeOoRoON-~~<br>~~ee~~|A<br>~~ee~~|
|ID@ TC= 100°C|Continuous Drain Current, VGS@ 10V (See Fig. 9)<br>~~a~~<br>~~ee~~|28<br>~~a~~<br>~~ee~~||
|ID@ TC= 25°C<br>~~a~~|Continuous Drain Current, VGS@ 10V(Package Limited)<br>~~ee~~<br>~~a~~|30<br>~~ee~~||
|IDM<br>~~a~~|Pulsed Drain Current<br>~~ee~~<br>~~a~~|150<br>~~ee~~||
|PD@TC= 25°C<br>~~a~~<br>~~NN~~|Maximum Power Dissipation<br>~~ee~~<br>~~a~~<br>~~oo~~<br>~~NN~~<br>~~eoN_~~|120<br>~~ee~~<br>~~oo~~<br>~~eoN_~~|W<br>~~ee~~<br>~~oo~~|
|~~NN~~|Linear Derating Factor<br>~~NN~~<br>~~eoN_~~|0.77<br>~~eoN_~~|W/°C|
|VGS<br>~~NN~~|Linear Derating Factor<br>Gate-to-Source Voltage<br>~~NN~~<br>~~eoN_~~<br>~~a~~|± 16<br>~~eoN_~~<br>~~a~~|V<br>~~a~~|
|EAS|Single Pulse Avalanche Energy (ThermallyLimited)<br>~~a~~<br>~~8~~<br>~~ee~~|180<br>~~a~~<br>~~8~~<br>~~ee~~|mJ<br>~~a~~<br>~~8~~<br>~~ee~~<br>~~eee~~|
|EAS(tested)|Single Pulse Avalanche Energy Tested Value<br>~~ee~~<br>~~en~~|250<br>~~ee~~<br>~~eee~~||
|IAR|Avalanche Current<br>~~ee~~<br>~~ee~~<br>~~en~~|See Fig.12a,12b,15,16<br>~~ee~~<br>~~ee~~<br>~~eee~~|A<br>~~ee~~<br>~~eee~~|
|EAR|Repetitive Avalanche Energy<br>~~en~~||mJ<br>~~eee~~|
|dv/dt<br>~~po~~|Peak Diode Recoverydv/dt<br>~~en~~<br>~~es~~<br>~~po~~|2.3<br>~~eee~~<br>~~po~~|V/ns<br>~~eee~~<br>~~po~~|
|TJ<br>TSTG<br>~~po~~|Operating Junction and<br>Storage Temperature Range<br>~~es~~<br>~~po~~|-55  to + 175<br>~~po~~|°C<br>~~po~~|
|~~po~~|Soldering Temperature, for 10 seconds<br>~~es~~<br>~~po~~|300 (1.6mm from case )<br>~~po~~||



**Static @ TJ = 25°C (unless otherwise specified)** 

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|||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
|Parameter|Min.|Typ.|Max.|Units|Conditions|
|V(BR)DSS|I|Drain-to-Source Breakdown Voltage|80|–––|GO|–––|V|VGS = 0V, ID = 250µA|
|∆Β|VDSS/|∆|TJ|es|Breakdown Voltage Temp. Coefficient|–––|0.085|GO|–––|V/°C|Reference to 25°C, ID = 1mA|
|RDS(on)|Static Drain-to-Source On-Resistance|–––|22.5|28|m|Ω|VGS = 10V, ID = 23A|
|Se|–––|25|30|OE|VGS = 4.5V, ID = 20A|
|VGS(th)|CO|Gate Threshold Voltage|1.0|–––|2.5|V|VDS = VGS, ID = 250µA|
|gfs|es|Forward Transconductance|35|–––|GO|–––|S|VDS = 25V, ID = 23A|
|IDSS|Drain-to-Source Leakage Current|–––|–––|20|µA|VDS = 80V, VGS = 0V|
|OEE|–––|–––|250|VDS = 80V, VGS = 0V, TJ = 125°C|
|IGSS|Gate-to-Source Forward Leakage|–––|–––|200|nA|VGS = 16V|
|oe|Gate-to-Source Reverse Leakage|fT|–––|–––|CT|-200|VGS = -16V|
|Qg|ee|Total Gate Charge|–––|22|33|nC|ID = 23A|
|Qgs|es|Gate-to-Source Charge|–––|6.0|9.1|VDS = 64V|
|Qgd|Gate-to-Drain ("Miller") Charge|–––|11|17|VGS = 4.5V|
|td(on)|es|Turn-On Delay Time|Gs|–––|12|ee|–––|ns|VDD = 40V|
|tr|ee|Rise Time|–––|95|–––|ID = 23A|
|td(off)|es|Turn-Off Delay Time|–––|36|–––|RG = 8.3|Ω|
|tf|Fall Time|–––|55|–––|VGS = 4.5V|
|LD|Internal Drain Inductance|–––|4.5|–––|nH|Between lead,|D|
|ee|6mm (0.25in.)|
|LS|Internal Source Inductance|–––|7.5|–––|from package|G|
|FF|and center of die contact|&|S|
|Ciss|es|Input Capacitance|–––|es|1890|–––|pF|VGS = 0V|
|Coss|ee|Output Capacitance|–––|260|–––|VDS = 25V|
|Crss|es|Reverse Transfer Capacitance|–––|35|–––|ƒ = 1.0MHz, See Fig. 5|
|Coss|ee|Output Capacitance|–––|1920|–––|VGS = 0V,  VDS = 1.0V,  ƒ = 1.0MHz|
|Coss|es|Output Capacitance|–––|170|–––|VGS = 0V,  VDS = 64V,  ƒ = 1.0MHz|
|Coss eff.|es|Effective Output Capacitance|–––|310|–––|VGS = 0V, VDS = 0V to 64V|

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**Diode Characteristics** 

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||||||||
|---|---|---|---|---|---|---|
|Parameter|Min.|Typ.|Max.|Units|Conditions|
|IS|Continuous Source Current|–––|–––|39|MOSFET symbol|D|
|SE|(Body Diode)|A|showing  the|
|ISM|Pulsed Source Current|–––|–––|150|integral reverse|G|
|ow|(Body Diode)|p-n junction diode.|S|
|VSD|Diode Forward Voltage|–––|–––|1.3|V|TJ = 25°C, IS = 23A, VGS = 0V|
|Rs|GO|
|trr|Reverse Recovery Time|–––|75|110|ns|TJ = 25°C, IF = 23A, VDD = 25V|
|Qrr|Reverse Recovery Charge|–––|210|310|nC|di/dt = 100A/µs|
|Iee|ed|®|
|ton|Forward Turn-On Time|Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)|
|a|

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Notes hrough re  on page 11 HEXFET[®] is a registered trademark of International Rectifier. 

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1000<br>VGS<br>TOP           15V<br>10V<br>4.5V<br>100 4.0V ae<br>3.5V<br>3.0V<br>2.7V<br>BOTTOM 2.5V<br>10 ec<br>2.5V<br>ecm<br>1 P y |<br>0.1<br>20µs PULSE WIDTH<br>ee I<br>A Tj = 25°C 1 Al<br>0.01<br>0.01 0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 1.   Typical Output Characteristics<br>1000<br>Seesee<br>100<br>| _| |_|<br>T = 175°C<br>J<br>a7 aeee e e eee<br>T = 25°C<br>10 J<br>| |<br>7 )aa ee eee<br>VDS = 25V<br>20µs PULSE WIDTH<br>1<br>2 3 4 5<br>VGS, Gate-to-Source Voltage (V)<br>ID, Drain-to-Source Current (A)<br>) (Α<br>ID, Drain-to-Source Current<br>**----- End of picture text -----**<br>


**Fig 3.** Typical Transfer Characteristics 

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1000<br>VGS<br>TOP           15V<br>10V<br>4.5V<br>4.0V EE<br>100 3.5V<br>3.0V<br>2.7V<br>BOTTOM 2.5V<br>gEPCH IIT<br>10 2.5V<br>P E et<br>EH Pr FE | AaB<br>1<br>20µs PULSE WIDTH<br>4ZA ll Tj = 175°C lll<br>0.1<br>0.01 0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 2.   Typical Output Characteristics<br>60<br>TJ = 25°C<br>50<br>40 TAL<br>T = 175°C<br>J<br>30 Zann<br>Vane<br>20<br>10<br>VDS = 10V<br>20µs PULSE WIDTH<br>0<br>0 10 20 30 40 50 60<br>ID, Drain-to-Source Current (A)<br>GFS, Forward Transconductance (S)<br>ID, Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 4.** Typical Forward Transconductance vs. Drain Current 

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100000 5.0<br>VGS   = 0V,       f = 1 MHZ<br>Ciss   = Cgs + Cgd,  Cds SHORTED ID= 23A VDS= 64V<br>_ Crss    = Cgd  | 4.0 VDS= 40V yy<br>10000 Coss   = Cds + Cgd VDS= 16V<br>3.0<br>at Ciss eA<br>1000<br>Coss 2.0<br>a ee NG ee SE<br>100<br>e S C ll 1.0 f T lt of<br>rss<br>a ee eee ee<br>ee ee<br>10 0.0<br>1 10 100 0 5 10 15 20 25<br>VDS, Drain-to-Source Voltage (V)  QG  Total Gate Charge (nC)<br>C, Capacitance(pF)<br>VGS, Gate-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 5.** Typical Capacitance vs. Drain-to-Source Voltage 

**Fig 6.** Typical Gate Charge vs. Gate-to-Source Voltage 

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1000.00<br>Ee ee ee ee ee es ee<br>100.00<br>e s<br>T = 175°C<br>J<br>ee 4 a 2 ee ee<br>10.00<br>2 /4) ae<br>i ee ee ee ee eee<br>T = 25°C<br>1.00 P pp J<br>VGS = 0V<br>0.10 |eefL fF | [| | |<br>0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


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1000<br>OPERATION IN THIS AREA<br>rT Ye LIMITED BY R DS ' (on) ll<br>100<br>PesraatHE tibTT<br>100µsec<br>10 PTS SS tT<br>|<br>1msec<br>| Mall<br>1 PA SST oT<br>Tc = 25°C 10msec<br>Tj = 175°C<br>Single Pulse<br>0.1 eelllee<br>1 10 100 1000<br>VDS, Drain-to-Source Voltage (V)<br>ID,  Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 7.** Typical Source-Drain Diode Forward Voltage 

**Fig 8.** Maximum Safe Operating Area 

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40 3.0<br>ID = 38A<br>S LOT TAT<br>35<br>2.5 VGS = 4.5V<br>S a 4<br>30 N PT TT<br>2.0<br>2520 TT TTNE} [INT] | 1.5 H E E RRRReeaeee EE EA AATTY<br>15 P EN] P epa<br>1.0<br>P E TN a e>_dceeeeee<br>10<br>\ || ae ET<br>0.5<br>50 CPETE N [TN] 0.0 P e EEEEEEEHLLTETETTeeEE eT<br>25 50 75 100 125 150 175 -60 -40 -20 0 20 40 60 80 100 120 140 160 180<br> TC , Case Temperature (°C) TJ , Junction Temperature (°C)<br>Fig 9.   Maximum Drain Current vs. Fig 10.   Normalized On-Resistance<br>Case Temperature vs. Temperature<br>10<br>Saas so Os 600 | ee On a | ee OO a | OO OOO OO Oe |<br>PT Te<br>1<br>D = 0.50<br>— ——————<br>FO) 0.20 EAP rr rr | rR oy) PT<br>— 0.10 a a a Oc 0 ee | |<br>0.1<br>0.05<br>0.02 P DM<br>| 0.01 oS ce ee ee ee el eee<br>t 1<br>Se aaa<br>0.01 Pee SINGLE PULSE oT PTTTT t 2<br>ee ( THERMAL RESPONSE ) Notes:<br>a ee ee eee 1. Duty factor D = t   / t1 2<br>2. Peak T J = P DM x  Z thJC + T C<br>ee eee<br>0.001<br>1E-006 1E-005 0.0001 0.001 0.01 0.1 1<br>t1 , Rectangular Pulse Duration (sec)<br>ID,  Drain Current (A)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>Thermal Response ( Z  thJC )<br>**----- End of picture text -----**<br>


**Fig 11.** Maximum Effective Transient Thermal Impedance, Junction-to-Case 

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15V<br>VDS L DRIVER<br>RG D.U.T +<br>- [V][DD]<br>IAS<br>wi 20VVGS lt<br>tp 0.01 Ω<br>P Y<br>**----- End of picture text -----**<br>


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Fig 12a.   Unclamped Inductive Test Circuit<br>V(BR)DSS<br>tp<br>a<br>/<br>|<br>IAS<br>**----- End of picture text -----**<br>


**Fig 12b.** Unclamped Inductive Waveforms 

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o T QG<br>; QGS /oo QGD<br>VG<br>**----- End of picture text -----**<br>


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Charge<br>**----- End of picture text -----**<br>


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Fig 13a.   Basic Gate Charge Waveform<br>Current Regulator<br>Same Type as D.U.T.<br>o e<br>50K Ω<br>12V .2 µ F<br>7 .3 µ F<br>TLS +<br>D.U.T. -VDS<br>VGS<br>@<br>3mA<br>ot<br>IG ID<br>Current Sampling Resistors<br>**----- End of picture text -----**<br>


**Fig 13b.** Gate Charge Test Circuit 

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400<br>ID<br>GEaanae<br>TOP         9.3A<br>16A<br>XGRnaen<br>300 BOTTOM 23A<br>200 P N EEL<br>N NOK EEt<br>100<br>P SSNU ED<br>T TS<br>0<br>25 PE 50 75 100 | ASA 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>Fig 12c.   Maximum Avalanche Energy<br>vs. Drain Current<br>2.5 PEELE ELE<br>2.0<br>L ttttt tt tt<br>P PE<br>1.5 P EL ENEE EEE<br>ID = 250µA<br>AN E<br>1.0<br>PL E<br>PEEL ELLLLIN |<br>0.5<br>-75 -50 -25 0 25 50 75 100 125 150 175 200<br>FEE T TET ET<br>TJ , Temperature ( °C )<br>VGS(th) Gate threshold Voltage (V)<br>EAS , Single Pulse Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Fig 14.** Threshold Voltage vs. Temperature 

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1000<br>Duty Cycle = Single Pulse<br>cc Oe |<br>100 Allowed avalanche Current vs<br>avalanche  pulsewidth,  tav<br>0.01<br>assuming  ∆ Tj = 25°C due to<br>avalanche losses<br>10 0.05<br>0.10<br>1<br>a<br>0.1 ee ee ee ell<br>1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Fig 15.   Typical Avalanche Current vs.Pulsewidth<br>200 Notes on Repetitive Avalanche Curves , Figures 15, 16:<br>TOP          Single Pulse                 (For further info, see AN-1005 at www.irf.com)<br>BOTTOM   10% Duty Cycle 1. Avalanche failures assumption:<br>ID = 23A   Purely a thermal phenomenon and failure occurs at a<br>150     temperature far in excess of Tjmax. This is validated for<br>N ee     every part type.<br>2. Safe operation in Avalanche is allowed as long asTjmax is<br>C NT   not exceeded.<br>3. Equation below based on circuit and waveforms shown in<br>100<br>P UNE EEEEEEE   Figures 12a, 12b.<br>4. PD (ave) = Average power dissipation per single<br>O NC     avalanche pulse.<br>5. BV = Rated breakdown voltage (1.3 factor accounts for<br>50 P EEING     voltage increase during avalanche).<br>6. Iav = Allowable avalanche current.<br>POPPE SE 7.  ∆ T = Allowable rise in junction temperature, not to exceed<br>    Tjmax (assumed as 25°C in Figure 15, 16).<br>EEN<br>0   tav = Average time in avalanche.<br>25 50 75 100 125 150 175   D = Duty cycle in avalanche =  tav ·f<br>  ZthJC(D, tav) = Transient thermal resistance, see figure 11)<br>Starting TJ , Junction Temperature (°C)<br>EAR , Avalanche Energy (mJ)<br>Avalanche Current (A)<br>**----- End of picture text -----**<br>


**Fig 16.** Maximum Avalanche Energy vs. Temperature 

**PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2 T/ [1.3·BV·Zth]** 

- **EAS (AR) = PD (ave)·tav** 

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Driver Gate Drive<br>P.W.<br>D.U.T + Period — D = ——<br>+ P.W. Period<br>) ©)    •  Circuit Layout Considerations fi V t GS=10V<br> •<br>| =] - LowGround StrayPla I n eductance<br> •   CurrentLow LeakageTransformerInductance @) D.U.T. ISD Waveform<br>+<br>Reverse<br>- a | = - ® + RecoveryCurrent r Body Diode ForwardCurrent di/dt /\<br>® D.U.T. VDS Waveform Diode Recoverydv/dt ‘<br>00 _ VDD<br>•   Re-Applied<br>Re ) •   dvidtDriver controlledsame type byas ReD.U.T. Vop + Voltage Body Diode  Forward Drop [_<br>•   - Inductor Curent<br>•   D.U.T. - Device Under Test es ee<br>Ripple  ≤ 5% ISD<br>Isp controlled by Duty Factor "D" ®<br>**----- End of picture text -----**<br>


## **Fig 17.** Peak Diode Recovery dv/dt Test HEXFET ® Power MOSFETs 

## for N-Channel 

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-<br>≤ 1  ys<br>≤ 0.1 %<br>**----- End of picture text -----**<br>


**Fig 18a.** Switching Time Test Circuit 

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VDS<br>90%<br>10%<br>VGS |\< ve >!\ vie<br>td(on) tr td(off) tf<br>**----- End of picture text -----**<br>


**Fig 18b.** Switching Time Waveforms 

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EXAMPLE: THIS IS AN IRFR120<br>WITH ASSEMBLY INTERNATIONAL cE PART NUMBER<br>LOT CODE 1234 RECTIFIER IRFR120 DATE CODE<br>ASSEMBLED ON WW 16, 2001 LOGO 116A YEAR 1 =  2001<br>IN THE ASSEMBLY LINE "A" 12 34 WEEK 16<br>om | LINE A<br>Note: "P" in assembly line positionindicates "Lead-Free" ASSEMBLYLOT CODE t a t<br>"P" in assembly line position indicates<br>"Lead-Free" qualification to the consumer-level<br>PART NUMBER<br>OR INTERNATIONALRECTIFIER go IRFR120 N P =  DESIGNATES LEAD-FREEDAT E CODE<br>LOGO PRODUCT (OPTIONAL)<br>12 34 P =  DESIGNATES LEAD-FREE<br>ASSEMBLYLOT CODE at PRODUCT QUALIFIED TO THECONSUMER LEVEL (OPTIONAL)<br>YEAR 1 =  2001<br>WEEK 16<br>A =  ASSEMBLY SITE CODE<br>**----- End of picture text -----**<br>


## **Notes: 1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/ 2. For the most current drawing please refer to IR website at http://www.irf.com/package/** www.irf.com 

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EXAMPLE: THIS IS AN IRFU120 PART NUMBER<br>WITH ASSEMBLYLOT CODE 5678ASSEMBLED ON WW 19, 2001 INTERNATIONALRECTIFIERLOGO (a 56IRFU120119A78 DATE CODEYEAR 1 =  2001WEEK 19<br>IN THE ASSEMBLY LINE "A"<br>LINE A<br>ASSEMBLY<br>LOT CODE<br>Note: "P" in assembly line position<br>indicates Lead-Free"<br>OR<br>PART NUMBER<br>INTERNATIONAL a<br>RECTIFIER IRFU120 DATE CODE<br>LOGO P =  DESIGNATES LEAD-FREE<br>56 78 PRODUCT (OPTIONAL)<br>ASSEMBLY YEAR 1 =  2001<br>LOT CODE WEEK 19<br>A =  ASSEMBLY SITE CODE<br>**----- End of picture text -----**<br>


## **Notes:** 

**1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/ 2. For the most current drawing please refer to IR website at http://www.irf.com/package/** 

www.irf.com 

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TR TRR TRL<br>-OOO9 9 0) I eooo/1<br>16.3 ( .641 ) 16.3 ( .641 )<br>15.7 ( .619 ) 15.7 ( .619 )<br>7 7<br>12.1 ( .476 )11.9 ( .469 ) FEED DIRECTION 8.1 ( .318 )7.9 ( .312 ) FEED DIRECTION<br>NOTES :<br>1.  CONTROLLING DIMENSION : MILLIMETER.<br>2.  ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).<br>3.  OUTLINE CONFORMS TO EIA-481 & EIA-541.<br>.   13 INCH<br>16 mm<br>mw =e<br>NOTES :<br>1. OUTLINE CONFORMS TO EIA-481.<br>**----- End of picture text -----**<br>


Repetitive rating;  pulse width limited by max. junction temperature. (See fig. 11). 

Limited by TJmax, starting TJ = 25°C, L = 0.71mH, RG = 25 Ω , IAS = 23A, VGS =10V. Part not recommended for use above this value. 

ISD ≤ 23A, di/dt ≤ 400A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. Pulse width ≤ 1.0ms; duty cycle ≤ 2%. 

Coss eff. is a fixed capacitance that gives the same charging time  as Coss while VDS is rising from 0 to 80% VDSS . Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance. 

This value determined from sample failure population. 100% tested to this value in production. 

When mounted on 1" square PCB (FR-4 or G-10 Material).  For recommended footprint and soldering techniques refer to  application note #AN-994. 

Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. 

**IR WORLD HEADQUARTERS:** 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information **.** 10/2010 

www.irf.com 

11 

## **IMPORTANT NOTICE** 

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”) . 

With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 

The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. 

For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office ( **www.infineon.com** ). 

## **WARNINGS** 

Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. 

Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 



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---

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