# Power MOSFET, N Channel, 80 V, 39 A, 0.0225 ohm, TO-252 (DPAK), Surface Mount

![Product image](https://novapart.co/image/farnell:2577181/)

**URL**: https://novapart.co/products/IRLR2908TRLPBF/power-mosfet-n-channel-80-v-39-a-00225-ohm-to-252
**SKU**: IRLR2908TRLPBF
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.3510
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | HEXFET |
| Power Dissipation | 120W |
| Transistor Mounting | Surface Mount |
| Transistor Polarity | N Channel |
| Power Dissipation Pd | 120W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.0225ohm |
| Transistor Case Style | TO-252 (DPAK) |
| Drain Source Voltage Vds | 80V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 39A |
| Drain Source On State Resistance | 0.0225ohm |
| Gate Source Threshold Voltage Max | 2.5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2577181/)

PD - 95552B 

## **Features** 

## IRLR2908PbF IRLU2908PbF HEXFET[®] Power MOSFET 

Advanced Process Technology D Ultra Low On-Resistance VDSS = 80V Dynamic dv/dt Rating 175°C Operating Temperature R = 28m Ω Fast Switching G DS(on) Repetitive Avalanche Allowed up to Tjmax Lead-Free ID = 30A S 

## **Description** 

This HEXFET ® Power MOSFET utilizes the latest processing techniques to achieve extremely low on-resistance per silicon area. Additional features of this HEXFET power MOSFET are a 175°C junction operating temperature, low R θ JC, fast switching speed and improved repetitive avalanche rating. These features combine to make this design an extremely efficient and reliable device for use in a wide variety of applications. The D-Pak is designed for surface mounting using vapor  phase, infrared, or wave soldering techniques.  The straight lead version (IRFU series) is for through-hole mounting applications.  Power dissipation levels up to 1.5 watts are possible in typical surface mount applications. 

D-Pak I-Pak IRLR2908PbF IRLU2908PbF 

## **Absolute Maximum Ratings** 

||**Parameter**|**Max.**|**Units**|
|---|---|---|---|
|ID@ TC= 25°C|Continuous Drain Current, VGS@ 10V (Silicon Limited)<br>~~—_CTFTeoeOoRoON-~~<br>~~ee~~|39<br>~~—_CTFTeoeOoRoON-~~<br>~~ee~~|A<br>~~ee~~|
|ID@ TC= 100°C|Continuous Drain Current, VGS@ 10V (See Fig. 9)<br>~~a~~<br>~~ee~~|28<br>~~a~~<br>~~ee~~||
|ID@ TC= 25°C<br>~~a~~|Continuous Drain Current, VGS@ 10V(Package Limited)<br>~~ee~~<br>~~a~~|30<br>~~ee~~||
|IDM<br>~~a~~|Pulsed Drain Current<br>~~ee~~<br>~~a~~|150<br>~~ee~~||
|PD@TC= 25°C<br>~~a~~<br>~~NN~~|Maximum Power Dissipation<br>~~ee~~<br>~~a~~<br>~~oo~~<br>~~NN~~<br>~~eoN_~~|120<br>~~ee~~<br>~~oo~~<br>~~eoN_~~|W<br>~~ee~~<br>~~oo~~|
|~~NN~~|Linear Derating Factor<br>~~NN~~<br>~~eoN_~~|0.77<br>~~eoN_~~|W/°C|
|VGS<br>~~NN~~|Linear Derating Factor<br>Gate-to-Source Voltage<br>~~NN~~<br>~~eoN_~~<br>~~a~~|± 16<br>~~eoN_~~<br>~~a~~|V<br>~~a~~|
|EAS|Single Pulse Avalanche Energy (ThermallyLimited)<br>~~a~~<br>~~8~~<br>~~ee~~|180<br>~~a~~<br>~~8~~<br>~~ee~~|mJ<br>~~a~~<br>~~8~~<br>~~ee~~<br>~~eee~~|
|EAS(tested)|Single Pulse Avalanche Energy Tested Value<br>~~ee~~<br>~~en~~|250<br>~~ee~~<br>~~eee~~||
|IAR|Avalanche Current<br>~~ee~~<br>~~ee~~<br>~~en~~|See Fig.12a,12b,15,16<br>~~ee~~<br>~~ee~~<br>~~eee~~|A<br>~~ee~~<br>~~eee~~|
|EAR|Repetitive Avalanche Energy<br>~~en~~||mJ<br>~~eee~~|
|dv/dt<br>~~po~~|Peak Diode Recoverydv/dt<br>~~en~~<br>~~es~~<br>~~po~~|2.3<br>~~eee~~<br>~~po~~|V/ns<br>~~eee~~<br>~~po~~|
|TJ<br>TSTG<br>~~po~~|Operating Junction and<br>Storage Temperature Range<br>~~es~~<br>~~po~~|-55  to + 175<br>~~po~~|°C<br>~~po~~|
|~~po~~|Soldering Temperature, for 10 seconds<br>~~es~~<br>~~po~~|300 (1.6mm from case )<br>~~po~~||



**Static @ TJ = 25°C (unless otherwise specified)** 

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|||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|
|Parameter|Min.|Typ.|Max.|Units|Conditions|
|V(BR)DSS|I|Drain-to-Source Breakdown Voltage|80|–––|GO|–––|V|VGS = 0V, ID = 250µA|
|∆Β|VDSS/|∆|TJ|es|Breakdown Voltage Temp. Coefficient|–––|0.085|GO|–––|V/°C|Reference to 25°C, ID = 1mA|
|RDS(on)|Static Drain-to-Source On-Resistance|–––|22.5|28|m|Ω|VGS = 10V, ID = 23A|
|Se|–––|25|30|OE|VGS = 4.5V, ID = 20A|
|VGS(th)|CO|Gate Threshold Voltage|1.0|–––|2.5|V|VDS = VGS, ID = 250µA|
|gfs|es|Forward Transconductance|35|–––|GO|–––|S|VDS = 25V, ID = 23A|
|IDSS|Drain-to-Source Leakage Current|–––|–––|20|µA|VDS = 80V, VGS = 0V|
|OEE|–––|–––|250|VDS = 80V, VGS = 0V, TJ = 125°C|
|IGSS|Gate-to-Source Forward Leakage|–––|–––|200|nA|VGS = 16V|
|oe|Gate-to-Source Reverse Leakage|fT|–––|–––|CT|-200|VGS = -16V|
|Qg|ee|Total Gate Charge|–––|22|33|nC|ID = 23A|
|Qgs|es|Gate-to-Source Charge|–––|6.0|9.1|VDS = 64V|
|Qgd|Gate-to-Drain ("Miller") Charge|–––|11|17|VGS = 4.5V|
|td(on)|es|Turn-On Delay Time|Gs|–––|12|ee|–––|ns|VDD = 40V|
|tr|ee|Rise Time|–––|95|–––|ID = 23A|
|td(off)|es|Turn-Off Delay Time|–––|36|–––|RG = 8.3|Ω|
|tf|Fall Time|–––|55|–––|VGS = 4.5V|
|LD|Internal Drain Inductance|–––|4.5|–––|nH|Between lead,|D|
|ee|6mm (0.25in.)|
|LS|Internal Source Inductance|–––|7.5|–––|from package|G|
|FF|and center of die contact|&|S|
|Ciss|es|Input Capacitance|–––|es|1890|–––|pF|VGS = 0V|
|Coss|ee|Output Capacitance|–––|260|–––|VDS = 25V|
|Crss|es|Reverse Transfer Capacitance|–––|35|–––|ƒ = 1.0MHz, See Fig. 5|
|Coss|ee|Output Capacitance|–––|1920|–––|VGS = 0V,  VDS = 1.0V,  ƒ = 1.0MHz|
|Coss|es|Output Capacitance|–––|170|–––|VGS = 0V,  VDS = 64V,  ƒ = 1.0MHz|
|Coss eff.|es|Effective Output Capacitance|–––|310|–––|VGS = 0V, VDS = 0V to 64V|

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**Diode Characteristics** 

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||||||||
|---|---|---|---|---|---|---|
|Parameter|Min.|Typ.|Max.|Units|Conditions|
|IS|Continuous Source Current|–––|–––|39|MOSFET symbol|D|
|SE|(Body Diode)|A|showing  the|
|ISM|Pulsed Source Current|–––|–––|150|integral reverse|G|
|ow|(Body Diode)|p-n junction diode.|S|
|VSD|Diode Forward Voltage|–––|–––|1.3|V|TJ = 25°C, IS = 23A, VGS = 0V|
|Rs|GO|
|trr|Reverse Recovery Time|–––|75|110|ns|TJ = 25°C, IF = 23A, VDD = 25V|
|Qrr|Reverse Recovery Charge|–––|210|310|nC|di/dt = 100A/µs|
|Iee|ed|®|
|ton|Forward Turn-On Time|Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)|
|a|

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Notes hrough re  on page 11 HEXFET[®] is a registered trademark of International Rectifier. 

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1000<br>VGS<br>TOP           15V<br>10V<br>4.5V<br>100 4.0V ae<br>3.5V<br>3.0V<br>2.7V<br>BOTTOM 2.5V<br>10 ec<br>2.5V<br>ecm<br>1 P y |<br>0.1<br>20µs PULSE WIDTH<br>ee I<br>A Tj = 25°C 1 Al<br>0.01<br>0.01 0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 1.   Typical Output Characteristics<br>1000<br>Seesee<br>100<br>| _| |_|<br>T = 175°C<br>J<br>a7 aeee e e eee<br>T = 25°C<br>10 J<br>| |<br>7 )aa ee eee<br>VDS = 25V<br>20µs PULSE WIDTH<br>1<br>2 3 4 5<br>VGS, Gate-to-Source Voltage (V)<br>ID, Drain-to-Source Current (A)<br>) (Α<br>ID, Drain-to-Source Current<br>**----- End of picture text -----**<br>


**Fig 3.** Typical Transfer Characteristics 

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1000<br>VGS<br>TOP           15V<br>10V<br>4.5V<br>4.0V EE<br>100 3.5V<br>3.0V<br>2.7V<br>BOTTOM 2.5V<br>gEPCH IIT<br>10 2.5V<br>P E et<br>EH Pr FE | AaB<br>1<br>20µs PULSE WIDTH<br>4ZA ll Tj = 175°C lll<br>0.1<br>0.01 0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 2.   Typical Output Characteristics<br>60<br>TJ = 25°C<br>50<br>40 TAL<br>T = 175°C<br>J<br>30 Zann<br>Vane<br>20<br>10<br>VDS = 10V<br>20µs PULSE WIDTH<br>0<br>0 10 20 30 40 50 60<br>ID, Drain-to-Source Current (A)<br>GFS, Forward Transconductance (S)<br>ID, Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 4.** Typical Forward Transconductance vs. Drain Current 

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100000 5.0<br>VGS   = 0V,       f = 1 MHZ<br>Ciss   = Cgs + Cgd,  Cds SHORTED ID= 23A VDS= 64V<br>_ Crss    = Cgd  | 4.0 VDS= 40V yy<br>10000 Coss   = Cds + Cgd VDS= 16V<br>3.0<br>at Ciss eA<br>1000<br>Coss 2.0<br>a ee NG ee SE<br>100<br>e S C ll 1.0 f T lt of<br>rss<br>a ee eee ee<br>ee ee<br>10 0.0<br>1 10 100 0 5 10 15 20 25<br>VDS, Drain-to-Source Voltage (V)  QG  Total Gate Charge (nC)<br>C, Capacitance(pF)<br>VGS, Gate-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 5.** Typical Capacitance vs. Drain-to-Source Voltage 

**Fig 6.** Typical Gate Charge vs. Gate-to-Source Voltage 

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1000.00<br>Ee ee ee ee ee es ee<br>100.00<br>e s<br>T = 175°C<br>J<br>ee 4 a 2 ee ee<br>10.00<br>2 /4) ae<br>i ee ee ee ee eee<br>T = 25°C<br>1.00 P pp J<br>VGS = 0V<br>0.10 |eefL fF | [| | |<br>0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


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1000<br>OPERATION IN THIS AREA<br>rT Ye LIMITED BY R DS ' (on) ll<br>100<br>PesraatHE tibTT<br>100µsec<br>10 PTS SS tT<br>|<br>1msec<br>| Mall<br>1 PA SST oT<br>Tc = 25°C 10msec<br>Tj = 175°C<br>Single Pulse<br>0.1 eelllee<br>1 10 100 1000<br>VDS, Drain-to-Source Voltage (V)<br>ID,  Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 7.** Typical Source-Drain Diode Forward Voltage 

**Fig 8.** Maximum Safe Operating Area 

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40 3.0<br>ID = 38A<br>S LOT TAT<br>35<br>2.5 VGS = 4.5V<br>S a 4<br>30 N PT TT<br>2.0<br>2520 TT TTNE} [INT] | 1.5 H E E RRRReeaeee EE EA AATTY<br>15 P EN] P epa<br>1.0<br>P E TN a e>_dceeeeee<br>10<br>\ || ae ET<br>0.5<br>50 CPETE N [TN] 0.0 P e EEEEEEEHLLTETETTeeEE eT<br>25 50 75 100 125 150 175 -60 -40 -20 0 20 40 60 80 100 120 140 160 180<br> TC , Case Temperature (°C) TJ , Junction Temperature (°C)<br>Fig 9.   Maximum Drain Current vs. Fig 10.   Normalized On-Resistance<br>Case Temperature vs. Temperature<br>10<br>Saas so Os 600 | ee On a | ee OO a | OO OOO OO Oe |<br>PT Te<br>1<br>D = 0.50<br>— ——————<br>FO) 0.20 EAP rr rr | rR oy) PT<br>— 0.10 a a a Oc 0 ee | |<br>0.1<br>0.05<br>0.02 P DM<br>| 0.01 oS ce ee ee ee el eee<br>t 1<br>Se aaa<br>0.01 Pee SINGLE PULSE oT PTTTT t 2<br>ee ( THERMAL RESPONSE ) Notes:<br>a ee ee eee 1. Duty factor D = t   / t1 2<br>2. Peak T J = P DM x  Z thJC + T C<br>ee eee<br>0.001<br>1E-006 1E-005 0.0001 0.001 0.01 0.1 1<br>t1 , Rectangular Pulse Duration (sec)<br>ID,  Drain Current (A)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>Thermal Response ( Z  thJC )<br>**----- End of picture text -----**<br>


**Fig 11.** Maximum Effective Transient Thermal Impedance, Junction-to-Case 

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15V<br>VDS L DRIVER<br>RG D.U.T +<br>- [V][DD]<br>IAS<br>wi 20VVGS lt<br>tp 0.01 Ω<br>P Y<br>**----- End of picture text -----**<br>


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Fig 12a.   Unclamped Inductive Test Circuit<br>V(BR)DSS<br>tp<br>a<br>/<br>|<br>IAS<br>**----- End of picture text -----**<br>


**Fig 12b.** Unclamped Inductive Waveforms 

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o T QG<br>; QGS /oo QGD<br>VG<br>**----- End of picture text -----**<br>


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Charge<br>**----- End of picture text -----**<br>


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Fig 13a.   Basic Gate Charge Waveform<br>Current Regulator<br>Same Type as D.U.T.<br>o e<br>50K Ω<br>12V .2 µ F<br>7 .3 µ F<br>TLS +<br>D.U.T. -VDS<br>VGS<br>@<br>3mA<br>ot<br>IG ID<br>Current Sampling Resistors<br>**----- End of picture text -----**<br>


**Fig 13b.** Gate Charge Test Circuit 

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400<br>ID<br>GEaanae<br>TOP         9.3A<br>16A<br>XGRnaen<br>300 BOTTOM 23A<br>200 P N EEL<br>N NOK EEt<br>100<br>P SSNU ED<br>T TS<br>0<br>25 PE 50 75 100 | ASA 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>Fig 12c.   Maximum Avalanche Energy<br>vs. Drain Current<br>2.5 PEELE ELE<br>2.0<br>L ttttt tt tt<br>P PE<br>1.5 P EL ENEE EEE<br>ID = 250µA<br>AN E<br>1.0<br>PL E<br>PEEL ELLLLIN |<br>0.5<br>-75 -50 -25 0 25 50 75 100 125 150 175 200<br>FEE T TET ET<br>TJ , Temperature ( °C )<br>VGS(th) Gate threshold Voltage (V)<br>EAS , Single Pulse Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Fig 14.** Threshold Voltage vs. Temperature 

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1000<br>Duty Cycle = Single Pulse<br>cc Oe |<br>100 Allowed avalanche Current vs<br>avalanche  pulsewidth,  tav<br>0.01<br>assuming  ∆ Tj = 25°C due to<br>avalanche losses<br>10 0.05<br>0.10<br>1<br>a<br>0.1 ee ee ee ell<br>1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Fig 15.   Typical Avalanche Current vs.Pulsewidth<br>200 Notes on Repetitive Avalanche Curves , Figures 15, 16:<br>TOP          Single Pulse                 (For further info, see AN-1005 at www.irf.com)<br>BOTTOM   10% Duty Cycle 1. Avalanche failures assumption:<br>ID = 23A   Purely a thermal phenomenon and failure occurs at a<br>150     temperature far in excess of Tjmax. This is validated for<br>N ee     every part type.<br>2. Safe operation in Avalanche is allowed as long asTjmax is<br>C NT   not exceeded.<br>3. Equation below based on circuit and waveforms shown in<br>100<br>P UNE EEEEEEE   Figures 12a, 12b.<br>4. PD (ave) = Average power dissipation per single<br>O NC     avalanche pulse.<br>5. BV = Rated breakdown voltage (1.3 factor accounts for<br>50 P EEING     voltage increase during avalanche).<br>6. Iav = Allowable avalanche current.<br>POPPE SE 7.  ∆ T = Allowable rise in junction temperature, not to exceed<br>    Tjmax (assumed as 25°C in Figure 15, 16).<br>EEN<br>0   tav = Average time in avalanche.<br>25 50 75 100 125 150 175   D = Duty cycle in avalanche =  tav ·f<br>  ZthJC(D, tav) = Transient thermal resistance, see figure 11)<br>Starting TJ , Junction Temperature (°C)<br>EAR , Avalanche Energy (mJ)<br>Avalanche Current (A)<br>**----- End of picture text -----**<br>


**Fig 16.** Maximum Avalanche Energy vs. Temperature 

**PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC Iav = 2 T/ [1.3·BV·Zth]** 

- **EAS (AR) = PD (ave)·tav** 

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Driver Gate Drive<br>P.W.<br>D.U.T + Period — D = ——<br>+ P.W. Period<br>) ©)    •  Circuit Layout Considerations fi V t GS=10V<br> •<br>| =] - LowGround StrayPla I n eductance<br> •   CurrentLow LeakageTransformerInductance @) D.U.T. ISD Waveform<br>+<br>Reverse<br>- a | = - ® + RecoveryCurrent r Body Diode ForwardCurrent di/dt /\<br>® D.U.T. VDS Waveform Diode Recoverydv/dt ‘<br>00 _ VDD<br>•   Re-Applied<br>Re ) •   dvidtDriver controlledsame type byas ReD.U.T. Vop + Voltage Body Diode  Forward Drop [_<br>•   - Inductor Curent<br>•   D.U.T. - Device Under Test es ee<br>Ripple  ≤ 5% ISD<br>Isp controlled by Duty Factor "D" ®<br>**----- End of picture text -----**<br>


## **Fig 17.** Peak Diode Recovery dv/dt Test HEXFET ® Power MOSFETs 

## for N-Channel 

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-<br>≤ 1  ys<br>≤ 0.1 %<br>**----- End of picture text -----**<br>


**Fig 18a.** Switching Time Test Circuit 

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VDS<br>90%<br>10%<br>VGS |\< ve >!\ vie<br>td(on) tr td(off) tf<br>**----- End of picture text -----**<br>


**Fig 18b.** Switching Time Waveforms 

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EXAMPLE: THIS IS AN IRFR120<br>WITH ASSEMBLY INTERNATIONAL cE PART NUMBER<br>LOT CODE 1234 RECTIFIER IRFR120 DATE CODE<br>ASSEMBLED ON WW 16, 2001 LOGO 116A YEAR 1 =  2001<br>IN THE ASSEMBLY LINE "A" 12 34 WEEK 16<br>om | LINE A<br>Note: "P" in assembly line positionindicates "Lead-Free" ASSEMBLYLOT CODE t a t<br>"P" in assembly line position indicates<br>"Lead-Free" qualification to the consumer-level<br>PART NUMBER<br>OR INTERNATIONALRECTIFIER go IRFR120 N P =  DESIGNATES LEAD-FREEDAT E CODE<br>LOGO PRODUCT (OPTIONAL)<br>12 34 P =  DESIGNATES LEAD-FREE<br>ASSEMBLYLOT CODE at PRODUCT QUALIFIED TO THECONSUMER LEVEL (OPTIONAL)<br>YEAR 1 =  2001<br>WEEK 16<br>A =  ASSEMBLY SITE CODE<br>**----- End of picture text -----**<br>


## **Notes: 1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/ 2. For the most current drawing please refer to IR website at http://www.irf.com/package/** www.irf.com 

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EXAMPLE: THIS IS AN IRFU120 PART NUMBER<br>WITH ASSEMBLYLOT CODE 5678ASSEMBLED ON WW 19, 2001 INTERNATIONALRECTIFIERLOGO (a 56IRFU120119A78 DATE CODEYEAR 1 =  2001WEEK 19<br>IN THE ASSEMBLY LINE "A"<br>LINE A<br>ASSEMBLY<br>LOT CODE<br>Note: "P" in assembly line position<br>indicates Lead-Free"<br>OR<br>PART NUMBER<br>INTERNATIONAL a<br>RECTIFIER IRFU120 DATE CODE<br>LOGO P =  DESIGNATES LEAD-FREE<br>56 78 PRODUCT (OPTIONAL)<br>ASSEMBLY YEAR 1 =  2001<br>LOT CODE WEEK 19<br>A =  ASSEMBLY SITE CODE<br>**----- End of picture text -----**<br>


## **Notes:** 

**1. For an Automotive Qualified version of this part please seehttp://www.irf.com/product-info/auto/ 2. For the most current drawing please refer to IR website at http://www.irf.com/package/** 

www.irf.com 

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TR TRR TRL<br>-OOO9 9 0) I eooo/1<br>16.3 ( .641 ) 16.3 ( .641 )<br>15.7 ( .619 ) 15.7 ( .619 )<br>7 7<br>12.1 ( .476 )11.9 ( .469 ) FEED DIRECTION 8.1 ( .318 )7.9 ( .312 ) FEED DIRECTION<br>NOTES :<br>1.  CONTROLLING DIMENSION : MILLIMETER.<br>2.  ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ).<br>3.  OUTLINE CONFORMS TO EIA-481 & EIA-541.<br>.   13 INCH<br>16 mm<br>mw =e<br>NOTES :<br>1. OUTLINE CONFORMS TO EIA-481.<br>**----- End of picture text -----**<br>


Repetitive rating;  pulse width limited by max. junction temperature. (See fig. 11). 

Limited by TJmax, starting TJ = 25°C, L = 0.71mH, RG = 25 Ω , IAS = 23A, VGS =10V. Part not recommended for use above this value. 

ISD ≤ 23A, di/dt ≤ 400A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. Pulse width ≤ 1.0ms; duty cycle ≤ 2%. 

Coss eff. is a fixed capacitance that gives the same charging time  as Coss while VDS is rising from 0 to 80% VDSS . Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance. 

This value determined from sample failure population. 100% tested to this value in production. 

When mounted on 1" square PCB (FR-4 or G-10 Material).  For recommended footprint and soldering techniques refer to  application note #AN-994. 

Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. 

**IR WORLD HEADQUARTERS:** 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information **.** 10/2010 

www.irf.com 

11 



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