# Power MOSFET, N Channel, 150 V, 33 A, 0.042 ohm, TO-263AB, Surface Mount

![Product image](https://novapart.co/image/farnell:2725991/)

**URL**: https://novapart.co/products/IRFS4615TRLPBF/power-mosfet-n-channel-150-v-33-a-0042-ohm-to
**SKU**: IRFS4615TRLPBF
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.8960
**Stock**: 500+
**Lead Time**: 64 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:33A; Drain Source Voltage Vds:150V; On Resistance Rds(on):0.0345ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:5V; P

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | HEXFET |
| Qualification | - |
| Power Dissipation | 144W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-263AB |
| Drain Source Voltage Vds | 150V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 33A |
| Drain Source On State Resistance | 0.042ohm |
| Gate Source Threshold Voltage Max | 5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2725991/)

96202 

## IRFS4615PbF IRFSL4615PbF 

HEXFET Power MOSFET 

## **Applications** 

High Efficiency Synchronous Rectification in SMPS Uninterruptible Power Supply High Speed Power Switching Hard Switched and High Frequency Circuits 

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D VDSS 150V<br>RDS(on)   typ. 34.5m<br>G               max. 42m Q<br>S ID  po 33A<br>**----- End of picture text -----**<br>


## **Benefits** 

Improved  Gate, Avalanche and Dynamic  dV/dt Ruggedness 

Fully Characterized Capacitance and Avalanche SOA 

Enhanced body diode dV/dt and dI/dt Capability Lead-Free 

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D D<br>S S<br>D<br>G G<br>D [2] Pak TO-262<br>IRFS4615PbF IRFSL4615PbF<br>**----- End of picture text -----**<br>


|**G**|**D**|**S**|
|---|---|---|
|Gate|Drain|Source|



## **Absolute Maximum Ratings** 

|**Symbol**|**Parameter**<br>**Units**<br>**Max.**|
|---|---|
|ID@ TC= 25°C<br>Continuous Drain Current, VGS@ 10V<br>ID@ TC= 100°C<br>Continuous Drain Current, VGS@ 10V<br>IDM<br>Pulsed Drain Current<br>PD@TC= 25°C<br>Maximum Power Dissipation<br>W<br>Linear DeratingFactor<br>W/°C<br>VGS<br>Gate-to-Source Voltage<br>V<br>dv/dt<br>Peak Diode Recovery<br>V/ns<br>TJ<br>Operating Junction and<br>TSTG<br>Storage Temperature Range<br>Soldering Temperature, for 10 seconds<br>(1.6mm from case)<br>**Avalanche Characteristics**<br>33<br>24<br>140<br>0.96<br>300<br>°C<br>A<br>144<br>38<br>-55  to + 175<br>± 20<br>~~pT~~<br>~~ee~~<br>~~ie~~<br>~~a———#~~<br>~~a~~<br>~~a~~<br>~~a~~||
|EAS(Thermallylimited)|Single Pulse Avalanche Energy<br>mJ<br>109|
|IAR|Avalanche Current<br>A<br>See Fig. 14, 15, 22a, 22b,|
|EAR|Repetitive Avalanche Energy<br>mJ|
|**Thermal Resistance**||
|**Symbol**|**Parameter**<br>**Typ.**<br>**Max.**<br>**Units**|
|RθJC<br>RθJA|Junction-to-Case<br>–––<br>1.045<br>Junction-to-Ambient(PCB Mount)<br>–––<br>40<br>°C/W<br>~~a~~|



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**Static @ TJ = 25°C (unless otherwise specified)** 

|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**||
|---|---|---|
|V(BR)DSS<br>Drain-to-Source Breakdown Voltage<br>150<br>–––<br>–––<br>V<br>∆V(BR)DSS/∆TJBreakdown Voltage Temp. Coefficient<br>–––<br>0.19<br>–––<br>V/°C<br>RDS(on)<br>Static Drain-to-Source On-Resistance<br>–––<br>34.5<br>42<br>mΩ<br>VGS(th)<br>Gate Threshold Voltage<br>3.0<br>–––<br>5.0<br>V<br>IDSS<br>Drain-to-Source Leakage Current<br>–––<br>–––<br>20<br>–––<br>–––<br>250<br>IGSS<br>Gate-to-Source Forward Leakage<br>–––<br>–––<br>100<br>Gate-to-Source Reverse Leakage<br>–––<br>–––<br>-100<br>RG<br>Internal Gate Resistance<br>–––<br>2.7<br>–––<br>Ω<br>**Dynamic @ TJ = 25°C (unless otherwise specified)**<br>VGS= 20V<br>VGS= -20V<br>VGS= 0V, ID= 250µA<br>Reference to 25°C, ID= 5mA<br>VGS= 10V, ID= 21A<br>VDS= VGS, ID= 100µA<br>VDS= 150V, VGS= 0V<br>VDS= 150V, VGS= 0V, TJ= 125°C<br>µA<br>nA<br>~~GG~~<br>~~GG~~<br>~~QQ~~<br>~~QO~~<br>~~©~~<br>~~GG~~<br>~~GG~~<br>~~©~~<br>~~QQ~~<br>~~QO~~<br>~~ee~~<br>~~ee ee ee~~<br>~~||~~<br>~~ee~~<br>~~**|**~~<br>~~GG~~<br>~~GG~~|||
|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**||
|gfs<br>Qg|Forward Transconductance<br>35<br>–––<br>–––<br>S<br>Total Gate Charge<br>–––<br>26<br>40<br>VDS= 50V, ID= 21A<br>ID= 21A<br>~~GG~~<br>~~QO~~<br>~~I~~<br>~~a~~||
|Qgs<br>Qgd|Gate-to-Source Charge<br>–––<br>8.6<br>–––<br>Gate-to-Drain("Miller")Charge<br>–––<br>9.0<br>–––<br>VDS= 75V<br>VGS= 10V<br>nC<br>~~a~~<br>~~a~~<br>®||
|Qsync|Total Gate Charge Sync. (Qg- Qgd)<br>–––<br>17<br>–––<br>ID= 21A, VDS=0V, VGS= 10V<br>~~ee~~||
|td(on)|Turn-On DelayTime<br>–––<br>15<br>–––<br>VDD= 98V<br>~~a~~||
|tr<br>td(off)|Rise Time<br>–––<br>35<br>–––<br>Turn-Off DelayTime<br>–––<br>25<br>–––<br>ID= 21A<br>RG= 7.3Ω<br>ns<br>~~a~~<br>~~a~~||
|tf|Fall Time<br>–––<br>20<br>–––<br>VGS= 10V<br>~~a~~<br>@||
|Ciss|Input Capacitance<br>–––<br>1750<br>–––<br>VGS= 0V<br>~~a~~||
|Coss|Output Capacitance<br>–––<br>155<br>–––<br>VDS= 50V<br>~~a~~||
|Crss<br>Cosseff. (ER) <br>Cosseff. (TR)|Reverse Transfer Capacitance<br>–––<br>40<br>–––<br> Effective Output Capacitance(EnergyRelated)<br>–––<br>179<br>–––<br> Effective Output Capacitance(Time Related)<br>–––<br>382<br>–––<br>ƒ= 1.0MHz(See Fig.5)<br>VGS= 0V, VDS= 0V to 120V<br>(See Fig.11)<br>VGS= 0V, VDS= 0V to 120V<br>pF<br>~~a~~<br>~~**©**)~~<br>~~©®~~||
|**Diode Characteristics**|||
|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**||
|IS<br>ISM<br>VSD<br>trr<br>Qrr<br>IRRM|S<br>D<br>G<br>Continuous Source Current<br>(BodyDiode)<br>Pulsed Source Current<br>(BodyDiode)<br>Diode Forward Voltage<br>–––<br>–––<br>1.3<br>V<br>Reverse Recovery Time<br>–––<br>70<br>–––<br>TJ= 25°C<br>VR= 100V,<br>–––<br>83<br>–––<br>TJ= 125°C<br>IF= 21A<br>Reverse Recovery Charge<br>–––<br>177<br>–––<br>TJ= 25°C<br>di/dt = 100A/µs<br>–––<br>247<br>–––<br>TJ= 125°C<br>Reverse RecoveryCurrent<br>–––<br>4.9<br>–––<br>A<br>TJ= 25°C<br>MOSFET symbol<br>showing  the<br>TJ= 25°C, IS= 21A, VGS= 0V<br>integral reverse<br>p-njunction diode.<br>A<br>–––<br>–––<br>–––<br>–––<br>ns<br>nC<br>33<br>140<br>~~|~~<br>~~GG~~<br>~~GO~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~|~~~~**|**~~<br>~~ee ee~~<br>~~ee~~<br>;<br>~~|~~<br>~~a~~||
|ton|Forward Turn-On Time<br>Intrinsic turn-on time is negligible(turn-on is dominated byLS+LD)<br>~~a~~<br>~~Q~~||



> Notes: ~~)~~ a Repetitive rating;  pulse width limited by max. junction ~~©~~ Coss eff. (TR) is a fixed capacitance that gives the same charging time temperature. as Coss while VDS is rising from 0 to 80% VDSS. ® Limited by TJmax, starting TJ = 25°C, L = 0.51mH © Coss eff. (ER) is a fixed capacitance that gives the same energy as RG = 25Ω, IAS = 21A, VGS =10V. Part not recommended for use Coss while VDS is rising from 0 to 80% VDSS. above this value . 

@ When mounted on 1" square PCB (FR-4 or G-10 Material).  For recom mended footprint and soldering techniques refer to application note #AN-994 

ISD ≤ 21A, di/dt ≤ 549A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. Pulse width ≤ 400µs; duty cycle ≤ 2%. 

θ 

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1000<br>VGS<br>TOP           15V<br>12V<br>100 10V<br>8.0V<br>7.0V<br>6.0V<br>5.5V<br>10 B OTTOM 5.0V<br>il ee ee ee<br>1<br>5.0V<br>0.1<br>≤60µs PULSE WIDTH<br>Tj = 25°C<br>0.01 SSS So<br>0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 1.   Typical Output Characteristics<br>1000<br>Py tT cP dT dT<br>100 S e<br>TJ = 175°C<br>a) a<br>TJ = 25°C<br>10<br>s/ o<br>en ee ee ee eee ee<br>1<br>A to<br>VDS = 50V<br>≤60µs PULSE WIDTH<br>0.1 rTPEPEAtt Ee<br>2 4 6 8 10 12 14 16<br>VGS, Gate-to-Source Voltage (V)<br>ID, Drain-to-Source Current (A)<br>ID, Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 3.** Typical Transfer Characteristics 

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100000<br>VGS   = 0V,       f = 1 MHZ<br>Ciss   = C gs + Cgd,  C ds SHORTED<br>C  = C<br>rss   gd<br>C = C + C<br>10000 oss   ds  gd<br>e Ciss e<br>1000<br>Sy Coss oo<br>C<br>S rss I P<br>100<br>10 enr+-FTELEmLLET|<br>1 10 100 1000<br>VDS, Drain-to-Source Voltage (V)<br>C, Capacitance (pF)<br>**----- End of picture text -----**<br>


**Fig 5.** Typical Capacitance vs. Drain-to-Source Voltage 

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1000<br>VGS<br>TOP           15V<br>12V<br>10V<br>8.0V<br>100 7.0V<br>6.0V<br>5.5V<br>BOTTOM 5.0V<br>10<br>E P? ee<br>5.0V<br>1<br>≤60µs PULSE WIDTH<br>Tj = 175°C<br>0.1 ir nail!<br>0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 2.   Typical Output Characteristics<br>3.0<br>ID = 21A<br>PTT TTL<br>VGS = 10V<br>2.5<br>Hitt IITA<br>2.0 T TY!<br>1.5<br>1.0 P ELE<br>0.5 BPZapZGnnan n eeeee<br>-60 -40 -20 0 20 40 60 80 100120140160180<br>TJ , Junction Temperature (°C)<br>ID, Drain-to-Source Current (A)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>**----- End of picture text -----**<br>


**Fig 4.** Normalized On-Resistance vs. Temperature 

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14.0<br>ID= 21A<br>12.0<br>VDS= 120V<br>10.0 VDS= 75V<br>VDS= 30V<br>Gf<br>8.0<br>Bey e<br>6.0<br>4.0 Y tti tt<br>2.0 Z ann<br>0.0<br>0 5 10 15 20 25 30 35<br> QG,  Total Gate Charge (nC)<br>VGS, Gate-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 6.** Typical Gate Charge vs. Gate-to-Source Voltage 

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1000<br>100<br>a  2<br>T = 175°C<br>J<br>T = 25°C<br>J<br>10 P | ff | |<br>VGS = 0V<br>a e<br>1.0<br>0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


**Fig 7.** Typical Source-Drain Diode Forward Voltage 

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40<br>35<br>f T | | | [ [|<br>30 eT e eeeS<br>25 ~~<br>20<br>[ eNee<br>1510 PP t| || |EKIN |<br>P T<br>5<br>0 Ft | | lt uN.<br>25 50 75 100 125 150 175<br> TC , Case Temperature (°C)<br>ID,  Drain Current (A)<br>**----- End of picture text -----**<br>


**Fig 9.** Maximum Drain Current vs. Case Temperature 

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3.0<br>2.5<br>T HOT T<br>2.01.5 ST ReeeeO T|<br>f<br>1.0 S an ne<br>4<br>0.5<br>0.0 aPeea<br>-20 0 20 40 60 80 100 120 140 160<br>VDS, Drain-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


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Energy (µJ)<br>**----- End of picture text -----**<br>


**Fig 11.** Typical COSS Stored Energy 

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1000<br>OPERATION IN THIS AREA<br>LIMITED BY R DS(on)<br>100<br>100µsec<br>1msec<br>ii i, Se<br>10<br>10msec<br>Po SP DC RREA FyD<br>1<br>Tc = 25°C<br>Tj = 175°C<br>Single Pulse<br>0.1 i ll<br>1 10 100 1000<br>VDS, Drain-to-Source Voltage (V)<br>ID,  Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 8.** Maximum Safe Operating Area 

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190<br>Id = 5mA<br>185<br>C TT<br>180<br>ttt<br>175<br>| Ad<br>P TE ELLE LVL<br>170<br>165 P EELE<br>160 P CELLALELEL<br>155<br>iF CELVELLELLtt<br>150 S ACELEE EEL<br>tt tt<br>145<br>140 MA CELLELELELLTEL<br>-60 -40 -20 0 20 40 60 80 100120140160180<br>TJ , Temperature ( °C )<br>V(BR)DSS, Drain-to-Source Breakdown Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 10.** Drain-to-Source Breakdown Voltage 

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500<br>450 ID<br>TOP          2.8A<br>400 o e 5.3A<br>BOTTOM 21A<br>350 C\ OnnnnnLEC<br>300<br>A SE<br>250 P EREP Er<br>200<br>P CPXELL<br>150 P NR<br>100<br>S OESNS<br>50<br>C OOL ESS<br>0<br>25 50 75 100 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>EAS , Single Pulse Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Fig 12.** Maximum Avalanche Energy vs. DrainCurrent 

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10<br>a ae a ee ee ee ee ee ee ee ee ee eee<br>1 A<br>D = 0.50<br>— 0.20 ee == ee a | - -<br>0.1 — 0.020.010.050.10 C r τJ τJτ1τ1 R1 R1 τ2 τR22 R2 Rτ33 R τ3 3 τR4τ4R4 4 τCτ po Ri (°C/W)   0.02324    0.0000080.26212    0.0001060.50102    0.001115 τi (sec)<br>0.01 Ci= τi/Ri 0.25880    0.005407<br>o T err | ae! Ci i/Ri rs<br>Notes:<br>SINGLE PULSE<br>rf S| CT EY ( THERMAL RESPONSE ) re ee ee 1. Duty Factor D = t1/t2 al<br>2. Peak Tj = P dm x Zthjc + Tc<br>0.001 Sa ltrmnntitionmcnililianal il<br>1E-006 1E-005 0.0001 0.001 0.01 0.1<br>t1 , Rectangular Pulse Duration (sec)<br>Fig 13.   Maximum Effective Transient Thermal Impedance, Junction-to-Case<br>100<br>Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche<br>a 2 ee ee ee ee ee (14<br>ss ss cs me OO OO pulsewidth, tav, assuming ∆Tj = 150°C and  1 |<br>Tstart =25°C (Single Pulse)<br>0.01<br>10 a,eo<br>0.05<br>0.10<br>etd ee |<br>1 I SIP=o<br>| Allowed avalanche Current vs avalanche  ee ee ee ee eee<br>pulsewidth, tav, assuming ∆Τ j = 25°C and<br>Tstart = 150°C.<br>PE  Peri<br>0.1<br>1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Fig 14.   Typical Avalanche Current vs.Pulsewidth<br>120 Notes on Repetitive Avalanche Curves , Figures 14, 15:<br>TOP          Single Pulse                 (For further info, see AN-1005 at www.irf.com)<br>BOTTOM   1.0% Duty Cycle 1. Avalanche failures assumption:<br>100 ID = 21A Purely a thermal phenomenon and failure occurs at a temperature far in<br>M t excess of Tjmax. This is validated for every part type.<br>2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded.jmax is not exceeded. is not exceeded.<br>80<br>3. Equation below based on circuit and waveforms shown in Figures 16a, 16b.<br>o oo 4. PD (ave) = Average power dissipation per single avalanche pulse.<br>60 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase<br>during avalanche).<br>S NELL 6. Iav = Allowable avalanche current.<br>40 7. ∆T = Allowable rise in junction temperature, not to exceed∆T = Allowable rise in junction temperature, not to exceedT = Allowable rise in junction temperature, not to exceed = Allowable rise in junction temperature, not to exceedAllowable rise in junction temperature, not to exceed Tjmax (assumed asjmax (assumed as(assumed as<br>25°C in Figure 14, 15).<br>H ASSE tav = Average time in avalanche.<br>20 D = Duty cycle in avalanche =  tav ·f<br>T INA TTT ZthJC(D, tav) = Transient thermal resistance, see Figures 13)<br>0 LL EL EL NAAN<br>PD (ave) = 1/2 ( 1.3·BV·Iav) = T/ ZthJC<br>25 50 75 100 125 150 175 Iav = 2 A T/ [1.3·BV·Zth]<br>Starting TJ , Junction Temperature (°C) EAS (AR) = PD (ave)·tav<br>EAR , Avalanche Energy (mJ)<br>Avalanche Current (A)<br>Thermal Response ( Z thJC ) °C/W<br>**----- End of picture text -----**<br>


2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded.jmax is not exceeded. is not exceeded. 

3. Equation below based on circuit and waveforms shown in Figures 16a, 16b. 

5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 

7. ∆T = Allowable rise in junction temperature, not to exceed∆T = Allowable rise in junction temperature, not to exceedT = Allowable rise in junction temperature, not to exceed = Allowable rise in junction temperature, not to exceedAllowable rise in junction temperature, not to exceed Tjmax (assumed asjmax (assumed as(assumed as 25°C in Figure 14, 15). 

**Fig 15.** Maximum Avalanche Energy vs. Temperature 

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6.0 a ee ee ee ee ee ee<br>5.5 ) e |e Fe.eefteefteefteefteeeft<br>5.0 e eee ee eee<br>4.5 BP |SNORSee eeDS<br>4.0<br>Pp | | US A ERT<br>P f | | ASA RK] UK LE<br>3.5 |_ _| a V4<br>3.0 |_ _| ID = 100µA ALZAZ SSI<br>ID = 250uA<br>|| AY | NAA<br>2.52.0 ||__ _|| ID = 1.0mAID = 1.0A f Jf f[ [|pe}rT| | | UNGTN<br>1.5 pe t<br>e e N ee eeNee ee ee<br>1.0 e eee ee eee<br>-75 -50 -25 0 25 50 75 100 125 150 175<br>TJ , Temperature ( °C )<br>VGS(th), Gate threshold Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 16.** Threshold Voltage vs. Temperature 

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35<br>IF = 21A<br>¢<br>30 V R = 100V | | |.<br>TJ = 25°C<br>25<br>TJ = 125°C<br>20 | Reeoe<br>| oy |<br>15<br>| 7<br>P it | |<br>10<br>A 2 | | |<br>5<br>0<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>IRRM (A)<br>**----- End of picture text -----**<br>


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30<br>IF = 14A ,<br>25 VR = 100V o”<br>TJ = 25°C<br>Pa<br>20 TJ = 125°C 4 7<br>, Ga<br>~<br>15 4<br>10 / |<br>Wa<br>5 S|<br>0<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>Fig. 17 - Typical Recovery Current vs. di;/dt<br>800<br>IF = 14A<br>eo<br>700 V R = 100V ae<br>TJ = 25°C<br>600<br>TJ = 125°C<br>500 nwoe¢<br>400 “<br>¢<br>300 P LT<br>200 t eo T|<br>|<br>100<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>IRRM (A)<br>QRR (A)<br>**----- End of picture text -----**<br>


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1000<br>IF = 21A<br>900 | | |<br>VR = 100V ¢v<br>ee<br>800 T J = 25°C<br>700 TJ = 125°C | [ot]<br>600 | [ot] OY<br>500 P| Le| EY<br>400<br>tA+ |<br>300 m 2 ae<br>w ae<br>200 | |<br>100<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>QRR (A)<br>**----- End of picture text -----**<br>


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Driver Gate Drive<br>P.W.<br>D.U.T + {+ P.W. Period ——— — D = —— Period<br>) [©)]    •  CircuitLow  LayoutStray ConsiderationsInduct | t V t GS=10<br> •<br>- •   Low Leakage Inductance @ D.U.T. ISD Waveform<br>+<br>Reverse<br>Recovery Body Diode Forward<br>oi - [1] Current Transformer - ® + Current r Current di/dt AN<br>® D.U.T. VDS Waveform Diode Recoverydv/dt ‘<br>00 a VDD<br>ma<br>•   Re-Applied<br>•   Driver same type as D.U.T. + Voltage Body Diode  Forward Drop<br>Re ( 4 •   dv/dt controlled by Rg Vpp -<br>•<br>D.U.T. - Device Under Test SOO |<br>Ripple  ≤ 5% ISD<br>Isp controlled by Duty Factor "D" @| t<br>* Vg = 5V for Logic Level Devices<br>Fig 21.  Peak Diode Recovery dv/dt Test Circuit for N-Channel<br>HEXFET ® Power MOSFETs<br>V(BR)DSS(BR)DSS<br>15V —_ tp -><br>VDS L DRIVER<br>RG D.U.T +<br>- [V][DD]<br>IAS A<br>¢ 20VVGS dt<br>tp 0.01Ω<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
V(BR)DSS(BR)DSS<br>—_ tp -><br>IAS<br>**----- End of picture text -----**<br>


## **Fig 22b.** Unclamped Inductive Waveforms 

**Fig 22a.** Unclamped Inductive Test Circuit 

**==> picture [130 x 58] intentionally omitted <==**

**----- Start of picture text -----**<br>
+<br>-<br>≤ 1<br>≤ 0.1 %<br>**----- End of picture text -----**<br>


## **Fig 23a.** Switching Time Test Circuit 

**==> picture [134 x 132] intentionally omitted <==**

**----- Start of picture text -----**<br>
Current Regulator<br>Same Type as D.U.T.<br>50KΩ<br>12V .2µF .3µF ||<br>+<br>D.U.T. -VDS<br>VGS<br>3mA<br>WAV IG ID<br>Current Sampling Resistors<br>**----- End of picture text -----**<br>


**Fig 24a.** Gate Charge Test Circuit 

**==> picture [192 x 121] intentionally omitted <==**

**----- Start of picture text -----**<br>
VDS<br>90%<br>\<br>10% /\<br>VGS «le ys<br>td(on) tr td(off) tf<br>**----- End of picture text -----**<br>


**==> picture [164 x 10] intentionally omitted <==**

**----- Start of picture text -----**<br>
Fig 23b.   Switching Time Waveforms<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
Id<br>Vds<br>fl Vgs<br>i<br>Vgs(th)<br>a plag [p] [l] [e] w i e » !<br>Qgs1 Qgs2 Qgd Qgodr<br>**----- End of picture text -----**<br>


**Fig 24b.** Gate Charge Waveform 

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## TO-262 Package Outline Dimensions are shown in millimeters (inches) 

## TO-262 Part Marking Information 

www.irf.com 

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Dimensions are shown in millimeters (inches) 

**==> picture [405 x 171] intentionally omitted <==**

**----- Start of picture text -----**<br>
TRR<br>1.60 (.063)<br>1.50 (.059)<br>1.60 (.063)<br>4.10 (.161)<br>1.50 (.059)<br>3.90 (.153) 0.368 (.0145)<br>4!______*00°00He | tL oO SOO G8| @ Te- 0.342 (.0135)<br>FEED DIRECTION 1.85 (.073) 11.60 (.457)<br>1.65 (.065) 11.40 (.449) 24.30 (.957)<br>15.42 (.609)<br>23.90 (.941)<br>15.22 (.601)<br>TRL<br>| x<br>1.75 (.069)<br>10.90 (.429) 1.25 (.049)<br>10.70 (.421) 4.72 (.136)<br>16.10 (.634) 4.52 (.178)<br>15.90 (.626)<br>**----- End of picture text -----**<br>


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FEED DIRECTION<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
13.50 (.532) 27.40 (1.079)<br>12.80 (.504) 23.90 (.941) 1<br>4<br>330.00(14.173) a g 60.00 (2.362)      MIN.<br>  MAX.<br>gD x<br>30.40 (1.197)<br>NOTES :       MAX.<br>1.   COMFORMS TO EIA-418.<br>2.   CONTROLLING DIMENSION: MILLIMETER. 26.40 (1.039)24.40 (.961) al 4<br>3.   DIMENSION MEASURED @ HUB.<br>3<br>**----- End of picture text -----**<br>


4.   INCLUDES FLANGE DISTORTION @ OUTER EDGE. 

Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. 

**IR WORLD HEADQUARTERS:** 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information **.** 12/2008 

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## **IMPORTANT NOTICE** 

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”) . 

With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 

The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. 

For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office ( **www.infineon.com** ). 

## **WARNINGS** 

Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. 

Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 



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---

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