# Power MOSFET, N Channel, 60 V, 195 A, 2500 µohm, TO-263AB, Surface Mount

![Product image](https://novapart.co/image/farnell:2725979/)

**URL**: https://novapart.co/products/IRFS3006TRLPBF/power-mosfet-n-channel-60-v-195-a-2500-ohm-to
**SKU**: IRFS3006TRLPBF
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €1.7200
**Stock**: 500+
**Lead Time**: 64 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:195A; Drain Source Voltage Vds:60V; On Resistance Rds(on):0.002ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:4V; Po

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | HEXFET |
| Qualification | - |
| Power Dissipation | 375W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-263AB |
| Drain Source Voltage Vds | 60V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 195A |
| Drain Source On State Resistance | 2500µohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2725979/)

## IRFS3006PbF IRFSL3006PbF 

HEXFET ® Power MOSFET 

## **Applications** 

High Efficiency Synchronous Rectification in SMPS Uninterruptible Power Supply High Speed Power Switching Hard Switched and High Frequency Circuits 

## **Benefits** 

Improved  Gate, Avalanche and Dynamic  dV/dt Ruggedness 

Fully Characterized Capacitance and Avalanche SOA 

Enhanced body diode dV/dt and dI/dt Capability Lead-Free 

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D VDSS 60V<br>RDS(on)   typ. 2.0m<br>              max. 2.5m QO<br>G ID (Silicon Limited) oO 270A<br>S ID (Package Limited) sl 195A<br>D<br>D<br>S<br>S D<br>G<br>G<br>D [2] Pak TO-262<br>IRFS3006PbF IRFSL3006PbF<br>**----- End of picture text -----**<br>


|**G**|**D**|**S**|
|---|---|---|
|Gate|Drain|Source|



## **Absolute Maximum Ratings** 

|**Symbol**|**Parameter**<br>~~—<—<—_—?—_————~~|**Max.**<br>~~—<—<—_—?—_————~~|**Units**<br>~~ae~~|
|---|---|---|---|
|ID@ TC= 25°C|Continuous Drain Current, VGS@ 10V (Silicon Limited)<br>~~—<—<—_—?—_————~~|270<br>~~—<—<—_—?—_————~~|A<br>~~ae~~|
|ID@ TC= 100°C|Continuous Drain Current, VGS@ 10V (Silicon Limited)<br>~~sO~~<br>~~—<—<—_—?—_————~~|191<br>~~sO~~<br>~~—<—<—_—?—_————~~||
|ID@ TC= 25°C|Continuous Drain Current, VGS@ 10V (Wire Bond Limited)<br>~~a~~<br>~~—<—<—_—?—_————~~|195<br>~~a~~<br>~~—<—<—_—?—_————~~||
|IDM|Pulsed Drain Current<br>~~—<—<—_—?—_————~~|1080<br>~~—<—<—_—?—_————~~||
|PD@TC= 25°C<br>~~a~~|Maximum Power Dissipation<br>~~—<—<—_—?—_————~~<br>~~a~~<br>~~a~~|375<br>~~—<—<—_—?—_———— ~~<br>~~a~~|W<br> ~~ae~~<br>~~a~~|
|~~a~~|Linear DeratingFactor<br>~~a~~<br>~~a~~<br>~~(~~|2.5<br>~~a~~<br>~~(~~<br>~~(~~|W/°C<br>~~a~~<br>~~(~~<br>~~(~~|
|VGS<br>~~a~~|Gate-to-Source Voltage<br>~~a~~<br>~~a~~|± 20<br>~~a~~<br>~~(~~|V<br>~~a~~<br>~~(~~|
|dv/dt|Peak Diode Recovery|10<br>~~(~~|V/ns<br>~~(~~|
|TJ<br>TSTG|Operating Junction and<br>Storage Temperature Range|-55  to + 175|°C|
|~~a~~|Soldering Temperature, for 10 seconds<br>(1.6mm from case)<br>~~a~~|300||
|~~a~~|Mountingtorque,6-32 or M3 screw<br>~~a~~|10lb n(1.1N m)||



www.irf.com 

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10/06/08 

**Static @ TJ = 25°C (unless otherwise specified)** 

|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**||
|---|---|---|
|V(BR)DSS<br>∆V(BR)DSS/∆TJ<br>RDS(on)<br>VGS(th)<br>IDSS<br>IGSS<br>RG|Drain-to-Source Breakdown Voltage<br>60<br>–––<br>–––<br>V<br>Breakdown Voltage Temp. Coefficient<br>–––<br>0.07<br>–––<br>V/°C<br>Static Drain-to-Source On-Resistance<br>–––<br>2.0<br>2.5<br>mΩ<br>Gate Threshold Voltage<br>2.0<br>–––<br>4.0<br>V<br>Drain-to-Source Leakage Current<br>–––<br>–––<br>20<br>µA<br>–––<br>–––<br>250<br>Gate-to-Source Forward Leakage<br>–––<br>–––<br>100<br>nA<br>Gate-to-Source Reverse Leakage<br>–––<br>–––<br>-100<br>Internal Gate Resistance<br>–––<br>2.0<br>–––<br>Ω<br>VGS= 20V<br>VGS= -20V<br>VGS= 0V, ID= 250µA<br>Reference to 25°C, ID= 5mA<br>VGS= 10V, ID= 170A<br>VDS= VGS, ID= 250µA<br>VDS= 60V, VGS= 0V<br>VDS= 60V, VGS= 0V, TJ= 125°C<br>~~QO~~<br>~~GO~~<br>~~eG~~<br>~~GN QQ~~<br>~~pe~~<br>~~RQ~~<br>~~GN QO (~~<br>~~Ce~~<br>~~||~~<br>~~———~~<br>~~ee ——~~<br>~~a~~<br>~~a~~<br>~~GG QO~~||
|**Dynamic @ TJ = 25°C (unless otherwise specified)**|||
|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**||
|gfs<br>Qg|Forward Transconductance<br>280<br>–––<br>–––<br>S<br>Total Gate Charge<br>–––<br>200<br>300<br>nC<br>VDS= 25V, ID= 170A<br>ID= 170A<br>~~GG~~<br>~~QO (a~~<br>~~a~~||
|Qgs|Gate-to-Source Charge<br>–––<br>37<br>–––<br>VDS=30V<br>~~a~~||
|Qgd|Gate-to-Drain("Miller")Charge<br>–––<br>60<br>VGS= 10V<br>~~a~~<br>®||
|Qsync|Total Gate Charge Sync. (Qg- Qgd)<br>–––<br>140<br>–––<br>ID= 170A, VDS=0V, VGS= 10V<br>~~a~~||
|td(on)|Turn-On DelayTime<br>–––<br>16<br>–––<br>ns<br>VDD= 39V<br>~~a~~||
|tr|Rise Time<br>–––<br>182<br>–––<br>ID= 170A<br>~~a~~||
|td(off)|Turn-Off DelayTime<br>–––<br>118<br>–––<br>RG= 2.7Ω<br>~~a~~||
|tf|Fall Time<br>–––<br>189<br>–––<br>VGS= 10V<br>~~a~~<br>®||
|Ciss|Input Capacitance<br>–––<br>8970<br>–––<br>pF<br>VGS= 0V<br>~~a~~||
|Coss|Output Capacitance<br>–––<br>1020<br>–––<br>VDS= 50V<br>~~a~~||
|Crss|Reverse Transfer Capacitance<br>–––<br>534<br>–––<br>ƒ= 1.0MHz,  See Fig. 5<br>~~a~~||
|Cosseff. (ER)<br>Effective Output Capacitance(EnergyRelated)<br>–––<br>1480<br>–––<br>Cosseff. (TR)<br>Effective Output Capacitance(Time Related)<br>–––<br>1920<br>–––<br>**Diode Characteristics**<br>VGS= 0V, VDS= 0V to 48V<br>See Fig. 11<br>VGS= 0V, VDS= 0V to 48V<br>~~a~~<br>®<br>~~>)~~<br>~~©~~|||
|**Symbol**|**Parameter**<br>**Min. Typ. Max. Units**<br>**Conditions**||
|IS<br>ISM<br>VSD<br>trr<br>Qrr<br>IRRM|S<br>D<br>G<br>Continuous Source Current<br>–––<br>–––<br>270<br>A<br>(BodyDiode)<br>Pulsed Source Current<br>–––<br>–––<br>1080<br>A<br>(BodyDiode)<br>Diode Forward Voltage<br>–––<br>–––<br>1.3<br>V<br>Reverse Recovery Time<br>–––<br>44<br>–––<br>ns<br>TJ= 25°C<br>VR= 51V,<br>–––<br>48<br>–––<br>TJ= 125°C<br>IF= 170A<br>Reverse Recovery Charge<br>–––<br>63<br>–––<br>nC<br>TJ= 25°C<br>di/dt = 100A/µs<br>–––<br>77<br>–––<br>TJ= 125°C<br>Reverse RecoveryCurrent<br>–––<br>2.4<br>–––<br>A<br>TJ= 25°C<br>MOSFET symbol<br>showing  the<br>TJ= 25°C, IS= 170A, VGS= 0V<br>integral reverse<br>p-njunction diode.<br>~~pePoe~~<br>~~GG~~<br>~~OQ~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~||~~<br>~~ee~~<br>~~**|**~~<br>~~a~~||
|ton|Forward Turn-On Time<br>Intrinsic turn-on time is negligible(turn-on is dominated byLS+LD)<br>~~Ge~~||



Notes: ~~®~~ Calculated continuous current based on maximum allowable junction ~~®~~ ISD ≤ 170A, di/dt ≤ 1360A/µs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. temperature. Bond wire current limit is 195A. Note that current ® Pulse width ≤ 400µs; duty cycle ≤ 2%. limitations arising from heating of the device leads may occur with © Coss eff. (TR) is a fixed capacitance that gives the same charging time 

some lead mounting arrangements. 

as Coss while VDS is rising from 0 to 80% VDSS. 

®@ Repetitive rating;  pulse width limited by max. junction Coss eff. (ER) is a fixed capacitance that gives the same energy as temperature. Coss while VDS is rising from 0 to 80% VDSS. while VDS is rising from 0 to 80% VDSS. 

Coss while VDS is rising from 0 to 80% VDSS. 

@ Limited by TJmax, starting TJ = 25°C, L = 0.022mH When mounted on 1" square PCB (FR-4 or G-10 Material).  For recom RG = 25Ω, IAS = 170A, VGS =10V. Part not recommended for use mended footprint and soldering techniques refer to application note #AN-994. above this value . @R θ is measured at T, approximately 90°C 

When mounted on 1" square PCB (FR-4 or G-10 Material).  For recom mended footprint and soldering techniques refer to application note #AN-994. 

θJC 

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1000 1000<br>VGS VGS<br>TOP           15V TOP           15V<br>10V 10V<br>8.0V 8.0V<br>6.0V 6.0V<br>5.0V 5.0V<br>100 4.5V4.0V 4.5V4.0V<br>Py /7veaell BOTTOM 3.5V a) Zeal BOTTOM 3.5V<br>100<br>Bee email eer Fl<br>cae a SF At ecSeeact<br>10 I EE ET PA | Le O<br>3.5V<br>PEE 3.5V ≤ 60µs PULSE WIDTH eri Cain ≤ 60µs PULSE WIDTH tT<br>Tj = 25°C Tj = 175°C<br>1 TC LLU 10 4illinenn<br>0.1 1 10 100 0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V)<br>Fig 1.   Typical Output Characteristics Fig 2.   Typical Output Characteristics<br>1000 2.5<br>ID = 170A<br>VGS = 10V<br>a= ae LEE<br>re aa 2.0<br>100 TJ = 175°C<br>fe AMIN<br>1.5<br>T = 25°C<br>J<br>10 fn)= 2 LL EATHK LL<br>1.0<br>ft ff VDS = 25V<br>≤ 60µs PULSE WIDTH<br>1<br>0.5<br>2.0 3.0 4.0 5.0 6.0 7.0<br>-60 -40 -20 0 20 40 60 80 100 120 140 160 180<br>VGS, Gate-to-Source Voltage (V)<br>TJ , Junction Temperature (°C)<br>Fig 4.   Normalized On-Resistance vs. Temperature<br>Fig 3.   Typical Transfer Characteristics<br>16000 16<br>VGS   = 0V,       f = 1 MHZGS   = 0V,       f = 1 MHZ = 0V,       f = 1 MHZ<br>CCiss Ciss iss    = C = Cgs + Cgd,  C = Cgs + Cgd,  Cgs + Cgd,  C+ Cgd,  Cgd,  C,  C ds SHORTEDSHORTED ID= 170A VDS= 48V<br>rss   gd<br>12000 all Coss  = Cds + Cgdoss  = Cds + Cgd= Cds + Cgdds + Cgd+ Cgdgd 12 P| VDS= 30V ann<br>oT o o n<br>C<br>iss<br>T Y a a<br>8<br>8000 otaa t aaeenany aan<br>4<br>~ee aay 4nee<br>4000 Cossoss<br>a Crssrss nT LTT 0 Joon f F<br>t L | | |<br>0 0 40 80 120 160 200 240 280<br>1 10 100<br> QG  Total Gate Charge (nC)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A)<br>)(Α<br>ID, Drain-to-Source Current<br>VGS, Gate-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 4.** Normalized On-Resistance vs. Temperature 

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16000<br>VGS   = 0V,       f = 1 MHZGS   = 0V,       f = 1 MHZ = 0V,       f = 1 MHZ<br>CCiss Ciss iss    = C = Cgs + Cgd,  C = Cgs + Cgd,  Cgs + Cgd,  C+ Cgd,  Cgd,  C,  C ds SHORTEDSHORTED<br>rss   gd<br>all<br>12000 Coss  = Cds + Cgdoss  = Cds + Cgd= Cds + Cgdds + Cgd+ Cgdgd<br>oT<br>C<br>iss<br>T Y<br>8000 t<br>otaa<br>~ee<br>4000 Cossoss<br>a Crssrss nT LTT<br>t L<br>0<br>1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>C, Capacitance (pF)<br>**----- End of picture text -----**<br>


**Fig 5.** Typical Capacitance vs. Drain-to-Source Voltage 

**Fig 6.** Typical Gate Charge vs. Gate-to-Source Voltage 

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1000<br>T = 175°C<br>J<br>100 O m<br>10<br>TJ = 25°CJ = 25°C= 25°C<br>1<br>VGS = 0VGS = 0V= 0V<br>Fo o<br>0.1<br>0.0 0.4 0.8 1.2 1.6 2.0<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


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1000 10000<br>OPERATION IN THIS AREA<br>LIMITED BY R DS(on)<br>T = 175°C<br>J<br>1000<br>100 O m Seime 10 0µsec i<br>100<br>10<br>TJ = 25°CJ = 25°C= 25°C 10 LIMITED BY PACKAGE 1 m sec<br>10 ms e c<br>1<br>1<br>Tc = 25°C<br>Tj = 175°C DC<br>VGS = 0VGS = 0V= 0V Single Pulse<br>0.1 Fo o 0.1 ee<br>0.0 0.4 0.8 1.2 1.6 2.0 0.1 1 10 100<br>VSD, Source-to-Drain Voltage (V) VDS, Drain-toSource Voltage (V)<br>Fig 7.   Typical Source-Drain Diode Fig 8.   Maximum Safe Operating Area<br>Forward Voltage<br>300 80<br>ID = 5mA<br>Limited By Package<br>250 75<br>a TTL<br>200<br>aR | | ad<br>70<br>150<br>SeeNee ETL ELL<br>65<br>100<br>S REeNe ATT<br>60<br>50<br>{ t t t ok 55 TLE<br>0 P| | A<br>-60 -40 -20 0 20 40 60 80 100 120 140 160 180<br>25 50 75 100 125 150 175<br>TJ , Junction Temperature (°C)<br> TC , Case Temperature (°C)<br>Fig 9.   Maximum Drain Current vs. Fig 10.   Drain-to-Source Breakdown Voltage<br>Case Temperature<br>2.0 1400<br>                 I D<br>1200 TOP         20A<br>               27A<br>1.5 | tL Ls. oe BOTTOM   170A<br>1000<br>L Lo<br>800<br>LLL IT<br>1.0<br>600400 DN<br>0.5 LIAL ACT<br>200<br>P eaZEnnn HASeS<br>0.0 0<br>0 10 20 30 40 50 60 25 50 75 100 125 150 175<br>VDS, Drain-to-Source Voltage (V) Starting TJ, Junction Temperature (°C)<br>ID,  Drain Current (A)<br>ID,  Drain-to-Source Current (A)<br>V(BR)DSS , Drain-to-Source Breakdown Voltage<br>Energy (µJ)<br>EAS, Single Pulse Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Fig 10.** Drain-to-Source Breakdown Voltage 

**Fig 11.** Typical COSS Stored Energy 

**Fig 12.** Maximum Avalanche Energy Vs. DrainCurrent 

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1<br>ee ee eee<br>D = 0.50<br>0.1 0.20 errr<br>Ce a [CO] ee tH tH<br>0.10 0 ee ee ee ee ee ee eee<br>0.05 ATI R1 R2<br>0.01 ee 0.02 0.01 ee τJ τJτ1 τ1 R1 τ2τ2 R2 τ C Ri  0.175365 ee (°C/W) 0.000343 τι  ee (sec)<br>=a Pd OS oo 0 Ci= τi/Ri Edee 0.22547 0.006073 |<br>C<br>0.001 ee<br>SINGLE PULSE<br>( THERMAL RESPONSE ) Notes:<br>Po EE 1. Duty Factor D = t1/t2<br>P E 2. Peak Tj = P dm x Zthjc + Tc<br>0.0001<br>1E-006 1E-005 0.0001 0.001 0.01 0.1<br>t1 , Rectangular Pulse Duration (sec)<br>Fig 13.   Maximum Effective Transient Thermal Impedance, Junction-to-Case<br>1000<br>PES Duty Cycle = Single Pulse Allowed avalanche Current vs avalanche<br>pulsewidth, tav, assuming  ∆Tj = 150°C and<br>a ee ee eee eee Tstart =25°C (Single Pulse) LT<br>PO ZAP i<br>100 T 0.01 NTT TTT TTT<br>po SSRN<br>PO 0.05 SE ee<br>0.10<br>10 a pe oS ee<br>| Allowed avalanche Current vs avalanche  a<br>pulsewidth, tav, assuming ∆Τ j = 25°C and<br>Tstart = 150°C.<br>1 ree e<br>1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Thermal Response ( Z thJC )<br>Avalanche Current (A)<br>**----- End of picture text -----**<br>


**Fig 14.** Typical Avalanche Current vs.Pulsewidth 

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400<br>TOP          Single Pulse<br>BOTTOM   1% Duty Cycle<br>ID = 170A<br>300<br>200<br>STE<br>100<br>HOS<br>TANS<br>0<br>25 50 75 100 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>EAR , Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Notes on Repetitive Avalanche Curves , Figures 14, 15: (For further info, see AN-1005 at www.irf.com)** 

1. Avalanche failures assumption: 

- Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 

2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 

3. Equation below based on circuit and waveforms shown in Figures 16a, 16b. 

4. PD (ave) = Average power dissipation per single avalanche pulse. 

5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 

6. Iav = Allowable avalanche current. 

7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 14, 15). 

- tav = Average time in avalanche. 

- D = Duty cycle in avalanche =  tav ·f 

- ZthJC(D, tav) = Transient thermal resistance, see Figures 13) 

**PD (ave) = 1/2 ( 1.3·BV·Iav) =** A **T/ ZthJC Iav = 2** A **T/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav** 

**Fig 15.** Maximum Avalanche Energy vs. Temperature 

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4.0 20<br>ID = 1.0A<br>3.5 BRERRE ID = 1.0mA pi |pe e.<br>16<br>ID = 250µA<br>SEP? am<br>3.0<br>FNanas 12 CA<br>2.5<br>/| SSAUPESK 7<br>8<br>2.0<br>I = 112A<br>F<br>4 VR = 51V<br>1.5<br>T  = 125°C<br>J<br>TJ =  25°C<br>1.0 0<br>-75 HoH -50 -25 0 25 50 75 100 125 150 \ 175 = 100 PE 200 300 400 TE 500 600 = 700 800<br>TJ , Temperature ( °C ) dif / dt - (A / µs)<br>Fig. 17 - Typical Recovery Current vs. di;/dt<br>Fig 16.   Threshold Voltage Vs. Temperature<br>20 700<br>600<br>TEE TE<br>16<br>500<br>12 ery a aen<br>400<br>wi, ti<br>8 EaVanne 300 LA |<br>IF = 170A 200 IF = 112A<br>4 VR = 51V fa VR = 51V<br>5S [At] [ne] TJ = 125°C  [n] 100 arene T J  = 125°C<br>TJ =  25°C TJ =  25°C<br>0 Ptr = 0 PP |<br>100 200 300 400 500 600 700 800 100 PEt 200 300 400 500 600 = 700 800<br>dif / dt - (A / µs) dif / dt - (A / µs)<br>VGS(th) Gate threshold Voltage (V)<br>IRRM - (A)<br>IRRM - (A) QRR - (nC)<br>**----- End of picture text -----**<br>


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700<br>600<br>Pt tT tT |<br>500<br>ptt ee<br>ERA<br>400 Eee Anee<br>300<br>200 IF = 170A<br>pi wy} [|]<br>VR = 51V<br>100 T J  = 125°C<br>T  =  25°C<br>J<br>pvt.PE |<br>0<br>100 200 300 400 500 600 700 800<br>dif / dt - (A / µs)<br>QRR - (nC)<br>**----- End of picture text -----**<br>


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Driver Gate Drive<br>P.W.<br>D.U.T + {+ P.W. Period ——— — D = —— Period<br>) [©)]    •  CircuitLow  LayoutStray ConsiderationsInduct | t V t GS=10<br> •<br>- •   Low Leakage Inductance @ D.U.T. ISD Waveform<br>+<br>Reverse<br>Recovery Body Diode Forward<br>oi - [1] Current Transformer - ® + Current r Current di/dt AN<br>® D.U.T. VDS Waveform Diode Recoverydv/dt ‘<br>00 a VDD<br>ma<br>•   Re-Applied<br>•   Driver same type as D.U.T. + Voltage Body Diode  Forward Drop<br>Re ( 4 •   dv/dt controlled by Rg Vpp -<br>•<br>D.U.T. - Device Under Test SOO |<br>Ripple  ≤ 5% ISD<br>Isp controlled by Duty Factor "D" @| t<br>* Vg = 5V for Logic Level Devices<br>Fig 21.  Peak Diode Recovery dv/dt Test Circuit for N-Channel<br>HEXFET ® Power MOSFETs<br>V(BR)DSS(BR)DSS<br>15V —_ tp -><br>VDS L DRIVER<br>RG D.U.T +<br>- [V][DD]<br>IAS A<br>¢ 20VVGS dt<br>tp 0.01Ω<br>**----- End of picture text -----**<br>


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V(BR)DSS(BR)DSS<br>—_ tp -><br>IAS<br>**----- End of picture text -----**<br>


## **Fig 22b.** Unclamped Inductive Waveforms 

**Fig 22a.** Unclamped Inductive Test Circuit 

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+<br>-<br>≤ 1<br>≤ 0.1 %<br>**----- End of picture text -----**<br>


## **Fig 23a.** Switching Time Test Circuit 

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**----- Start of picture text -----**<br>
Current Regulator<br>Same Type as D.U.T.<br>50KΩ<br>12V .2µF .3µF ||<br>+<br>D.U.T. -VDS<br>VGS<br>3mA<br>WAV IG ID<br>Current Sampling Resistors<br>**----- End of picture text -----**<br>


**Fig 24a.** Gate Charge Test Circuit 

**==> picture [192 x 121] intentionally omitted <==**

**----- Start of picture text -----**<br>
VDS<br>90%<br>\<br>10% /\<br>VGS «le ys<br>td(on) tr td(off) tf<br>**----- End of picture text -----**<br>


**==> picture [164 x 10] intentionally omitted <==**

**----- Start of picture text -----**<br>
Fig 23b.   Switching Time Waveforms<br>**----- End of picture text -----**<br>


**==> picture [162 x 131] intentionally omitted <==**

**----- Start of picture text -----**<br>
Id<br>Vds<br>fl Vgs<br>i<br>Vgs(th)<br>a plag [p] [l] [e] w i e » !<br>Qgs1 Qgs2 Qgd Qgodr<br>**----- End of picture text -----**<br>


**Fig 24b.** Gate Charge Waveform 

www.irf.com 

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## TO-262 Package Outline 

Dimensions are shown in millimeters (inches) 

TO-262 Part Marking Information 

9 

Dimensions are shown in millimeters (inches) 

**==> picture [19 x 7] intentionally omitted <==**

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TRR<br>**----- End of picture text -----**<br>


**==> picture [404 x 162] intentionally omitted <==**

**----- Start of picture text -----**<br>
1.60 (.063)<br>1.50 (.059)<br>1.60 (.063)<br>4.10 (.161)<br>1.50 (.059)<br>3.90 (.153) 0.368 (.0145)<br>!00°00He | tL , Te 0.342 (.0135)<br>4_______* oOo SOO GE -<br>FEED DIRECTION 1.85 (.073) 11.60 (.457)<br>1.65 (.065) 11.40 (.449) 24.30 (.957)<br>15.42 (.609)<br>23.90 (.941)<br>15.22 (.601)<br>TRL<br>| x<br>1.75 (.069)<br>10.90 (.429) 1.25 (.049)<br>10.70 (.421) 4.72 (.136)<br>16.10 (.634) 4.52 (.178)<br>15.90 (.626)<br>**----- End of picture text -----**<br>


**==> picture [75 x 7] intentionally omitted <==**

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FEED DIRECTION<br>**----- End of picture text -----**<br>


**==> picture [395 x 198] intentionally omitted <==**

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13.50 (.532) 27.40 (1.079)<br>12.80 (.504) 23.90 (.941) 1<br>4<br>330.00(14.173) \ 60.00 (2.362)      MIN.<br>  MAX.<br>i) x<br>30.40 (1.197)<br>NOTES :       MAX.<br>1.   COMFORMS TO EIA-418.<br>26.40 (1.039) 4<br>2.   CONTROLLING DIMENSION: MILLIMETER. 24.40 (.961)<br>3.   DIMENSION MEASURED @ HUB.<br>3<br>**----- End of picture text -----**<br>


4.   INCLUDES FLANGE DISTORTION @ OUTER EDGE. 

Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. 

**IR WORLD HEADQUARTERS:** 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information **.** 10/2008 

www.irf.com 

10 

## **IMPORTANT NOTICE** 

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”) . 

With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 

The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. 

For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office ( **www.infineon.com** ). 

## **WARNINGS** 

Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. 

Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 



## Links

- [View this product on Novapart](https://novapart.co/products/IRFS3006TRLPBF/power-mosfet-n-channel-60-v-195-a-2500-ohm-to)
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- [Supplier page](https://es.farnell.com/infineon/irfs3006trlpbf/mosfet-n-ch-60v-195a-to-263ab/dp/2725979)
---

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