# Power MOSFET, N Channel, 40 V, 350 A, 1700 µohm, TO-247AC, Through Hole

![Product image](https://novapart.co/image/farnell:1684527/)

**URL**: https://novapart.co/products/IRFP4004PBF/power-mosfet-n-channel-40-v-350-a-1700-ohm-to
**SKU**: IRFP4004PBF
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €3.5800
**Stock**: 50+
**Lead Time**: 2 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:350A; Drain Source Voltage Vds:40V; On Resistance Rds(on):0.00135ohm; Rds(on) Test Voltage Vgs:20V; Threshold Voltage Vgs:4V; Power D

## Specifications

| Parameter | Value |
|---|---|
| Msl | - |
| Svhc | No SVHC (23-Jan-2024) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 380W |
| Transistor Mounting | Through Hole |
| Rds(On) Test Voltage | 20V |
| Transistor Case Style | TO-247AC |
| Drain Source Voltage Vds | 40V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 350A |
| Drain Source On State Resistance | 1700µohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:1684527/)

## IRFP4004PbF 

## **Applications** 

High Efficiency Synchronous Rectification in SMPS 

Uninterruptible Power Supply 

High Speed Power Switching Hard Switched and High Frequency Circuits 

## **Benefits** 

Improved  Gate, Avalanche and Dynamic dv/dt Ruggedness Fully Characterized Capacitance and Avalanche SOA Enhanced body diode dV/dt and dI/dt Capability 

## HEXFET Power MOSFET 

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D VDSS 40V<br>ee ee<br>RDS(on)   typ. 1.35m Ω<br>              max. 1.70m Ω<br>G ee ID (Silicon Limited) eee 350A<br>eePF Oe<br>S fTti“‘<“‘dLSC*‘(C(C;C;*C ID (Package Limited) 195A<br>**----- End of picture text -----**<br>


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D<br>S<br>D<br>G<br>TO-247AC<br>**----- End of picture text -----**<br>


|**G**|**D**|**S**|
|---|---|---|
|Gate|Drain|Source|



## **Absolute Maximum Ratings** 

|**Symbol**<br>**Parameter**<br>**Max.**|**Units**<br>~~—~~||
|---|---|---|
|ID@ TC= 25°C<br>Continuous Drain Current,VGS @ 10V(Silicon Limited)<br>350<br>~~a~~<br>~~ee~~|||
|ID@ TC= 100°C<br>Continuous Drain Current, VGS@ 10V(Silicon Limited)<br>250<br>~~a (©~~|A||
|ID@ TC= 25°C<br>Continuous Drain Current, VGS@ 10V(Wire Bond Limited)<br>IDM<br>Pulsed Drain Current<br>PD@TC= 25°C<br>Maximum Power Dissipation<br>Linear DeratingFactor<br>VGS<br>Gate-to-Source Voltage<br>1390<br>195<br>380<br>± 20<br>2.5<br>~~a GO~~<br>~~a~~<br>~~en~~<br>~~GO~~<br>~~———aSI~~<br>~~a~~<br>~~ee~~|W<br>W/°C<br>V<br>~~Ts~~||
|dv/dt<br>Peak Diode Recovery<br>V/ns<br>2.0<br>~~a GO~~|||
|TJ<br>Operating Junction and<br>-55  to + 175|°C||
|TSTG<br>Storage Temperature Range|||
|Soldering Temperature, for 10 seconds<br>300|||
|(1.6mm from case)|||
|Mountingtorque,6-32 or M3 screw<br>10lb in(1.1N m)<br>~~a DO~~|||
|**Avalanche Characteristics**|||
|EAS(Thermallylimited)<br>Single Pulse Avalanche Energy<br>IAR<br>Avalanche Current<br>EAR<br>Repetitive Avalanche Energy<br>290<br>See Fig. 14, 15, 22a, 22b<br>~~a~~<br>~~=~~<br>~~a~~<br>~~pai~~|mJ<br>A<br>mJ<br>~~—~~||
|**Thermal Resistance**|||
|**Symbol**<br>**Parameter**<br>**Typ.**<br>**Max.**<br>**Units**<br>~~a~~<br>~~a~~|||
|RθJC<br>Junction-to-Case<br>–––<br>0.40|||
|RθCS<br>Case-to-Sink,Flat Greased Surface<br>0.24<br>–––<br>°C/W<br>~~|~~|||
|RθJA<br>Junction-to-Ambient<br>–––<br>40<br>~~a~~|||



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06/05/08 

**Static @ TJ = 25°C (unless otherwise specified)** 

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|||||||||||
|---|---|---|---|---|---|---|---|---|---|
|Symbol|Parameter|Min.|Typ.|Max.|Units|Conditions|
|Ds|QO OO|
|V(BR)DSS|Drain-to-Source Breakdown Voltage|40|–––|–––|V|VGS = 0V, ID = 250µA|
|eG GO|
|∆V(BR)DSS/∆TJ|Breakdown Voltage Temp. Coefficient|–––|0.035|–––|V/°C|Reference to 25°C, ID = 5mA|
|DsGG|
|ef|RDS(on)|Static Drain-to-Source On-Resistance|–––|1.35|1.70|mΩ|VGS = 10V, ID = 195A|
|VGS(th)|Gate Threshold Voltage|2.0|–––|4.0|V|VDS = VGS, ID = 250µA|
|Ds|GOO|
|IDSS|Drain-to-Source Leakage Current|–––|–––|20|µA|VDS = 40V, VGS = 0V|
|EEa|–––|–––|250|pe|VDS = 40V, VGS = 0V, TJ = 125°C|
|IGSS|Gate-to-Source Forward Leakage|–––|–––|200|nA|VGS = 20V|
|————————————————————es|Gate-to-Source Reverse Leakage|–––|–––|-200|pO|VGS = -20V|
|Dynamic @ TJ = 25°C (unless otherwise specified)|
|Symbol|Parameter|Min.|Typ.|Max.|Units|Conditions|
|Ds|OQ GO|
|gfs|Forward Transconductance|290|–––|–––|S|VDS = 10V, ID = 195A|
|Ds|GOO|
|Ds|Qg|Total Gate Charge|–––|220|330|nC|ID = 195A|
|Qgs|Gate-to-Source Charge|–––|59|–––|VDS = 20V|
|es|
|Qgd|Gate-to-Drain ("Miller") Charge|–––|75|–––|VGS = 10V|
|es|®|
|Qsync|Total Gate Charge Sync. (Qg - Qgd)|–––|145|–––|ID = 195A, VDS =0V, VGS = 10V|
|Rs|pe|
|RG(int)|Internal Gate Resistance|–––|6.8|–––|Ω|
|Ds|DG|GO|
|td(on)|Turn-On Delay Time|–––|59|–––|ns|VDD = 20V|
|es|
|tr|Rise Time|–––|370|–––|ID = 195A|
|es|
|Re|td(off)|Turn-Off Delay Time|–––|160|–––|RG = 2.7Ω|
|tf|Fall Time|–––|190|–––|VGS = 10V|
|es|®|
|Ciss|Input Capacitance|–––|8920|–––|pF|VGS = 0V|
|es|
|Coss|Output Capacitance|–––|2360|–––|VDS = 25V|
|es|
|Crss|Reverse Transfer Capacitance|–––|930|–––|ƒ = 1.0MHz|
|ee|
|Coss eff. (ER)|Effective Output Capacitance (Energy Related)|–––|2860|–––|VGS = 0V, VDS = 0V to 32V|
|esee”CO|
|©|Coss eff. (TR)|Effective Output Capacitance (Time Related)|–––|3110|–––|VGS = 0V, VDS = 0V to 32V|
|Diode|Characteristics|
|Symbol|Parameter|Min.|Typ.|Max.|Units|Conditions|
|ReRGQO|GO|
|IS|Continuous Source Current|–––|–––|350|A|MOSFET symbol|D|
|(Body Diode)|showing  the|
|ISM|Pulsed Source Current|–––|–––|1390|integral reverse|G|
|(Body Diode)|p-n junction diode.|S|
|eepo|VSD|Diode Forward Voltage|–––|–––|1.3|||V|TJ = 25°C, IS = 195A, VGS = 0V|Se|
|trr|Reverse Recovery Time|–––|83|130|ns|TJ = 25°C|VR = 20V,|
|aPt|–––|78|120|TJ = 125°C|IF = 195A|
|Qrr|Reverse Recovery Charge|–––|190|290|nC|TJ = 25°C|di/dt = 100A/µs|
|a|=|–––|210|320|TJ = 125°C|:|
|Re|IRRM|a|Reverse Recovery Current|Pt|–––|4.0|–––|A|TJ = 25°C|
|ton|Forward Turn-On Time|Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD)|
|Re|GO|

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Notes: ~~©~~ Calculated continuous current based on maximum allowable junction ~~®~~ ISD ≤ 195A, di/dt ≤ 690A/µs, V 195A, di/dt ≤ 690A/µs, V≤ 690A/µs, V 690A/µs, VDD ≤ VV(BR)DSS, TJ ≤ 175°C. 175°C. ≤ 195A, di/dt ≤ 690A/µs, V 195A, di/dt ≤ 690A/µs, V≤ 690A/µs, V 690A/µs, VDD ≤ VV(BR)DSS, TJ ≤ 175°C. 175°C. ≤ VV(BR)DSS, TJ ≤ 175°C. 175°C. , TJ ≤ 175°C. 175°C. ≤ 175°C. 175°C. 

~~©~~ Calculated continuous current based on maximum allowable junction ~~®~~ ISD ≤ 195A, di/dt ≤ 690A/µs, V 195A, di/dt ≤ 690A/µs, V≤ 690A/µs, V 690A/µs, VDD ≤ VV(BR)DSS, TJ ≤ 175°C. 175°C. temperature. Bond wire current limit is 195A. Note that current ~~©~~ Pulse width ≤ 400µs; duty cycle ≤ 2%. limitations arising from heating of the device leads may occur with © Coss eff. (TR) is a fixed capacitance that gives the same charging time some lead mounting arrangements. Refer to App Notes (AN-1140). as Coss while VDS is rising from 0 to 80% VDSS. 

- @ Repetitive rating;  pulse width limited by max. junction @ temperature. 

Coss eff. (ER) is a fixed capacitance that gives the same energy as 

Coss while VDS is rising from 0 to 80% VDSS. 

Limited by TJmax, starting TJ = 25°C, L = 0.015mH 

When mounted on 1" square PCB (FR-4 or G-10 Material).  For recom mended footprint and soldering techniques refer to application note #AN-994. Rθ is measured at TJ approximately 90°C. 

RG = 25Ω, IAS = 195A, VGS =10V. Part not recommended for use above this value. 

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1000<br>VGS<br>TOP           15V<br>10V<br>8.0V<br>7.0V Wis<br>6.0V<br>5.5V<br>5.0V<br>BOTTOM 4.5V<br>100<br>f lo<br>Z a<br>4.5V —<br>≤60µs PULSE WIDTH<br>Tj = 25°C<br>10<br>Torttt<br>0.1 1 10<br>VDS, Drain-to-Source Voltage (V)<br>Fig 1.   Typical Output Characteristics<br>1000<br>a es es eeeS ee ee<br>100 TJ = 175°C<br>oe 7Anaae<br>r |v TT<br>TJ = 25°C<br>10 yfS S ,ft<br>VDS = 10V<br>≤60µs PULSE WIDTH<br>i e<br>1.0<br>3 4 5 6 7 8<br>VGS, Gate-to-Source Voltage (V)<br>ID, Drain-to-Source Current (A)<br>ID, Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 3.** Typical Transfer Characteristics 

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100000<br>VGS   = 0V,       f = 1 MHZ<br>Ciss    = Cgs + Cgd,  Cds SHORTED<br>Crss    = Cgd<br>Coss   = Cds + Cgd<br>10000 SoT. Ciss oo |<br>Coss<br>Crss<br>1000<br>FOF TLR LL<br>EEE HH<br>100<br>1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>C, Capacitance (pF)<br>**----- End of picture text -----**<br>


**Fig 5.** Typical Capacitance vs. Drain-to-Source Voltage 

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1000<br>VGS<br>TOP           15V<br>10V<br>8.0V<br>7.0V Y<br>6.0V<br>5.5V<br>5.0V<br>BOTTOM 4.5V<br>100<br>y y o<br>Y oo<br>Amina 4.5V<br>≤60µs PULSE WIDTH<br>Tj = 175°C<br>10<br>ToAtt<br>0.1 1 10<br>VDS, Drain-to-Source Voltage (V)<br>Fig 2.   Typical Output Characteristics<br>2.0<br>ID = 195A<br>VGS = 10V<br>1.5<br>1.0<br>0.5<br>-60 -40 -20 0 20 40 60 80 100120140160180<br>TJ , Junction Temperature (°C)<br>ID, Drain-to-Source Current (A)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>**----- End of picture text -----**<br>


**Fig 4.** Normalized On-Resistance vs. Temperature 

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12.0<br>ID= 195A<br>10.0 VDS= 32V<br>VDS= 24V<br>8.0 F= Y SY<br>6.0<br>4.0<br>2.0 A nmmm<br>0.0<br>0 50 100 150 200 250<br> QG,  Total Gate Charge (nC)<br>VGS, Gate-to-Source Voltage (V)<br>**----- End of picture text -----**<br>


**Fig 6.** Typical Gate Charge vs. Gate-to-Source Voltage 

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1000<br>ee ee<br>r T e J = 175°C<br>100 o a<br>Po |<br>P f fe<br>10 TJ = 25°C<br>f f i i<br>Tp<br>1<br>VGS = 0V<br>pp<br>0.1<br>0.0 0.4 0.8 1.2 1.6 2.0<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


**Fig 7.** Typical Source-Drain Diode Forward Voltage 

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350<br>300 Limited By Package<br>250<br>rhs}<br>200<br>avace n<br>150<br>CTT TAL<br>100 yy<br>50 S aw<br>0<br>PTT TT rN<br>25 50 75 100 125 150 175<br> TC , Case Temperature (°C)<br>ID,  Drain Current (A)<br>**----- End of picture text -----**<br>


**Fig 9.** Maximum Drain Current vs. Case Temperature 

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2.5<br>2.0<br>1.5<br>1.0<br>0.5<br>0.0<br>-5 0 5 10 15 20 25 30 35 40<br>VDS, Drain-to-Source Voltage (V)<br>Energy (µJ)<br>**----- End of picture text -----**<br>


**Fig 11.** Typical COSS Stored Energy 

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10000<br>OPERATION IN THIS AREA<br>LIMITED BY R : DS ! (on) 4<br>1000 = [ne][e]<br>ew 100µsec<br>B os ce |<br>100 1msec<br>R aac eeen g e es mae<br>1 0msec<br>10 a TS<br>Tc = 25°C<br>DC<br>Tj = 175°C<br>Single Pulse<br>1 BEE<br>1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Fig 8.   Maximum Safe Operating Area<br>52<br>Id = 5.0mA<br>50<br>E ero<br>48<br>o T EePr<br>46<br>Pann<br>44<br>C APT<br>42 A A<br>40<br>E EE<br>-60 -40 -20 0 20 40 60 80 100120140160180<br>TJ , Temperature ( °C )<br>V(BR)DSS, Drain-to-Source Breakdown Voltage (V)<br>ID,  Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Fig 10.** Drain-to-Source Breakdown Voltage 

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1200<br>ID<br>TOP         36A<br>1000<br>73A<br>BOTTOM 195A<br>800 NM ULE<br>600<br>N UT<br>400<br>I NN ETT<br>200<br>S INT<br>R SS<br>0<br>25 50 75 100 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>EAS , Single Pulse Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


**Fig 12.** Maximum Avalanche Energy vs. DrainCurrent 

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1<br>a ee ee ee ee eS ee<br>D = 0.50 nia<br>eee ALLL LILI<br>0.1<br>0.20<br>0.10<br>0.01 Pt 0.020.05 ee τJ τJτ1τ1 R1 R 1 τ2τR22 R 2 Rτ33 R τ3 3 τR4τ4R4 4 τCτ Ri (°C/W)    HE 0.0123       0.0000110.0585       0.0000550.1693       0.000917  EEA)  τi (sec)<br>aeTE 0.01 al Ci= τi/Ri |Ld 0.1601       0.008784<br>Ci i/Ri<br>Notes:<br>SINGLE PULSE<br>1 be Saniil| 1. Duty Factor D = t1/t2 IEP<br>( THERMAL RESPONSE )<br>2. Peak Tj = P dm x Zthjc + Tc<br>aan [|<br>0.001<br>1E-006 1E-005 0.0001 0.001 0.01 0.1<br>t1 , Rectangular Pulse Duration (sec)<br>Fig 13.   Maximum Effective Transient Thermal Impedance, Junction-to-Case<br>1000<br>F rrr<br>Duty Cycle = Single Pulse<br>Allowed avalanche Current vs avalanche<br>cu le<br>pulsewidth, tav, assuming  ∆Tj = 150°C and<br>0.01 Tstart =25°C (Single Pulse)<br>100 Sto<br>Ee [T] [R] [ARY] Soo tro<br>0.05<br>10 P 0.10 I eI |<br>p F SSS<br>Sse Allowed avalanche Current vs avalanche  i) ee eee, | TL<br>| aes<br>pulsewidth, tav, assuming  ∆Τj = 25°C and  EES eee<br>Tstart = 150°C.<br>PEee E eee |<br>1 ||<br>1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Fig 14.   Typical Avalanche Current vs.Pulsewidth<br>300<br>Notes on Repetitive Avalanche Curves , Figures 14, 15:<br>TOP          Single Pulse<br>(For further info, see AN-1005 at www.irf.com)<br>BOTTOM   1.0% Duty Cycle 1. Avalanche failures assumption:<br>250 ID = 195A Purely a thermal phenomenon and failure occurs at a temperature far in<br>excess of Tjmax. This is validated for every part type.<br>200 2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded.<br>b ee 3. Equation below based on circuit and waveforms shown in Figures 16a, 16b.<br>A S 4. PD (ave) = Average power dissipation per single avalanche pulse.<br>150 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase<br>during avalanche).<br>N TT 6. Iav = Allowable avalanche current.<br>100 7. ∆T = Allowable rise in junction temperature, not to exceed Tjmax (assumed as<br>L LANE 25°C in Figure 14, 15).<br>tav = Average time in avalanche.<br>50 D = Duty cycle in avalanche =  tav ·f<br>N ST ZthJC(D, tav) = Transient thermal resistance, see Figures 13)<br>SETTLE NAN<br>0<br>25 50 75 100 125 150 175 PD (ave) = 1/2 ( 1.3·BV·Iav) =D (ave) = 1/2 ( 1.3·BV·Iav) = = 1/2 ( 1.3·BV·Iav) =av) =) = A T/ ZthJCthJC<br>Iav =av == 2 A T/ [1.3·BV·Zth]th]]<br>Starting TJ , Junction Temperature (°C) EAS (AR) = PD (ave)·tavav  = PD (ave)·tavav ·tavav<br>EAR , Avalanche Energy (mJ)<br> thJC ) °C/W<br>Thermal Response ( Z<br>Avalanche Current (A)<br>**----- End of picture text -----**<br>


3. Equation below based on circuit and waveforms shown in Figures 16a, 16b. 

5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 

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PD (ave) = 1/2 ( 1.3·BV·Iav) =D (ave) = 1/2 ( 1.3·BV·Iav) = = 1/2 ( 1.3·BV·Iav) =av) =) = A T/ ZthJCthJC<br>Iav =av == 2 A T/ [1.3·BV·Zth]th]]<br>EAS (AR) = PD (ave)·tavav<br>**----- End of picture text -----**<br>


**Fig 15.** Maximum Avalanche Energy vs. Temperature 

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5.0<br>| | | | | | } ft ft ff<br>4.5 | Toms] ft tt tt<br>4.0<br>3.5<br>S EEPS<br>3.0 ID = 250µA<br>2.5 ID = 1.0mA SA<br>ZeaNSEae<br>ID = 1.0A<br>2.0<br>HAN<br>| PEA<br>1.5 PpP | EEEEEEEE | tT| tT| | tt| | |TNN NSKT<br>1.0<br>-75 -50 -25 0 25 50 75 100 125 150 175 200<br>TJ , Temperature ( °C )<br>VGS(th), Gate threshold Voltage (V)<br>**----- End of picture text -----**<br>


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12<br>IF = 78A<br>10 VR = 34V “|<br>TJ = 25°C<br>TJ = 125° C<br>8<br>Bye<br>T A<br>6<br>:<br>4 A<br>J |<br>Z yy, ,ann<br>2<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>IRR (A)<br>**----- End of picture text -----**<br>


**Fig 16.** Threshold Voltage vs. Temperature 

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14<br>IF = 117A<br>12 VR = 34V<br>pf |<br>TJ = 25°C<br>10 TJ = 125° C<br>Be<br>86 a pne<br>“)<br>4 e an<br>S annnn<br>2<br>0 100 200 300 400 500 600<br>diF /dt (A/µs)<br>IRR (A)<br>**----- End of picture text -----**<br>


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350<br>IF = 78A<br>300 VR = 34V<br>| [fy]<br>TJ = 25°C<br>250 TJ = 125° C<br>mA<br>200<br>| 7<br>150<br>le |<br>p e<br>100<br>P T| |<br>50<br>0 200 400 600 800 1000<br>diF /dt (A/µs)<br>QRR (A)<br>**----- End of picture text -----**<br>


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400<br>IF = 117A<br>350 VR = 34V<br>TJ = 25°C<br>300 TJ = 125° C ERA<br>|<br>250<br>°Z.<br>200<br>| ler |<br>E van<br>150<br>. ecnnn<br>100<br>0 100 200 300 400 500 600<br>diF /dt (A/µs)<br>QRR (A)<br>**----- End of picture text -----**<br>


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Driver Gate Drive<br>P.W.<br>Period D =<br>D.U.T + [{ P.W. n d — Period<br>) [©)]    •  Circuit Layout Considerations lt V | GS=10V<br> •<br>| —| - LowGround Stray Pla I n eductance<br> •   Low Leakage Inductance 2) D.U.T. ISD Waveform<br>+<br>Reverse<br>Recovery Body Diode Forward<br>oH - [1] Current Transformer - ® + Current r Current di/dt NN<br>1) D.U.T. VDS Waveform Diode Recoverydv/dt ‘<br>00 = VDD<br>ma<br>•   Re-Applied<br>•   Driver same type as D.U.T. + Voltage Body Diode  Forward Drop<br>Re ( aA •   dv/dt controlled by Rg Vpp -<br>•<br>D.U.T. - Device Under Test er ae<br>Isp controlled by Duty Factor "D" @ t Ripple  ≤ 5% ISD<br>* Veg = 5V for Logic Level Devices<br>Fig 20. Peak Diode Recovery dv/dt Test Circuit for N-Channel<br>HEXFET ® Power MOSFETs<br>V(BR)DSS<br>15V < tp ><br>VDS L DRIVER<br>RG D.U.T +<br>- [V][DD]<br>IAS A<br>20VVGS<br>tp 0.01Ω IAS<br>**----- End of picture text -----**<br>


**Fig 21a.** Unclamped Inductive Test Circuit 

**Fig 21b.** Unclamped Inductive Waveforms 

**==> picture [186 x 282] intentionally omitted <==**

**----- Start of picture text -----**<br>
LD<br>VDS<br>+<br>VDD -<br>D.U.T<br>VGS<br>Pulse Width < 1µs<br>Duty Factor < 0.1%<br>Fig 22a.   Switching Time Test Circuit<br>L<br>VCC<br>DUT<br>0<br>1K<br>a:<br>**----- End of picture text -----**<br>


**Fig 22a.** Switching Time Test Circuit 

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**----- Start of picture text -----**<br>
V<br>DS<br>90%<br>10%<br>V<br>GS<br>1<br>yay<br>td(on) tr td(off) tf<br>**----- End of picture text -----**<br>


**==> picture [164 x 10] intentionally omitted <==**

**----- Start of picture text -----**<br>
Fig 22b.   Switching Time Waveforms<br>**----- End of picture text -----**<br>


**==> picture [162 x 132] intentionally omitted <==**

**----- Start of picture text -----**<br>
Id<br>Vds<br>Vgs<br>Vgs(th)<br>Qgs1 l ey! Qgs2 Qgd Qgodr<br>**----- End of picture text -----**<br>


**Fig 23b.** Gate Charge Waveform 

**Fig 23a.** Gate Charge Test Circuit 

www.irf.com 

7 

TO-247AC package is not recommended for Surface Mount Application. 

Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. 

**IR WORLD HEADQUARTERS:** 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information **.** 06/08 

www.irf.com 

8 

## **IMPORTANT NOTICE** 

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”) . 

With respect to any examples, hints or any typical values stated herein and/or any information regarding the application of the product, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

In addition, any information given in this document is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 

The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with respect to such application. 

For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office ( **www.infineon.com** ). 

## **WARNINGS** 

Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. 

Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 



## Links

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- [Supplier page](https://es.farnell.com/infineon/irfp4004pbf/mosfet-40v-350a-to-247ac/dp/1684527)
---

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