# Power MOSFET, N Channel, 200 V, 90 A, 0.014 ohm, TO-263AB, Surface Mount

![Product image](https://novapart.co/image/farnell:3227659/)

**URL**: https://novapart.co/products/IRF200S234/power-mosfet-n-channel-200-v-90-a-0014-ohm-to
**SKU**: IRF200S234
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €2.4300
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | StrongIRFET |
| Power Dissipation | 417W |
| Transistor Mounting | Surface Mount |
| Transistor Polarity | N Channel |
| Power Dissipation Pd | 417W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.014ohm |
| Transistor Case Style | TO-263AB |
| Drain Source Voltage Vds | 200V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 90A |
| Drain Source On State Resistance | 0.014ohm |
| Gate Source Threshold Voltage Max | 5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3227659/)

**IRF200S234** 

## **IR MOSFET - StrongIRFET™** 

## **Applications** 

- Brushed Motor drive applications 

- BLDC Motor drive applications 

- Battery powered circuits 

- Half-bridge and full-bridge topologies 

- Synchronous rectifier applications 

- Resonant mode power supplies 

- OR-ing and redundant power switches 

- DC/DC and AC/DC converters 

- DC/AC Inverters 

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D VDSS  200V<br>RDS(on) typ.  14m <br>G<br>            max   16.9m <br>S ID   90A<br>D<br>G<br>S<br>D2-Pak<br>IRF200S234<br>**----- End of picture text -----**<br>


## **Benefits** 

- Improved  Gate, Avalanche and Dynamic dv/dt Ruggedness 

- Fully Characterized Capacitance and Avalanche SOA 

**G D S** Gate Drain Source ~~——}—_-—~~ 

- Enhanced body diode dv/dt and di/dt Capability 

- Pb-Free ; RoHS Compliant ; Halogen-Free 

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 Standard Pack<br>Base part number   Package Type   Orderable Part Number<br> Form  Quantity<br>IRF200S234   D2-PAK   Tape and Reel    800   IRF200S234<br>85 100<br>ID = 51A<br>80<br>65 eid} | Nee<br>60<br>45 TPEEEEERR |.  PeN<br>TJ = 125°C<br>40<br>25 PU | pA<br>TJ = 25°C 20<br>AEE ptt ttTN<br>5 TMHeH | 0 fo"<br>2 4 6 8 10 12 14 16 18 20<br>25 50 75 100 125 150 175<br>VGS, Gate -to -Source Voltage  (V)  TC , Case Temperature (°C)<br>ID,  Drain Current (A)<br>)  <br>RDS(on),  Drain-to -Source On Resistance (m<br>**----- End of picture text -----**<br>


**Figure 1      Typical On-Resistance vs. Gate Voltage** 

**Figure 2      Maximum Drain Current vs. Case Temperature** 

Final Datasheet                             Please read the important Notice and Warnings at the end of this document                                                               V2.0 **www.infineon.com** 2017-6-30 

**IRF200S234** 

**Table of Contents** 

## **IR MOSFET-StrongIRFET™** 

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## **Table of Contents** 

|**Table of Contents**|**Table of Contents**|
|---|---|
|**Applications**<br>**…..………………………………………………………………………...……………..……………1**||
|**Benefits**|**…..………………………………………………………………………...……………..…………….1**|
|**Ordering**|**Table ….……………………………………………………………………………………………………1**|
|**Table of**|**Contents ….………………………………………………………………………………………………...2**|
|**1**<br>|**Parameters ………………………………………………………………………………………………3**|
|**2**<br>|**Maximum ratings, Thermal, and Avalanche characteristics ………………………………………4**|
|**3**<br>|**Electrical characteristics ………………………………………………………………………………5**|
|**4**<br>|**Electrical characteristic diagrams ……………………………………………………………………6**|
|**Package**|**Information ………………………………………………………………………………………………14**|
|**Qualification  Information ……………………………………………………………………………………………16**||
|**Revision**|**History …………………………………………………………………………………………..…………17**|



Final Datasheet                                                                                                              2                                                                                                                                       V2.0 

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**IRF200S234 Parameters** 

## **IR MOSFET-StrongIRFET™** 

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## **1               Parameters** 

**Table1          Key performance parameters** 

|**Parameter**|**Values**|**Units**|
|---|---|---|
|VDS|200|V|
|RDS(on) max|16.9|m|
|ID|90|A|



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**IR MOSFET-StrongIRFET™** 

**IRF200S234** 

**Maximum ratings and thermal characteristics** 

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## **2               Maximum ratings and thermal characteristics** 

**Table 2          Maximum ratings (at TJ=25** ° **C, unless otherwise specified)** 

|**Parameter**|**Symbol**|**Conditions**|**Values**|**Unit**|
|---|---|---|---|---|
|Continuous Drain Current|ID|TC= 25°C,VGS @10V|90|A|
|Continuous Drain Current|ID|TC= 100°C,VGS@ 10V|61||
|Pulsed Drain Current |IDM|TC= 25°C|312||
|Maximum Power Dissipation|PD|TC= 25°C|417|W|
|Linear DeratingFactor||TC= 25°C|2.8|W/°C|
|Gate-to-Source Voltage|VGS|-|± 20|V|
|Operating Junction and<br>Storage Temperature Range|TJ<br>TSTG|-|-55  to + 175|°C|
|Soldering Temperature, for 10 seconds<br>(1.6mm from case)|-|-|300||



**Table 3          Thermal characteristics** 

|**Parameter**|**Symbol**|**Conditions**|**Min.**|**Typ. **|**Max.**|**Unit**|
|---|---|---|---|---|---|---|
|Junction-to-Case|RJC|TJapproximately90°C|-|-|0.36|°C/W|
|Case-to-Sink,Flat Greased Surface|RCS|-|-|0.50|-||
|Junction-to-Ambient|RJA|(PCB Mount) (D2-Pak)|-|-|40||



**Table 4          Avalanche characteristics** 

|**Parameter**|**Symbol**|**Values**|**Unit**|
|---|---|---|---|
|Single Pulse Avalanche Energy |EAS (Thermally limited)|574|mJ|
|Single Pulse Avalanche Energy|EAS (Thermally limited)|693||
|Avalanche Current|IAR|See Fig  16, 17, 23a, 23b|A|
|Repetitive Avalanche Energy|EAR||mJ|



## _**Notes:**_ 

>  _Repetitive rating; pulse width limited by max. junction temperature._ 

>  _Limited by TJmax, starting TJ = 25°C, L = 0.436µH, RG = 50_  _, IAS =_ 51A, _VGS = 10V._ 

>  _ISD_  _51A, di/dt_  _1899A/µs, VDD_  _V(BR)DSS, TJ_  _175°C._ 

>  _Pulse width_  _400µs; duty cycle_  _2%._ 

- _Coss eff. (TR) is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS._ 

>  _Coss eff. (ER) is a fixed capacitance that gives the same energy as Coss while VDS is rising from 0 to 80% VDSS._ 

- _R_  _is measured at TJ  approximately 90°C._ 

- _When mounted on 1" square PCB (FR-4 or G-10 Material). For recommended footprint and soldering techniques_ 

- _refer to application note #AN-994.:_ 

- _Limited by TJmax, starting TJ = 25°C, L = 1mH, RG = 50_  _, IAS = 37A, VGS = 10V_ 

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**IR MOSFET-StrongIRFET™** 

**IRF200S234** 

**Electrical characteristics** 

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## **3               Electrical characteristics** 

## **Table 5          Static characteristics** 

|**Table 5          Static characteristics**|||||||
|---|---|---|---|---|---|---|
|**Parameter**|**Symbol**|**Conditions**|**Values**|||**Unit**|
||||**Min.**|**Typ. **|**Max.**||
|Drain-to-Source Breakdown Voltage<br>|V(BR)DSS<br>|VGS= 0V,ID= 250µA<br>|200|-|-|V|
|Breakdown Voltage Temp. Coeficient|V(BR)DSS/TJ|Reference to 25°C,ID= 3.0mA|-|0.18|-|V/°C|
|Static Drain-to-Source On-Resistance|RDS(on)|VGS= 10V, ID= 51A|-|14|16.9|m|
|Gate Threshold Voltage|VGS(th)|VDS= VGS, ID= 250µA|3.0|-|5.0|V|
|Drain-to-Source Leakage Current|IDSS|VDS= 200V,VGS=0V|-|-|20|µA|
|||VDS= 200V,VGS= 0V,TJ=125°C|-|-|250||
|Gate-to-Source Forward Leakage|IGSS|VGS= 20V|-|-|100|nA|
|Gate-to-Source Reverse Leakage|IGSS|VGS= -20V|-|-|-100|nA|
|Gate Resistance|RG||-|2.4|-||



**Table 6          Dynamic characteristics** 

|**Table 6          Dynamic characteristics**|||||||
|---|---|---|---|---|---|---|
|**Parameter**|**Symbol**|**Conditions**|**Values**|||**Unit**|
||||**Min.**|**Typ. **|**Max.**||
|Forward Trans conductance|gfs|VDS= 50V, ID= 51A|96|-|-|S|
|Total Gate Charge|Qg|ID= 51A<br>VDS= 100V<br>VGS= 10V|-|108|162|nC|
|Gate-to-Source Charge|Qgs||-|26|-||
|Gate-to-Drain Charge|Qgd||-|37|-||
|Total Gate Charge Sync.(Qg–Qgd)|Qsync||-|71|-||
|Turn-On DelayTime|td(on)|VDD= 100V<br>ID= 51A<br>RG= 2.7<br>VGS= 10V|-|21|-|ns|
|Rise Time|tr||-|58|-||
|Turn-Of DelayTime|td(of)||-|67|-||
|Fall Time|tf||-|37|-||
|Input Capacitance|Ciss|VGS= 0V<br>VDS= 50V<br>ƒ = 1.0MHz,  See Fig.7|-|6484|-|pF|
|Output Capacitance|Coss||-|462|-||
|Reverse Transfer Capacitance<br>|Crss||-|142|-||
|Efective Output Capacitance<br> (EnergyRelated)|Coss ef.(ER)|VGS= 0V, VDS= 0V to 160V|-|356|-||
|Output Capacitance(Time Related)|Coss ef.(TR)|VGS= 0V,VDS= 0V to 160V |-|491|-||



**Table 7          Reverse Diode** 

|**Table 7          Reverse Diode**|||||||
|---|---|---|---|---|---|---|
|**Parameter**|**Symbol**|**Conditions**|**Values**|||**Unit**|
||||**Min.**|**Typ. **|**Max.**||
|Continuous Source Current<br>(BodyDiode)|IS|D<br>S<br>G<br>MOSFET symbol<br>showing  the<br>integral reverse<br> p-njunction diode.|-|-|90|A|
|Pulsed Source Current<br>(Body Diode)|ISM||-|-|312||
|Diode Forward Voltage|VSD|TJ= 25°C, IS=  51A,VGS= 0V |-|-|1.3|V|
|Peak Diode Recoverydv/dt|dv/dt|TJ= 175°C,IS= 51A,VDS= 200V|-|26|-|V/ns|
|Reverse Recovery Time|trr|TJ= 25°C<br>VDD =170V|-|117|-|ns|
|||TJ= 125°C<br>IF= 51A,<br>|-|140|-||
|Reverse Recovery Charge|Qrr|TJ= 25°C<br>~~di/dt = 100A/µs~~|-|563|-|nC|
|||TJ= 125°C|-|801|-||
|Reverse RecoveryCurrent|IRRM|TJ= 25°C|-|8.7|-|A|



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**IRF200S234** 

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## **Electrical characteristic diagrams** 

## **4               Electrical characteristic diagrams** 

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1000 1000<br>VGS  60µs PULSE WIDTH VGS<br>TOP           15V 10V Tj = 25°C TOP           15V10V<br>8.0V 8.0V<br>100 7.0V 7.0V<br>6.0V 6.0V<br>5.5V 100 5.5V<br>5.0V 5.0V<br>BOTTOM 4.8V BOTTOM 4.8V<br>10 4.8V<br>10<br>1<br> 60µs PULSE WIDTH<br>4.8V Tj = 175°C<br>0.1 1<br>0.1 1 10 100 0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V) VDS, Drain-to-Source Voltage (V)<br>ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Figure 3      Typical Output Characteristics** 

**Figure 4      Typical Output Characteristics** 

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1000 3.5<br>V = 50V ID = 51A<br>DS<br>3.0 V = 10V<br> 60µs PULSE WIDTH GS<br>100<br>2.5<br>T J  = 175°C 2.0<br>10<br>1.5<br>T = 25°C<br>J<br>1.0<br>1.0<br>0.5<br>0.10<br>0.0<br>2 3 4 5 6 7 8<br>-60 -20 20 60 100 140 180<br>VGS, Gate-to-Source Voltage (V) TJ , Junction Temperature (°C)<br>ID, Drain-to-Source Current (A)<br>RDS(on) , Drain-to-Source On Resistance                        (Normalized)<br>**----- End of picture text -----**<br>


**Figure 5      Typical Transfer Characteristics** 

**Figure 6      Normalized On-Resistance vs. Temperature** 

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**IRF200S234** 

## **IR MOSFET-StrongIRFET™** 

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## **Electrical characteristic diagrams** 

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1E+006 14<br>VGS = 0V,       f = 1 MHZ<br>I = 51A<br>Ciss   = C gs + Cgd,  Cds SHORTED D<br>12<br>C  = C<br>100000 rss   gd<br>C = C + C V = 160V<br>oss   ds  gd DS<br>10<br>V = 100V<br>DS<br>10000 VDS= 40V<br>Ciss 8<br>6<br>1000<br>C<br>oss<br>Crss 4<br>100<br>2<br>10 0<br>1 10 100 1000 0 20 40 60 80 100 120 140<br>VDS, Drain-to-Source Voltage (V)  QG,  Total Gate Charge (nC)<br>VGS, Gate-to-Source Voltage (V)<br>C, Capacitance (pF)<br>**----- End of picture text -----**<br>


**Figure 7      Typical Capacitance vs. Drain-to-Source Voltage** 

**Figure 8      Typical Gate Charge vs.  Gate-to-Source Voltage** 

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1000<br>100<br>T = 175°C<br>10 J<br>T = 25°C<br>J<br>1<br>VGS = 0V<br>0.1<br>0.0 0.4 0.8 1.2<br>VSD, Source-to-Drain Voltage (V)<br>ISD, Reverse Drain Current (A)<br>**----- End of picture text -----**<br>


**Figure 9      Typical Source-Drain Diode Forward Voltage** 

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## **IR MOSFET-StrongIRFET™** 

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## **Electrical characteristic diagrams** 

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1000<br>OPERATION IN THIS AREA<br>LIMITED BY RDS(on)<br>100<br>100µsec<br>10<br>1msec<br>1<br>10msec<br>0.1 Tc = 25°C<br>DC<br>Tj = 175°C<br>Single Pulse<br>0.01<br>0.1 1 10 100<br>VDS, Drain-to-Source Voltage (V)<br>Figure 10      Maximum Safe Operating Area<br>250 7<br>Id = 3.0mA<br>6<br>240<br>5<br>230<br>4<br>220<br>3<br>210<br>2<br>200 1<br>0<br>190<br>0 50 100 150 200<br>-60 -40 -20 0 20 40 60 80 100 120 140 160 180<br>TJ , Temperature ( °C ) VDS, Drain-to-Source Voltage (V)<br>Energy (µJ)<br>V(BR)DSS, Drain-to-Source Breakdown Voltage (V)<br>ID,  Drain-to-Source Current (A)<br>**----- End of picture text -----**<br>


**Figure 11      Drain-to-Source Breakdown Voltage** 

**Figure 12      Typical Coss Stored Energy** 

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## **IR MOSFET-StrongIRFET™** 

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## **Electrical characteristic diagrams** 

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50 5.5<br>VGS = 6.0V<br>45 5.0<br>VGS = 7.0V<br>VGS = 8.0V 4.5<br>40<br>VGS = 10V<br>4.0<br>35<br>3.5<br>30<br>3.0<br>25 ID = 250µA<br>2.5<br>ID = 1.0mA<br>20 I = 1.0A<br>2.0 D<br>15 1.5<br>10 1.0<br>0 25 50 75 100 125 150 175 200 -75 -50 -25 0 25 50 75 100 125 150 175<br>ID, Drain Current (A) TJ , Temperature ( °C )<br>Figure 13      Typical On-Resistance vs. Drain   Figure 14      Threshold Voltage vs. Temperature<br>                          Current<br>1<br>D = 0.50<br>0.1<br>0.20<br>0.10<br>0.05<br>0.01<br>0.02<br>0.01<br>0.001<br>SINGLE PULSE Notes:<br>( THERMAL RESPONSE ) 1. Duty Factor D = t1/t2<br>2. Peak Tj = P dm x Zthjc + Tc<br>0.0001<br>1E-006 1E-005 0.0001 0.001 0.01 0.1<br>t1 , Rectangular Pulse Duration (sec)<br>VGS(th), Gate threshold Voltage (V)<br>)<br> <br>RDS(on),  Drain-to -Source On Resistance (m<br>Thermal Response ( Z thJC ) °C/W<br>**----- End of picture text -----**<br>


**Figure 15      Maximum Effective Transient Thermal Impedance, Junction-to-Case** 

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**IRF200S234** 

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## **Electrical characteristic diagrams** 

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100<br>Allowed avalanche Current vs avalanche<br>pulsewidth, tav, assuming  Tj = 150°C and<br>Tstart =25°C (Single Pulse)<br>10<br>1<br>Allowed avalanche Current vs<br>avalanche pulsewidth, tav, assuming<br> Tj = 25°C and Tstart = 150°C.<br>0.1<br>1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01<br>tav (sec)<br>Avalanche Current (A)<br>**----- End of picture text -----**<br>


**Figure 16      Avalanche Current vs. Pulse Width** 

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600<br>TOP          Single Pulse<br>BOTTOM   1.0% Duty Cycle<br>500<br>ID = 51A<br>400<br>300<br>200<br>100<br>0<br>25 50 75 100 125 150 175<br>Starting TJ , Junction Temperature (°C)<br>EAR , Avalanche Energy (mJ)<br>**----- End of picture text -----**<br>


## **Notes on Repetitive Avalanche Curves , Figures 16, 17: (For further info, see AN-1005 at www.infineon.com)** 

- 1.Avalanche failures assumption: 

Purely a thermal phenomenon and failure occurs at a temperature far in excess of Tjmax. This is validated for every part type. 

2. Safe operation in Avalanche is allowed as long asTjmax is not exceeded. 

3. Equation below based on circuit and waveforms shown in Figures 23a, 23b. 

4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 

6. Iav = Allowable avalanche current. 

7. DT = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 15, 16). 

   - tav = Average time in avalanche. 

   - D = Duty cycle in avalanche =  tav ·f 

   - ZthJC(D, tav) = Transient thermal resistance, see Figures 14) 

      - PD (ave) = 1/2 ( 1.3·BV·Iav) =  T/ ZthJC 

      - Iav = 2  T/ [1.3·BV·Zth] 

      - EAS (AR) = PD (ave)·tav 

## **Figure 17      Maximum Avalanche Energy vs. Temperature** 

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## **IR MOSFET-StrongIRFET™** 

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## **Electrical characteristic diagrams** 

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60 70<br>IF = 34A IF = 51A<br>50 V R  = 170V 60 V R  = 170V<br>TJ = 25°C TJ = 25°C<br>40 T J = 125°C 50 TJ = 125°C<br>40<br>30<br>30<br>20<br>20<br>10<br>10<br>0 0<br>100 200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000<br>diF /dt (A/µs) diF /dt (A/µs)<br>Figure 18      Typical Recovery Current vs. dif/dt Figure 19      Typical Recovery Current vs. dif/dt<br>2500 3000<br>IF = 34A IF = 51A<br>VR = 170V 2500 VR = 170V<br>2000<br>TJ = 25°C TJ = 25°C<br>TJ = 125°C 2000 T J = 125°C<br>1500<br>1500<br>1000<br>1000<br>500<br>500<br>0 0<br>100 200 300 400 500 600 700 800 900 1000 100 200 300 400 500 600 700 800 900 1000<br>diF /dt (A/µs) diF /dt (A/µs)<br>IRRM (A) IRRM (A)<br>QRR (nC) QRR (nC)<br>**----- End of picture text -----**<br>


**Figure 20      Typical Stored Charge vs. dif/dt** 

**Figure 21      Typical Stored Charge vs. dif/dt** 

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**IRF200S234** 

## **IR MOSFET-StrongIRFET™** 

## **Electrical characteristic diagrams** 

**Figure 22      Peak Diode Recovery dv/dt Test Circuit for N-Channel  Power MOSFETs** 

**Figure 23a      Unclamped Inductive Test Circuit** 

**Figure 23b      Unclamped Inductive Waveforms** 

2017-06-30 

**IRF200S234** 

## **IR MOSFET-StrongIRFET™** 

## **Electrical characteristic diagrams** 

**Figure 24a      Switching Time Test Circuit** 

**Figure 25a      Gate Charge Test Circuit** 

**Figure 24b      Switching Time Waveforms** 

**Figure 25b      Gate Charge Waveform** 

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**IR MOSFET-StrongIRFET™** 

**IRF200S234 Package Information** 

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## **5               Package Information** 

**D2Pak (TO-263AB) Package Outline** (Dimensions are shown in millimeters (inches)) 

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## **D2Pak (TO-263AB) Part Marking Information** 

Final Datasheet                                                                                                              14 

Note: For the most current drawing please refer to  website at http://www.irf.com/package/ 

2017-06-30 

**IR MOSFET-StrongIRFET™** 

**IRF200S234** 

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## **D2Pak (TO-263AB) Tape & Reel Information** (Dimensions are shown in millimeters (inches)) 

TRR 

**==> picture [364 x 371] intentionally omitted <==**

**----- Start of picture text -----**<br>
1.60 (.063)<br>1.50 (.059)<br>1.60 (.063)<br>4.10 (.161)<br>3.90 (.153) 1.50 (.059) 0.368 (.0145)<br>0.342 (.0135)<br>FEED DIRECTION 1.85 (.073) 11.60 (.457)<br>1.65 (.065) 11.40 (.449) 24.30 (.957)<br>15.42 (.609)<br>23.90 (.941)<br>15.22 (.601)<br>TRL<br>1.75 (.069)<br>10.90 (.429) 1.25 (.049)<br>10.70 (.421) 4.72 (.136)<br>16.10 (.634) 4.52 (.178)<br>15.90 (.626)<br>FEED DIRECTION<br>13.50 (.532) 27.40 (1.079)<br>12.80 (.504) 23.90 (.941)<br>4<br>330.00 60.00 (2.362)<br>(14.173)       MIN.<br>  MAX.<br>30.40 (1.197)<br>NOTES :       MAX.<br>1.   COMFORMS TO EIA-418.<br>26.40 (1.039) 4<br>2.   CONTROLLING DIMENSION: MILLIMETER. 24.40 (.961)<br>3.   DIMENSION MEASURED @ HUB. 3<br>**----- End of picture text -----**<br>


4.   INCLUDES FLANGE DISTORTION @ OUTER EDGE. 

Note: For the most current drawing please refer to  website at http://www.irf.com/package/ 

Final Datasheet                                                                                                              15 

2017-06-30 

**IR MOSFET-StrongIRFET™** 

**IRF200S234 Qualification Information** 

**==> picture [100 x 46] intentionally omitted <==**

## **6               Qualification Information** 

**Qualification Information** 

|**Qualification Information**|||
|---|---|---|
|**Qualification Level**|Industrial<br>(per JEDEC JESD47F)†||
|**Moisture Sensitivity Level**|D2Pak|MSL1<br>(per JEDEC J-STD-020D†)|
|**RoHS Compliant**|Yes||



- Applicable version of JEDEC standard at the time of product release. 

Final Datasheet                                                                                                              16 

2017-06-30 

**IR MOSFET-StrongIRFET™** 

**IRF200S234 Revision History** 

**==> picture [100 x 46] intentionally omitted <==**

## **Revision History** 

## **Major changes since the last revision** 

|**Page or Reference**|**Revision**|<br>**Date**|**Description of changes**|
|---|---|---|---|
|All pages|1.0|2016-09-23|<br>First release Provisional data sheet.|
|All pages|2.0|2017-06-30|<br>First release Final data sheet.|



Final Datasheet                                                                                                              17 

2017-06-30 

## **Trademarks of Infineon Technologies AG** 

µHVIC™, µIPM™, µPFC™, AU-ConvertIR™, AURIX™, C166™, CanPAK™, CIPOS™, CIPURSE™, CoolDP™, CoolGaN™, COOLiR™, CoolMOS™, CoolSET™, CoolSiC™, DAVE™, DI-POL™, DirectFET™, DrBlade™, EasyPIM™, EconoBRIDGE™, EconoDUAL™, EconoPACK™, EconoPIM™, EiceDRIVER™, eupec™, FCOS™, GaNpowIR™, HEXFET™, HITFET™, HybridPACK™, iMOTION™, IRAM™, ISOFACE™, IsoPACK™, LEDrivIR™, LITIX™, MIPAQ™, ModSTACK™, my-d™, NovalithIC™, OPTIGA™, OptiMOS™, ORIGA™, PowIRaudio™, PowIRStage™, PrimePACK™, PrimeSTACK™, PROFET™, PRO-SIL™, RASIC™, REAL3™, SmartLEWIS™, SOLID FLASH™, SPOC™, StrongIRFET™, SupIRBuck™, TEMPFET™, TRENCHSTOP™, TriCore™, UHVIC™, XHP™, XMC™ 

Trademarks updated November 2015 

## **Other Trademarks** 

All referenced product or service names and trademarks are the property of their respective owners. 

## **IMPORTANT NOTICE** 

> **Edition 2015-05-06** The information given in this document shall in no **Published by** event be regarded as a guarantee of conditions or **Infineon Technologies AG** characteristics  (“Beschaffenheitsgarantie”) . **81726 Munich, Germany** With respect to any examples, hints or any typical values stated herein and/or any information 

> **© 2016 Infineon Technologies AG.** regarding the application of the product, Infineon 

> **All Rights Reserved.** Technologies hereby disclaims any and all warranties and liabilities of any kind, including **Do you have a question about this** without limitation warranties of non-infringement of **document?** intellectual property rights of any third party. **Email: erratum@infineon.com** In addition, any information given in this document **Document reference** is subject to customer’s compliance with its obligations stated in this document and any applicable legal requirements, norms and standards concerning customer’s products and any use of the product of Infineon Technologies in customer’s applications. 

For further information on the product, technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies office **(www.infineon.com).** 

## **WARNINGS** 

Due to technical requirements products may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies office. 

Except as otherwise explicitly approved by Infineon Technologies in a written document signed by authorized representatives of Infineon Technologies, Infineon Technologies’ products may not be used in any applications where a failure of the product or any consequences of the use thereof can reasonably be expected to result in personal injury. 

The data contained in this document is exclusively intended for technically trained staff. It is the responsibility of customer’s technical departments to evaluate the suitability of the product for the intended application and the completeness of the product information given in this document with 



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---

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