# IGBT, 16 A, 1.7 V, 70 W, 1.2 kV, TO-247, 3 Pins

![Product image](https://novapart.co/image/farnell:2781344/)

**URL**: https://novapart.co/products/IGW08T120FKSA1/igbt-16-a-17-v-70-w-12-kv-to-247-3-pins
**SKU**: IGW08T120FKSA1
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || IGBTs || Single IGBTs
**Price**: €1.5000
**Stock**: 10+

## Description

DC Collector Current:16A; Collector Emitter Saturation Voltage Vce(on):1.7V; Power Dissipation Pd:70W; Collector Emitter Voltage V(br)ceo:1.2kV; Transistor Case Style:TO-247; No. of Pins

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (27-Jun-2018) |
| No. Of Pins | 3Pins |
| Product Range | TrenchStop |
| Power Dissipation | 70W |
| Transistor Mounting | Through Hole |
| Transistor Case Style | TO-247 |
| Operating Temperature Max | 150°C |
| Continuous Collector Current | 16A |
| Collector Emitter Voltage Max | 1.2kV |
| Collector Emitter Saturation Voltage | 1.7V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2781344/)

IGW08T120 

TrenchStop[®] Series 

## Cinfin eon 

## Low Loss IGBT in TrenchStop[®] and Fieldstop technology 

- Short circuit withstand time – 10µs 

- Designed for : 

   - Frequency Converters 

   - Uninterrupted Power Supply 

- TrenchStop[®] and Fieldstop technology for 1200 V applications offers : 

   - very tight parameter distribution 

   - high ruggedness, temperature stable behavior 

- NPT technology offers easy parallel switching capability due to positive temperature coefficient in VCE(sat) 

- Low EMI 

C G & E PG-TO-247-3 

- Low Gate Charge 

- Qualified according to JEDEC[1] for target applications 

- Pb-free lead plating; RoHS compliant 

- Complete product spectrum and PSpice Models : http://www.infineon.com/igbt/ 

|**Maximum Ratings **||||
|---|---|---|---|
|**Parameter**|**Symbol**<br>~~—_|—___~~|**Value**<br>~~—_|—___~~|**Unit**<br>~~—_|—___~~|
|Collector-emitter voltage|_V_C E<br>~~—_|—___~~|1200<br>~~—_|—___~~|V<br>~~—_|—___~~|
|DC collector current<br>_T_C= 25°C<br>_T_C= 100°C|_I_C<br>~~—_|—___~~<br>~~pf~~|16<br>8<br>~~—_|—___~~<br>~~pf~~|A<br>~~—_|—___~~<br>~~pf~~<br>~~Pf~~<br>~~eee~~|
|Pulsed collector current,_t_plimited by _T_jmax|_I_Cpu l s<br>~~pf~~|24<br>~~pf~~||
|Turn off safe operating area<br>_V_CE≤1200V,_T_j ≤150°C|_-_<br>~~pf~~<br>~~Pf~~<br>~~ee~~|24<br>~~pf~~<br>~~Pf~~<br>~~eee~~||
|Gate-emitter voltage|_V_G E<br>~~ee~~|±20<br>~~eee~~|V<br>~~eee~~|
|Short circuit withstand time2) <br>_V_GE= 15V,_V_CC≤1200V,_T_j ≤150°C|_t_SC<br>~~ee ~~<br>~~Pf~~|10<br> ~~eee~~<br>~~Pf~~|µs<br>~~eee~~<br>~~Pf~~|
|Power dissipation<br>_T_C= 25°C|_P_to t<br>~~Pf~~<br>~~ee~~|70<br>~~Pf~~<br>~~eee~~|W<br>~~Pf~~<br>~~eee~~|
|Operating junction temperature|_T_ j <br>~~Pf~~<br>~~ee~~|-40...+150<br>~~Pf~~<br>~~eee~~|°C<br>~~Pf~~<br>~~eee~~<br>~~ee~~|
|Storage temperature|_T_stg<br>~~ee~~<br>~~ee~~|-55...+150<br>~~eee~~<br>~~ee~~||
|Solderingtemperature, 1.6mm(0.063 in.)from case for 10s|-<br>~~ee~~|260<br>~~ee~~||



> 1 J-STD-020 and JESD-022 

> 2) Allowed number of short circuits: <1000; time between short circuits: >1s. 

Rev. 2.6     Nov. 09 

Power Semiconductors 

IGW08T120 

TrenchStop[®] Series 

## **Thermal Resistance** 

|**Thermal Resistance**|||||
|---|---|---|---|---|
|**Parameter**|**Symbol**|**Conditions**|**Max. Value**|**Unit**|
|**Characteristic**|||||
|IGBT thermal resistance,<br>junction – case|_R_t h JC||1.7|K/W|
|Thermal resistance,<br>junction – ambient|_R_t h JA||40||



## **Electrical Characteristic,** at _T_ j = 25 °C, unless otherwise specified 

|**Parameter**|**Symbol**|**Conditions**|**Value**|**Value**|**Value**|**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ. **|**max.**||
|**Static Characteristic**|||||||
|Collector-emitter breakdown voltage|_V_ (BR)C ES|_V_G E=0V,_I_C=0.5mA|1200|-|-|V|
|Collector-emitter saturation voltage|_V_C E(sa t )|_V_G E= 15V,_I_C=8A<br>_T_j=25°C<br>_T_j=125°C<br>_T_j=150°C|-<br>-<br>-|1.7<br>2.0<br>2.2|2.2<br>-<br>-||
|Gate-emitter threshold voltage|_V_G E(th)|_I_C=0.3mA,_V_C E=_V_G E|5.0|5.8|6.5||
|Zero gate voltage collector current|_I_C ES|_V_C E=1200V,<br>_V_G E=0V<br>_T_j=25°C<br>_T_j=150°C|-<br>-|-<br>-|0.2<br>2.0|mA|
|Gate-emitter leakage current|_I_G E S|_V_C E=0V,_V_GE=20V|-|-|100|nA|
|Transconductance|_g_f s|_V_C E=20V,_I_C=8A|-|5|-|S|
|Integratedgate resistor|_R G i n t_||none|||Ω|



## **Dynamic Characteristic** 

|**Dynamic Characteristic**|||||||
|---|---|---|---|---|---|---|
|Input capacitance|_C_i s s|_V_C E=25V,<br>_V_G E=0V,<br>_f_=1MHz|-|600|-|pF|
|Output capacitance|_C_o s s||-|36|-||
|Reverse transfer capacitance|_C_r s s||-|28|-||
|Gate charge|_Q_Ga te|_V_C C=960V,_I_C=8A<br>_V_G E=15V|-|53|-|nC|
|Internal emitter inductance<br>measured 5mm(0.197 in.)from case|_L_E||-|13|-|nH|
|Short circuit collector current1)|_I_C (SC )|_V_G E=15V,_t_SC≤10µs<br>_V_C C= 600V,<br>_T_j=  25°C|-|48|-|A|



> 1) Allowed number of short circuits: <1000; time between short circuits: >1s. 

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TrenchStop[®] Series 

## **Switching Characteristic, Inductive Load,** at _T_ j=25 °C 

|**Parameter**|**Symbol**|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ.**|**max.**||
|**IGBT Characteristic**|||||||
|Turn-on delaytime|_t_d(o n)|_T_j=25°C,<br>_V_C C=600V,_I_C=8A,<br>_V_G E=-15/15V,<br>_R_G=81Ω,<br>_L_σ<br>_2 )_=180nH,<br>_C_σ<br>_2 )_=39pF<br>Energy losses include<br>“tail” and diode<br>reverse recovery.|-|40|-|ns|
|Rise time|_t_r||-|23|-||
|Turn-off delaytime|_t_d(o f f)||-|450|-||
|Fall time|_t_f||-|70|-||
|Turn-on energy|_E_o n||-|0.67|-|mJ|
|Turn-off energy|_E_o ff||-|0.7|-||
|Total switchingenergy|_E_t s||-|1.37|-||



## **Switching Characteristic, Inductive Load,** at _T_ j=150 °C 

|**Parameter**|**Symbol**|**Conditions**||**Value**||**Unit**|
|---|---|---|---|---|---|---|
||||**min.**|**typ.**|**max.**||
|**IGBT Characteristic**|||||||
|Turn-on delaytime|_t_d(o n)|_T_j=150°C_,_<br>_V_C C=600V,_I_C=8A,<br>_V_G E=-15/15V,<br>_R_G= 81Ω_,_<br>_L_σ<br>_2 )_=180nH,<br>_C_σ<br>_2 )_=39pF<br>Energy losses include<br>“tail” and diode<br>reverse recovery.|-|40|-|ns|
|Rise time|_t_r||-|26|-||
|Turn-off delaytime|_t_d(o f f)||-|570|-||
|Fall time|_t_f||-|140|-||
|Turn-on energy|_E_o n||-|1.08|-|mJ|
|Turn-off energy|_E_o ff||-|1.2|-||
|Total switchingenergy|_E_t s||-|2.28|-||



> 2) Leakage inductance _L_ σ and Stray capacity _C_ σ due to dynamic test circuit in Figure E. 

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## TrenchStop[®] Series 

**==> picture [219 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
20A<br>T C=80°C<br>15A<br>T C=110°C<br>10A<br>Ic<br>5A<br>Ic<br>0A<br>10Hz 100Hz 1kHz 10kHz 100kHz<br>f , SWITCHING FREQUENCY<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**Figure 1. Collector current as a function of switching frequency** ( _T_ j ≤ 150°C, _D =_ 0.5, _V_ CE = 600V, _V_ GE = 0/+15V, _R_ G = 81Ω) 

**==> picture [216 x 219] intentionally omitted <==**

**----- Start of picture text -----**<br>
t p=2µs<br>10A<br>10µs<br>50µs<br>1A<br>150µs<br>500µs<br>0,1A 20ms<br>DC<br>0,01A<br>1V 10V 100V 1000V<br>V CE, COLLECTOR-EMITTER VOLTAGE<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**Figure 2. Safe operating area** 

( _D =_ 0, _T_ C = 25°C, _T_ j ≤150°C; _V_ GE=15V) 

**==> picture [218 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
70W<br>60W<br>50W<br>40W<br>30W<br>20W<br>10W<br>0W<br>25°C 50°C 75°C 100°C 125°C<br>T C, CASE TEMPERATURE<br>POWER DISSIPATION<br>tot,<br>P<br>**----- End of picture text -----**<br>


**Figure 3. Power dissipation as a function of case temperature** ( _T_ j ≤ 150°C) 

**==> picture [216 x 201] intentionally omitted <==**

**----- Start of picture text -----**<br>
15A<br>10A<br>5A<br>0A<br>25°C 75°C 125°C<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**==> picture [96 x 9] intentionally omitted <==**

**----- Start of picture text -----**<br>
T C, CASE TEMPERATURE<br>**----- End of picture text -----**<br>


**Figure 4. Collector current as a function of case temperature** 

( _V_ GE ≥ 15V, _T_ j ≤ 150°C) 

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**==> picture [215 x 219] intentionally omitted <==**

**----- Start of picture text -----**<br>
20A<br>V GE=17V<br>15V<br>15A<br>13V<br>11V<br>9V<br>10A<br>7V<br>5A<br>0A<br>0V 1V 2V 3V 4V 5V 6V<br>V CE, COLLECTOR-EMITTER VOLTAGE<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**Figure 5. Typical output characteristic** ( _T_ j = 25°C) 

**==> picture [220 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
20A<br>15A<br>10A<br>5A<br>T J=150°C<br>25°C<br>0A<br>0V 2V 4V 6V 8V 10V 12V<br>V GE, GATE-EMITTER VOLTAGE<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**==> picture [184 x 21] intentionally omitted <==**

**----- Start of picture text -----**<br>
Figure 7. Typical transfer characteristic<br>(VCE=20V)<br>**----- End of picture text -----**<br>


**==> picture [218 x 219] intentionally omitted <==**

**----- Start of picture text -----**<br>
20A<br>V GE=17V<br>15V<br>15A<br>13V<br>11V<br>9V<br>10A<br>7V<br>5A<br>0A<br>0V 1V 2V 3V 4V 5V 6V<br>V CE, COLLECTOR-EMITTER VOLTAGE<br>COLLECTOR CURRENT<br>,<br>I C<br>**----- End of picture text -----**<br>


**Figure 6. Typical output characteristic** ( _T_ j = 150°C) 

**==> picture [216 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
3,0V<br>IC =15A<br>2,5V<br>2,0V<br>IC =8A<br>1,5V<br>IC =5A<br>1,0V IC =2.5A<br>0,5V<br>0,0V<br>-50°C 0°C 50°C 100°C<br>T J, JUNCTION TEMPERATURE<br>EMITT SATURATION VOLTAGE<br>-<br>COLLECTOR<br>CE(sat),<br>V<br>**----- End of picture text -----**<br>


**Figure 8. Typical collector-emitter saturation voltage as a function of junction temperature** ( _V_ GE = 15V) 

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IGW08T120 

## TrenchStop[®] Series 

**==> picture [221 x 219] intentionally omitted <==**

**----- Start of picture text -----**<br>
t<br>d(off)<br>100ns t f<br>t<br>d(on)<br>10ns<br>t r<br>1ns<br>5A 10A 15A<br>IC , COLLECTOR CURRENT<br>SWITCHING TIMES<br>t,<br>**----- End of picture text -----**<br>


**Figure 9. Typical switching times as a function of collector current** (inductive load, _T_ J=150°C, _V_ CE=600V, VGE=0/15V, _R_ G=81Ω, Dynamic test circuit in Figure E) 

**==> picture [201 x 219] intentionally omitted <==**

**----- Start of picture text -----**<br>
t<br>d(off)<br>t f<br>100 ns<br>t<br>d(on)<br>10 ns<br>t r<br>1 ns<br>5Ω 50Ω 100Ω 150Ω 200Ω<br>R G, GATE RESISTOR<br>**----- End of picture text -----**<br>


**==> picture [9 x 77] intentionally omitted <==**

**----- Start of picture text -----**<br>
SWITCHING TIMES<br>t,<br>**----- End of picture text -----**<br>


## **Figure 10. Typical switching times as a function of gate resistor** (inductive load, _T_ J=150°C, 

_V_ CE=600V, VGE=0/15V, _I_ C=8A, Dynamic test circuit in Figure E) 

**==> picture [222 x 201] intentionally omitted <==**

**----- Start of picture text -----**<br>
t<br>d(off)<br>100ns<br>t f<br>t<br>d(on)<br>t r<br>10ns<br>0°C 50°C 100°C 150°C<br>SWITCHING TIMES<br>t,<br>**----- End of picture text -----**<br>


**==> picture [112 x 9] intentionally omitted <==**

**----- Start of picture text -----**<br>
T J, JUNCTION TEMPERATURE<br>**----- End of picture text -----**<br>


**Figure 11. Typical switching times as a function of junction temperature** (inductive load, _V_ CE=600V, VGE=0/15V, _I_ C=8A, _R_ G=81Ω, Dynamic test circuit in Figure E) 

**==> picture [212 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
7V<br>6V<br>5V max.<br>typ.<br>4V<br>min.<br>3V<br>2V<br>1V<br>0V<br>-50°C 0°C 50°C 100°C 150°C<br>T J, JUNCTION TEMPERATURE<br>EMITT TRSHOLD VOLTAGE<br>-<br>GATE<br>) GE(th,<br>V<br>**----- End of picture text -----**<br>


**Figure 12. Gate-emitter threshold voltage as a function of junction temperature** ( _I_ C = 0.3mA) 

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TrenchStop[®] Series 

**==> picture [215 x 219] intentionally omitted <==**

**----- Start of picture text -----**<br>
*)  E on and  E tsinclude losses<br>   due to diode recovery E ts*<br>6,0mJ<br>4,0mJ<br>E offon*<br>2,0mJ EE onoff*<br>0,0mJ<br>5A 10A 15A<br>IC , COLLECTOR CURRENT<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>**----- End of picture text -----**<br>


**Figure 13. Typical switching energy losses as a function of collector current** (inductive load, _T_ J=150°C, _V_ CE=600V, VGE=0/15V, _R_ G=81Ω, Dynamic test circuit in Figure E) 

**==> picture [222 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
*)  E on and  E ts include losses<br>    due to diode recovery E ts*<br>2.0mJ<br>1.5mJ<br>E off<br>1.0mJ E on*<br>0.5mJ<br>0.0mJ<br>25°C 50°C 75°C 100°C 125°C<br>T J, JUNCTION TEMPERATURE<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>**----- End of picture text -----**<br>


## **Figure 15. Typical switching energy losses as a function of junction temperature** 

(inductive load, _V_ CE=600V, VGE=0/15V, _I_ C=8A, _R_ G=81Ω, Dynamic test circuit in Figure E) 

**==> picture [217 x 541] intentionally omitted <==**

**----- Start of picture text -----**<br>
*)  E on and  E ts include losses<br>3,2 mJ    due to diode recovery E ts*<br>2,8 mJ<br>2,4 mJ<br>2,0 mJ E on E off*<br>1,6 mJ EE offon*<br>1,2 mJ<br>0,8 mJ<br>0,4 mJ<br>0,0 mJ<br>5Ω 50Ω 100Ω 150Ω 200Ω<br>R G, GATE RESISTOR<br>Figure 14. Typical switching energy losses<br>as a function of gate resistor<br>(inductive load,  T J=150°C,<br>V CE=600V, VGE=0/15V,  I C=8A,<br>Dynamic test circuit in Figure E)<br>*)  E on and  E ts include losses<br>    due to diode recovery<br>3mJ<br>2mJ<br>E ts*<br>1mJ EE offon*<br>EE onoff*<br>0mJ<br>400V 500V 600V 700V 800V<br>VCE , COLLECTOR-EMITTER VOLTAGE<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>SWITCHING ENERGY LOSSES<br>,<br>E<br>**----- End of picture text -----**<br>


## **Figure 16. Typical switching energy losses as a function of collector emitter voltage** 

(inductive load, _T_ J=150°C, VGE=0/15V, _I_ C=8A, _R_ G=81Ω, Dynamic test circuit in Figure E) 

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**==> picture [222 x 220] intentionally omitted <==**

**----- Start of picture text -----**<br>
15V<br>240V 960V<br>10V<br>5V<br>0V<br>0nC 25nC 50nC<br>Q GE, GATE CHARGE<br>EMITTER VOLTAGE<br>-<br>GATE<br>,<br>GE<br>V<br>**----- End of picture text -----**<br>


**Figure 17. Typical gate charge** ( _I_ C=8 A) 

**==> picture [218 x 201] intentionally omitted <==**

**----- Start of picture text -----**<br>
1nF<br>C iss<br>100pF<br>C oss<br>C rss<br>10pF 0V 10V 20V<br>CAPACITANCE<br>c,<br>**----- End of picture text -----**<br>


**==> picture [141 x 10] intentionally omitted <==**

**----- Start of picture text -----**<br>
V CE, COLLECTOR-EMITTER VOLTAGE<br>**----- End of picture text -----**<br>


**Figure 18. Typical capacitance as a function of collector-emitter voltage** ( _V_ GE=0V, _f_ = 1 MHz) 

**==> picture [219 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
15µs<br>10µs<br>5µs<br>0µs<br>12V 14V 16V<br>V GE, GATE-EMITTETR VOLTAGE<br>SHORT CIRCUIT WITHSTAND TIME<br>t SC,<br>**----- End of picture text -----**<br>


**Figure 19. Short circuit withstand time as a function of gate-emitter voltage** ( _V_ CE=600V _,_ start at _T_ J _=_ 25°C _)_ 

**==> picture [213 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
75A<br>50A<br>25A<br>0A<br>12V 14V 16V 18V<br>V GE, GATE-EMITTETR VOLTAGE<br>COLLECTOR CURRENT<br>, short circuit<br>I C(sc)<br>**----- End of picture text -----**<br>


**Figure 20. Typical short circuit collector current as a function of gateemitter voltage** 

- ( _V_ CE ≤ 600V, _T_ j ≤ 150°C) 

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**==> picture [443 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
V<br>CE<br>600V 30A 30A 600V<br>400V 20A 20A 400V<br>I<br>C<br>200V 10A 10A 200V<br>I C V CE<br>0V 0A 0A 0V<br>0us 0.5us 1us 1.5us 0us 0.5us 1us 1.5us<br>t , TIME t , TIME<br>EMITTER VOLTAGE<br>-<br>COLLECTOR CURRENT<br>,<br>COLLECTOR I C<br>,<br>CE<br>V<br>**----- End of picture text -----**<br>


**Figure 21. Typical turn on behavior** (VGE=0/15V, _R_ G=81Ω, _T_ j = 150°C, Dynamic test circuit in Figure E) 

**Figure 22. Typical turn off behavior** (VGE=15/0V, _R_ G=81Ω, _T_ j = 150°C, Dynamic test circuit in Figure E) 

**==> picture [215 x 218] intentionally omitted <==**

**----- Start of picture text -----**<br>
100K/W D =0.5<br>0.2 R , ( K / W ) τ , ( s )<br>0.187  1.73*10-1<br>0.1 0.575 2.75*10-2<br>-3<br>0.589 2.57*10<br>0.350  2.71*10-4<br>0.05<br>10-1K/W R  1 R  2<br>0.02<br>0.01 C  1= τ1/ R  1 C  2= τ2/ R  2<br>single pulse<br>10-2K/W<br>10µs 100µs 1ms 10ms 100ms<br>t P, PULSE WIDTH<br>TRANSIENT THERMAL RESISTANCE<br>,<br>thJC<br>Z<br>**----- End of picture text -----**<br>


**Figure 23. IGBT transient thermal resistance** ( _D = t_ p / _T_ ) 

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**==> picture [267 x 267] intentionally omitted <==**

**Figure A. Definition of switching times** 

**==> picture [177 x 106] intentionally omitted <==**

**----- Start of picture text -----**<br>
τ1 τ2 τn<br>r1 r 2 r n<br>Tj (t)<br>p(t) r1 r 2 r n<br>TC<br>**----- End of picture text -----**<br>


**Figure D. Thermal equivalent circuit** 

**Figure B. Definition of switching losses** 

**Figure E. Dynamic test circuit** Leakage inductance _L_ σ =180nH and Stray capacity _C_ σ =39pF. 

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## **Edition 2006-01** 

## **Published by Infineon Technologies AG 81726 München, Germany** 

## **© Infineon Technologies AG 11/18/09. All Rights Reserved.** 

## **Attention please!** 

The information given in this data sheet shall in no event be regarded as a guarantee of conditions or characteristics (“Beschaffenheitsgarantie”). With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation warranties of non-infringement of intellectual property rights of any third party. 

## **Information** 

For further information on technology, delivery terms and conditions and prices please contact your nearest Infineon Technologies Office ( **www.infineon.com** ). 

## **Warnings** 

Due to technical requirements components may contain dangerous substances. For information on the types in question please contact your nearest Infineon Technologies Office. 

Infineon Technologies Components may only be used in life-support devices or systems with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system, or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body, or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. 

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Power Semiconductors 



## Links

- [View this product on Novapart](https://novapart.co/products/IGW08T120FKSA1/igbt-16-a-17-v-70-w-12-kv-to-247-3-pins)
- [Request a quote for this part](https://novapart.co/quote/)
- [Supplier page](https://es.farnell.com/infineon/igw08t120fksa1/igbt-single-1-2kv-16a-to-247/dp/2781344)
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