# Bipolar Transistor Array, NPN, PNP, 30 V, 30 V, 2 A, 2 A, 1.1 W

![Product image](https://novapart.co/image/farnell:4062480/)

**URL**: https://novapart.co/products/HN4B102J(TE85L,F)/bipolar-transistor-array-npn-pnp-30-v-2-a-11-w
**SKU**: HN4B102J(TE85L,F)
**Manufacturer**: TOSHIBA
**Category**: Semiconductors - Discretes || Transistors || Bipolar Transistors || Bipolar Junction Transistor Arrays - BJT
**Price**: €0.1930
**Stock**: 1000+
**Lead Time**: 2 days (indicative)

## Specifications

| Parameter | Value |
|---|---|
| Svhc | To Be Advised |
| No. Of Pins | 5Pins |
| Product Range | - |
| Qualification | - |
| Transistor Mounting | Surface Mount |
| Transistor Polarity | NPN, PNP |
| Power Dissipation Npn | 1.1W |
| Power Dissipation Pnp | 1.1W |
| Transistor Case Style | SOT-25 |
| Transition Frequency Npn | - |
| Transition Frequency Pnp | - |
| Operating Temperature Max | 150°C |
| Dc Current Gain Hfe Min Npn | 40hFE |
| Dc Current Gain Hfe Min Pnp | 40hFE |
| Continuous Collector Current Npn | 2A |
| Continuous Collector Current Pnp | 2A |
| Collector Emitter Voltage Max Npn | 30V |
| Collector Emitter Voltage Max Pnp | 30V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:4062480/)

HN4B102J 

TOSHIBA Transistor  Silicon PNP / NPN Epitaxial Type (PCT Process) 

## **HN4B102J** 

## MOS Gate Drive Applications Switching Applications 

- Small footprint due to a small and thin package 

- High DC current gain : PNP  hFE = 200 to 500 (IC =－0.2 A) 

   - : NPN  hFE = 200 to 500 (IC = 0.2 A) 

- Low collector-emitter saturation : PNP  VCE (sat) =－0.20 V (max) : NPN  VCE (sat) = 0.14 V (max) 

- High-speed switching : PNP  tf = 40 ns (typ.) 

   - : NPN  tf = 45 ns (typ.) 

## **Absolute Maximum Ratings (Ta = 25°C)** 

|**Characteristic**|**Characteristic**|**Symbol**|**Rating**|**Rating**|**Unit**|
|---|---|---|---|---|---|
||||**PNP**|**NPN**||
|Collector-base voltage||VCBO|−30|60|V|
|Collector-emitter voltage||VCEO|−30|30|V|
|Emitter-base voltage||VEBO|−7|7|V|
|Collector current|DC  (Note 1)<br>Pulse (Note 1)|IC|−1.8|2.0|A|
|||ICP|−8.0|8.0||
|Base current||IB|−0.5|0.5|A|
|Collector power<br>dissipation (t = 10 s)|<br>Single-device<br>operation|PC(Note 2)|1.1||W|
|Collector power<br>dissipation (DC)|Single-device<br>operation|PC(Note 2)|0.75||W|
|Junction temperature||Tj|150||°C|
|Storage temperature range||Tstg|−55 to 150||°C|



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Unit: mm<br>**----- End of picture text -----**<br>


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+0.2<br>2.8 -0.3<br>+0.2<br>1.6 -0.1<br>1 5<br>2<br>4<br>3<br>1. Base  (Q1 PNP)<br>2. Emitter  (Q1 PNP/Q2 NPN)<br>3. Base  (Q2 NPN)<br>4. Collector (Q2 NPN)<br>5. Collector (Q1 PNP)<br>JEDEC  ―<br>JEITA  ―<br>TOSHIBA  2-3L1A<br>0.2 0.2 0.95 0.1<br>± ± ±<br>2.9 1.9 0.95 0.4<br>+0.1<br>+0.2<br>0.16 -0.06<br>1.1 -0.1<br>0~0.1<br>**----- End of picture text -----**<br>


Weight: 0.014g (typ.) 

- Note 1: Ensure that the channel temperature does not exceed 150°C during use of the device. 

- Note 2: Mounted on an FR4 board (glass-epoxy; 1.6 mm thick; Cu area, 645 mm[2] ) 

- Note 3: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. 

Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/Derating Concept and Methods) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). 

## **Figure 1  Circuit Configuration (top view)** 

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５  ４<br>１  ２  ３<br>Q1  Q2<br>(PNP)  (NPN)<br>**----- End of picture text -----**<br>


## **Figure 2  Marking** 

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Part No.<br>(or abbreviation code)  5   L<br>Start of commercial production<br>2007-02<br>**----- End of picture text -----**<br>


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## **Electrical Characteristics (Ta = 25°C) PNP** 

|**PNP**|**PNP**|||||||
|---|---|---|---|---|---|---|---|
|**Characteristic**||**Symbol**|**Test Condition**|**Min**|**Typ.**|**Max**|**Unit**|
|Collector cut-off current||ICBO|VCB = −30 V, IE =0|⎯|⎯|−100|nA|
|Emitter cut-off current||IEBO|VEB = −7 V, IC =0|⎯|⎯|−100|nA|
|Collector-emitter breakdown voltage||V(BR) CEO|IC = −10 mA, IB =0|−30|⎯|⎯|V|
|DC current gain||hFE(1)|VCE = −2 V, IC = −0.2 A|200|⎯|500||
|||hFE(2)|VCE = −2 V, IC = −0.6 A|125|⎯|⎯||
|||hFE(3)|VCE = −2 V, IC = −2.0 A|40|⎯|⎯||
|Collector-emitter saturation voltage||VCE (sat)|IC = −0.6 A, IB = −20 mA|⎯|⎯|−0.20|V|
|Base-emitter saturation voltage||VBE (sat)|IC = −0.6 A, IB = −20 mA|⎯|⎯|−1.10|V|
|Collector output capacitance||Cob|VCB = −10 V, IE =0, f = 1MHz|⎯|16.5|⎯|pF|
|Switching time|Rise time|tr|See Figure 3 circuit diagram<br>VCCi≒−18 V, RL =30Ω<br>IB1 =IB2 =20 mA|⎯|40|⎯|ns|
||Storage time|tstg||⎯|280|⎯||
||Fall time|tf||⎯|40|⎯||



## **NPN** 

|**NPN**|**NPN**|||||||
|---|---|---|---|---|---|---|---|
|**Characteristic**||**Symbol**|**Test Condition**|**Min**|**Typ.**|**Max**|**Unit**|
|Collector cut-off current||ICBO|VCB =60 V, IE =0|⎯|⎯|100|nA|
|Emitter cut-off current||IEBO|VEB =7 V, IC =0|⎯|⎯|100|nA|
|Collector-emitter breakdown voltage||V(BR) CEO|IC =10 mA, IB =0|30|⎯|⎯|V|
|DC current gain||hFE(1)|VCE =2 V, IC =0.2 A|200|⎯|500||
|||hFE(2)|VCE =2 V, IC =0.6 A|125|⎯|⎯||
|||hFE(3)|VCE =2 V, IC =2.0 A|40|⎯|⎯||
|Collector-emitter saturation voltage||VCE (sat)|IC =0.6 A, IB =20 mA|⎯|⎯|0.14|V|
|Base-emitter saturation voltage||VBE (sat)|IC =0.6 A, IB =20 mA|⎯|⎯|1.10|V|
|Collector output capacitance||Cob|VCB =10 V, IE =0, f = 1MHz|⎯|14|⎯|pF|
|Switching time|Rise time|tr|See Figure 4 circuit diagram<br>VCC≒18 V, RL =30Ω<br>IB1 =IB2 =20 mA|⎯|45|⎯|ns|
||Storage time|tstg||⎯|580|⎯||
||Fall time|tf||⎯|45|⎯||



**Figure 3. Switching Time Test Circuit & Timing Chart** 

**Figure 4. Switching Time Test Circuit & Timing Chart** 

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VCC VCC<br>20μs 20μs<br>RL RL<br>IB1<br>IB2<br>IB1 Output IB1 Output<br>IB1 IB2<br>Input<br>Input<br>Duty cycle  ＜1%  IB2 Duty cycle  ＜1%  IB2<br>**----- End of picture text -----**<br>


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## **PNP** 

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IC – VCE hFE – IC<br>-2  1000<br>-10 Ta = 100°C<br>-20<br>-1.6  -8<br>300 25°C<br>-6<br>A SEL<br>-1.2  | i7 A anil −55°C | SHITTN<br>-5<br>100<br>-4<br>Vee STN<br>-0.8<br>-3<br>-2<br>30<br>-0.4<br>Common emitter  Common emitter<br>| Zorn IB =− 1 mA  Ta = 25°C  cH VCE = −2 V  ite<br>Single nonrepetitive pulse Single nonrepetitive pulse<br>0  10<br>0  Voto -0.4  -0.8  -1.2  -1.6  -2  a a<br>-0.001 -0.01 -0.1  -1  -10<br>Collector−emitter voltage  VCE   (V)  Collector current  IC  (A)<br>VCE (sat) – IC VBE (sat) – IC<br>-1  Common emitter  -10 Common emitter<br>IC/IB = 30  IC/IB = 30<br>Single nonrepetitive pulse  Single nonrepetitive pulse<br>ee ee<br>-0.3  |of bsp|HA llfl -3 LIa etlTTee<br>-0.1  -1 Ta = -55°C<br>BI Eh a wv a a<br>25°C 100°C<br>-0.03  rhino Ta = 100°C  −55°C  -0.3 TM ICC<br>25°C<br>SS<br>-0.01  ae -0.1 TInt<br>-0.001  Beniiiantl| -0.01  -0.1  EO -1  -10  -0.001 UTNE -0.01 LTE -0.1  AE -1  Un -10<br>Collector current  IC  (A)<br>Collector current  IC  (A)<br>Safe operating area<br>IC – VBE -10<br>-2  Common emitter  IC max (pulse)  * 10  μs *<br>VCE = −2 V<br>Single nonrepetitive  IC max (pulse) *<br>-1.6  pulse  100 ms*<br>100μs*<br>IC max<br>-1.2  -1 (continuous)*<br>Ta = 100°C  −55°C  DC operation<br>-0.8  Ta = 25°C 1 ms *<br>10 s*<br>-0.4  CEASATOT ToT 25°C  -0.1 Pu * Note that the curves for 100 ms, 10 s and  : Single nonrepetitive pulse Ta = 25°C  NO 10 ms*<br>DC operation will be different when the devices aren ’ t mounted on an FR4 board<br>(glass-epoxy, 1.6 mm thick, Cu area: 645<br>0  mm Single-device operation  [2] ).<br>0  -0.4  -0.8  -1.2  -1.6  These characteristic curves must be<br>derated linearly with increase in<br>PCr -0.01 temperature. Bt milli<br>Base−emitter voltage  VBE  (V)  -0.1  -1  -10  -100<br>Collector−emitter voltage  VCE   (V)<br>FE<br>  (A)<br>C<br>DC current gain  h<br>Collector current  I<br>  (V)<br>  (V)<br>CE (sat)<br>emitter saturation voltage  V VBE (sat)<br>−<br>emitter saturation voltage<br>−<br>Base<br>Collector<br>  (A)    (A)<br>Collector current  IC IC<br>Collector current<br>VCEO max<br>**----- End of picture text -----**<br>


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## **NPN** 

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IC – VCE<br>2<br>20  10<br>8<br>1.6<br>6<br>1.2  Agee 5<br>77a 4<br>0.8<br>3<br>2<br>0.4<br>| 2<br>Common emitter<br>=== IB = 1 mA  Ta = 25°C<br>0  iit Single nonrepetitive pulse<br>0  0.4  0.8  1.2  1.6  2<br>Collector−emitter voltage  VCE   (V)<br>VCE (sat) – IC<br>1<br>Common emitter<br>IC/IB = 30<br>Single nonrepetitive pulse<br>0.3<br>TAMA EMEC<br>0.1<br>−55°C<br>0.03  Siiiiiimaal Ta = 100°C i) Beaman<br>25°C<br>i<br>0.01  maaan) et<br>0.001  0.01  0.1  00 1  10<br>Collector current  IC  (A)<br>IC – VBE<br>2<br>Common emitter<br>V CE = 2 V<br>Single nonrepetitive pulse<br>1.6<br>1.2<br>Ta = 100°C  −55°C<br>0.8<br>0.4<br>25°C<br>0<br>0  0.4  0.8  1.2  1.6<br>Base−emitter voltage  VBE  (V)<br>TT<br>  (A)<br>C<br>Collector current  I<br>  (V)<br>CE (sat)<br>emitter saturation voltage  V<br>−<br>Collector<br>  (A)<br>C<br>Collector current  I<br>**----- End of picture text -----**<br>


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hFE – IC<br>1000<br>Ta = 100°C<br>300<br>25°C<br>EN<br>−55°C<br>100 Tn nll<br>30<br>CEE Common emitter  Eco<br>VCE = 2 V<br>Single nonrepetitive pulse<br>10 a<br>ai<br>0.001 0.01 0.1  1  10<br>Collector current  IC  (A)<br>VBE (sat) – IC<br>10<br>Common emitter<br>IC/IB = 30<br>Single nonrepetitive pulse<br>3<br>AAA<br>Ta = -55°C<br>1<br>100°C<br>25°C<br>0.3<br>eea Te<br>0.1 PRIME TTI PEE ETT<br>UTM LUI LIM Lin<br>0.001 0.01 0.1  1  10<br>Collector current  IC  (A)<br>Safe operating area<br>10<br>IC max (pulse)  * 10μs*<br>IC max (pulse)  *<br>100 ms*<br>100μs*<br>IC max<br>1 (continuous)*<br>DC operation<br>Ta = 25°C<br>1 ms*<br>10 s *<br>0.1 * : Single nonrepetitive pulse Ta = 25°C  10 ms *<br>Note that the curves for 100 ms, 10 s and<br>DC operation will be different when the<br>devices aren’t mounted on an FR4 board<br>(glass-epoxy, 1.6 mm thick, Cu area: 645 mm [2] ).   TK LT<br>Single-device operation<br>These characteristic curves must be<br>derated linearly with increase in<br>0.01 ORS temperature. iCN it<br>0.1  1  10  100<br>Collector−emitter voltage  VCE   (V)<br>FE<br>DC current gain  h<br>  (V)<br>BE (sat)<br>V<br>emitter saturation voltage<br>−<br>Base<br>  (A)<br>C<br>Collector current  I<br>VCEO max<br>**----- End of picture text -----**<br>


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## **Common** 

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rth－tw<br>**----- End of picture text -----**<br>


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1000  —=—-—-.Feo——_ =... —— so —— =. — ==e<br>a<br>eeeA oo or oo<br>PTT<br>Lt [TT] | OO OO<br>100  TU|TIETPT<br>——[————aee ee ee ><br>a A A 0 | OO<br>a a a<br>Beem THE FER Pee ep Peete FTA<br>10  i erTE<br>—-el<br>ee Curves apply only to limited areas of thermal resistance.<br>-PTjoe [Tei] eee Sin Mounted on an FR4 board (glass gle nonepetitive pulse  Ta = 25°C  -epoxy; 1.6 mm thick; Cu area, 645 mm [2] )<br>Single-device operation<br>1<br>0.001  0.01  0.1  1  10  100  1000<br>Pulse width  tw  (s)<br>(j-a)  (°C/W)<br>rth<br>Transient thermal resistance<br>**----- End of picture text -----**<br>


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## **RESTRICTIONS ON PRODUCT USE** 

- Toshiba Corporation, and its subsidiaries and affiliates (collectively "TOSHIBA"), reserve the right to make changes to the information in this document, and related hardware, software and systems (collectively "Product") without notice. 

- This document and any information herein may not be reproduced without prior written permission from TOSHIBA. Even with TOSHIBA's written permission, reproduction is permissible only if reproduction is without alteration/omission. 

- Though TOSHIBA works continually to improve Product's quality and reliability, Product can malfunction or fail. Customers are responsible for complying with safety standards and for providing adequate designs and safeguards for their hardware, software and systems which minimize risk and avoid situations in which a malfunction or failure of Product could cause loss of human life, bodily injury or damage to property, including data loss or corruption. Before customers use the Product, create designs including the Product, or incorporate the Product into their own applications, customers must also refer to and comply with (a) the latest versions of all relevant TOSHIBA information, including without limitation, this document, the specifications, the data sheets and application notes for Product and the precautions and conditions set forth in the "TOSHIBA Semiconductor Reliability Handbook" and (b) the instructions for the application with which the Product will be used with or for. Customers are solely responsible for all aspects of their own product design or applications, including but not limited to (a) determining the appropriateness of the use of this Product in such design or applications; (b) evaluating and determining the applicability of any information contained in this document, or in charts, diagrams, programs, algorithms, sample application circuits, or any other referenced documents; and (c) validating all operating parameters for such designs and applications. **TOSHIBA ASSUMES NO LIABILITY FOR CUSTOMERS' PRODUCT DESIGN OR APPLICATIONS.** 

- **PRODUCT IS NEITHER INTENDED NOR WARRANTED FOR USE IN EQUIPMENTS OR SYSTEMS THAT REQUIRE EXTRAORDINARILY HIGH LEVELS OF QUALITY AND/OR RELIABILITY, AND/OR A MALFUNCTION OR FAILURE OF WHICH MAY CAUSE LOSS OF HUMAN LIFE, BODILY INJURY, SERIOUS PROPERTY DAMAGE AND/OR SERIOUS PUBLIC IMPACT (** " **UNINTENDED USE** " **).** Except for specific applications as expressly stated in this document, Unintended Use includes, without limitation, equipment used in nuclear facilities, equipment used in the aerospace industry, medical equipment, equipment used for automobiles, trains, ships and other transportation, traffic signaling equipment, equipment used to control combustions or explosions, safety devices, elevators and escalators, devices related to electric power, and equipment used in finance-related fields. **IF YOU USE PRODUCT FOR UNINTENDED USE, TOSHIBA ASSUMES NO LIABILITY FOR PRODUCT.** For details, please contact your TOSHIBA sales representative. 

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- **ABSENT A WRITTEN SIGNED AGREEMENT, EXCEPT AS PROVIDED IN THE RELEVANT TERMS AND CONDITIONS OF SALE FOR PRODUCT, AND TO THE MAXIMUM EXTENT ALLOWABLE BY LAW, TOSHIBA (1) ASSUMES NO LIABILITY WHATSOEVER, INCLUDING WITHOUT LIMITATION, INDIRECT, CONSEQUENTIAL, SPECIAL, OR INCIDENTAL DAMAGES OR LOSS, INCLUDING WITHOUT LIMITATION, LOSS OF PROFITS, LOSS OF OPPORTUNITIES, BUSINESS INTERRUPTION AND LOSS OF DATA, AND (2) DISCLAIMS ANY AND ALL EXPRESS OR IMPLIED WARRANTIES AND CONDITIONS RELATED TO SALE, USE OF PRODUCT, OR INFORMATION, INCLUDING WARRANTIES OR CONDITIONS OF MERCHANTABILITY, FITNESS FOR A PARTICULAR PURPOSE, ACCURACY OF INFORMATION, OR NONINFRINGEMENT.** 

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