# Power MOSFET, N Channel, 100 V, 10 A, 0.142 ohm, TO-251AA, Through Hole

![Product image](https://novapart.co/image/farnell:2454174/)

**URL**: https://novapart.co/products/FQU13N10LTU/power-mosfet-n-channel-100-v-10-a-0142-ohm-to
**SKU**: FQU13N10LTU
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.4050
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Power Dissipation | 40W |
| Transistor Mounting | Through Hole |
| Transistor Polarity | N Channel |
| Power Dissipation Pd | 40W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.142ohm |
| Transistor Case Style | TO-251AA |
| Drain Source Voltage Vds | 100V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 10A |
| Drain Source On State Resistance | 0.142ohm |
| Gate Source Threshold Voltage Max | 2V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2454174/)

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## **FQD13N10L / FQU13N10L** 

## **N-Channel QFET[®] MOSFET** 

**100 V, 10 A, 180 mΩ** 

## **Description** 

## **Features** 

This N-Channel enhancement mode power MOSFET • 10 A, 100 V, RDS(on) = 180 mΩ (Max.) @ VGS = 10 V, is produced using Fairchild Semiconductor’s proprietary ID = 5.0 A planar stripe and DMOS technology. This advanced MOSFET technology has been especially tailored to reduce • Low Gate Charge (Typ. 8.7 nC) on-state resistance, and to provide superior switching • Low Crss (Typ. 20 pF) performance and high avalanche energy strength. These devices are suitable for switched mode power supplies, • 100% Avalanche Tested audio amplifier, DC motor control, and variable switching • Low Level Gate Drive Requirement AllowingLevel Gate Drive Requirement Allowingevel Gate Drive Requirement AllowingGate Drive Requirement Allowingate Drive Requirement AllowingDrive Requirement Allowingrive Requirement AllowingRequirement Allowingequirement AllowingAllowingllowing power applications. 

- Low Level Gate Drive Requirement AllowingLevel Gate Drive Requirement Allowingevel Gate Drive Requirement AllowingGate Drive Requirement Allowingate Drive Requirement AllowingDrive Requirement Allowingrive Requirement AllowingRequirement Allowingequirement AllowingAllowingllowing Direct Operation Form Logic Drivers 

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**Absolute Maximum Ratings** TC = 25°C unless otherwise noted. 

|**Symbol**<br>**Parameter**<br>**FQD13N10LTM /FQU13N10LTU**<br>~~re~~|**Symbol**<br>**Parameter**<br>**FQD13N10LTM /FQU13N10LTU**<br>~~re~~|**Symbol**<br>**Parameter**<br>**FQD13N10LTM /FQU13N10LTU**<br>~~re~~|**Symbol**<br>**Parameter**<br>**FQD13N10LTM /FQU13N10LTU**<br>~~re~~|**Symbol**<br>**Parameter**<br>**FQD13N10LTM /FQU13N10LTU**<br>~~re~~||**Unit**|
|---|---|---|---|---|---|---|
|VDSS||Drain-Source Voltage||100||V|
|ID||Drain Current<br>- Continuous (TC= 25°C)||10||A|
|||- Continuous (TC= 100°C)||6.3||A|
|IDM||Drain Current<br>- Pulsed|(Note 1)|40||A|
|VGSS||Gate-Source Voltage||± 20||V|
|EAS||Single Pulsed Avalanche Energy|(Note 2)|95||mJ|
|IAR||Avalanche Current|(Note 1)|10||A|
|EAR||Repetitive Avalanche Energy|(Note 1)|4.0||mJ|
|dv/dt<br>PD||Peak Diode Recoverydv/dt<br>Power Dissipation (TA= 25°C) *<br>~~a~~|(Note 3)|6.0<br>2.5||V/ns<br>W|
|TJ, TSTG||Power Dissipation (TC= 25°C)<br>40<br>- Derate above 25°C<br>0.32<br>Operating and Storage Temperature Range<br>-55 to +150<br>~~|io~~||||W<br>W/°C<br>°C|
|TL||Maximum Lead Temperature for Soldering,<br>1/8”from Case for 5 Seconds||300||°C|
|**Thermal Characteristics**|**Thermal Characteristics**|**Thermal Characteristics**|||||
|**Symbol**||**Parameter**||**FQD13N10LTM /**|**FQD13N10LTM /**|**Unit**|
|||||**FQU13N10LTU**|||
|RJC||Thermal Resistance, Junction to Case, Max.||3.13|||
|RJA||Thermal Resistance, Junction to Ambient(MinimumPad of 2-ozCopper), Max.<br>110<br>Thermal Resistance, Junction to Ambient(*1 in2 Pad of 2-ozCopper), Max.<br>50||||oC/W|



## **Thermal Characteristics** 

www.fairchildsemi.com 

©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

**1** 

|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|**Package Marking and Ordering Information**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FQD13N10L<br>FQD13N10LT<br>PAK<br>330 mm<br>16 mm<br>2500units<br>**Packing Method**<br>**Electrical Characteristics**TC= 25°C unless otherwise noted.<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>**Off Characteristics**<br>BVDSS<br>Drain-Source Breakdown Voltage<br>VGS= 0 V, ID= 250µA<br>100<br>--<br>--<br>V<br>∆BVDSS<br>/∆TJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250µA, Referenced to 25°C<br>--<br>0.09<br>--<br>V/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 100 V, VGS= 0 V<br>--<br>--<br>1<br>µA<br>VDS= 80 V, TC= 125°C<br>--<br>--<br>10<br>µA<br>IGSSF<br>Gate-Body Leakage Current, Forward<br>VGS= 20 V, VDS= 0 V<br>--<br>--<br>100<br>nA<br>IGSSR<br>Gate-Body Leakage Current, Reverse<br>VGS= -20 V, VDS= 0 V<br>--<br>--<br>-100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate Threshold Voltage<br>VDS= VGS, ID= 250µA<br>1.0<br>--<br>2.0<br>V<br>RDS(on)<br>Static Drain-Source<br>On-Resistance<br>VGS= 10 V, ID= 5.0 A<br>VGS= 5 V, ID= 5.0 A<br>--<br>0.142<br>0.158<br>0.18<br>0.2<br>Ω<br>gFS<br>Forward Transconductance<br>VDS= 30 V, ID= 5.0 A<br>--<br>8.7<br>--<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= 25 V, VGS= 0 V,<br>f = 1.0 MHz<br>--<br>400<br>520<br>pF<br>Coss<br>Output Capacitance<br>--<br>95<br>125<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>--<br>20<br>25<br>pF<br>FQU13N10L<br>FQU13N10LTU<br>I PAK<br>N/A<br>N/A<br>70 units<br>Tube<br>~~ee~~|
|---|---|---|---|---|---|---|---|---|
|**Switching Characteristics**|||||||||
|td(on)<br>Turn-On Delay Time<br>VDD= 50 V, ID= 12.8 A,<br>RG= 25Ω<br>tr<br>Turn-On Rise Time|||--<br>--||7.5<br>220|25<br>450||ns<br>ns|
|td(off)<br>Turn-Off Delay Time|||--||22|55||ns|
|(<br>tf<br>Turn-Off Fall Time|( Note 4)||--||72|150||ns|
|Qg<br>Total Gate Charge<br>VDS= 80 V, ID= 12.8 A,|||--||8.7|12||nC|
|VGS= 5 V<br>Qgs<br>Gate-Source Charge|||--||2.0|--||nC|
|<br>Qgd<br>Gate-Drain Charge|(|( Note 4)|--||5.3|--||nC|
|**Drain-Source Diode Characteristics and Maximum Ratings**|||||||||
|IS<br>Maximum Continuous Drain-Source Diode Forward Current|||--||--|10||A|
|ISM<br>Maximum Pulsed Drain-Source Diode Forward Current|||--||--|40||A|
|VSD<br>Drain-Source Diode Forward Voltage<br>VGS= 0 V, IS= 10 A|||--||--|1.5||V|
|trr<br>Reverse Recovery Time<br>VGS= 0 V, IS= 12.8 A,|||--||75|--||ns|
|dIF/ dt = 100 A/µs<br>Qrr<br>Reverse Recovery Charge|||--||0.17|--||µC|



## **Notes:** 

1. Repetitive rating : pulse-width limited by maximum junction temperature. 

2. L = 1.43 mH, IAS = 10 A, VDD = 25 V, RG = 25 Ω, Starting  TJ = 25°C. 

3. ISD ≤ 12.8 A, di/dt ≤ 300 A/µs, VDD ≤ BVDSS, Starting  TJ = 25°C. 

4. Essentially independent of operating temperature. 

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©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

**2** 

## **Typical Characteristics** 

**==> picture [394 x 554] intentionally omitted <==**

**----- Start of picture text -----**<br>
Top :       10.0 V  VGS<br>  8.0 V<br>  6.0 V<br>  5.0 V 101<br>101   4.5 V  4.0 V<br>  3.5 V 150℃<br>Bottom :    3.0 V<br>100 25℃<br>-55℃<br>100 ※1. 250 Notes :μs Pulse Test ※ 1. V Notes :DS = 30V<br>2. TC = 25℃  2. 250μs Pulse Test<br>10-1 100 101 10-1 0 2 4 6 8 10<br>VDS, Drain-Source Voltage [V] VGS , Gate-Source Voltage  [V]<br>Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics<br>0.8<br>0.6 VGS = 5V 101<br>0.4 VGS = 10V<br>100<br>0.2<br>※ Notes :<br>※ Note : TJ = 25℃ 150℃ 25℃   1. V  2. 250GS = 0Vμs Pulse Test<br>0.0 10-1<br>0 10 20 30 40 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8<br>ID, Drain Current [A] VSD, Source-Drain voltage [V]<br>Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage<br>Drain Current and Gate Voltage Variation vs. Source Current<br>and Temperature<br>1000 12<br>Ciss = Cgs + Cgd (Cds = shorted)<br>Coss = Cds + Cgd<br>Crss = Cgd 10<br>800 VDS = 50V<br>8 VDS = 80V<br>600<br>Ciss<br>6<br>400 Coss<br>※ Notes : 4<br> 1. V 2. f = 1 MHzGS = 0 V<br>200 Crss 2<br>※ Note : ID = 12.8A<br>SS 0<br>10-1 100 101 0 4 8 12 16<br>VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC]<br>Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics<br>, Drain Current [A]ID  , Drain Current  [A]ID<br>],<br>Ω<br>  [<br>DS(ON)<br>R<br>, Reverse Drain Current [A]<br>Drain-Source On-Resistance IDR<br>Capacitance [pF]<br>, Gate-Source Voltage [V]<br>GS<br>V<br>**----- End of picture text -----**<br>


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©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

**3** 

## **Typical Characteristics**[    (Continued)] 

**==> picture [394 x 534] intentionally omitted <==**

**----- Start of picture text -----**<br>
1.2 2.5<br>2.0<br>1.1<br>1.5<br>1.0<br>1.0<br>0.9 ※ Notes :<br> 1. VGS = 0 V 0.5 ※ Notes :<br> 2. ID = 250 μA  1. VGS = 10 V<br> 2. ID = 5.0 A<br>0.8 eae 0.0<br>-100 -50 0 50 100 150 200 -100 -50 0 50 100 150 200<br>TJ, Junction Temperature [oC] TJ, Junction Temperature [oC]<br>Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation<br>vs. Temperature vs. Temperature<br>10<br>102 is Limited by R Operation in This Area DS(on) 8<br>100 µs<br>101 1 ms 6<br>10 ms<br>DC<br>4<br>100<br>※  1. T Notes :C = 25 oC 2<br>10-110 ee 0   3. Single Pulse  2. TJ10 = 150 1 oC 102 025 < 50 75 100 125 150<br>VDS, Drain-Source Voltage [V] TC, Case Temperature [℃]<br>Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current<br>vs. Case Temperature<br>D = 0 .5<br>1 0 0<br>0 .2 ※   1 . Z N o te s  :θ J C(t)  =  3 .1 3  ℃ /W  M a x .<br>0 .1    2 . D u ty  F a c to r, D = t   3 . T J M  - T C  =  P D M  *  Z 1θ/t 2J C(t)<br>0 .0 5<br>1 0 -1 0 .0 2 PDM<br>0 .0 1 s in g le  p u ls e t1 t2<br>1 0 -5 1 0 -4 1 0 -3 1 0 -2 1 0 -1 1 0 0 1 0 1<br>t 1 , S q u a re  W a v e  P u ls e  D u ra tio n  [s e c ]<br>, (Normalized)  , (Normalized)<br> DSS DS(ON)<br>BV R<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br>, Drain Current [A]ID , Drain Current [A]ID<br>oC/W](t), Thermal Response [<br>ZJC<br>**----- End of picture text -----**<br>


**Figure 11. Transient Thermal Response Curve** 

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©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

**4** 

**==> picture [384 x 313] intentionally omitted <==**

**----- Start of picture text -----**<br>
VGS<br>Same Type<br>50KΩ as DUT Qg<br>12V 200nF 300nF 10V<br>VGS VDS Qgs Qgd<br>DUT<br>IG = const. 3mA<br>Charge<br> Figure 12. Gate Charge Test Circuit & Waveform<br>VDS RL VDS 90%<br>VGS VDD<br>RG<br>10%<br>V 10V GS DUT VGS<br>td(on) tr td(off) tf<br>t on t off<br>**----- End of picture text -----**<br>


**Figure 13. Resistive Switching Test Circuit & Waveforms** 

**==> picture [432 x 126] intentionally omitted <==**

**----- Start of picture text -----**<br>
VDS L EAS = ----12 L IAS2 --------------------BVBVDSSDSS- VDD<br>I D BVDSSIAS<br>RG VDD ID (t)<br>VV 10V GSGS DUT VDD VDS (t)<br>t p t p Time<br>**----- End of picture text -----**<br>


**Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms** 

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©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

**5** 

**==> picture [335 x 556] intentionally omitted <==**

**----- Start of picture text -----**<br>
DUT +<br>VDS<br>_<br>I SD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT VDD<br>VGS • dv/dt controlled by  RG<br>• ISD controlled by pulse period<br>Gate Pulse Width<br>VGS D = --------------------------<br>Gate Pulse Period 10V<br>( Driver )<br>i<br>IFM , Body Diode Forward Current<br>I SD<br>( DUT ) di/dt<br>IRM<br>4Ne<br>Body Diode Reverse Current<br>VDS<br>( DUT ) Body Diode Recovery dv/dt<br>VSD VDD<br>tT<br>Body Diode<br>Forward Voltage Drop<br> Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms<br>**----- End of picture text -----**<br>


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©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

**6** 

## **Mechanical Dimensions** 

## **Figure 16. TO252 (D-PAK), Molded, 3-Lead, Option AA&AB** 

_Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products._ 

_Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TT252-003_ 

www.fairchildsemi.com 

**7** 

©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

## **Mechanical Dimensions** 

## **Figure 17. TO251 (I-PAK), Molded, 3-Lead** 

_Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products._ 

_Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings:_ 

_http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TO251-003_ 

**8** 

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©2000 Fairchild Semiconductor Corporation FQD13N10L / FQU13N10L Rev. C4 

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## **PRODUCT STATUS DEFINITIONS** 

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Rev. I66 

**9** 

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