# Power MOSFET, N Channel, 400 V, 10.5 A, 0.43 ohm, TO-220FP, Through Hole

![Product image](https://novapart.co/image/farnell:3368821/)

**URL**: https://novapart.co/products/FQPF11N40C/power-mosfet-n-channel-400-v-105-a-043-ohm-to
**SKU**: FQPF11N40C
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.6190
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | QFET |
| Power Dissipation | 44W |
| Transistor Mounting | Through Hole |
| Transistor Polarity | N Channel |
| Power Dissipation Pd | 44W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.43ohm |
| Transistor Case Style | TO-220FP |
| Drain Source Voltage Vds | 400V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 10.5A |
| Drain Source On State Resistance | 0.43ohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3368821/)

## FQP11N40C, FQPF11N40C 

## QFET MOSFET, N-Channel **400 V, 10.5 A, 530 m** Q 

## **Description** 

This N−Channel enhancement mode power MOSFET is produced using ON Semiconductor proprietary planar stripe and DMOS technology. This advanced MOSFET technology has been especially tailored to reduce on−state resistance, and to provide superior switching performance and high avalanche energy strength. These devices are suitable for switched mode power supplies, active power factor correction (PFC), and electronic lamp ballasts. 

## **Features** 

- 10.5 A, 400 V, RDS(on) = 530 m Q (Max.) @ VGS = 10 V, ID = 5.25 A 

- Low Gate Charge (Typ. 28 nC) 

- Low Crss (Typ. 85 pF) 

- 100% Avalanche Tested 

- These Devices are Pb−Free and are RoHS Compliant 

## **www.onsemi.com** 

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G G<br>D D<br>S S<br>TO−220−3LD TO−220F−3SG<br>CASE 340AT CASE 221AT<br>D<br>G<br>S<br>**----- End of picture text -----**<br>


## **ORDERING INFORMATION** 

See detailed ordering, marking and shipping information on page 2 of this data sheet. 

Publication Order Number: **FQPF11N40C/D** 

**1** 

© Semiconductor Components Industries, LLC, 2018 **June, 2018 − Rev. 4** 

**FQP11N40C, FQPF11N40C** 

## **ORDERING INFORMATION** 

|**Device**|**Device Marking**|**Package**|**Shipping**|
|---|---|---|---|
|FQP11N40C|FQP11N40C|TO−220<br>(Pb−Free)|1,000 Units / Tube|
|FQPF11N40C|FQPF11N40C|TO−220 Fullpack, TO−220F−3SG<br>(Pb−Free)|1,000 Units / Tube|



## **MOSFET MAXIMUM RATINGS** (TC = 25 ° C unless otherwise noted) 

|**MOSFET MA**|**XIMUM RATINGS**(TC= 25°C unless otherwise noted)||||
|---|---|---|---|---|
|**Symbol**|**Parameter**|**FQP11N40C**|**FQPF11N40C**|**Unit**|
|VDSS|Drain to Source Voltage|400||V|
|ID|Drain Current<br>−Continuous (TC = 25°C)<br>−Continuous (TC = 100°C)|10.5|10.5 *|A|
|||6.6|6.6 *|A|
|IDM|Drain Current<br>− Pulsed<br>(Note 1)|42|42 *|A|
|VGSS|Gate to Source Voltage|± 30||V|
|EAS|Single Pulsed Avalanche Energy<br>(Note 2)|360||mJ|
|IAR|Avalanche Current<br>(Note 1)|11||A|
|EAR|Repetitive Avalanche Energy<br>(Note 1)|13.5||mJ|
|dv/dt|Peak Diode Recovery dv/dt<br>(Note 3)|4.5||V/ns|
|PD|Power Dissipation<br>(TC = 25°C)<br>− Derate above 25°C|135|44|W|
|||1.07|0.35|W/°C|
|TJ, TSTG|Operating and Storage Temperature Range|−55 to 150||°C|
|TL|Maximum Lead Temperature for Soldering Purpose, 1/8” from Case for<br>5 Seconds|300||°C|



Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 

*Drain current limited by maximum junction temperature 

1. Repetitive Rating : Pulse width limited by maximum junction temperature. 

2. L = 5.7 mH, IAS = 10.5 A, VDD = 50 V, RG = 25 �, starting TJ = 25 ° C. 

3. ISD ≤ 10.5 A, di/dt ≤ 200 A/ � s, VDD ≤ BVDSS, starting TJ = 25 ° C. 

## **THERMAL CHARACTERISTICS** 

|**Symbol**|**Parameter**|**FQP11N40C**|**FQPF11N40C**|**Unit**|
|---|---|---|---|---|
|R�JC|Thermal Resistance, Junction to Case, Max|0.93|2.86|°C/W|
|R�JA|Thermal Resistance, Junction to Ambient, Max|62.5|62.5|°C/W|



**www.onsemi.com** 

**2** 

**FQP11N40C, FQPF11N40C** 

**ELECTRICAL CHARACTERISTICS** (TC = 25 ° C unless otherwise noted) 

|**ELECTRIC**|**ELECTRIC**|**AL CHARACTERISTICS**(TC= 25°C unless|o|therwise noted)|||||
|---|---|---|---|---|---|---|---|---|
|**Symbol**||**Parameter**||**Test Conditions**|**Min**|**Typ**|**Max**|**Unit**|
|**Off Characteristics**|||||||||
||BVDSS|Drain−Source Breakdown Voltage||VGS= 0 V, ID= 250�A|400|||V|
||Δ<br>BV<br>~~DSS~~<br>ΔTJ|Breakdown Voltage Temperature Coefficient||ID= 250�A, Referenced to 25°C||0.54||V/°C|
||IDSS|Zero Gate Voltage Drain Current||VDS= 400 V, VGS= 0 V|||1|�A|
|||||VDS= 320 V, TC= 125°C|||10|�A|
||IGSSF|Gate−Body Leakage Current, Forward||VGS= 30 V, VDS= 0 V|||100|nA|
||IGSSR|Gate−Body Leakage Current, Reverse||VGS= −30 V, VDS= 0 V|||−100|nA|
|**On Characteristics**|||||||||
|VGS(th)||Gate Threshold Voltage||VDS= VGS, ID= 250�A|2.0||4.0|V|
|rDS(on)||Static Drain−Source On−Resistance||VGS= 10 V, ID= 5.25 A||0.43|0.53|�|
|gFS||Forward Transconductance||VDS= 40 V, ID= 5.25 A||7.1||s|
|**Dynamic Characteristics**|||||||||
|Ciss||Input Capacitance||VDS= 25 V, VGS= 0 V, f = 1 MHz||840|1090|pF|
|Coss||Output Capacitance||||250|325|pF|
|Crss||Reverse Transfer Capacitance||||85|110|pF|
|**Switching Characteristics**|||||||||
|td(on)||Turn−On Delay Time|VDD= 200 V, ID= 10.5 A, RG= 25�<br>(Note 4)|||14|40|ns|
|tr||Turn−On Rise Time||||89|190|ns|
|td(off)||Turn−Off Delay Time||||81|170|ns|
|tf||Turn−Off Fall Time||||81|170|ns|
|Qg||Total Gate Charge|VDS= 320 V, ID= 10.5 A, RG= 25�<br>(Note 4)|||28|35|nC|
|Qgs||Gate−Source Charge||||4||nC|
|Qgd||Gate−Drain Charge||||15||nC|
|**Drain−Source Diode Characteristics and Maximum Ratings**|||||||||
|IS||Maximum Continuous Drain−Source Diode<br>Forward Current|||||10.5|A|
|ISM||Maximum Pulsed Drain−Source Diode<br>Forward Current|||||42|A|
|VSD||Drain−Source Diode Forward Voltage|VGS= 0 V, IS= 10.5 A||||1.4|V|
|trr||Reverse Recovery Time|VGS= 0 V, IS= 10.5 A,<br>dIF/dt = 100 A/�s|||290||ns|
|Qrr||Reverse Recovery Charge||||2.4||�C|



Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 4. Essentially independent of operating temperature. 

**www.onsemi.com** 

**3** 

**FQP11N40C, FQPF11N40C** 

## **TYPICAL PERFORMANCE CHARACTERISTICS** 

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**----- Start of picture text -----**<br>
     V GS<br>Top :        15.0 V<br>           10.0 V<br>   8.0 V<br>101    7.0 V    6.0 V<br>   5.5 V<br>   5.0 V<br>Bottom :    4.5 V<br>100<br> Notes :<br>1. 250 2. T C  = 25 �s Pulse Test �C<br>10−1 100 101<br>VDS, Drain−Source Voltage [V]<br>Figure 1. On−Region Characteristics<br>2.0<br>VGS = 10 V<br>1.5<br>1.0<br>VGS = 20 V<br>0.5<br> Note : TJ  = 25�C<br>0 5 10 15 20 25 30 35 40<br>ID, Drain Current [A]<br>Figure 3. On−Resistance Variation vs Drain Current<br>and Gate Voltage<br>2000<br>C iss  = C gs  + C gd  (C ds  = shorted)<br>1800 C oss  = C ds  + C gd<br>1600 C rss  = C gd<br>1400<br>C iss<br>1200 C oss<br>1000<br>800<br>600 C rss  Notes ;1. V GS  = 0 V<br>400 2. f = 1 MHz<br>200<br>0<br>10−1 100 101<br>VDS, Drain−Source Voltage [V]<br>, Drain Current [A]ID<br>],<br>�<br> [<br>DS(ON)<br>R<br>Drain−Source On−Resistance<br>Capacitance [pF]<br>**----- End of picture text -----**<br>


**Figure 3. On−Resistance Variation vs Drain Current and Gate Voltage** 

**Figure 5. Capacitance Characteristics** 

**==> picture [189 x 327] intentionally omitted <==**

**----- Start of picture text -----**<br>
150 � C<br>−55 � C<br>25 � C<br> Notes :<br> 1. VDS = 40V<br> 2. 250�s Pulse Test<br>VGS, Gate−Source Voltage [V]<br>Figure 2. Transfer Characteristics<br>101<br>100<br>150 � C<br>25 � C  Notes : 1. VGS = 0V<br>2 . 250�s Pulse Test<br>10−1<br>0.2 0.4 0.6 0.8 1.0 1.2 1.4<br>VSD, Source−Drain voltage [V]<br>, Drain Current [A]ID<br>, Reverse Drain Current [A]<br>IDR<br>**----- End of picture text -----**<br>


**Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature** 

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**----- Start of picture text -----**<br>
12<br>10 V DS  = 100 V<br>VDS = 250 V<br>8<br>VDS = 400 V<br>6<br>4<br>2<br> Note : ID = 10.5 A<br>0<br>0 5 10 15 20 25 30<br>QG, Total Gate Charge [nC]<br>, Gate−Source Voltage [V]<br>GS<br>V<br>**----- End of picture text -----**<br>


**Figure 6. Gate Charge Characteristics** 

**www.onsemi.com** 

**4** 

**FQP11N40C, FQPF11N40C** 

## **TYPICAL PERFORMANCE CHARACTERISTICS** 

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1.2<br>1.1<br>1.0<br>0.9  Notes :<br> 1. VGS = 0 V<br> 2. I D [= 250 ] [�] [A]<br>0.8<br>−100 −50 0 50 100 150 200<br>TJ , Junction Temperature [�C]<br>, (Normalized)<br>DSS<br>BV<br>Drain−Source Breakdown Voltage<br>**----- End of picture text -----**<br>


**Figure 7. Breakdown Voltage Variation vs. Temperature** 

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**----- Start of picture text -----**<br>
102 O is Limited by R peration in This Area  DS(on)<br>10  � s<br>100  � s<br>101 1 ms<br>10 ms<br>100 ms<br>DC<br>100<br> Notes :<br>1. TC = 25 � C<br>2. T J  = 150 � C<br>3. Single Pulse<br>10−1100 101 102 103<br>VDS, Drain−Source Voltage [V]<br>Figure 9. Maximum Safe Operating Area of<br>FQP11N40C<br>12<br>10<br>8<br>6<br>4<br>2<br>0<br>25 50 75 100 125 150<br>TC, Case Temperature [ ° C]<br>, Drain Current [A]ID<br>, Drain Current [A]ID<br>**----- End of picture text -----**<br>


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3.0<br>2.5<br>2.0<br>1.5<br>1.0<br> Notes :<br>0.5 1. VGS = 10 V<br>2. ID = 5.25 A<br>0.0<br>−100 −50 0 50 100 150 200<br>TJ , Junction Temperature [�C]<br>Figure 8. On−Resistance Variation vs. Temperature<br>102 Operation in This Area  is Limited by R DS(on)<br>10  � s<br>100  � s<br>101 1 ms<br>10 ms<br>100 ms<br>100 DC<br> Notes :<br>1. T C  = 25 � C<br>2. T J  = 15 � C<br>3. Single Pulse<br>10−1100 101 102 103<br>VDS, Drain−Source Voltage [V]<br>, (Normalized)<br>DS(ON)<br>R<br>Drain−Source On−Resistance<br>, Drain Current [A]ID<br>**----- End of picture text -----**<br>


**Figure 8. On−Resistance Variation vs. Temperature** 

**Figure 10. Maximum Safe Operating Area of FQPF11N40C** 

**Figure 11. Maximum Drain Current** 

**www.onsemi.com** 

**5** 

**FQP11N40C, FQPF11N40C** 

## **TYPICAL PERFORMANCE CHARACTERISTICS** 

**==> picture [301 x 148] intentionally omitted <==**

**----- Start of picture text -----**<br>
10 0<br>D=0.5<br>0.2<br>Notes:<br>10 −1 0.1 1. Z � JC (t) = 0.93 ° C/W Max.<br>2. Duty Factor, D = t1/t2<br>0.05<br>3. T JM  − T C  = P DM  * Z � JC (t)<br>0.02<br>0.01 P DM<br>10 −2 single pulse t1 t2<br>10 −5 10 −4 10 −3 10 −2 10 −1 10 0 10 1<br>t 1 , Square W ave Pulse Duration [sec]<br>oC/W](t), Thermal Response [(t), Thermal ResponseJC<br> ZZ JC�<br>**----- End of picture text -----**<br>


**Figure 12. Transient Thermal Response Curve of FQP11N40C** 

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**----- Start of picture text -----**<br>
D=0.5<br>10 0<br>Notes:<br>0.2<br>1. Z � JC (t) = 2.86 ° C/W Max.<br>0.1<br>2. Duty Factor, D = t 1 /t 2<br>10 −1 0.05 3. TJM − TC = PDM * Z � JC(t)<br>0.02<br>0.01<br>PDM<br>t 1<br>10 −2 single pulse t2<br>10 −5 10 −4 10 −3 10 −2 10 −1 10 0 10 1<br>t 1 , Square W ave Pulse Duration [sec]<br>oC/W](t), Thermal ResponseJC<br>(t), Thermal Response [<br>ZZ JC�<br>**----- End of picture text -----**<br>


**Figure 13. Transient Thermal Response Curve of FQPF11N40C** 

**www.onsemi.com** 

**6** 

**FQP11N40C, FQPF11N40C** 

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**----- Start of picture text -----**<br>
VGS<br>Same Type<br>50KΩ as DUT Qg<br>12V 200nF 300nF 10V<br>VGS VDS Qgs Qgd<br>DUT<br>IG = const. 3mA<br>**----- End of picture text -----**<br>


**Charge** 

**Figure 14. Gate Charge Test Circuit & Waveform** 

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**----- Start of picture text -----**<br>
VDS RL VDS 90%<br>VGS VDD<br>RG<br>10%<br>V 10 GS V DUT VGS<br>td(on) tr td(off) tf<br>t on t off<br>**----- End of picture text -----**<br>


**Figure 15. Resistive Switching Test Circuit & Waveforms** 

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**----- Start of picture text -----**<br>
VDS L EAS = 12 LI AS2 BVBVDSSDSS−VDD<br>I D BVDSSIAS<br>RG VDD ID (t)<br>VV 10V GS DUT VDD VDS (t)<br>t p t p Time<br>**----- End of picture text -----**<br>


**Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms** 

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**7** 

**FQP11N40C, FQPF11N40C** 

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**----- Start of picture text -----**<br>
DUT +<br>VDS<br>_<br>I SD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT VDD<br>VGS �dv/dtcontrolled by  R G<br>�I SD controlled by pulse period<br>Gate Pulse Width<br>VGS D = −−−−−−−−−−−−−−−−−−−−−−−−−−<br>Gate Pulse Period 10V<br>( Driver )<br>IFM , Body Diode Forward Current<br>I SD<br>( DUT ) di/dt<br>IRM<br>Body Diode Reverse Current<br>VDS<br>( DUT ) Body Diode Recoverydv/dt<br>VSD VDD<br>Body Diode<br>Forward Voltage Drop<br>**----- End of picture text -----**<br>


**Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms** 

All other brand names and product names appearing in this document are registered trademarks or trademarks of their respective holders. 

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**8** 

MECHANICAL CASE OUTLINE **PACKAGE DIMENSIONS** 

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TO−220 Fullpack, 3−Lead / TO−220F−3SG<br>CASE 221AT<br>ISSUE A<br>DATE 12 NOV 2013<br>Scale 1:1<br>**----- End of picture text -----**<br>


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Electronic versions are uncontrolled except when accessed directly from the Document Repository.<br>DOCUMENT NUMBER: 98AON67439E Printed  versions are uncontrolled  except when stamped  “CONTROLLED COPY” in red.<br>DESCRIPTION: TO−220 FULLPACK, 3−LEAD / TO−220F−3SG PAGE 1 OF 1<br>**----- End of picture text -----**<br>


ON Semiconductor and          are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. 

www.onsemi.com 

© Semiconductor Components Industries, LLC, 2019 

MECHANICAL CASE OUTLINE **PACKAGE DIMENSIONS** 

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TO−220−3LD<br>CASE 340AT<br>ISSUE A<br>SUPPLIER "B" PACKAGE DATE 03 OCT 2017<br>**----- End of picture text -----**<br>


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Scale 1:1<br>**----- End of picture text -----**<br>


Electronic versions are uncontrolled except when accessed directly from the Document Repository. **DOCUMENT NUMBER: 98AON13818G** Printed  versions are uncontrolled  except when stamped  “CONTROLLED COPY” in red. **DESCRIPTION: TO−220−3LD PAGE 1 OF 1** 

ON Semiconductor and          are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. 

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© Semiconductor Components Industries, LLC, 2019 

ON Semiconductor and      are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

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