# Power MOSFET, N Channel, 100 V, 48 A, 0.03 ohm, TO-247, Through Hole

![Product image](https://novapart.co/image/farnell:3368811/)

**URL**: https://novapart.co/products/FQH44N10-F133/power-mosfet-n-channel-100-v-48-a-003-ohm-to-247
**SKU**: FQH44N10-F133
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €1.8700
**Stock**: 500+
**Lead Time**: 2 days (indicative)

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | QFET |
| Power Dissipation | 180W |
| Transistor Mounting | Through Hole |
| Transistor Polarity | N Channel |
| Power Dissipation Pd | 180W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.03ohm |
| Transistor Case Style | TO-247 |
| Drain Source Voltage Vds | 100V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 48A |
| Drain Source On State Resistance | 0.03ohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3368811/)

## MOSFET – N-Channel, QFET 100 V, 48 A, 39 m 

## FQH44N10 

## **Description** 

This N−Channel enhancement mode power MOSFET is produced using ON Semiconductor’s proprietary planar stripe and DMOS technology. This advanced MOSFET technology has been especially tailored to reduce on−state resistance, and to provide superior switching performance and high avalanche energy strength. These devices are suitable for switched mode power supplies, audio amplifier, DC motor control, and variable switching power applications. 

## **Features** 

- 48 A, 100 V, RDS(on) = 39 m (Max.) @ VGS = 10 V, ID = 24 A 

- Low Gate Charge (Typ. 48 nC) 

- Low Crss (Typ. 85 pF) 

- 100% Avalanche Tested 

- 175°C Maximum Junction Temperature Rating 

## **www.onsemi.com** 

|**VDSS**|**RDS(ON) MAX**|**ID MAX**|
|---|---|---|
|100 V|39 m @ 10 V|48 A|



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D<br>G<br>S<br>**----- End of picture text -----**<br>


## **POWER MOSFET** 

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G<br>D<br>S<br>- 2<br>**----- End of picture text -----**<br>


## **TO−247−3LD CASE 340CK** 

## **MARKING DIAGRAM** 

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$Y&Z&3&K<br>FQH<br>44N10<br>**----- End of picture text -----**<br>


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$Y = ON Semiconductor Logo<br>&Z = Assembly Plant Code<br>&3 = Numeric Date Code<br>&K = Lot Code<br>FQH44N10 = Specific Device Code<br>**----- End of picture text -----**<br>


## **ORDERING INFORMATION** 

See detailed ordering and shipping information on page 2 of this data sheet. 

Publication Order Number: **FQH44N10/D** 

**1** 

© Semiconductor Components Industries, LLC, 2008 **February, 2020 − Rev. 4** 

**FQH44N10** 

**ABSOLUTE MAXIMUM RATINGS** (TC = 25 ° C, Unless otherwise noted) 

|**ABSOLUTE M**|**AXIMUM RATINGS**(TC= 25°C, Unless other|wise noted)|||
|---|---|---|---|---|
|**Symbol**|**Parameter**||**FQH44N10−133**|**Unit**|
|VDSS|Drain−Source Voltage||100|V|
|ID|Drain Current|Continuous (TC= 25°C)|48|A|
|||Continuous (TC= 100°C)|34||
|IDM|Drain Current|Pulsed (Note 1)|192|A|
|VGSS|Gate−Source Voltage||±25|V|
|EAS|Single Pulsed Avalanche Energy (Note 2)||530|mJ|
|IAR|Avalanche Current (Note 1)||48|A|
|EAR|Repetitive Avalanche Energy (Note 1)||18|mJ|
|dv/dt|Peak Diode Recovery dv/dt (Note 3)||6.0|V/ns|
|PD|Power Dissipation|(TC= 25°C)|180|W|
|||Derate Above 25°C|1.2|W/°C|
|TJ, TSTG|Operating and Storage Temperature Range||−55 to +175|°C|
|TL|Maximum Lead Temperature for Soldering Purpose<br>1/8″from Case for 5 seconds||300|°C|



Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 

1. Repetitive rating: pulse−width limited by maximum junction temperature. 

2. L = 0.345 mH, IAS = 48 A, VDD = 25 V, RG = 25 � , starting TJ = 25 ° C. 

3. ISD ≤ 43.5 A, di/dt ≤ 300 A/ � s, VDD ≤ BVDSS, starting TJ = 25 ° C. 

## **THERMAL CHARACTERISTICS** 

|**Symbol**|**Parameter**|**FQH44N10−133**|**Unit**|
|---|---|---|---|
|R�JC|Thermal Resistance, Junction to Case, Max.|0.83|�C/W|
|R�CS|Thermal Resistance, Case−to−Sink, Typ.|0.24|�C/W|
|R�JA|Thermal Resistance, Junction to Ambient, Max.|40|�C/W|



## **PACKAGE MARKING AND ORDERING INFORMATION** 

|**Part Number**|**Top Mark**|**Package**|**Packing**<br>**Method**|**Reel Size**|**Tape Width**|**Quantity**|
|---|---|---|---|---|---|---|
|FQH44N10−133|FQH44N10|TO−247|Tube|N/A|N/A|30 Units|



**www.onsemi.com** 

**2** 

**FQH44N10** 

**ELECTRICAL CHARACTERISTICS** (TC = 25 ° C unless otherwise noted) 

|**ELECTRICAL**|**CHARACTERISTICS**(TC= 25°C unle|ss otherwise noted)|||||
|---|---|---|---|---|---|---|
|**Symbol**|**Parameter**|**Test Conditions**|**Min.**|**Typ.**|**Max.**|**Unit**|
|**OFF CHARACTERISTICS**|||||||
|BVDSS|Drain−Source Breakdown Voltage|VGS= 0 V, ID= 250�A|100|||V|
|�BVDSS/�TJ|Breakdown Voltage Temperature<br>Coefficient|ID= 250�A, Referenced to 25�C||0.1||V/�C|
|IDSS|Zero Gate Voltage Drain Current|VDS= 100 V, VGS= 0 V|||1|�A|
|||VDS= 80 V, TC= 150�C|||10||
|IGSSF|Gate−Body Leakage Current, Forward|VGS= 25 V, VDS= 0 V|||100|nA|
|IGSSR|Gate−Body Leakage Current, Reverse|VGS= −25 V, VDS= 0 V|||−100|nA|
|**ON CHARACTERISTICS**|||||||
|VGS(th)|Gate Threshold Voltage|VDS= VGS, ID= 250�A|2.0||4.0|V|
|RDS(on)|Static Drain−Source On−Resistance|VGS= 10 V, ID= 24 A||0.03|0.039|�|
|gFS|Forward Transconductance|VDS= 40 V, ID= 24 A||31||S|
|**DYNAMIC CHARACTERISTICS**|||||||
|Ciss|Input Capacitance|VDS= 25 V, VGS= 0 V, f = 1.0 MHz||1400|1800|pF|
|Coss|Output Capacitance|||425|550|pF|
|Crss|Reverse Transfer Capacitance|||85|110|pF|
|**SWITCHING CHARACTERISTICS**|||||||
|td(on)|Turn-On Delay Time|VDD= 50 V, ID= 43.5 A, Rg= 25�<br>(Note 4)||19|45|ns|
|tr|Turn-On Rise Time|||190|390|ns|
|td(off)|Turn-Off Delay Time|||90|190|ns|
|tf|Turn-Off Fall Time|||100|210|ns|
|Qg|Total Gate Charge|VDS= 80 V, ID= 43.5 A, VGS= 10 V<br>(Note 4)||48|62|nC|
|Qgs|Gate−Source Charge|||9.0||nC|
|Qgd|Gate−Drain Charge|||24||nC|
|**DRAIN−SOURCE DIODE CHARACTERISTICS AND MAXIMUM RATINGS**|||||||
|IS|Maximum Continuous Drain−Source Diode Forward Current||||48|A|
|ISM|Maximum Pulsed Drain−Source Diode Forward Current||||192|A|
|VSD|Drain−Source Diode Forward Voltage|VGS=  0 V, IS=  48A|||1.5|V|
|trr|Reverse Recovery Time|VGS=  0 V, IS=  43.5 A,<br>dIF/dt = 100 A/�s||98||ns|
|Qrr|Reverse Recovery Charge|||360||nC|



Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 4. Essentially independent of operating temperature typical characteristics. 

**www.onsemi.com** 

**3** 

**FQH44N10** 

## **TYPICAL PERFORMANCE CHARACTERISTICS** 

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Top VGS : 15.0 V<br>10 [2] 10.0 V<br>8.0 V<br>7.0 V<br>6.0 V<br>5.5 V<br>5.0 V<br>Bottom : 4.5 V<br>10 [1]<br>* Notes :<br>1. 250 � s Pulse Test<br>2. TC = 25  ° C<br>10 [0]<br>10 [−1] 10 [0] 10 [1]<br>VDS, Drain−Source Voltage (V)<br>Figure 1. On−Region Characteristics<br>0.15<br>0.12<br>VGS = 10 V<br>0.09<br>VGS = 20 V<br>0.06<br>0.03<br>* Notes : TJ = 25 ° C<br>0.00<br>0 30 60 90 120 150 180<br>ID, Drain Current (A)<br>Figure 3. On−Resistance Variation<br>vs. Drain Current and Gate Voltage<br>4000<br>Ciss = Cgs + Cgd (Cds = shorted)<br>3500 Coss = Cds + Cgd<br>C rss  = C gd<br>3000 *  Notes :<br>2500 1. VGS = 0 V<br>C iss 2. f = 1 MHz<br>2000<br>1500<br>1000 Crss C oss<br>500<br>0<br>10 [−1] 10 [0] 10 [1]<br>VDS, Drain−Source Voltage (V)<br>, Drain Current (A)<br>ID<br>) �<br>, Drain−Source On−Resistance (<br>DS(ON)<br>R<br>Capacitance (pF)<br>**----- End of picture text -----**<br>


**Figure 5. Capacitance Characteristics** 

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10 [2]<br>175 ° C<br>10 [1]<br>25 ° C<br>−55 ° C<br>10 [0]<br>* Notes :<br>1. V DS =40 V<br>2. 250  � s Pulse Test<br>10 [−1]<br>2 4 6 8 10<br>VGS, Gate−Source Voltage (V)<br>, Drain Current (A)<br>ID<br>**----- End of picture text -----**<br>


**Figure 2. Transfer Characteristics** 

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10 [2]<br>10 [1]<br>10 [0]<br>* Notes :<br>175 ° C 25 ° C 1. VDS = 0 V<br>2. 250  � s Pulse Test<br>10 [−1]<br>0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6 1.8 2.0<br>VSD, Source−Drain Voltage (V)<br>Figure 4. Body Diode Forward Voltage<br>Variation vs. Source Current and Temperature<br>12<br>VDS = 50 V<br>10<br>VDS = 80 V<br>8<br>6<br>4<br>2<br>* Notes : ID = 43.5 A<br>0<br>0 10 20 30 40 50<br>Qg, Total Gate Charge (nC)<br>, Reverse Drain Current (A)<br>IDR<br>, Gate−Source Voltage (V)<br>GS<br>V<br>**----- End of picture text -----**<br>


**Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature** 

**Figure 6. Gate Charge Characteristics** 

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**4** 

**FQH44N10** 

## **TYPICAL PERFORMANCE CHARACTERISTICS** (Continued) 

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1.2<br>1.1<br>1.0<br>0.9 * Notes:<br>1. VGS = 0 V<br>2. ID =  250  � A<br>0.8<br>−100 −50 0 50 100 150 200<br>TJ, Junction Temperature ( � C)<br>Figure 7. Breakdown Voltage<br>Variation vs. Temperature<br>10 [3] Operation in This Area is<br>Limited by RDS(on)<br>10 [2] 100  � s 10  � s<br>1 ms<br>10 ms<br>10 [1] DC<br>* Notes:<br>10 [0] 1. TC = 25  ° C<br>2. TJ = 175  ° C<br>3. Single Pulse<br>10 [−1]<br>10 [0] 10 [1] 10 [2]<br>VDS, Drain−Source Voltage (V)<br>, (Normalized)<br>DSS<br>BV<br>Drain−Source Breakdown Voltage<br>, Drain Current (A)<br>ID<br>**----- End of picture text -----**<br>


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3.0<br>2.5<br>2.0<br>1.5<br>1.0<br>* Notes:<br>0.5 1. VGS = 10 V<br>2. ID = 21.75 A<br>0.0<br>−100 −50 0 50 100 150 200<br>TJ, Junction Temperature ( � C)<br>, (Normalized)<br>DS(on)<br>R<br>Drain−Source On−Resistance<br>**----- End of picture text -----**<br>


**Figure 8. On−Resistance Variation vs. Temperature** 

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50<br>40<br>30<br>20<br>10<br>0<br>25 50 75 100 125 150 175<br>TC, Case Temperature ( � C)<br>, Drain Current (A)<br>ID<br>**----- End of picture text -----**<br>


**Figure 9. Maximum Safe Operating Area** 

**Figure 10. Maximum Drain Current vs. Case Temperature** 

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10 [0]<br>D=0.5 * Notes :<br>1. Z � JC(t) = 0.83  ° C/W Max.<br>0.2<br>2. Duty Factor, D = t1/t2<br>10 [−1] 0.1 3. TJM − TC = PDM * Z � JC(t)<br>0.05<br>0.02 P DM<br>0.01 t1<br>Single Pulse t2<br>10 [−2]<br>10 [−5] 10 [−4] 10 [−3] 10 [−2] 10 [−1] 10 [−0] 10 [1]<br>t1, Square Wave Pulse Duration (sec)<br>C/W)<br>�<br>(t), Thermal Response (<br>JC<br>�<br>Z<br>**----- End of picture text -----**<br>


**Figure 11. Transient Thermal Response Curve** 

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**5** 

**FQH44N10** 

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VGS<br>50 k � Same Type Qg<br>12 V 200 nF 300 nF as DUT<br>VGS VDS Qgs Qgd<br>DUT<br>IG = Const.<br>Charge<br>**----- End of picture text -----**<br>


**Figure 12. Gate Charge Test Circuit & Waveform** 

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VDS RL VDS 90% 90% 90%<br>VGS VDD<br>RG<br>10% 10%<br>DUT VGS<br>VGS<br>td(on) tr td(off) tf<br>ton toff<br>**----- End of picture text -----**<br>


**Figure 13. Resistive Switching Test Circuit & Waveforms** 

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L<br>VDS EAS  � [1] 2 L IAS2 BVDSSBV  � DSSVDD<br>BVDSS<br>ID<br>IAS<br>RG VDD ID(t)<br>VGS DUT VDD VDS(t)<br>t<br>p Time<br>t<br>p<br>**----- End of picture text -----**<br>


**Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms** 

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**FQH44N10** 

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+<br>DUT<br>VDS<br>−<br>ISD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT<br>VDD<br>VGS<br>− dv/dt controlled by RG<br>− ISD controlled by pulse period<br>Gate Pulse Width<br>D  �<br>Gate Pulse Period<br>VGS 10 V<br>(Driver)<br>IFM, Body Diode Forward Current<br>ISD di/dt<br>(DUT)<br>IRM<br>Body Diode Reverse Current<br>VDS Body Diode Recovery dv/dt<br>(DUT)<br>VSD VDD<br>Body Diode<br>Forward Voltage Drop<br>**----- End of picture text -----**<br>


**Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms** 

QFET is registered trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. 

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**7** 

MECHANICAL CASE OUTLINE **PACKAGE DIMENSIONS** 

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TO−247−3LD SHORT LEAD<br>CASE 340CK<br>ISSUE A<br>**----- End of picture text -----**<br>


DATE 31 JAN 2019 A P1 | A E A2 @ P 0) D2 ~~1 + _~~ Q E2 ) ! S C ~~R OG )~~ D1 D B E1 2 1 2 3 ~~|~~ Oo | ~~N77~~ L1 A1 b4 L c (3X) b (2X) b2 0.25[M] B A[M] MILLIMETERS (2X)  e DIM MIN NOM MAX A ~~eee~~ A 4.58 4.70 4.82 NOTES: UNLESS OTHERWISE SPECIFIED. ~~|~~ A1 2.20 2.40 2.60 A. DIMENSIONS ARE EXCLUSIVE OF BURRS, MOLD ~~a~~ A2 1.40 ~~ee~~ 1.50 ~~ee~~ 1.60 ~~ee~~ b 1.17 1.26 1.35 ©. FLASH,DRAWING ANDCONFORMS TIE BAR EXTRUSIONS.TO ASME Y14.5 - 2009. ~~eeee~~ b2 1.53 ~~ee~~ 1.65 ~~ee~~ 1.77 D. DIMENSION A1 TO BE MEASURED IN THE REGION DEFINED BYL1. ~~[—~~ b4 ~~[|~~ 2.42 2.54 ~~ss~~ 2.66 c 0.51 0.61 0.71 E. LEAD FINISH IS UNCONTROLLED IN THE REGION DEFINED BY L1. ~~ee ee ee eee~~ **GENERIC** D 20.32 20.57 20.82 **MARKING DIAGRAM*** ~~ee ee ee ee~~ D1 13.08 ~ ~ ~~ee ee eee eee~~ AYWWZZ ~~ee~~ D2 ~~ee~~ 0.51 0.93 1.35 XXXXXXX ~~a~~ E ~~ee~~ 15.37 15.62 15.87 ~~eee~~ XXXXXXX ~~a~~ E1 ~~ee~~ 12.81 ~ ~~eee~~ ~ ~~a~~ E2 ~~ee~~ 4.96 5.08 ~~eee~~ 5.20 XXXX = Specific Device Code ~~a~~ e ~~ee~~ ~ 5.56 ~~eee~~ ~ A = Assembly Location Y = Year ~~ee~~ L ~~ee~~ 15.75 16.00 ~~**eee**~~ 16.25 WW = Work Week L1 3.69 3.81 3.93 ZZ = Assembly Lot Code P 3.51 3.58 3.65 *This information is generic. Please refer to ~~po |~~ ~~**|**~~ P1 6.60 6.80 7.00 device data sheet for actual part marking. ~~fo |~~ ~~**|**~~ Pb−Free indicator, “G” or microdot “ . ”, may ~~a~~ Q ~~ee~~ 5.34 5.46 5.58 or may not be present. Some products may not follow the Generic Marking. ~~a~~ S ~~ee~~ 5.34 5.46 eee 5.58 ~~ee~~ Electronic versions are uncontrolled except when accessed directly from the Document Repository. **DOCUMENT NUMBER: 98AON13851G** Printed  versions are uncontrolled  except when stamped  “CONTROLLED COPY” in red. 

## **DOCUMENT NUMBER: 98AON13851G** 

**DESCRIPTION: TO−247−3LD SHORT LEAD** 

**PAGE 1 OF 1** 

ON Semiconductor and          are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. 

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© Semiconductor Components Industries, LLC, 2018 

ON Semiconductor and      are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

## **PUBLICATION ORDERING INFORMATION** 

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