# Power MOSFET, P Channel, 200 V, 11.5 A, 0.47 ohm, TO-263 (D2PAK), Surface Mount

![Product image](https://novapart.co/image/farnell:2575361/)

**URL**: https://novapart.co/products/FQB12P20TM/power-mosfet-p-channel-200-v-115-a-047-ohm-to-263
**SKU**: FQB12P20TM
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.7660
**Stock**: 10+

## Description

Transistor Polarity:P Channel; Continuous Drain Current Id:-11.5A; Drain Source Voltage Vds:-200V; On Resistance Rds(on):0.36ohm; Rds(on) Test Voltage Vgs:-10V; Threshold Voltage Vg

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | Lead (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | P Channel |
| Product Range | FQB |
| Qualification | - |
| Power Dissipation | 120W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-263 (D2PAK) |
| Drain Source Voltage Vds | 200V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 11.5A |
| Drain Source On State Resistance | 0.47ohm |
| Gate Source Threshold Voltage Max | 5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2575361/)

## MOSFET – P-Channel, QFET -200 V, -11.5 A, 470 m FQB12P20 : 

## **General Description** 

These P−Channel enhancement mode power field effect transistors are produced using ON Semiconductor’s proprietary, planar stripe, DMOS technology. 

This advanced technology has been especially tailored to minimize on−state resistance, provide superior switching performance, and withstand high energy pulse in the avalanche and commutation mode. These devices are well suited for high efficiency switching DC/DC converters. 

## **Features** 

- −11.5 A, −200 V, RDS(on) = 0.47  @ VGS = −10 V 

- Low Gate Charge (Typical 31 nC) 

- Low Crss (typical 30 pF) 

- Fast Switching 

- 100% Avalanche Tested 

- Improved dv/dt Capability 

- These Devices are Pb−Free and are RoHS Compliant 

|**Symbol**<br>~~a~~<br>~~ee~~|**Parameter**<br>~~ee~~|**FQB12P20**<br>~~e~~|**Unit**<br>~~e~~|
|---|---|---|---|
|VDSS<br>~~ee~~|Drain−Source Voltage<br>~~ee~~|−200<br>~~e~~|V<br>~~e~~|
|ID<br>~~ee~~<br>~~a~~|Drain Current − Continuous (TC= 25°C)<br>− Continuous (TC= 100°C)<br>~~ee~~<br>~~a~~|−11.5<br>~~e~~<br>~~a~~|A<br>~~e~~<br>~~a~~|
|||−7.27<br>~~a~~|A<br>~~a~~|
|IDM<br>~~a~~|Drain Current − Pulsed (Note 1)<br>~~a~~|−46<br>~~a~~|A<br>~~a~~|
|VGSS<br>~~a~~<br>~~——~~|Gate−Source Voltage<br>~~a~~<br>~~——~~|+30<br>~~a~~<br>~~——~~|V<br>~~a~~<br>~~——~~|
|EAS<br>~~a~~<br>~~——~~|Single Pulsed Avalanche Energy (Note 2)<br>~~a~~<br>~~——~~|810<br>~~a~~<br>~~——~~|mJ<br>~~a~~<br>~~——~~|
|IAR<br>~~a~~<br>~~——~~|Avalanche Current (Note 1)<br>~~a~~<br>~~——~~|−11.5<br>~~a~~<br>~~——~~|A<br>~~a~~<br>~~——~~|
|EAR<br>~~——~~|Repetitive Avalanche Energy (Note 1)<br>~~——~~|12<br>~~——~~|mJ<br>~~——~~|
|dv/dt<br>~~——~~|Peak Diode Recovery dv/dt (Note 3)<br>~~——~~|−5.5<br>~~——~~|V/ns<br>~~——~~|
|PD<br>~~——~~|Power Dissipation (TA= 25°C) *<br>~~——~~|3.13<br>~~——~~|W<br>~~——~~|
||Power Dissipation (TC= 25°C)<br>− Derate above 25°C<br>~~——~~|120<br>~~——~~|W<br>~~——~~|
|||0.96|W/°C|
|TJ, TSTG<br>~~Pf~~|Operating and Storage Temperature<br>Range<br>~~Pf~~|−55 to +150<br>~~Pf~~<br>~~ee~~|°C<br>~~Pf~~<br>~~ee~~|
|TL<br>~~ee~~|Maximum lead temperature for soldering<br>purposes, 1/8” from case for 5 seconds<br>~~ee~~|300<br>~~ee~~<br>~~ee~~|°C<br>~~ee~~<br>~~ee~~|



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www.onsemi.com<br>VDSS RDS(ON) MAX ID MAX<br>−200 V 0.47  @ −10 V −11.5 A<br>eeee ee<br>S<br>G<br>D<br>P−CHANNEL MOSFET<br>><br>D [2] PAK−3 (TO−263, 3−LEAD)<br>CASE 418AJ<br>MARKING DIAGRAM<br>$Y&Z&3&K<br>FQB<br>12P20<br>a<br>FQB12P20 = Specific Device Code<br>$Y = ON Semiconductor Logo<br>&Z = Assembly Plant Code<br>&3 = Digit Date Code<br>&K = Lot Run Traceability Code<br>**----- End of picture text -----**<br>


## **ORDERING INFORMATION** 

See detailed ordering and shipping information on page 6 of this data sheet. 

3. ISD ≤ −11.5 A, di/dt ≤ 300 A/ s, VDD ≤ BVDSS, Starting TJ = 25 ° C 

Publication Order Number: **FQB12P20/D** 

**1** 

© Semiconductor Components Industries, LLC, 2008 **December, 2019 − Rev. 2** 

**FQB12P20** 

## **THERMAL RESISTANCE MAXIMUM RATINGS** 

|**Symbol**|**Parameter**|**Typ**|**Max**|**Unit**|
|---|---|---|---|---|
|R�JC|Thermal Resistance, Junction−to−Case|−|1.04|°C/W|
|R�JA|Thermal Resistance, Junction−to−Ambient *|−|40|°C/W|
|R�JA|Thermal Resistance, Junction−to−Ambient|−|62.5|°C/W|



*When mounted on the minimum pad size recommended (PCB Mount) 

## **ELECTRICAL CHARACTERISTICS** (TC = 25 ° C unless otherwise specified) 

|**ELECTRICA**|**L CHARACTERISTICS**(TC= 25°C unless|otherwise specified)|||||
|---|---|---|---|---|---|---|
|**Symbol**|**Parameter**|**Test Condition**|**Min**|**Typ**|**Max**|**Unit**|
|**OFF CHARACTERISTICS**|||||||
|BVDSS|Drain−Source Breakdown Voltage|VGS= 0 V, ID= −250�A|−200|−|−|V|
|�BVDSS/�TJ|Breakdown Voltage Temperature Coefficient|ID= −250�A, Referenced to 25°C|−|−|−|V/°C|
|IDSS|Zero Gate Voltage Drain Current|VDS= −200 V, VGS= 0 V|−|−|−1|�A|
|||VDS= −160 V, TC= 125°C|−|−|−10|�A|
|IGSSF|Gate−Body Leakage Current, Forward|VGS= −30 V, VDS= 0 V|−|−|−100|nA|
|IGSSR|Gate−Body Leakage Current, Reverse|VGS= 30 V, VDS= 0 V|−|−|100|nA|
|**ON CHARACTERISTICS**|||||||
|VGS(th)|Gate Threshold Voltage|VDS= VGS, ID= −250�A|−3.0|−|−5.0|V|
|RDS(on)|Static Drain−Source On−Resistance|VGS= −10 V, ID= −5.75 A|−|0.36|0.47|�|
|gFS|Forward Transconductance|VDS= −40 V, ID= −5.75 A (Note 4)|−|6.4|−|S|
|**DYNAMIC CHARACTERISTICS**|||||||
|Ciss|Input Capacitance|VDS= −25 V, VGS= 0 V, f = 1.0 MHz|−|920|1200|pF|
|Coss|Output Capacitance||−|190|250|pF|
|Crss|Reverse Transfer Capacitance||−|30|40|pF|
|**SWITCHING**|**CHARACTERISTICS**||||||
|td(on)|Turn−On Delay Time|VDD= −100 V, ID= −11.5 A,<br>RG= 25�<br> (Note 4, 5)|−|20|50|ns|
|tr|Turn−On Rise Time||−|195|400|ns|
|td(off)|Turn−Off Delay Time||−|40|90|ns|
|tf|Turn−Off Fall Time||−|60|130|ns|
|Qg|Total Gate Charge|VDS= −160 V, ID= −11.5 A,<br>VGS= −10 V<br>(Note 4, 5)|−|31|40|nC|
|Qgs|Gate−Source Charge||−|8.1|−|nC|
|Qgd|Gate−Drain Charge||−|16|−|nC|
|**DRAIN−SOURCE DIODE CHARACTERISTICS AND MAXIMUMUM RATINGS**|||||||
|IS|Maximum Continuous Drain−Source Diode Forward Current||−|−|−11.5|A|
|ISM|Maximum Pulsed Drain−Source Diode Forward Current||−|−|−46|A|
|VSD|Drain−Source Diode Forward Voltage|VGS= 0 V, IS= −11.5 A|−|−|−5.0|V|
|trr|Reverse Recovery Time|VGS= 0 V, IS= −11.5 A,<br>dIF/ dt = 100 A/�s (Note 4)|−|180|−|ns|
|Qrr|Reverse Recovery Charge||−|1.44|−|�C|



Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 4. Pulse Test: Pulse width ≤ 300 � s, Duty cycle ≤ 2% 

5. Essentially independent of operating temperature 

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**FQB12P20** 

## **TYPICAL CHARACTERISTICS** 

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**----- Start of picture text -----**<br>
VGS<br>Top: −15.0 V<br>−10.0 V<br>−8.0 V<br>10 [1] −7.0 V<br>−6.5 V<br>−6.0 V<br>Bottom: −5.5 V<br>10 [0]<br>Notes:<br>1. 250  � s Pulse Test<br>2. TC = 25 ° C<br>10 [−1]<br>10 [−1] 10 [0] 10 [1]<br>, Drain Current (A)<br>D<br>−I<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
−VDS, Drain−Source Voltage (V)<br>**----- End of picture text -----**<br>


**Figure 1. On Characteristics** 

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**----- Start of picture text -----**<br>
10 [1]<br>150 ° C −55 ° C<br>10 [0]<br>25 ° C<br>Notes:<br>1. VDS = −40 V<br>2. 250  � s Pulse Test<br>10 [−1]<br>2 4 6 8 10<br>, Drain Current (A)<br>D<br>−I<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
−VGS, Gate−Source Voltage (V)<br>**----- End of picture text -----**<br>


**Figure 2. Transfer Characteristics** 

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**----- Start of picture text -----**<br>
2.0<br>1.5<br>VGS = − 10 V<br>1.0<br>VGS = − 20 V<br>0.5<br>Note: TJ = 25 ° C<br>0.0<br>0 10 20 30 40<br>−ID, Drain Current (A)<br>Figure 3. On−Resistance Variation vs. Drain Current<br>and Gate Voltage<br>2400<br>Ciss = Cgs + Cgd (Cds = shorted)<br>Coss = Cds + Cgd<br>2000 Crss = Cgd<br>1600<br>1200 Ciss<br>800 Coss<br>Crss<br>400<br>0<br>10 [−1] 10 [0] 10 [1]<br>−VDS, Drain−Source Voltage (V)<br>) �<br>, Drain−Source On−Resistance (<br>DS(on)<br>R<br>Capacitance (pF)<br>**----- End of picture text -----**<br>


**Figure 5. Capacitance Characteristics** 

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**----- Start of picture text -----**<br>
10 [1]<br>10 [0]<br>150 ° C 25 ° C Notes:<br>1. VGS = 0 V<br>2. 250  � s Pulse Test<br>10 [−1]<br>0.0 0.5 1.0 1.5 2.0 2.5 3.0<br>−VSD, Source−Drain Voltage (V)<br>, Reverse Drain Current (A)<br>DR<br>−I<br>**----- End of picture text -----**<br>


**Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature** 

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12<br>VDS = −40 V<br>10<br>VDS = −100 V<br>8 VDS = −160 V<br>6<br>4<br>2<br>Note: ID = 11.5 A<br>0<br>0 5 10 15 20 25 30 35<br>QG, Total Gate Charge (nC)<br>, Gate−Source Voltage (V)<br>GS<br>−V<br>**----- End of picture text -----**<br>


**Figure 6. Gate Charge Characteristics** 

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**3** 

**FQB12P20** 

## **TYPICAL CHARACTERISTICS** (continued) 

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**----- Start of picture text -----**<br>
1.2 2.5<br>2.0<br>1.1<br>1.5<br>1.0<br>1.0<br>0.9<br>0.5<br>Notes: Notes:<br>1. VGS = 0 V 1. VGS = −10 V<br>2. ID = 250  � A 2. ID = −5.75 A<br>0.8 0.0<br>−100 −50 0 50 100 150 200 −100 −50 0 50 100 150 200<br>TJ, Junction Temperature ( ° C) TJ, Junction Temperature ( ° C)<br>Figure 7. Breakdown Voltage Variation vs. Figure 8. On−Resistance Variation vs.<br>Temperature Temperature<br>12<br>Operation in This Area<br>10 [2]<br>is Limited by RDS(on)<br>10<br>100  � s<br>8<br>1 ms<br>10 [1]<br>10 ms<br>6<br>DC<br>4<br>10 [0]<br>Notes:<br>1. TC = 25 ° C 2<br>2. TJ = 150 ° C<br>3. Single Pulse<br>10 [−1] 0<br>10 [0] 10 [1] 10 [2] 25 50 75 100 125 150<br>−VDS, Drain−Source Voltage (V) TC, Case Temperature ( ° C)<br>Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs.<br>Case Temperature<br>10 [0]<br>D = 0.5<br>0.2<br>10−1 0.1 Notes:1. Z � JC (t) = 1.04 ° C/W Max.<br>0.05 3. T2. Duty Factor, D = tJM − TC = PDM * Z1 / t � JC2  (t)<br>0.02<br>0.01 P DM<br>single pulse t1<br>10 [−2] t 2<br>10 [−5] 10 [−4] 10 [−3] 10 [−2] 10 [−1] 10 [0] 10 [1]<br>t1, Square Wave Pulse Duration (s)<br>) �<br>, (Normalized)<br>DSS<br>On−Resistance (<br>−BV , (Normalized) Drain−Source<br>Drain−Source Breakdown Voltage DS(on)<br>R<br>, Drain Current (A)ID , Drain Current (A)−ID<br>(t), Thermal Response<br>JC<br>�<br>Z<br>**----- End of picture text -----**<br>


**Figure 11. Capacitance Characteristics** 

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**4** 

**FQB12P20** 

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**----- Start of picture text -----**<br>
V GS<br>Same Type<br>50 k �<br>12 V as DUT Q g<br>−10 V<br>200 nF 300 nF<br>V GS V DS Q gs Q gd<br>DUT<br>−3 mA<br>Charge<br>**----- End of picture text -----**<br>


**Figure 12. Gate Charge Test Circuit & Waveform** 

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RL<br>VDS<br>VGS V DD<br>RG<br>DUT<br>−10 V<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
ton toff<br>td(on) tr t d(off)<br>tf<br>VGS 10%<br>90%<br>VDS<br>**----- End of picture text -----**<br>


**Figure 13. Resistive Switching Test Circuit & Waveforms** 

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**----- Start of picture text -----**<br>
VDS L EAS � [1] 2 LI [2] AS BVDSSBV  � DSSVDD<br>t p Time<br>I D<br>RG VDD VDS (t)<br>VDD<br>ID (t)<br>−10 V DUT<br>IAS<br>t p BVDSS<br>**----- End of picture text -----**<br>


**Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms** 

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**5** 

**FQB12P20** 

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**----- Start of picture text -----**<br>
+<br>VDS<br>DUT<br>_<br>I SD<br>L<br>Driver<br>R G<br>Compliment of DUT<br>(N−Channel) VDD<br>VGS � dv/dt controlled by RG<br>� ISD controlled by pulse period<br>**----- End of picture text -----**<br>


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**----- Start of picture text -----**<br>
Gate Pulse Width<br>VGS D = Gate Pulse Period 10 V<br>(Driver)<br>Body Diode Reverse Current<br>ISD<br>(DUT) IRM<br>di/dt<br>IFM , Body Diode Forward Current<br>VDS VSD<br>(DUT)<br>Body Diode VDD<br>Forward Voltage Drop<br>Body Diode Recovery dv/dt<br>**----- End of picture text -----**<br>


**Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms** 

**PACKAGE MARKING AND ORDERING INFORMATION** 

|**Device**|**Marking**|**Package**|**Reel Size**|**Tape Width**|**Shipping**†|
|---|---|---|---|---|---|
|FQB12P20TM|FQB12P20|D2PAK<br>(Pb−Free)|330 mm|24 mm|800 / Tape & Reel|



†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. 

QFET is registered trademark of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. 

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**6** 

## MECHANICAL CASE OUTLINE **PACKAGE DIMENSIONS** 

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D [2] PAK−3 (TO−263, 3−LEAD)<br>CASE 418AJ<br>ISSUE F<br>SCALE 1:1<br>**----- End of picture text -----**<br>


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DATE 11 MAR 2021<br>**----- End of picture text -----**<br>


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XXXXXX = Specific Device Code<br>OP TI ON A L CONS T RUC TI ONS<br>A = Assembly Location<br>GENERIC MARKING DIAGRAMS* WL = Wafer Lot<br>Y = Year<br>WW = Work Week<br>XX AYWW W = Week Code (SSG)<br>XXXXXXXXX XXXXXXXXG XXXXXXXXG XXXXXX M = Month Code (SSG)<br>AWLYWWG AYWW  AKA XXYMW G = Pb−Free Package<br>AKA = Polarity Indicator<br>*This information is generic. Please refer to<br>device data sheet for actual part marking.<br>Pb−Free indicator, “G” or microdot “ ”,<br>may or may not be present. Some products<br>IC Standard Rectifier SSG may not follow the Generic Marking.<br>Electronic versions are uncontrolled except when accessed directly from the Document Repository.<br>DOCUMENT NUMBER: 98AON56370E Printed  versions are uncontrolled  except when stamped  “CONTROLLED COPY” in red.<br>DESCRIPTION: D [2] PAK−3 (TO−263, 3−LEAD) PAGE 1 OF 1<br>**----- End of picture text -----**<br>


ON Semiconductor and          are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. ON Semiconductor does not convey any license under its patent rights nor the rights of others. 

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© Semiconductor Components Industries, LLC, 2018 

**onsemi** , , and other names, marks, and brands are registered and/or common law trademarks of Semiconductor Components Industries, LLC dba “ **onsemi** ” or its affiliates and/or subsidiaries in the United States and/or other countries. **onsemi** owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of **onsemi’s** product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. **onsemi** reserves the right to make changes at any time to any products or information herein, without notice. The information herein is provided “as−is” and **onsemi** makes no warranty, representation or guarantee regarding the accuracy of the information, product features, availability, functionality, or suitability of its products for any particular purpose, nor does **onsemi** assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using **onsemi** products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by **onsemi** . “Typical” parameters which may be provided in **onsemi** data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. **onsemi** does not convey any license under any of its intellectual property rights nor the rights of others. **onsemi** products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use **onsemi** products for any such unintended or unauthorized application, Buyer shall indemnify and hold **onsemi** and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that **onsemi** was negligent regarding the design or manufacture of the part. **onsemi** is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

## **PUBLICATION ORDERING INFORMATION** 

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