# Power MOSFET, P Channel, 250 V, 10.5 A, 0.62 ohm, TO-3PN, Through Hole

![Product image](https://novapart.co/image/farnell:3368792/)

**URL**: https://novapart.co/products/FQA9P25/power-mosfet-p-channel-250-v-105-a-062-ohm-to-3pn
**SKU**: FQA9P25
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €1.3300
**Stock**: 500+
**Lead Time**: 2 days (indicative)

## Specifications

| Parameter | Value |
|---|---|
| Svhc | No SVHC (15-Jan-2018) |
| No. Of Pins | 3Pins |
| Channel Type | P Channel |
| Product Range | QFET |
| Qualification | - |
| Power Dissipation | 150W |
| Transistor Mounting | Through Hole |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-3PN |
| Drain Source Voltage Vds | 250V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 10.5A |
| Drain Source On State Resistance | 0.62ohm |
| Gate Source Threshold Voltage Max | 5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3368792/)

## **Is Now Part of** 

## **To learn more about ON Semiconductor, please visit our website at www.onsemi.com** 

Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. 

ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

**==> picture [461 x 625] intentionally omitted <==**

**----- Start of picture text -----**<br>
ee<br>December 2000<br>FAIRCHILD<br>ee<br>SEMICONDUCTOR m<br>QFET TM<br>FQA9P25<br>250V P-Channel MOSFET<br>General Description Features<br>These P-Channel enhancement mode power field effect • -10.5A, -250V, RDS(on) = 0.62Ω @VGS = -10 V<br>transistors are produced using Fairchild’s proprietary, • Low gate charge ( typical  29 nC)<br>planar stripe, DMOS technology. • Low Crss ( typical  27 pF)<br>This advanced technology is especially tailored to minimize • Fast switching<br>on-state  resistance,  provide  superior  switching • 100% avalanche tested<br>performance, and withstand a high energy pulse in the • Improved dv/dt capability<br>avalanche and commutation modes. These devices are<br>well suited for high efficiency switching DC/DC converters.<br>S<br>!<br>●<br>G ! ●<br>▶ ▲<br>●<br> TO-3PN<br>G D S !<br>FQA Series D<br>Absolute Maximum Ratings    TC = 25°C unless otherwise noted<br>Symbol Parameter FQA9P25 Units<br>VDSS Drain-Source Voltage -250 V<br>ID Drain Current - Continuous (TC = 25°C) -10.5 A<br>- Continuous (TC = 100°C) -6.6 A<br>IDM Drain Current - Pulsed (Note 1) -42 A<br>VGSS Gate-Source Voltage ± 30 V<br>EAS Single Pulsed Avalanche Energy (Note 2) 650 mJ<br>IAR Avalanche Current (Note 1) -10.5 A<br>EAR Repetitive Avalanche Energy (Note 1) 15 mJ<br>dv/dt Peak Diode Recovery dv/dt (Note 3) -5.5 V/ns<br>PD Power Dissipation (TC = 25°C) 150 W<br>- Derate above 25°C 1.2 W/°C<br>TJ, TSTG Operating and Storage Temperature Range -55 to +150 °C<br>TL Maximum lead temperature for soldering purposes,1/8 ”  from case for 5 seconds 300 °C<br>Thermal Characteristics<br>Symbol Parameter Typ Max Units<br>RθJC Thermal Resistance, Junction-to-Case -- 0.83 °C / W<br>RθCS Thermal Resistance, Case-to-Sink 0.24 -- °C / W<br>RθJA Thermal Resistance, Junction-to-Ambient -- 40 °C / W<br>FQA9P25<br>**----- End of picture text -----**<br>


©2000 Fairchild Semiconductor International 

Rev. A2, December 2000 

|**Electrical Characteristics**TC= 25°C|**Electrical Characteristics**TC= 25°C|unless otherwise noted|||||
|---|---|---|---|---|---|---|
|**Symbol**|**Parameter**|**Test Conditions**|**Min**|**Typ**|**Max**|**Units**|
|**Off Characteristics**|||||||
|BVDSS|Drain-Source Breakdown Voltage|VGS= 0 V, ID= -250µA|-250|--|--|V|
|∆BVDSS<br>/∆TJ|Breakdown Voltage Temperature<br>Coefficient|ID= -250µA, Referenced to 25°C|--|-0.2|--|V/°C|
|IDSS|Zero Gate Voltage Drain Current|VDS= -250 V, VGS= 0 V|--|--|-1|µA|
|||VDS= -200 V, TC= 125°C|--|--|-10|µA|
|IGSSF|Gate-Body Leakage Current, Forward|VGS= -30 V, VDS= 0 V|--|--|-100|nA|
|IGSSR|Gate-Body Leakage Current, Reverse|VGS= 30 V, VDS= 0 V|--|--|100|nA|
|**On Characteristics**|||||||
|VGS(th)|Gate Threshold Voltage|VDS= VGS, ID= -250µA|-3.0|--|-5.0|V|
|RDS(on)|Static Drain-Source<br>On-Resistance|VGS= -10 V, ID= -5.25 A|--|0.48|0.62|Ω|
|gFS|Forward Transconductance|(Note 4)<br>VDS= -40 V, ID= -5.25 A|--|6.1|--|S|
|**Dynamic Characteristics**|||||||
|Ciss|Input Capacitance|VDS= -25 V, VGS= 0 V,<br>f = 1.0 MHz|--|910|1180|pF|
|Coss|Output Capacitance||--|170|220|pF|
|Crss|Reverse Transfer Capacitance||--|27|35|pF|
|**Switching Characteristics**|||||||
|td(on)|Turn-On Delay Time|(Note 4, 5)<br>VDD= -125 V, ID= -9.4 A,<br>RG= 25Ω|--|20|50|ns|
|tr|Turn-On Rise Time||--|150|310|ns|
|td(off)|Turn-Off Delay Time||--|45|100|ns|
|tf|Turn-Off Fall Time||--|65|140|ns|
|Qg|Total Gate Charge|(Note 4, 5)<br>VDS= -200 V, ID= -9.4 A,<br>VGS= -10 V|--|29|38|nC|
|Qgs|Gate-Source Charge||--|7.6|--|nC|
|Qgd|Gate-Drain Charge||--|14|--|nC|
|**Drain-Source Diode Characteristics and Maximum Ratings**|||||||
|IS|Maximum Continuous Drain-Source Diode Forward Current||--|--|-10.5|A|
|ISM|Maximum Pulsed Drain-Source Diode Forward Current||--|--|-42|A|
|VSD|Drain-Source Diode Forward Voltage|VGS= 0 V, IS= -10.5 A|--|--|-5.0|V|
|trr|Reverse Recovery Time|(Note 4)<br>VGS= 0 V, IS= -9.4 A,<br>dIF/ dt = 100 A/µs|--|190|--|ns|
|Qrr|Reverse Recovery Charge||--|1.45|--|µC|



## **Notes:** 

1. Repetitive Rating : Pulse width limited by maximum junction temperature 

2. L = 9.4mH, IAS = -10.5A, VDD = -50V, RG = 25 Ω, Starting  TJ = 25°C 

3. ISD ≤ -9.4A, di/dt ≤ 300A/µs, VDD ≤ BVDSS, Starting  TJ = 25°C 

4. Pulse Test : Pulse width ≤ 300µs, Duty cycle ≤ 2% 

5. Essentially independent of operating temperature 

©2000 Fairchild Semiconductor International 

Rev. A2, December 2000 

## **Typical Characteristics** 

**==> picture [422 x 567] intentionally omitted <==**

**----- Start of picture text -----**<br>
                    VTop :       -15.0 VGS<br>                -10.0 V<br>                  -8.0 V<br>101                   -7.0 V 101<br>                  -6.5 V<br>                  -6.0 V<br>Bottom :    -5.5 V<br>150℃<br>100 100<br>25℃<br>※ Notes : ※ Notes :<br>   1. 250μs Pulse Test -55℃    1. VDS = -50V<br>   2. TC = 25℃    2. 250μs Pulse Test<br>10-110-1 100 101 10-1 2 4 6 8 10<br>-VDS, Drain-Source Voltage [V] -VGS , Gate-Source Voltage  [V]<br>Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics<br>2.0<br>1.5 VGS = - 10V 101<br>VGS = - 20V<br>1.0<br>100<br>0.5<br>※ Note : TJ = 25℃ 150℃ 25℃    1. V※   2. 250 Notes :GS = 0Vμs Pulse Test<br>0.0 10-1<br>0 10 20 30 40 0.0 0.5 1.0 1.5 2.0 2.5 3.0<br>-ID , Drain Current  [A] -VSD , Source-Drain Voltage  [V]<br>Figure 3. On-Resistance Variation vs. Figure 4. Body Diode Forward Voltage<br>Drain Current and Gate Voltage Variation vs. Source Current<br>and Temperature<br>2400 12<br>2000 CCCissossrss = C = C = Cgsgdds + C + Cgdgd (Cds = shorted) 10 VDSV = -125VDS = -50V<br>1600 8 VDS = -200V<br>Ciss    1. V※ Notes :GS = 0 V<br>1200 Coss    2. f = 1 MHz 6<br>800 4<br>Crss<br>400 2<br>※ Note : ID = -9.4 A<br>0 0<br>10-1 100 101 0 5 10 15 20 25 30 35<br>-VDS, Drain-Source Voltage [V] QG, Total Gate Charge [nC]<br>, Drain Current [A]-ID  , Drain Current  [A]-ID<br>],<br>Ω<br>   [<br>DS(on)<br>R<br>Drain-Source On-Resistance  , Reverse Drain Current  [A]<br>DR<br>-I<br>Capacitance [pF]<br>, Gate-Source Voltage [V]<br>GS<br>-V<br>**----- End of picture text -----**<br>


**Figure 5. Capacitance Characteristics** 

**Figure 6. Gate Charge Characteristics** 

©2000 Fairchild Semiconductor International 

Rev. A2, December 2000 

**==> picture [428 x 602] intentionally omitted <==**

**----- Start of picture text -----**<br>
Typical Characteristics      (Continued)<br>1.2 3.0<br>2.5<br>1.1<br>2.0<br>1.0 1.5<br>1.0<br>0.9 ※   1. V   2. I Notes :DGS = -250  = 0 VμA 0.5 ※   1. V   2. I Notes :DGS = -4.7 A = -10 V<br>0.8 0.0<br>-100 -50 0 50 100 150 200 -100 -50 0 50 100 150 200<br>TJ, Junction Temperature [oC] TJ, Junction Temperature [oC]<br>Figure 7. Breakdown Voltage Variation Figure 8. On-Resistance Variation<br>vs. Temperature vs. Temperature<br>12<br>102 Operation in This Area is Limited by R DS(on) 10<br>100 µs<br>101 1 ms 8<br>10 ms<br>DC 6<br>100 4<br>※ Notes :<br>   1. TC = 25 oC 2<br>   2. TJ = 150 oC<br>   3. Single Pulse<br>10-1100 101 102 025 50 75 100 125 150<br>-VDS, Drain-Source Voltage [V] TC, Case Temperature [℃]<br>Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current<br>vs. Case Temperature<br>1 0 0<br>D = 0 .5<br>1 0 -1 0 .20 .1    2 . D u ty F a c to r, D = t※   1 . Z   3 . T N o te s  :θJ M  -  TJ C(t) =  0 .8 3  C  =  P D M  *  Z℃  1/Wθ/t 2J C M(t)a x .<br>0 .0 5<br>0 .0 2 PDM<br>0 .0 1 t1<br>1 0 -2 s in g le  p u ls e t2<br>1 0 -5 1 0 -4 1 0 -3 1 0 -2 1 0 -1 1 0 0 1 0 1<br>t 1 , S q u a re  W a v e  P u ls e  D u ra tio n  [s e c ]<br>Figure 11. Transient Thermal Response Curve<br>, (Normalized)  , (Normalized)<br> DSS DS(ON)<br>-BV R<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br>, Drain Current [A]-ID , Drain Current [A]-ID<br>(t), T h e rm a l R e s p o n s eJ C<br>θ<br>Z<br>**----- End of picture text -----**<br>


Rev. A2, December 2000 

©2000 Fairchild Semiconductor International 

**==> picture [436 x 575] intentionally omitted <==**

**----- Start of picture text -----**<br>
 Gate Charge Test Circuit & Waveform<br>VGS<br>Same Type<br>50KΩ as DUT Qg<br>12V 200nF 300nF -10V<br>VGS VDS Qgs Qgd<br>DUT<br>-3mA<br>Charge<br> Resistive Switching Test Circuit & Waveforms<br>RL<br>VDS t on t off<br>RG VGS VDD VGS 10% td(on) tr td(off) tf<br>DUT<br>-10V<br>VDS 90%<br> Unclamped Inductive Switching Test Circuit & Waveforms<br>VDS L EAS = ----12 L IAS2 --------------------BVBVDSSDSS- VDD<br>t p Time<br>I D<br>RG VDD VDD VDS (t)<br>ID (t)<br>-10V DUT<br>IAS<br>t p BVDSS<br>**----- End of picture text -----**<br>


©2000 Fairchild Semiconductor International 

Rev. A2, December 2000 

## **Peak Diode Recovery dv/dt Test Circuit & Waveforms** 

**==> picture [320 x 468] intentionally omitted <==**

**----- Start of picture text -----**<br>
+<br>VDS<br>DUT<br>_<br>I SD<br>L<br>Driver<br>RG<br>Compliment of DUT<br>(N-Channel) VDD<br>VGS • dv/dt controlled by  RG<br>• ISD controlled by pulse period<br>Gate Pulse Width<br>VGS D = --------------------------Gate Pulse Period 10V<br>( Driver )<br>Body Diode Reverse Current<br>I SD<br>( DUT ) IRM<br>di/dt<br>IFM , Body Diode Forward Current<br>VDS VSD<br>( DUT )<br>Body Diode VDD<br>Forward Voltage Drop<br>Body Diode Recovery dv/dt<br>**----- End of picture text -----**<br>


©2000 Fairchild Semiconductor International 

Rev. A2, December 2000 

**==> picture [420 x 580] intentionally omitted <==**

**----- Start of picture text -----**<br>
Mechanical Dimensions<br>TO-3PN<br>m6) 5,00<br>30 4, 80<br>15,80 1,65<br>16.40 1.45<br>/s 8 iv.\ | (RO.50) =<br>| |<br>— 20.40 18,90<br>a<br>3.70<br>330<br>(1.85) ~-10<br>220_|{I||<br>1.80 2.60<br>2.20<br>3.20 20,30<br>2.80 19.70<br>80H<br>1 3<br>0.55<br>(R050) —,<br>Dimensions in Millimeters<br>**----- End of picture text -----**<br>


©2000 Fairchild Semiconductor International 

Rev. A2, December 2000 

## **TRADEMARKS** 

The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. 

|ACEx™|HiSeC™|SuperSOT™-8|
|---|---|---|
|Bottomless™|ISOPLANAR™|SyncFET™|
|CoolFET™|MICROWIRE™|TinyLogic™|
|CROSSVOLT™|POP™|UHC™|
|E2CMOS™|PowerTrench®|VCX™|
|FACT™|QFET™||
|FACT Quiet Series™|QS™||
|FAST®|Quiet Series™||
|FASTr™|SuperSOT™-3||
|GTO™|SuperSOT™-6||



## **DISCLAIMER** 

FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. 

## **LIFE SUPPORT POLICY** 

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR INTERNATIONAL. 

As used herein: 

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result in significant injury to the user. 

2. A critical component is any component of a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or system, or to affect its safety or effectiveness. 

## **PRODUCT STATUS DEFINITIONS** 

## **Definition of Terms** 

|**Definition of Terms**|||
|---|---|---|
|**Datasheet Identification**|**Product Status**|**Definition**|
|Advance Information|Formative or In<br>Design|This datasheet contains the design specifications for<br>product development. Specifications may change in<br>any manner without notice.|
|Preliminary|First Production|This datasheet contains preliminary data, and<br>supplementary data will be published at a later date.<br>Fairchild Semiconductor reserves the right to make<br>changes at any time without notice in order to improve<br>design.|
|No Identification Needed|Full Production|This datasheet contains final specifications. Fairchild<br>Semiconductor reserves the right to make changes at<br>any time without notice in order to improve design.|
|Obsolete|Not In Production|This datasheet contains specifications on a product<br>that has been discontinued by Fairchild semiconductor.<br>The datasheet is printed for reference information only.|



©2000 Fairchild Semiconductor International 

Rev. A,  January 2000 

ON Semiconductor and      are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

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