# Power MOSFET, N Channel, 500 V, 2 A, 3 ohm, SOT-223, Surface Mount

![Product image](https://novapart.co/image/farnell:3766137/)

**URL**: https://novapart.co/products/FDT4N50NZU/power-mosfet-n-channel-500-v-2-a-3-ohm-sot-223
**SKU**: FDT4N50NZU
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.4490
**Stock**: 50+
**Lead Time**: 99 days (indicative)

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 4Pins |
| Channel Type | N Channel |
| Product Range | UniFET II Ultra FRFET |
| Qualification | - |
| Power Dissipation | 2W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | SOT-223 |
| Drain Source Voltage Vds | 500V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 2A |
| Drain Source On State Resistance | 3ohm |
| Gate Source Threshold Voltage Max | 5.5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3766137/)

## MOSFET - Power, N-Channel, UniFET II, Ultra FRFET 500 V, 2 A, 3 ~~Q~~ 

## FDT4N50NZU 

## **Description** 

UniFET II MOSFET is ON Semiconductor’s high voltage MOSFET family based on advanced planar stripe and DMOS technology. This advanced MOSFET family has the smallest on−state resistance among the planar MOSFET, and also provides superior switching performance and higher avalanche energy strength. In addition, internal gate−source ESD diode allows UniFET II MOSFET to withstand over 2 kV HBM surge stress. UniFET II Ultra FRFET MOSFET has much superior body diode reverse recovery performance. Its trr is less than 50 nsec and the reverse dv/dt immunity is 20 V/nsec while normal planar MOSFETs have over 200 nsec and 4.5 V/nsec respectively. Therefore UniFET II Ultra FRFET MOSFET can remove additional component and improve system reliability in certain applications that require performance improvement of the MOSFET’s body diode. This device family is suitable for switching power converter applications such as power factor correction (PFC), flat panel display (FPD) TV power, ATX and electronic lamp ballasts. 

## **Features** 

- Typ. RDS(on) = 2.42 

- Ultra Low Gate Charge (Typ. Qg = 9.1 nC) 

- 100% Avalanche Tested 

- These Devices are Pb−Free, Halogen Free/BFR Free and are RoHS Compliant 

## **Applications** 

- Computing / Display Power Supplies 

- Industrial Power Supplies 

- Consumer Power Supplies 

**www.onsemi.com** 

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VDSS RDS(ON) MAX ID MAX<br>500 V 3  @ 10 V 2 A<br>eeee ee<br>**----- End of picture text -----**<br>


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D<br>G<br>S<br>**----- End of picture text -----**<br>


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POWER MOSFET<br>**----- End of picture text -----**<br>


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D<br>SS<br>LX A<br>G<br>D<br>S<br>SOT−223<br>(TO−261)<br>CASE 318E<br>MARKING DIAGRAM<br>D<br>AYW<br>4N50U<br>G D S<br>A = Assembly Location<br>Y = Year<br>W = Work Week<br>4N50U = Device Code<br>**----- End of picture text -----**<br>


## **ORDERING INFORMATION** 

See detailed ordering and shipping information on page 2 of this data sheet. 

Publication Order Number: **FDT4N50NZU/D** 

**1** 

© Semiconductor Components Industries, LLC, 2019 **February, 2021 − Rev. 1** 

## **FDT4N50NZU** 

**ABSOLUTE MAXIMUM RATINGS** (TC = 25 ° C, Unless otherwise noted) 

|**ABSOLUTE M**|**AXIMUM RATINGS**(TC= 25°C, Unless other|wise noted)|||
|---|---|---|---|---|
|**Symbol**|**Parameter**||**Value**|**Unit**|
|VDSS|Drain to Source Voltage||500|V|
|VGSS|Gate to Source Voltage|− DC|±25|V|
|ID|Drain Current|− Continuous (TC= 25°C)|2|A|
|||− Continuous (TC= 100°C)|1.2||
|IDM|Drain Current|− Pulsed (Note 1)|6|A|
|EAS|Single Pulsed Avalanche Energy (Note 2)||46|mJ|
|IAS|Avalanche Current (Note 2)||2|A|
|EAR|Repetitive Avalanche Energy (Note 1)||2|mJ|
|dv/dt|Peak Diode Recovery dv/dt (Note 3)||20|V/ns|
|PD|Power Dissipation|(TC= 25°C)|2|W|
|||− Derate Above 25°C|0.02|W/°C|
|TJ, TSTG|Operating and Storage Temperature Range||−55 to +150|°C|
|TL|Maximum Lead Temperature for Soldering, 1/8″f|rom Case for 5 seconds|300|°C|



Stresses exceeding those listed in the Maximum Ratings table may damage the device. If any of these limits are exceeded, device functionality should not be assumed, damage may occur and reliability may be affected. 

NOTE: Drain current limited by maximum junction temperature. 

1. Repetitive rating: pulse−width limited by maximum junction temperature. 

2. IAS = 2 A, RG =  25 � , starting TJ = 25 ° C. 

3. ISD ≤ 3 A, di/dt ≤ 100 A/ � s, VDD ≤ 400 V, starting TJ = 25 ° C. 

## **THERMAL CHARACTERISTICS** 

|**Symbol**|**Parameter**|**Value**|**Unit**|
|---|---|---|---|
|R�JA|Thermal Resistance, Junction to Ambient, (1 in2Pad of 2 oz. Copper) Max.|60|�C/W|



## **PACKAGE MARKING AND ORDERING INFORMATION** 

|**Part Number**|**Top Marking**|**Package**|**Packing Method**|**Reel Size**|**Tape Width**|**Quantity**|
|---|---|---|---|---|---|---|
|FDT4N50NZU|FDT4N50NZU|SOT−223|Tape & Reel†|330 mm|12 mm|4000 Units|



†For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specifications Brochure, BRD8011/D. 

**www.onsemi.com** 

**2** 

## **FDT4N50NZU** 

**ELECTRICAL CHARACTERISTICS** (TC = 25 ° C unless otherwise noted) 

|**ELECTRICAL**|**CHARACTERISTICS**(TC= 25°C unles|s otherwise noted)|||||
|---|---|---|---|---|---|---|
|**Symbol**|**Parameter**|**Test Conditions**|**Min.**|**Typ.**|**Max.**|**Unit**|
|**OFF CHARACTERISTICS**|||||||
|BVDSS|Drain to Source Breakdown Voltage|VGS= 0 V, ID= 250�A, TJ= 25�C|500|||V|
|�BVDSS/�TJ|Breakdown Voltage Temperature<br>Coefficient|ID= 1 mA, Referenced to 25�C||0.55||V/�C|
|IDSS|Zero Gate Voltage Drain Current|VDS= 500 V, VGS= 0 V|||1|�A|
|||VDS= 400 V, TC= 125�C||4.6|||
|IGSS|Gate to Body Leakage Current|VGS=±25 V, VDS= 0 V|||±10|�A|
|**ON CHARACTERISTICS**|||||||
|VGS(th)|Gate Threshold Voltage|VGS= VDS, ID= 250�A|3.5||5.5|V|
|RDS(on)|Static Drain to Source On Resistance|VGS= 10 V, ID= 1 A||2.42|3|�|
|gFS|Forward Transconductance|VDS= 20 V, ID= 1 A||1||S|
|**DYNAMIC CHARACTERISTICS**|||||||
|Ciss|Input Capacitance|VDS= 25 V, VGS= 0 V, f = 1 MHz||476||pF|
|Coss|Output Capacitance|||43||pF|
|Crss|Reverse Transfer Capacitance|||2.7||pF|
|Qg(tot)|Total Gate Charge at 10 V|VDS= 400 V, ID= 3 A, VGS= 10 V<br>(Note 4)||9.1||nC|
|Qgs|Gate to Source Gate Charge|||2.9||nC|
|Qgd|Gate to Drain “Miller” Charge|||3.3||nC|
|**SWITCHING CHARACTERISTICS**|||||||
|td(on)|Turn-On Delay Time|VDD= 250 V, ID= 3 A, VGS= 10 V,<br>Rg= 25�<br>(Note 4)||16||ns|
|tr|Turn-On Rise Time|||16||ns|
|td(off)|Turn-Off Delay Time|||34||ns|
|tf|Turn-Off Fall Time|||15||ns|
|**SOURCE-DRAIN DIODE CHARACTERISTICS**|||||||
|IS|Maximum Continuous Source to Drain Diode Forward Current||||2|A|
|ISM|Maximum Pulsed Source to Drain Diode Forward Current||||6|A|
|VSD|Source to Drain Diode Forward Voltage|VGS=  0 V, ISD=  1 A|||1.2|V|
|trr|Reverse Recovery Time|VDD= 400 V, ISD=  3 A, dIF/<br>dt = 100 A/�s||24||ns|
|Qrr|Reverse Recovery Charge|||18||nC|



Product parametric performance is indicated in the Electrical Characteristics for the listed test conditions, unless otherwise noted. Product performance may not be indicated by the Electrical Characteristics if operated under different conditions. 4. Essentially independent of operating temperature typical characteristics. 

**www.onsemi.com** 

**3** 

**FDT4N50NZU** 

## **TYPICAL CHARACTERISTICS** 

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**----- Start of picture text -----**<br>
250  � s Pulse Test<br>6 TC = 25 ° C VGS = 20 V<br>15 V<br>7.0 V<br>10 V<br>4 6.5 V<br>8.0 V<br>2<br>6.0 V<br>0<br>2 4 6 8 10 12 14 16 18 20<br>VDS, DRAIN−TO−SOURCE VOLTAGE (V)<br>Figure 1. On−Region Characteristics<br>3.8<br>3.6 VTJGS = 25 = 10 V ° C<br>3.4<br>3.2<br>3.0<br>2.8<br>2.6<br>2.4<br>2.2<br>2.0<br>0 1 2 3 4 5 6 7<br>ID, DRAIN CURRENT (A)<br>Figure 3. On−Resistance Variation vs. Drain<br>Current and Gate Voltage<br>1000<br>Ciss<br>100<br>Coss<br>10<br>f = 1 MHz<br>VGS = 0 V C rss<br>1<br>0.1 1 10 100<br>VDS, DRAIN−TO−SOURCE VOLTAGE (V)<br>, DRAIN CURRENT (A)<br>ID<br>, DRAIN−TO−SOURCE ON−RESISTANCE<br>DS(ON)<br>R<br>CAPACITANCE (pF)<br>**----- End of picture text -----**<br>


**Figure 5. Capacitance Characteristics** 

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6<br>VDS = 20 V<br>5<br>4<br>3<br>TJ = 150 ° C TJ = 25 ° C<br>2<br>1<br>0<br>3 4 5 6 7 8 9<br>VGS, GATE−TO−SOURCE VOLTAGE (V)<br>, DRAIN CURRENT (A)<br>ID<br>**----- End of picture text -----**<br>


**Figure 2. Transfer Characteristics** 

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10<br>TJ = 150 ° C<br>T J  = 25 ° C<br>1<br>0.1<br>0.01<br>V GS  = 0 V<br>0.001<br>0 0.5 1.0 1.5 2.0<br>VSD, BODY DIODE FORWARD VOLTAGE (V)<br>, REVERSE DRAIN CURRENT (A)<br>IS<br>**----- End of picture text -----**<br>


**Figure 4. Body Diode Forward Voltage Variation vs. Source Current and Temperature** 

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10<br>VDD = 100 V<br>8 V DD  = 250 V<br>VDD = 400 V<br>6<br>4<br>2<br>ID = 3 A<br>0<br>0 2 4 6 8 10<br>CHARGE (nC)<br> (V)<br>GS<br>V<br>**----- End of picture text -----**<br>


**Figure 6. Gate Charge Characteristics** 

**www.onsemi.com** 

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**FDT4N50NZU** 

## **TYPICAL CHARACTERISTICS** 

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1.2 2.00<br>ID = 250  � A<br>VGS = 0 V 1.75 ID = 1 A<br>VGS = 10 V<br>1.1<br>1.50<br>1.0 1.25<br>1.00<br>0.9<br>0.75<br>0.8 0.50<br>−75 −25 25 75 125 175 0 25 50 75 100 125 150 175<br>TJ, AMBIENT TEMPERATURE ( ° C) TJ, JUNCTION TEMPERATURE ( ° C)<br>Figure 7. Breakdown Voltage Variation vs. Figure 8. On−Resistance Variation vs.<br>Temperature Temperature<br>2.5<br>Operation in this area<br>10 is limited by RDS(on)<br>2.0<br>100  � s<br>1 1 ms 1.5<br>10 ms<br>1.0<br>0.1<br>TC = 25 ° C 100 ms 0.5<br>TJ = 150 ° C<br>Single Pulse DC<br>0.01 0<br>1 10 100 1000 25 50 75 100 125 150<br>VDS, DRAIN−TO−SOURCE VOLTAGE (V) TC, CASE TEMPERATURE ( ° C)<br>Figure 9. Maximum Safe Operating Area Figure 10. Maximum Drain Current vs. Case<br>Temperature<br>10<br>0.1 0.05<br>1 Duty Cycle = 0.5<br>0.2<br>0.1<br>0.02<br>0.01<br>0.01<br>1E−03<br>P DM Notes:<br>1E−04 Z � JA(t) = 60 ° C/W Max.<br>1E−05 Single Pulse t 1 t2 TDuty Factor, D = tJM − TC = PDM x Z1/t � 2JC(t)<br>1E−06<br>1E−06 1E−05 0.0001 0.001 0.01 0.1 1 10 100 1000<br>t, SQUARE WAVE PULSE DURATION (sec)<br>, NORMALIZED DRAIN−TO−<br>BREAKDOWN VOLTAGE<br>SOURCE ON−RESISTANCE<br>DS(ON)<br>NORMALIZED DRAIN−TO−SOURCE R<br>, DRAIN CURRENT (A) , DRAIN CURRENT (A)<br>ID ID<br>(t), NORMALIZED THERMAL RESPONSE<br>JA<br>�<br>Z<br>**----- End of picture text -----**<br>


**Figure 11. Transient Thermal Response** 

**www.onsemi.com** 

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**FDT4N50NZU** 

**==> picture [365 x 147] intentionally omitted <==**

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VGS<br>RL Qg<br>VGS VDS Qgs Qgd<br>DUT<br>IG = Const.<br>Charge<br>**----- End of picture text -----**<br>


**Figure 12. Gate Charge Test Circuit & Waveform** 

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VDS RL VDS 90% 90% 90%<br>VGS VDD<br>RG<br>10% 10%<br>DUT VGS<br>VGS<br>td(on) tr td(off) tf<br>ton toff<br>**----- End of picture text -----**<br>


**Figure 13. Resistive Switching Test Circuit & Waveforms** 

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L<br>VDS EAS  � [1] 2 � LIAS2<br>BVDSS<br>ID<br>IAS<br>RG VDD ID(t)<br>VGS DUT VDD VDS(t)<br>t<br>p Time<br>t<br>p<br>**----- End of picture text -----**<br>


**Figure 14. Unclamped Inductive Switching Test Circuit & Waveforms** 

**www.onsemi.com** 

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**----- Start of picture text -----**<br>
+<br>DUT<br>VDS<br>−<br>ISD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT<br>VDD<br>VGS<br>− dv/dt controlled by RG<br>− ISD controlled by pulse period<br>Gate Pulse Width<br>D  �<br>Gate Pulse Period<br>VGS 10 V<br>(Driver)<br>IFM, Body Diode Forward Current<br>ISD di/dt<br>(DUT)<br>IRM<br>Body Diode Reverse Current<br>Body Diode Recovery dv/dt<br>VDS<br>(DUT) VSD VDD<br>Body Diode<br>Forward Voltage Drop<br>**----- End of picture text -----**<br>


**Figure 15. Peak Diode Recovery dv/dt Test Circuit & Waveforms** 

Ultra FRFET and UniFET are trademarks of Semiconductor Components Industries, LLC (SCILLC) or its subsidiaries in the United States and/or other countries. 

**www.onsemi.com** 

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**FDT4N50NZU** 

## **PACKAGE DIMENSIONS** 

**SOT−223 (TO−261)** CASE 318E−04 ISSUE R 

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**FDT4N50NZU** 

ON Semiconductor and      are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

## **PUBLICATION ORDERING INFORMATION** 

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**9** 



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