# Power MOSFET, P Channel, 150 V, 2.2 A, 0.255 ohm, SOIC, Surface Mount

![Product image](https://novapart.co/image/farnell:2825189/)

**URL**: https://novapart.co/products/FDS86267P/power-mosfet-p-channel-150-v-22-a-0255-ohm-soic
**SKU**: FDS86267P
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.6000
**Stock**: 1000+
**Lead Time**: 134 days (indicative)

## Description

Transistor Polarity:P Channel; Continuous Drain Current Id:-2.2A; Drain Source Voltage Vds:-150V; On Resistance Rds(on):0.191ohm; Rds(on) Test Voltage Vgs:-10V; Threshold Voltage Vgs:-

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 8Pins |
| Channel Type | P Channel |
| Product Range | PowerTrench |
| Qualification | - |
| Power Dissipation | 2.5W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | SOIC |
| Drain Source Voltage Vds | 150V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 2.2A |
| Drain Source On State Resistance | 0.255ohm |
| Gate Source Threshold Voltage Max | 3V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2825189/)

## **Is Now Part of** 

## **To learn more about ON Semiconductor, please visit our website at www.onsemi.com** 

Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. 

ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

**==> picture [41 x 9] intentionally omitted <==**

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May 2015<br>**----- End of picture text -----**<br>


## **FDS86267P** 

## **P-Channel Shielded Gate PowerTrench[®] MOSFET -150 V, -2.2 A, 255 m** Ω 

## **Features** 

Shielded Gate MOSFET Technology 

Max rDS(on) = 255 mΩ at  VGS = -10 V, ID = -2.2 A Max rDS(on) = 290 mΩ at  VGS = -6 V, ID = -2 A 

Very Low rDS(on) Mid Voltage P-channel Silicon Technology Optimised for Low Qg 

## **General Description** 

This P-Channel MOSFET is produced using Fairchild Semiconductor‘s advanced PowerTrench **[®]** process that incorporates shielded gate technology. The process has been optimized for the on-state resistance and yet maintain superior switching performance. 

**==> picture [489 x 180] intentionally omitted <==**

**----- Start of picture text -----**<br>
This Product is Optimised for Fast Switching Applications as Applications<br>well as Load Switch Applications<br>Active Clamp Switch<br>100% UIL Tested<br>: Load Switch<br>. RoHS Compliant @<br>D<br>D<br>D 5 4 G<br>D<br>D D 6 3 S<br>D 7 2 S<br>G<br>SO-8<br>S D 8 1 S<br>* S<br>Pin 1 S<br>**----- End of picture text -----**<br>


## **MOSFET Maximum Ratings** TAA = 25 

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|||||||||
|---|---|---|---|---|---|---|---|
|TAA|= 25|°C unless otherwise noted.|
|Symbol|Parameter|Ratings|Units|
|VDS|Drain to Source Voltage|-150|V|
|VGS|Gate to Source Voltage|±25|V|
|Drain Current|-Continuous|(Note 1a)|-2.2|
|ID|-Pulsed|(Note 4|)|-34|A|
|EAS|Single Pulse Avalanche Energy|(Note 3|)|54|mJ|
|PD|Power DissiPower Dissippation   ation|T  TAA = 25 °C      = 25 °C|((Note 1aNote 1b|)|)|2.51.0|W|
|TJ, TSTG|Operating and Storage Junction Temperature Range|-55 to +150|°C|
|Thermal Characteristics|
|RθJA|Thermal Resistance, Junction to Ambient|(Note 1a|)|50|
|°C/W|
|—_|RθJA|Thermal Resistance, Junction to Ambient|(Note 1b)|125|
|Package Marking and Ordering Information|
|Device Marking|Device|Package|Reel Size|Tape Width|Quantity|
|FDS86267P|FDS86267P|SO-8|13 ’’|12|mm|2500|units|
|eeee ee|ee|

**----- End of picture text -----**<br>


©2015 Fairchild Semiconductor Corporation FDS86267P Rev 1.0 

www.fairchildsemi.com 

**1** 

## **Electrical Characteristics** TJ = 25 °C unless otherwise noted. 

|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Switching Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250 μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250 μA, referenced to 25 °C<br>-121<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID=  -250 μA<br>-2<br>-3<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250 μA, referenced to 25 °C<br>5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -2.2 A<br>191<br>255<br>mΩ<br>VGS= -6 V, ID= -2 A<br>214<br>290<br>VGS= -10 V, ID= -2.2 A,TJ = 125 °C<br>342<br>448<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -2.2 A<br>6.8<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>806<br>1130<br>pF<br>Coss<br>Output Capacitance<br>54<br>75<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>1.6<br>2.3<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>3<br>6<br>Ω<br>td(on)<br>Turn-On DelayTime<br>VDD= -75 V, ID= -2.2 A,<br>VGS= -10 V, RGEN= 6 Ω<br>9.7<br>20<br>ns<br>tr<br>Rise Time<br>2.5<br>10<br>ns<br>td(off)<br>Turn-Off DelayTime<br>17<br>30<br>ns<br>~~=~~<br>~~—————~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Switching Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250 μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250 μA, referenced to 25 °C<br>-121<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID=  -250 μA<br>-2<br>-3<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250 μA, referenced to 25 °C<br>5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -2.2 A<br>191<br>255<br>mΩ<br>VGS= -6 V, ID= -2 A<br>214<br>290<br>VGS= -10 V, ID= -2.2 A,TJ = 125 °C<br>342<br>448<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -2.2 A<br>6.8<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>806<br>1130<br>pF<br>Coss<br>Output Capacitance<br>54<br>75<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>1.6<br>2.3<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>3<br>6<br>Ω<br>td(on)<br>Turn-On DelayTime<br>VDD= -75 V, ID= -2.2 A,<br>VGS= -10 V, RGEN= 6 Ω<br>9.7<br>20<br>ns<br>tr<br>Rise Time<br>2.5<br>10<br>ns<br>td(off)<br>Turn-Off DelayTime<br>17<br>30<br>ns<br>~~=~~<br>~~—————~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Switching Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250 μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250 μA, referenced to 25 °C<br>-121<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID=  -250 μA<br>-2<br>-3<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250 μA, referenced to 25 °C<br>5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -2.2 A<br>191<br>255<br>mΩ<br>VGS= -6 V, ID= -2 A<br>214<br>290<br>VGS= -10 V, ID= -2.2 A,TJ = 125 °C<br>342<br>448<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -2.2 A<br>6.8<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>806<br>1130<br>pF<br>Coss<br>Output Capacitance<br>54<br>75<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>1.6<br>2.3<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>3<br>6<br>Ω<br>td(on)<br>Turn-On DelayTime<br>VDD= -75 V, ID= -2.2 A,<br>VGS= -10 V, RGEN= 6 Ω<br>9.7<br>20<br>ns<br>tr<br>Rise Time<br>2.5<br>10<br>ns<br>td(off)<br>Turn-Off DelayTime<br>17<br>30<br>ns<br>~~=~~<br>~~—————~~|
|---|---|---|
|tf<br>Fall Time|5.7<br>12|ns|
|**Drain-Source Diode Characteristics**<br>Qg<br>Total Gate Charge<br>Qg<br>Total Gate Charge<br>Qgs<br>Gate to Source Charge<br>Qgd<br>Gate to Drain “Miller” Charge<br>~~—————— ~~|VGS= 0 V to -10 V<br>VDD= -75 V,<br>ID= -2.2 A<br>11<br>16<br>nC<br>VGS= 0 V to -6 V<br>7<br>10<br>nC<br>3.2<br>nC<br>1.9<br>nC<br> ~~ne~~||
|VSD<br>Source-Drain Diode  Forward Voltage<br>VGS = 0 V, IS = -2.2 A(Note 2)<br>-0.8<br>-1.3<br>V<br>VGS = 0 V, IS = -2 A<br> (Note 2)<br>-0.8<br>-1.2<br>trr<br>Reverse RecoveryTime<br>IF= -2.2 A, di/dt = 100 A/μs<br>65<br>104<br>ns<br>Qrr<br>Reverse RecoveryCharge<br>157<br>251<br>nC<br>~~ee~~|||
|NOTES:|||
|1. RθJAis determined with the device mounted on a 1 in2pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJCis guaranteed by design while RθCAis determined by|||
|the user's board design.|||
|a) 50 °C/W when mounted on a<br>1 in2pad of 2 oz copper.|50 °C/W when mounted on a<br>b) 125 °C/W when mounted on a<br>minimum pad.||
|**G**<br>**DF**<br>**DS**<br>**SF**<br>**SS**|**G**<br>**DF**<br>**DS**<br>**SF**<br>**SS**||



2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%. 

3. Starting TJ = 25 °C,  L = 3 mH, IAS = -6 A, VDD = -150 V, VGS = -10 V. 100% tested at L = 0.3 mH, IAS = -13 A. 

4. Pulsed Id please refer to Fig 11 SOA graph for more details. 

©2015 Fairchild Semiconductor Corporation FDS86267P Rev 1.0 

www.fairchildsemi.com 

**2** 

## **Typical Characteristics** TJ = 25 °C unless otherwise noted 

**==> picture [454 x 582] intentionally omitted <==**

**----- Start of picture text -----**<br>
40<br>10<br>VGS =  -10 V VGS = -4.5 V PULSE DURATION = 80DUTY CYCLE = 0.5% MAX  μ s<br>8 30<br>VGS =  -6 V VGS = -5 V<br>6 VGS = -5 V<br>VGS = -5.5 V 20<br>4<br>10<br>2 VGS = -4.5 V VGS =  -5.5 V VGS = -6 V VGS =  -10 V<br>PULSE DURATION = 80  μ s<br>DUTY CYCLE = 0.5% MAX 0<br>0 0 2 4 6 8 10<br>0 1 2 3 4 5<br>-VDS, DRAIN TO SOURCE VOLTAGE (V) -ID, DRAIN CURRENT (A)<br>Figure 1.  On Region Characteristics Figure 2.  Normalized On-Resistance<br>vs Drain Current and Gate Voltage<br>2.2 1500<br>2.0 ID = -2.2 A PULSE DURATION = 80  μ s<br>VGS = -10 V DUTY CYCLE = 0.5% MAX<br>1.8<br>ID = -2.2 A<br>1.6 1000<br>1.4<br>1.2<br>1.0 500 TJ = 125  [o] C<br>0.8<br>0.6<br>TJ = 25  [o] C<br>0.4 0<br>-75 -50 -25 0 25 50 75 100 125 150 4 5 6 7 8 9 10<br>TJ, JUNCTION TEMPERATURE ( [o] C) -VGS, GATE TO SOURCE VOLTAGE (V)<br>Figure 3.  Normalized  On  Resistance    Figure 4.   On-Resistance vs  Gate to<br>vs Junction Temperature Source Voltage<br>10 10<br>PULSE DURATION = 80  μ s VGS = 0 V<br>DUTY CYCLE = 0.5% MAX<br>8<br>VDS = -5 V 1<br>6 TJ = 25 [ o] C<br>T J  = 150  [o] C<br>TJ = 150  [o] C 0.1<br>4<br>TJ = 25  [o] C TJ = -55  [o] C<br>0.01<br>2<br>TJ = -55  [o] C<br>0 0.001<br>2 3 4 5 6 7 0.0 0.3 0.6 0.9 1.2 1.5<br>-VGS, GATE TO SOURCE VOLTAGE (V) -VSD, BODY DIODE FORWARD VOLTAGE (V)<br>NORMALIZED<br>, DRAIN CURRENT (A)<br>D<br>-I<br>DRAIN TO SOURCE ON-RESISTANCE<br>) Ω<br>(m<br>DRAIN TO<br>NORMALIZED rDS(on),<br>SOURCE ON-RESISTANCE<br> DRAIN TO SOURCE ON-RESISTANCE<br>, DRAIN CURRENT (A)<br>D<br>-I , REVERSE DRAIN CURRENT (A)<br>S<br>-I<br>**----- End of picture text -----**<br>


**Figure 5.  Transfer Characteristics** 

**Figure 6.    Source to Drain  Diode Forward Voltage vs Source Current** 

©2015 Fairchild Semiconductor Corporation FDS86267P Rev 1.0 

www.fairchildsemi.com 

**3** 

**Typical Characteristics** TJ = 25 °C unless otherwise noted 

**==> picture [455 x 595] intentionally omitted <==**

**----- Start of picture text -----**<br>
10 1000<br>ID = -2.2 A Ciss<br>8<br>VDD = -75 V 100 Coss<br>6<br>VDD = -50 V VDD = -100 V<br>4<br>10 Crss<br>2<br>f = 1 MHz<br>V GS  = 0 V<br>0 1<br>0 3 6 9 12 0.1 1 10 100<br>Qg, GATE CHARGE (nC) -VDS, DRAIN TO SOURCE VOLTAGE (V)<br>Figure 7.  Gate Charge Characteristics Figure 8.  Capacitance vs Drain<br>to Source Voltage<br>50 2.4<br>2.0<br>VGS = -10 V<br>1.6<br>TJ = 25 [ o] C<br>10<br>TJ = 100  [o] C 1.2<br>VGS = -6 V<br>0.8<br>TJ = 125  [o] C<br>0.4<br>R θ JA = 50  [o] C/W<br>1 0.0<br>0.001 0.01 0.1 1 10 25 50 75 100 125 150<br>tAV, TIME IN AVALANCHE (ms) TC, CASE TEMPERATURE (oC)<br>Figure 9. Unclamped Inductive   Figure 10.  Maximum Continuous Drain<br>Switching Capability Current vs Ambient Temperature<br>100 1000<br>THIS AREA IS<br>SINGLE PULSE<br>LIMITED BY r<br>10 DS(on) R θ JA = 125  [o] C/W<br>100  μ s 100 TA = 25  [o] C<br>1<br>1 ms<br>10<br>10 ms<br>0.1 100 ms<br>SINGLE PULSE 1 s<br>0.01 T J = MAX RATED 10 s 1<br>R θ JA = 125 [ o] C/W CURVE BENT TO  DC<br>TA = 25  [o] C MEASURED DATA<br>0.001 0.1<br>0.01 0.1 1 10 100 1000 10-4 10-3 10-2 10-1 1 10 100 1000<br>-VDS, DRAIN to SOURCE VOLTAGE (V) t, PULSE WIDTH (sec)<br>Figure 11.  Forward Bias Safe     Figure 12.  Single  Pulse Maximum<br>Operating Area  Power  Dissipation<br>CAPACITANCE (pF)<br>, GATE TO SOURCE VOLTAGE (V)<br>GS<br>-V<br>DRAIN CURRENT (A)<br>,<br>D<br>-I<br>, AVALANCHE CURRENT (A)<br>AS<br>-I<br>, DRAIN CURRENT (A)<br>D<br>-I<br>PEAK TRANSIENT POWER (W)<br>,<br>(PK)<br>P<br>**----- End of picture text -----**<br>


©2015 Fairchild Semiconductor Corporation FDS86267P Rev 1.0 

www.fairchildsemi.com 

**4** 

**==> picture [502 x 694] intentionally omitted <==**

ON Semiconductor and      are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

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