# Power MOSFET, N Channel, 100 V, 40 A, 6500 µohm, TO-220F, Through Hole

![Product image](https://novapart.co/image/farnell:2825186/)

**URL**: https://novapart.co/products/FDPF085N10A/power-mosfet-n-channel-100-v-40-a-6500-ohm-to-220f
**SKU**: FDPF085N10A
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €1.0400
**Stock**: 1000+
**Lead Time**: 2 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:40A; Drain Source Voltage Vds:100V; On Resistance Rds(on):0.0065ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:4V;

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | PowerTrench |
| Qualification | - |
| Power Dissipation | 33.3W |
| Transistor Mounting | Through Hole |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-220F |
| Drain Source Voltage Vds | 100V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 40A |
| Drain Source On State Resistance | 6500µohm |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2825186/)

## **Is Now Part of** 

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Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. 

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## **FDPF085N10A N-Channel PowerTrench[® ] MOSFET** 

**100 V, 40 A, 8.5 m** Ω 

## **Features** 

- RDS(on) = 6.5 m Ω (Typ.) @ VGS = 10 V, ID = 40 A 

- Fast Switching Speed 

- Low Gate Charge, QG = 31 nC (Typ.) 

- High Performance Trench Technology for Extremely Low R DS(on) 

- High Power and Current Handling Capability 

- RoHS Compliant 

## **Description** 

This N-Channel MOSFET is produced using Fairchild Semiconductor’s advanced PowerTrench[®] process that has been tailored to minimize the on-state resistance while maintaining superior switching performance. 

## **Applications** 

- Consumer Appliances 

- LED TV 

- Synchronous Rectification for ATX / Sever / Telecom PSU 

- Motor Drives and Uninterruptible Power Supplies 

- Micro Solar Inverter 

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D<br>G<br>GDS<br>TO-220F<br>S<br>**----- End of picture text -----**<br>


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Absolute Maximum Ratings TC = 25 [o] C unless otherwise noted.<br>**----- End of picture text -----**<br>


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|WH Symbol Parameter FDPF085N10A Unit<br>|WH VDSS Drain to Source Voltage 100 V<br>pf VGSS Gate to Source Voltage ±20 V<br>ID Drain Current aa - Continuous - Continuous ((TTCC = 25 = 100 [o] C [o] C) ) 2840 A<br>| IDM Drain Current - Pulsed                                          (Note 1 =— ) | lll 160 Ae A<br>ky ~§ |<br>OO EAS Single Pulsed Avalanche Energy                                                                (Note 2) 269 mJ<br>dv/dt tCtC“‘(‘#NCCOCtCOt(‘(™’.Ct#d”SCOtdtstCAEE Peak Diode Recovery dv/dt                                                                         (Note 3) 6.0 V/ns<br>es CC <M 88 |<br>PD Power Dissipation - Derate Above 25(TC = 25 [o] C) [o] C 0.2233.3 W/W [o] C<br>eeLoe<br>|_| TJ, TSTG t(‘(‘(‘(‘ Operating and Storage Temperature Range -55 to +175 |= oC<br>ee[LLC TL Maximum Lead Temperature for Soldering, 1/8” from Case for 5 Seconds ==— iw 300 ee oC<br>Thermal Characteristics<br>Symbol Parameter FDPF085N10A Unit<br>R θ JC Thermal Resistance, Junction to Case, Max.             4.5 oC/W<br>R θ JA Thermal Resistance, Junction to Ambient, Max.             62.5<br>**----- End of picture text -----**<br>


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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**1** 

## **Package Marking and Ordering Information** 

|**Electrical Characteristics**TC= 25oC unless otherwise noted.<br>**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Part Number**<br>**Top Mark**<br>**Package**<br>**Packing Method**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FDPF085N10A<br>FDPF085N10A<br>TO-220F<br>Tube<br>N/A<br>N/A<br>50 units<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min.**<br>**Typ.**<br>**Max.**<br>**Unit**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0 V<br>100<br>-<br>-<br>V<br>ΔBVDSS<br>/ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, Referenced to 25oC<br>-<br>0.07<br>-<br>V/oC<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 80 V, VGS= 0 V<br>-<br>-<br>1<br>μA<br>VDS= 80 V, TC= 150oC<br>-<br>-<br>500<br>IGSS<br>Gate to BodyLeakage Current<br>VGS= ±20 V, VDS= 0 V<br>-<br>-<br>±100<br>nA<br>VGS(th)<br>Gate Threshold Voltage<br>VGS= VDS, ID= 250μA<br>2.0<br>-<br>4.0<br>V<br>RDS(on)<br>Static Drain to Source On Resistance<br>VGS= 10 V, ID= 96 A<br>-<br>6.5<br>8.5<br>mΩ<br>gFS<br>Forward Transconductance<br>VDS= 10 V, ID= 96 A<br>-<br>76<br>-<br>S<br>Ciss<br>Input Capacitance<br>VDS= 50 V, VGS= 0 V,<br>f = 1 MHz<br>-<br>2025<br>2695<br>pF<br>Coss<br>Output Capacitance<br>-<br>468<br>620<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>-<br>20<br>-<br>pF<br>Coss(er)<br>EngryRelated Output Capacitance<br>VDS= 50 V, VGS= 0 V<br>-<br>752<br>-<br>pF<br>Qg(tot)<br>Total Gate Charge at 10V<br>-<br>31<br>40<br>nC<br>~~oe~~<br>~~ee~~<br>~~==~~<br>~~EES~~|
|---|
|VGS= 10 V, VDS= 50 V,<br>Qgs<br>Gate to Source Gate Charge<br>-<br>9.7<br>-<br>nC|
|ID= 96 A<br>Qgs2<br>Gate Charge Threshoid to Plateau<br>-<br>5.0<br>-<br>nC|
|(Note 4)<br>Qgd<br>Gate to Drain “Miller” Charge<br>-<br>7.5<br>-<br>nC|
|ESR<br>Equivalent Series Resistance(G-S)<br>f = 1 MHz<br>-<br>0.97<br>-<br>Ω|
|**Switching Characteristics**|
|td(on)<br>Turn-On DelayTime<br>VDD= 50 V, ID= 96 A,<br>VGS= 10 V, RG= 4.7Ω<br>(Note 4)<br>-<br>18<br>46<br>ns<br>tr<br>Turn-On Rise Time<br>-<br>22<br>54<br>ns<br>td(off)<br>Turn-Off DelayTime<br>-<br>29<br>68<br>ns<br>tf<br>Turn-Off Fall Time<br>-<br>8<br>26<br>ns<br>~~===~~|
|**Drain-Source Diode Characteristics**<br>IS<br>Maximum Continuous Drain to Source Diode Forward Current<br>-<br>-<br>40<br>A<br>ISM<br>Maximum Pulsed Drain to Source Diode Forward Current<br>-<br>-<br>160<br>A<br>VSD<br>Drain to Source Diode Forward Voltage<br>VGS= 0 V, ISD= 96 A<br>-<br>-<br>1.3<br>V<br>trr<br>Reverse RecoveryTime<br>VDD= 50 V,VGS= 0 V, ISD= 96 A,<br>dIF/dt = 100 A/μs<br>-<br>59<br>-<br>ns<br>Qrr<br>Reverse RecoveryCharge<br>-<br>80<br>-<br>nC<br>**Notes:**<br>1. Repetitive rating: pulse-width limited by maximum junction temperature.<br>~~oa~~<br>~~eeenoee~~|
|2. L = 3 mH, IAS= 13.4 A, RG= 25Ω, starting TJ= 25°C.|



3. ISD ≤ 40 A, di/dt ≤ 200 A/ μ s, VDD ≤ BVDSS, starting TJ = 25 ° C. 

4. Essentially independent of operating temperature typical characteristics. 

www.fairchildsemi.com 

©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**2** 

## **Typical Performance Characteristics** 

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Figure 1. On-Region Characteristics Figure 2. Transfer Characteristics<br>500 300<br>VGS = 15.0V<br>           10.0V<br>             8.0V 100<br>             6.5V<br>             6.0V<br>100              5.5V 175oC<br>             5.0V<br>25oC<br>10<br>-55oC<br>a *Notes: Vaan *Notes:<br>10    1. 250 μ s Pulse Test    1. VDS = 10V<br>   2. TC = 25 [o] C    2. 250 μ s Pulse Test<br>5 1<br>0.1 1 5 2 3 4 5 6 7<br>VDS, Drain-Source Voltage[V] VGS, Gate-Source Voltage[V]<br>Figure 3. On-Resistance Variation vs.  Figure 4. Body Diode Forward Voltage<br>                     Drain Current and Gate Voltage                  Variation vs. Source Current<br>                                                                                                               and Temperature<br>18 500<br>*Note: TC = 25 [o] C<br>16<br> 175 [o] C<br>TT 100 =<br>VGS = 10V<br>12<br>25 [o] C<br>10<br>8<br>V GS = 20V *Notes:<br>1. V GS  = 0V<br>2. 250 μ s Pulse Test<br>4 = 1 He<br>0 100 200 300 400 0.3 0.6 0.9 1.2 1.5<br>ID, Drain Current [A] VSD, Body Diode Forward Voltage [V]<br>Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics<br>10000 10<br>VDS = 20V<br>Ciss 8 VDS = 50V<br>VDS = 80V<br>1000<br>Coss 6<br>4<br>*Note:<br>100    1. VGS = 0V<br>   2. f = 1MHz Crss<br>2<br>Ciss = Cgs + Cgd ( Cds = shorted )<br>Coss = Cds + Cgd<br>Crss = Cgd *Note: ID = 96A<br>10 ag 0 -<br>0.1 1 10 100 0 7 14 21 28 35<br>VDS, Drain-Source Voltage [V] Qg, Total Gate Charge [nC]<br>, Drain Current[A]ID , Drain Current[A]ID<br>] ,<br>Ω<br>m<br>[<br>DS(ON)<br>R<br>, Reverse Drain Current [A]<br>Drain-Source On-Resistance IS<br>, Gate-Source Voltage [V]<br>Capacitances [pF] GS<br>V<br>**----- End of picture text -----**<br>


**and Temperature** 

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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**3** 

## **Typical Performance Characteristics** (Continued) 

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       Figure 7. Breakdown Voltage Variation                      Figure 8. On-Resistance Variation<br>                        vs. Temperature                                                            vs. Temperature<br>1.12 2.5<br>1.08 eeeeeennnapen<br>2.0<br>1.04 PA<br>1.5<br>1.00<br>aa 4ln ne<br>1.0<br>0.96 *Notes: *Notes:<br>   1. VGS = 0V    1. VGS = 10V<br>   2. ID = 250 μ A    2. ID = 96A<br>0.92 ianPaaneee 0.5<br>-80 -40 0 40 80 120 160 200 -80 -40 0 40 80 120 160 200<br>TJ, Junction Temperature  [ [o] C ] TJ, Junction Temperature  [ [o] C ]<br>        Figure 9. Maximum Safe Operating Area                   Figure 10. Maximum Drain Current<br>                                                                                                                 vs. Case Temperature<br>500 45<br>100 VGS= 10V<br>100 μ s 36<br>=e ee me<br>1ms<br>10<br>27<br>10ms<br>oe PANE<br>1 Operation in This Area  100ms<br>is Limited by R  He DS(on) DC 18 pK<br>*Notes:<br>0.1    1. TC = 25 [o] C SAE 9 PENG<br>   2. TJ = 175 [o] C R θ JC = 4.5 [o] C/W<br>   3. Single Pulse<br>0.01 Hee 0 Po EE<br>0.1 1 10 100 200 25 50 75 100 125 150 175<br>VDS, Drain-Source Voltage [V] TC, Case Temperature  [ [o] C ]<br>       Figure 11. Eoss vs. Drain to Source Voltage               Figure 12. Unclamped Inductive<br>                                                                                                                   Switching Capability<br>2.5 30<br>If R = 0<br>tAV = (L)(IAS)/(1.3*RATED BVDSS-VDD)<br>If R = 0<br>tAV = (L/R)In[(IAS*R)/(1.3*RATED BVDSS-VDD)+1]<br>2.0<br>1.5 PETA 10 i wn:ee STARTING TJ = 25oC<br>STARTING TJ = 150 o C<br>1.0 faanne eee Similiar<br>0.5<br>Ean Bn NS<br>0.0 et + tt 1 TT EMLTE<br>0 20 40 60 80 100 0.01 0.1 1 10 100 300<br>VDS, Drain to Source Voltage  [ V ] tAV, TIME IN AVALANCHE (ms)<br>, [Normalized] , [Normalized]<br>DSS DS(on)<br>BV R<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br>, Drain Current [A]<br>ID , Drain Current [A]<br>ID<br>]<br>J<br>[μ<br>,<br>OSS<br>E<br>, AVALANCHE CURRENT (A)<br>IAS<br>**----- End of picture text -----**<br>


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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**4** 

## **Typical Performance Characteristics** (Continued) 

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Figure 13. Transient Thermal Response Curve<br>6<br>0.5<br>1 0.2 ae PDM<br>0.1 t1<br>0.05 fF a t2<br>*Notes:<br>0.1 0.02    1. Z θ JC(t) = 4.5 [o] C/W Max.<br>0.01    2. Duty Factor, D= t1/t2<br>   3. TJM - TC = PDM * Z θ JC(t)<br>Single pulse<br>0.01<br>10-5 10-4 10-3 10-2 10-1 1 10 100<br>  tRectangular Pulse Duration [sec]1, Rectangular Pulse Duration [sec]<br>o ] C/W] ZJC θ<br>[<br>(t), Thermal Response [<br>ZThermal Response JC θ<br>**----- End of picture text -----**<br>


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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**5** 

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IG = const.<br>F<br>Charge<br> Figure 14. Gate Charge Test Circuit & Waveform<br>VDS RL VDS 90%<br>VGS VDD<br>RG<br>10%<br>V 10V GS DUT VGS<br>td(on) tr td(off) tf<br>=n wa t on 4S t off<br> Figure 15. Resistive Switching Test Circuit & Waveforms<br>Vos oy5 EASa“a Las?LIAS<br>lo oy} BVpss<br>of las<br>>in (ad) =F Von Ip (t)<br>VGS TL DUT Vop<br>**----- End of picture text -----**<br>


**Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms** 

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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**6** 

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DUT +<br>VDS<br>_<br>I SD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT VDD<br>VGS • dv/dt controlled by  RG<br>• ISD controlled by pulse period<br>Gate Pulse Width<br>VGS D = --------------------------<br>Gate Pulse Period 10V<br>( Driver )<br>ff}<br>IFM , Body Diode Forward Current<br>I SD<br>( DUT ) di/dt<br>IRM<br>4 Ne<br>Body Diode Reverse Current<br>VDS<br>( DUT ) Body Diode Recovery dv/dt<br>VSD VDD<br>eerie<br>Body Diode<br>Forward Voltage Drop<br> Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms<br>**----- End of picture text -----**<br>


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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**7** 

## **Mechanical Dimensions** 

## **Figure 18. TO220, Molded, 3-Lead, Full Pack, EIAJ SC91, Straight Lead** 

_Package drawings are provided as a service to customers considering Fairchild components. Drawings may change in any manner without notice. Please note the revision and/or date on the drawing and contact a Fairchild Semiconductor representative to verify or obtain the most recent revision. Package specifications do not expand the terms of Fairchild’s worldwide terms and conditions, specifically the warranty therein, which covers Fairchild products._ 

_Always visit Fairchild Semiconductor’s online packaging area for the most recent package drawings: http://www.fairchildsemi.com/package/packageDetails.html?id=PN_TF22S-003_ 

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**8** 

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|**Datasheet Identification**|**Product Status**|**Definition**|
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|Advance Information|Formative / In Design|Datasheet contains the design specifications for product development. Specifications<br>may change in any manner without notice.|
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Rev. I66 

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©2011 Fairchild Semiconductor Corporation FDPF085N10A Rev. C1 

**9** 

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---

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