# Power MOSFET, N Channel, 500 V, 11.5 A, 0.52 ohm, TO-220, Through Hole

![Product image](https://novapart.co/image/farnell:3368760/)

**URL**: https://novapart.co/products/FDP12N50NZ/power-mosfet-n-channel-500-v-115-a-052-ohm-to-220
**SKU**: FDP12N50NZ
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.8200
**Stock**: 1000+
**Lead Time**: 2 days (indicative)

## Specifications

| Parameter | Value |
|---|---|
| Svhc | No SVHC (15-Jan-2018) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | UniFET II |
| Qualification | - |
| Power Dissipation | 170W |
| Transistor Mounting | Through Hole |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-220 |
| Drain Source Voltage Vds | 500V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 11.5A |
| Drain Source On State Resistance | 0.52ohm |
| Gate Source Threshold Voltage Max | 5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3368760/)

## **Is Now Part of** 

## **To learn more about ON Semiconductor, please visit our website at www.onsemi.com** 

Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. 

ON Semiconductor and the ON Semiconductor logo are trademarks of Semiconductor Components Industries, LLC dba ON Semiconductor or its subsidiaries in the United States and/or other countries. ON Semiconductor owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of ON Semiconductor’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent-Marking.pdf. ON Semiconductor reserves the right to make changes without further notice to any products herein. ON Semiconductor makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does ON Semiconductor assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. Buyer is responsible for its products and applications using ON Semiconductor products, including compliance with all laws, regulations and safety requirements or standards, regardless of any support or applications information provided by ON Semiconductor. “Typical” parameters which may be provided in ON Semiconductor data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. ON Semiconductor does not convey any license under its patent rights nor the rights of others. ON Semiconductor products are not designed, intended, or authorized for use as a critical component in life support systems or any FDA Class 3 medical devices or medical devices with a same or similar classification in a foreign jurisdiction or any devices intended for implantation in the human body. Should Buyer purchase or use ON Semiconductor products for any such unintended or unauthorized application, Buyer shall indemnify and hold ON Semiconductor and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that ON Semiconductor was negligent regarding the design or manufacture of the part. ON Semiconductor is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. 

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## **FDP12N50NZ / FDPF12N50NZ N-Channel UniFET[TM] II MOSFET 500 V, 11.5 A, 520 m**  

## **Features** 

- RDS(on) = 460 m (Typ.) @ VGS = 10 V, ID = 5.75 A 

- Low Gate Charge (Typ. 23 nC ) 

- Low Crss (Typ. 14 pF ) 

- 100% Avalanche Tested 

- ESD Improved Capability 

- RoHS Compliant 

## **Applications** 

## **Description** 

UniFET[TM] II MOSFET is Fairchild Semiconductor’s high voltage MOSFET family based on advanced planar stripe and DMOS technology. This advanced MOSFET family has the smallest on-state resistance among the planar MOSFET, and also provides superior switching performance and higher avalanche energy strength. In addition, internal gate-source ESD diode allows UniFET II MOSFET to withstand over 2kV HBM surge stress. This device family is suitable for switching power converter applications such as power factor correction (PFC), flat panel display (FPD) TV power, ATX and electronic lamp ballasts. 

- LCD/LED/PDP TV 

- Lighting 

- Uninterruptible Power Supply 

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D<br>G<br>GDS<br>TO-220 GDS TO-220F<br>S<br>**----- End of picture text -----**<br>


## **MOSFET Maximum Ratings** TC = 25[o] C unless otherwise noted. 

**Symbol Parameter FDP12N50NZ FDPF12N50NZ Unit** VDSS Drain to Source Voltage 500 V VGSS Gate to Source Voltage ±25 V ID Drain Current - Continuous - Continuous ((TTCC = 25 = 100[o] C[o] C) ) 11.56.9 11.5*6.9* A IDM Drain Current - Pulsed                                        (Note 1) 46 46* A EAS Single Pulsed Avalanche Energy (Note 2) 560 mJ IAR Avalanche Current                                                                                (Note 1) 11.5 A EAR Repetitive Avalanche Energy (Note 1) 17 mJ MOSFET dv/dt Ruggedness 20 V/ns dv/dt ~~——————~~ Peak Diode Recovery dv/dt                                                                 (Note 3) 10 V/ns PD Power Dissipation - Derate above 25(TC = 25[o] C)[o] C 1.37170 0.3342 W/W[o] C ~~ee~~ TJ, TSTG Operating and Storage Temperature Range -55 to +150 oC TL Maximum Lead Temperature for Soldering,1/8” from Case for 5 Seconds 300 oC ~~es ee eeee~~ *Drain current limited by maximum junction temperature **Thermal Characteristics Symbol Parameter FDP12N50NZ FDPF12N50NZ Unit** RJC Thermal Resistance, Junction to Case, Max. 0.73 3.0 oC/W ~~—_———————————~~ RJA Thermal Resistance, Junction to Ambient, Max. ~~es~~ 62.5 ~~ee~~ 62.5 ©2010 Fairchild Semiconductor Corporation **1** www.fairchildsemi.com FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**Package Marking and Ordering Information** 

**Device Marking Device Package Reel Size Tape Width Quantity** FDP12N50NZ FDP12N50NZ TO-220 Tube N/A 50 units FDPF12N50NZ FDPF12N50NZ TO-220F Tube N/A 50 units **Electrical Characteristics** TC = 25[o] C unless otherwise noted. ~~So~~ **Symbol Parameter Test Conditions Min. Typ. Max. Unit Off Characteristics** BVDSS Drain to Source Breakdown Voltage ID = 250A, VGS = 0V, TJ = 25[o] C 500 - - V / BVTDSSJ Breakdown Voltage Temperature Coefficient ID = 250A, Referenced to 25[o] C - 0.5 - V/[o] C IDSS Zero Gate Voltage Drain Current VVDSDS = 500V, V = 400V, TC GS = 125= 0V[o] C -- -- 101 A ~~aoe~~ IGSS Gate to Body Leakage Current VGS = ±25V, VDS = 0V - - ±10 A **On Characteristics** VGS(th) Gate Threshold Voltage VGS = VDS, ID = 250A 3.0 - 5.0 V RDS(on) Static Drain to Source On Resistance VGS = 10V, ID = 5.75A - 0.46 0.52  ~~———~~ gFS Forward Transconductance VDS = 20V, ID = 5.75A - 12 - S **Dynamic Characteristics** Ciss Input Capacitance - 945 1235 pF Coss Output Capacitance Vf = 1MHzDS = 25V, VGS = 0V - 155 205 pF Crss Reverse Transfer Capacitance - 14 20 pF Qg Total Gate Charge at 10V VDS = 400V, ID = 11.5A - 23 30 nC Qgs Gate to Source Gate Charge VGS = 10V - 5.5 - nC ~~SS~~ Qgd Gate to Drain “Miller” Charge (Note 4) - 9.6 - nC **Switching Characteristics** td(on) Turn-On Delay Time VDD = 250V, ID = 11.5A - 20 50 ns tr Turn-On Rise Time RG = 25 - 50 110 ns td(off) Turn-Off Delay Time - 60 130 ns tf Turn-Off Fall Time (Note 4) - 45 100 ns ~~=—————~~ **Drain-Source Diode Characteristics** ~~===~~ IS Maximum Continuous Drain to Source Diode Forward Current - - 11.5 A ISM Maximum Pulsed Drain to Source Diode Forward Current - - 46 A VSD Drain to Source Diode Forward Voltage VGS = 0V, ISD = 11.5A - - 1.4 V trr Reverse Recovery Time VGS = 0V, ISD = 11.5A - 315 - ns Qrr Reverse Recovery Charge dIF/dt = 100A/s - 2.0 - C **Notes:** ~~SSS~~ 1. Repetitive Rating: Pulse width limited by maximum junction temperature ~~SE~~ 2. L = 8.5mH, IAS = 11.5A, VDD = 50V, RG = 25, Starting TJ = 25C 

3. ISD 11.5A, di/dt  200A/s, VDD  BVDSS, Starting TJ = 25C 

4. Essentially Independent of Operating Temperature Typical Characteristics 

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©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**2** 

## **Typical Characteristics** 

**Figure 1. On-Region Characteristics** 

**Figure 2. Transfer Characteristics** 

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30 50<br>VGS = 15.0 V<br>           10.0 V<br>             8.0 V<br>10<br>             7.0 V<br>             6.5V 10<br>             6.0 V<br>             5.5 V     150oC<br>25oC<br>1<br>Bs 1 Ail<br>-55oC<br>*Notes: *Notes:<br>   1. 250  s Pulse Test    1. VDS = 20V<br>   2. TC = 25 [o] C    2. 250  s Pulse Test<br>0.1 Z|) 0.1 TA<br>0.1 1 10 20 3 4 5 6 7 8 9 10<br>VDS, Drain-Source Voltage[V] VGS, Gate-Source Voltage[V]<br>Figure 3. On-Resistance Variation vs.  Figure 4. Body Diode Forward Voltage<br>                     Drain Current and Gate Voltage                  Variation vs. Source Current<br>                                                                                                               and Temperature<br>1.0 100<br>0.9 Gagan<br>0.8<br> 150 [o] C<br>0.7 10<br>So 25 [o] C<br>0.6 VGS = 10V<br>0.5 *Notes:<br>VGS = 20V 1. VGS = 0V<br>0.4 eT *Note: TC = 25 [o] C 1 fh[| 2. 250  s Pulse Test<br>0 cet 6 12 18 24 30 | 0.4 0.6 0.8 1.0 1.2 1.4<br>ID, Drain Current [A] VSD, Body Diode Forward Voltage [V]<br>Figure 5. Capacitance Characteristics Figure 6. Gate Charge Characteristics<br>2500 10<br>Ciss = Cgs + Cgd ( Cds = shorted )<br>Coss = Cds + Cgd<br>2000 Crss = Cgd 8 V DS = 100V<br>Eee *Note: VDS = 250V<br>   1. VGS = 0V VDS = 400V<br>1500    2. f = 1MHz 6<br>C iss<br>1000 4<br>500 C oss 2<br>C rss<br>*Note: ID = 11.5A<br>0 PSY 0 AR<br>0.1 1 10 30 0 5 10 15 20 25<br>VDS, Drain-Source Voltage [V] Qg, Total Gate Charge [nC]<br>, Drain Current[A] , Drain Current[A]<br>ID ID<br>] ,<br><br>[<br>DS(ON)<br>R<br>, Reverse Drain Current [A]<br>Drain-Source On-Resistance IS<br>Capacitances [pF] , Gate-Source Voltage [V]<br>GS<br>V<br>**----- End of picture text -----**<br>


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©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**3** 

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Typical Characteristics  (Continued)<br>       Figure 7. Breakdown Voltage Variation                      Figure 8. On-Resistance Variation<br>                        vs. Temperature                                                            vs. Temperature<br>1.20 2.8<br>1.15 ee 2.4<br>ee<br>1.10 pr<br>1.05 py 2.0<br>1.6<br>1.00<br>1.2<br>0.95<br>*Notes: 0.8 * Notes:<br>0.90    1. V GS  = 0V    1. VGS = 10V<br>   2. I D  = 250uA    2. ID = 5.75A<br>0.85 py 0.4 ee<br>-100 -50 0 50 100 150 -75 -50 0 50 100 150<br>TJ, Junction Temperature  [ [o] C ] TJ, Junction Temperature  [ [o] C ]<br>       Figure 9. Maximum Safe Operating Area                    Figure 10.Maximum Safe Operating Area<br>                         - FDPF12N50NZ                                                               - FDP12N50NZ<br>100 100<br>10  s 30  s<br>100  s 100  s<br>10 1ms 10 1ms<br>10ms<br>10ms<br>100 ms<br>DC DC<br>1 1<br>Operation in This Area<br>Operation in This Area<br>ARS is Limited by RDS(on) ESS is Limited by R DS(on)<br>*Notes:<br>0.1    1. TC = 25 [o] C 0.1 * Notes :<br>   2. TJ = 150 [o] C    1. TC = 25 [o] C<br>   3. Single Pulse    2. T J  = 150 [o] C<br>   3. Single Pulse<br>0.01 eMSu 0.01 ES<br>1 10 100 1000 1 10 100 1000<br>VDS, Drain-Source Voltage [V] VDS, Drain-Source Voltage [V]<br>         Figure 11. Maximum   Drain   Current   vs. Case Temperature<br>12<br>10<br>8<br>6<br>4<br>2<br>0<br>25 50 75 100 125 150<br>TC,Case Temperature  [ [o] C ]<br>, [Normalized] , [Normalized]<br>DSS DS(on)<br>BV R<br>Drain-Source On-Resistance<br>Drain-Source Breakdown Voltage<br>FDP12N50NZ / FDPF12N50NZ — N-Channel UniFET<br>TM<br> II MOSFET<br>, Drain Current [A]<br>, Drain Current [A]ID ID<br>Drain Current [A]<br>ID,<br>**----- End of picture text -----**<br>


www.fairchildsemi.com 

©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**4** 

## **Typical Characteristics** (Continued) 

## **Figure 12. Transient Thermal Response Curve  - FDP12N50NZ** 

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5<br>1<br>0.5<br>Sei sine gateSn<br>0.2<br>0.1 0.1 PDM<br>0.05<br>0.02 t1<br>0.01 t 2<br>0.01 Single pulse aT * Notes : We<br>   1. Z  JC(t) = 0.73 [o] C/W Max.<br>   2. Duty Factor, D=t1/t2<br>   3. T JM  - T C  = P DM  * Z  JC (t)<br>0.001<br>10-5 10-4 10-3 10-2 10-1 1 10<br>t1 Rectangular Pulse Duration [sec] , Square Wave Pulse Duration [sec]<br>Figure 13. Transient Thermal Response Curve  - FDPF12N50NZ<br>5<br>D=0.5<br>1<br>0.2<br>0.1 PDM<br>0.05 t1<br>10-1 t2<br>0.02 *Notes:<br>0.01<br>   1. Z  JC(t) = 3.0 [o] C/W Max.<br>   2. Duty Factor, D = t 1 /t 2<br>single pulse    3. TJM - TC = PDM * Z  JC(t)<br>10-2<br>10-5 10-4 10-3 10-2 10-1 1 10<br>t1, Square Wave Pulse Duration [sec] t1, Square Wave Pulse Duration [sec]<br>o ] C/W]    ZJC <br>[<br>(t), Thermal Response [<br>Thermal Response  JC<br>   Z<br>oC/W]<br>(t), Thermal Response<br>(t), Thermal Response [<br>Z JC JC <br>   Z<br>**----- End of picture text -----**<br>


**Figure 13. Transient Thermal Response Curve  - FDPF12N50NZ** 

www.fairchildsemi.com 

©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**5** 

**Figure 14. Gate Charge Test Circuit & Waveform** 

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IG = const.<br>F<br>Charge<br> Figure 15. Resistive Switching Test Circuit & Waveforms<br>VDS RL VDS 90%<br>VGS VDD<br>RG<br>10%<br>V 10V GS DUT VGS<br>td(on) tr td(off) tf<br>=n wa t on 4S t off<br> Figure 16. Unclamped Inductive Switching Test Circuit & Waveforms<br>Vos oy5 EASa“a Las?LIAS<br>lo oy} BVpss<br>of las<br>>in (ad) =F Von Ip (t)<br>VGS TL DUT Vop<br>**----- End of picture text -----**<br>


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©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**6** 

**Figure 17. Peak Diode Recovery dv/dt Test Circuit & Waveforms** 

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DUT +<br>VDS<br>_<br>I SD<br>L<br>Driver<br>RG<br>Same Type<br>as DUT VDD<br>VGS • dv/dt controlled by  RG<br>• ISD controlled by pulse period<br>Gate Pulse Width<br>VGS D = --------------------------<br>Gate Pulse Period 10V<br>( Driver )<br>ff}<br>IFM , Body Diode Forward Current<br>I SD<br>( DUT ) di/dt<br>IRM<br>4 Ne<br>Body Diode Reverse Current<br>VDS<br>( DUT ) Body Diode Recovery dv/dt<br>VSD VDD<br>eerie<br>Body Diode<br>Forward Voltage Drop<br>**----- End of picture text -----**<br>


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©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**7** 

## **Mechanical Dimensions** 

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TO-220 3L<br>SUPPLIERSHAPE “B” PACKAGE24.00<br>10.87 2.50<br>PACKAGE 165A|<br>1<br>IS ft ‘ 3.40250<br>18.30<br>13.00<br>b Be 3% “<br>S42 83 Ay<br>MEE 440<br>| ir<br>||<br>|<br>1 14.04<br>213 || 12.70<br>|<br>FRONT VIEWS |<br>uw! 4<br>1.62 | | 1.82<br>1-8 Ay 267 110<br>«00<br>O55<br>- 240<br>- cr 3°5F |J Bf3<br>|<br>A | 1<br>FDP12N50NZ / FDPF12N50NZ — N-Channel UniFET<br>TM<br> II MOSFET<br>**----- End of picture text -----**<br>


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©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**8** 

## **Mechanical Dimensions** 

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TO-220F 3L<br>**----- End of picture text -----**<br>


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©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

**9** 

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AccuPower™ F-PFS™ OPTOPLANAR[®] ®* AttitudeEngine™ FRFET[®] tm[®] Eceven Awinda[®] Global Power Resource[SM] AX-CAP[®] * GreenBridge™ Power Supply WebDesigner™ TinyBoost[®] BitSiC™ Green FPS™ PowerTrench[®] TinyBuck[®] Build it Now™ Green FPS™ e-Series™ PowerXS™ TinyCalc™ CorePLUS™ G _max_ ™ Programmable Active Droop™ TinyLogicTINYOPTO™[®] CorePOWER™ GTO™ QFET[®] _CROSSVOLT_ ™ IntelliMAX™ QS™ TinyPower™ CTL™ ISOPLANAR™ Quiet Series™ TinyPWM™ TinyWire™ Current Transfer Logic™DEUXPEED[®] Marking Small Speakers Sound Louder and Better™ RapidConfigure™™ TranSiC™ TriFault Detect™ Dual Cool™ MegaBuck™ Oo TRUECURRENT[®] * EcoSPARKEfficentMax™[®] MICROCOUPLER™MicroFET™ Saving our world, 1mW/W/kW at a time™SignalWise™ SerDes™ ESBC™ MicroPak™ SmartMax™ ® MicroPak2™ SMART START™ MillerDrive™ Solutions for Your Success™ UHC[®] ~~=~~ WZ4... Fairchild[®] MotionMax™ SPM[®] Ultra FRFET™ Fairchild Semiconductor[®] MotionGrid[®] STEALTH™ UniFET™ FACT Quiet Series™ MTi[®] SuperFET[®] VCX™ FACT[®] MTx[®] SuperSOT™-3 VisualMax™ FastvCore™ MVN[®] SuperSOT™-6 VoltagePlus™ FETBench™ mWSaver[®] SuperSOT™-8 XS™ FPS™ OptoHiT™ SupreMOS[®] Xsens™ OPTOLOGIC[®] SyncFET™ 仙童[®] Sync-Lock™ 

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## **PRODUCT STATUS DEFINITIONS** 

|**Definition of Terms**|||
|---|---|---|
|**Datasheet Identification**|**Product Status**|**Definition**|
|Advance Information|Formative / In Design|Datasheet contains the design specifications for product development. Specifications<br>may change in any manner without notice.|
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Rev. I77 

©2010 Fairchild Semiconductor Corporation FDP12N50NZ / FDPF12N50NZ Rev. 1.5 

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**10** 

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19521 E. 32nd Pkwy, Aurora, Colorado 80011 USA **Europe, Middle East and Africa Technical Support: Phone** : 303−675−2175 or 800−344−3860 Toll Free USA/Canada Phone: 421 33 790 2910 **Fax** : 303−675−2176 or 800−344−3867 Toll Free USA/Canada **Japan Customer Focus Center Email** : orderlit@onsemi.com Phone: 81−3−5817−1050 

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## Links

- [View this product on Novapart](https://novapart.co/products/FDP12N50NZ/power-mosfet-n-channel-500-v-115-a-052-ohm-to-220)
- [Request a quote for this part](https://novapart.co/quote/)
- [Supplier page](https://es.farnell.com/onsemi/fdp12n50nz/mosfet-n-ch-500v-11-5a-150deg/dp/3368760)
---

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