# Power MOSFET, P Channel, 150 V, 22 A, 0.053 ohm, Power 56, Surface Mount

![Product image](https://novapart.co/image/farnell:2822538RL/)

**URL**: https://novapart.co/products/FDMS86263P/power-mosfet-p-channel-150-v-22-a-0053-ohm-56
**SKU**: FDMS86263P
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €1.3900
**Stock**: 1000+
**Lead Time**: 141 days (indicative)

## Description

Transistor Polarity:P Channel; Continuous Drain Current Id:-22A; Drain Source Voltage Vds:-150V; On Resistance Rds(on):0.042ohm; Rds(on) Test Voltage Vgs:-10V; Threshold Voltage Vgs

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | Lead (25-Jun-2025) |
| No. Of Pins | 8Pins |
| Channel Type | P Channel |
| Product Range | PowerTrench |
| Qualification | - |
| Power Dissipation | 104W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | Power 56 |
| Drain Source Voltage Vds | 150V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 22A |
| Drain Source On State Resistance | 0.053ohm |
| Gate Source Threshold Voltage Max | 2.9V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2822538RL/)

## **Is Now Part of** 

## **To learn more about ON Semiconductor, please visit our website at www.onsemi.com** 

Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. 

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## **FDMS86263P** 

## **P-Channel PowerTrench[®] MOSFET -150 V, -22 A, 53 m** Ω 

## **Features** 

Max rDS(on) = 53 mΩ at  VGS = -10 V, ID = -4.4 A Max rDS(on) = 64 mΩ at  VGS = -6 V, ID = -4 A 

Very low Rds-on in Mid-Voltage P-Channel silicon technology optimized for low Qg 

This product is optimised for fast switching applications as well as load switch applications 

## **General Description** 

This P-Channel MOSFET is produced using Fairchild Semiconductor‘s advanced PowerTrench **[®]** technology. This very high density process is especially tailored to minimize on-state resistance and optimized for superior switching performance. 

## **Applications** 

|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|**FDMS86263P P-Channel PowerTrench® MOSFET**<br>100% UIL tested<br>RoHS Compliant<br>Active Clamp Switch<br>Load Switch<br>|<br>a<br>|a|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|**Top**|||**S**<br>**Bottom**|**S**<br>Pin 1<br>**S**<br>**D**<br>~~—~~<br>7<br>fa||||||||||
|||||**G**<br>**S**||**S**||||**D**||||
|||||||**S**||||**D**||||
|**D **|**D D**||**D**|||**G**||||**D**||||
|**Power 56**||||||||||||||
|**MOSFET Maximum Ratings  **TA= 25 °C unless otherwise noted|= 25 °C unless otherwise noted||= 25 °C unless otherwise noted|||||||||||
|**Symbol**||**Parameter**|||||||**Ratings**||**Units**|||
|VDS<br>Drain to Source Voltage|||||||||-150||V|||
|VGS<br>Gate to Source Voltage|||||||||±25||V|||
|Drain Current   -Continuous|Drain Current   -Continuous|Drain Current   -Continuous|T|TC = 25 °C||= 25 °C|||-22|||||
|ID<br>-Continuous|||T|TA= 25 °C||= 25 °C<br> (Note 1a)|||-4.4||A|||
|-Pulsed|||||||||-70|||||
|EAS<br>Single Pulse Avalanche Energy||||||(Note 3|Note 3)||384||mJ|||
|PD<br>Power Dissipation<br>Power Dissipation|||T|TC= 25 °C<br>TA= 25 °C||= 25 °C<br> (Note 1a)|||104<br>2.5||W|||
|TJ, TSTG<br>Operatingand Storage Junction Tem|e Junction Temperature Range||||||||-55 to +150||°C|||
|**Thermal Characteristics**||||||||||||||
|RθJC<br>Thermal Resistance, Junction to Case|Thermal Resistance, Junction to Case||||||||1.2||°C/W|||
|RθJA<br>Thermal Resistance, Junction to Ambient|Thermal Resistance, Junction to Ambient|||||(Note 1a)|||50|||||
|**Package Marking and Ordering Information**||||||||||||||
|**Device Marking**<br>**Device**|||**Package**|||**Reel Size**|||**Tape Width**|**Quantity**||||
|FDMS86263P<br>FDMS86263P|||Power 56|||13 ’’|||12 mm|3000 units||||



©2014 Fairchild Semiconductor Corporation FDMS86263P Rev.C2 

www.fairchildsemi.com 

**1** 

## **Electrical Characteristics** TJ = 25 °C unless otherwise noted 

|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-116<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-2<br>-2.9<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>7<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -4.4 A<br>42<br>53<br>mΩ<br>VGS= -6 V, ID= -4 A<br>45<br>64<br>VGS= -10 V, ID= -4.4 A,TJ = 125 °C<br>71<br>94<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -4.4 A<br>19<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>2935<br>3905<br>pF<br>Coss<br>Output Capacitance<br>238<br>315<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>11<br>20<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>2.7<br>5.4<br>Ω<br>~~Te~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-116<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-2<br>-2.9<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>7<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -4.4 A<br>42<br>53<br>mΩ<br>VGS= -6 V, ID= -4 A<br>45<br>64<br>VGS= -10 V, ID= -4.4 A,TJ = 125 °C<br>71<br>94<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -4.4 A<br>19<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>2935<br>3905<br>pF<br>Coss<br>Output Capacitance<br>238<br>315<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>11<br>20<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>2.7<br>5.4<br>Ω<br>~~Te~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-116<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-2<br>-2.9<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>7<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -4.4 A<br>42<br>53<br>mΩ<br>VGS= -6 V, ID= -4 A<br>45<br>64<br>VGS= -10 V, ID= -4.4 A,TJ = 125 °C<br>71<br>94<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -4.4 A<br>19<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>2935<br>3905<br>pF<br>Coss<br>Output Capacitance<br>238<br>315<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>11<br>20<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>2.7<br>5.4<br>Ω<br>~~Te~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-150<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-116<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -120 V, VGS = 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-2<br>-2.9<br>-4<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>7<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V, ID= -4.4 A<br>42<br>53<br>mΩ<br>VGS= -6 V, ID= -4 A<br>45<br>64<br>VGS= -10 V, ID= -4.4 A,TJ = 125 °C<br>71<br>94<br>gFS<br>Forward Transconductance<br>VDS= -10 V, ID= -4.4 A<br>19<br>S<br>Ciss<br>Input Capacitance<br>VDS= -75 V, VGS= 0 V,<br>f = 1 MHz<br>2935<br>3905<br>pF<br>Coss<br>Output Capacitance<br>238<br>315<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>11<br>20<br>pF<br>Rg<br>Gate Resistance<br>0.1<br>2.7<br>5.4<br>Ω<br>~~Te~~<br>~~ee~~|
|---|---|---|---|
|**Switching Characteristics**||||
|td(on)<br>Turn-On DelayTime|17|31<br>ns||
|VDD= -75 V, ID= -4.4 A,<br>tr<br>Rise Time|10|21<br>ns||
|VGS= -10 V, RGEN= 6Ω<br>td(off)<br>Turn-Off DelayTime|37|59<br>ns||
|tf<br>Fall Time|14|25<br>ns||
|Qg<br>Total Gate Charge<br>VGS= 0 V to -10 V<br>VDD= -75 V,<br>ID= -4.4 A<br>45<br>63<br>nC<br>Qg<br>Total Gate Charge<br>VGS= 0 V to -6 V<br>29<br>40<br>nC<br>Qgs<br>Gate to Source Charge<br>11.3<br>nC<br>Qgd<br>Gate to Drain “Miller” Charge<br>8.9<br>nC<br>~~—————~~||||
|**Drain-Source Diode Characteristics**||||
|VSD<br>Source to Drain Diode  Forward Voltage<br>VGS = 0 V, IS = -4.4 A<br> (Note 2)<br>-0.79<br>-1.3<br>V<br>VGS = 0 V, IS = -2 A(Note 2)<br>-0.75<br>-1.2<br>trr<br>Reverse RecoveryTime<br>IF= -4.4 A, di/dt = 100 A/μs<br>91<br>146<br>ns<br>Qrr<br>Reverse RecoveryCharge<br>287<br>460<br>nC<br>~~———~~||||
|Notes**:**||||
|1. RθJAis determined with the device mounted on a 1 in2pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJCis guaranteed by design while R|is guaranteed by design while RθCAis determined by|||
|the user's board design.||||



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a) 50 °C/W when mounted  on  a  b) 125 °C/W when mounted on a<br>1 in [2 ] pad of  2 oz  copper            minimum pad of 2 oz copper.<br>i)<br>G DF DS SF SS G DF DS SF SS<br>**----- End of picture text -----**<br>


2. Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0%. 

3. Starting TJ = 25 °C; P-ch: L = 3 mH, IAS = -16 A, VDD = -150 V, VGS = -10 V. 100% test at L = 0.1 mH, IAS = -52 A. 

©2014 Fairchild Semiconductor Corporation FDMS86263P Rev.C2 

www.fairchildsemi.com 

**2** 

c **Typical Characteristics** TJ = 25 °C unless otherwise noted 

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70 4<br>VGS = -10 V<br>VGS = -6 V VGS = -4.5 V<br>56<br>VGS = -5.5 V 3<br>42 VGS = -5 V<br>2<br>28 VGS = -5 V VGS = -5.5 V<br>1<br>14 VGS = -4.5 V PULSE DURATION = 80 DUTY CYCLE = 0.5% MAX μ s PULSE DURATION = 80DUTY CYCLE = 0.5% MAX  μ s VGS = -6 V VGS = -10 V<br>0 0<br>0 1 2 3 4 5 0 14 28 42 56 70<br>-VDS, DRAIN TO SOURCE VOLTAGE (V) -ID, DRAIN CURRENT (A)<br>Figure 1.  On Region Characteristics Figure 2.  Normalized On-Resistance<br>vs Drain Current and Gate Voltage<br>2.2 140<br>2.0 ID = -4.4 A PULSE DURATION = 80 DUTY CYCLE = 0.5% MAX μ s<br>VGS = -10 V 120<br>1.8 ID = -4.4 A<br>1.6 100<br>1.4 TJ = 125  [o] C<br>80<br>1.2<br>1.0 60<br>0.8 TJ = 25  [o] C<br>40<br>0.6<br>0.4 20<br>-75 -50 -25 0 25 50 75 100 125 150 3 4 5 6 7 8 9 10<br>TJ, JUNCTION TEMPERATURE ( [o] C) -VGS, GATE TO SOURCE VOLTAGE (V)<br>Figure 3.  Normalized  On  Resistance    Figure 4.   On-Resistance vs  Gate to<br>vs Junction Temperature Source Voltage<br>70 100<br>PULSE DURATION = 80  μ s VGS = 0 V<br>DUTY CYCLE = 0.5% MAX<br>56 10<br>VDS = -10 V<br>T J  = 150  [o] C<br>42 1<br>TJ = 150  [o] C TJ = 25 [ o] C<br>28 0.1<br>TJ = 25  [o] C<br>14 0.01 TJ = -55  [o] C<br>TJ = -55  [o] C<br>0 0.001<br>2 3 4 5 6 0.0 0.2 0.4 0.6 0.8 1.0 1.2<br>-VGS, GATE TO SOURCE VOLTAGE (V) -VSD, BODY DIODE FORWARD VOLTAGE (V)<br>Figure 5.  Transfer Characteristics Figure 6.    Source to Drain  Diode            Source to Drain  Diode<br>NORMALIZED<br>, DRAIN CURRENT (A)<br>D<br>-I<br>DRAIN TO SOURCE ON-RESISTANCE<br>) Ω<br>(m<br>DRAIN TO<br>NORMALIZED rDS(on),<br>SOURCE ON-RESISTANCE<br> DRAIN TO SOURCE ON-RESISTANCE<br>, DRAIN CURRENT (A)<br>D<br>-I , REVERSE DRAIN CURRENT (A)<br>S<br>-I<br>**----- End of picture text -----**<br>


**Figure 6.    Source to Drain  Diode            Source to Drain  Diode Forward Voltage vs Source Current** 

©2014 Fairchild Semiconductor Corporation FDMS86263P Rev.C2 

www.fairchildsemi.com 

**3** 

**Typical Characteristics** TJ = 25 °C unless otherwise noted 

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10 10000<br>ID = -4.4 A VDD = -50 V Ciss<br>8<br>1000<br>VDD = -75 V Coss<br>6<br>VDD = -100 V 100<br>4 Crss<br>10<br>2<br>f = 1 MHz<br>VGS = 0 V<br>0 1<br>0 10 20 30 40 50 0.1 1 10 100<br>Qg, GATE CHARGE (nC) -VDS, DRAIN TO SOURCE VOLTAGE (V)<br>Figure 7.  Gate Charge Characteristics Figure 8.  Capacitance vs Drain<br>to Source Voltage<br>100 40<br>R θ JC = 1.2  [o] C/W<br>30<br>TJ = 25 [ o] C<br>TJ = 100  [o] C<br>10 20<br>VGS = -10 V<br>T J  = 125 [ o] C Limited by Package<br>VGS = -6 V<br>10<br>1 0<br>0.001 0.01 0.1 1 10 100 25 50 75 100 125 150<br>tAV, TIME IN AVALANCHE (ms) TC, CASE TEMPERATURE (oC)<br>Figure 9. Unclamped Inductive   Figure 10.  Maximum Continuous Drain<br>Switching Capability Current vs Case Temperature<br>200 30000<br>100 10  µ s SINGLE PULSE<br>10000 R θ JC = 1.2  [o] C/W<br>TC = 25  [o] C<br>10 100  µ s<br>THIS AREA IS<br>1000<br>LIMITED BY r<br>DS(on)<br>1 ms<br>1 SINGLE PULSE<br>TJ = MAX RATED<br>10 ms<br>R θ JC = 1.2 [ o] C/W CURVE BENT TO<br>T C = 25  [o] C MEASURED DATA DC 100<br>0.1 50<br>1 10 100 400 10-5 10-4 10-3 10-2 10-1 1<br>-VDS, DRAIN to SOURCE VOLTAGE (V) t, PULSE WIDTH (sec)<br>Figure 11.  Forward Bias Safe     Figure 12.  Single  Pulse Maximum<br>Operating Area  Power  Dissipation<br>CAPACITANCE (pF)<br>, GATE TO SOURCE VOLTAGE (V)<br>GS<br>-V<br>DRAIN CURRENT (A)<br>,<br>D<br>-I<br>, AVALANCHE CURRENT (A)<br>AS<br>-I<br>, DRAIN CURRENT (A)<br>D<br>-I<br>PEAK TRANSIENT POWER (W)<br>P)(PK,<br>**----- End of picture text -----**<br>


©2014 Fairchild Semiconductor Corporation FDMS86263P Rev.C2 

www.fairchildsemi.com 

**4** 

## **Typical Characteristics** TJ = 25 °C unless otherwise noted 

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2<br>DUTY CYCLE-DESCENDING ORDER<br>1<br>D = 0.5<br>   0.2   0.1 PDM<br>   0.05<br>   0.02<br>0.1 t1<br>0.01<br>t2<br>NOTES:<br>Z θ JC (t) = r(t) x R θ JC<br>R θ JC = 1.2  [o] C/W<br>SINGLE PULSE Peak TJ = PDM x Z θ JC(t) + TC<br>0.01 Duty Cycle, D = t1 / t2<br>0.005<br>10-5 10-4 10-3 10-2 10-1 1<br>t, RECTANGULAR PULSE DURATION (sec)<br>THERMAL RESISTANCE<br>r(t), NORMALIZED EFFECTIVE TRANSIENT<br>**----- End of picture text -----**<br>


**Figure 13.  Junction-to-Case Transient Thermal Response Curve** 

©2014 Fairchild Semiconductor Corporation FDMS86263P Rev.C2 

www.fairchildsemi.com 

**5** 

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PQFN8 5X6, 1.27P<br>  CASE 483AE<br>ISSUE A<br>5.10 A 5.10<br>3.91<br>PKG SEE<br>1.27<br>CL B DETAIL B<br>8 5 8 7 6 5<br>0.77<br>4.52<br>3.75<br>PKG CL 6.15 5.85 6.61<br>5.65<br>KEEP OUT<br>AREA<br>1.27<br>1 4<br>1 2 3 4<br>TOP VIEW<br>1.27 0.61<br>3.81<br>LAND PATTERN<br>OPTIONAL DRAFT RECOMMENDATION<br>ANGLE MAY APPEAR<br>SEE ON FOUR SIDES<br>5.00<br>4.80 DETAIL C OF THE PACKAGE<br>0.35<br>0.15<br>������<br>0.10 C<br>0.30<br>0.05<br>0.05<br>SIDE VIEW 0.00 ������<br>8X<br>0.08 C<br>0.35 C<br>5.20 0.15<br>4.80 1.10 SEATING<br>0.90 PLANE<br>DETAIL C DETAIL B<br>3.81<br>SCALE: 2:1 SCALE: 2:1<br>1.27 0.51<br>0.31 [ (8X)]<br>(0.34) NOTES: UNLESS OTHERWISE SPECIFIED<br>0.10 C A B    A.  PACKAGE STANDARD REFERENCE:  JEDEC MO-240,<br>1 2 3 4          ISSUE A, VAR. AA,.<br>   B.  DIMENSIONS DO NOT INCLUDE BURRS OR MOLD FLASH.<br>0.76          MOLD FLASH OR BURRS DOES NOT EXCEED 0.10MM.<br>0.51 (0.52)    C.  ALL DIMENSIONS ARE IN MILLIMETERS.<br>6.25    D.  DIMENSIONING AND TOLERANCING PER  ASME Y14.5M-2009.<br>5.90    E.  IT IS RECOMMENDED TO HAVE NO TRACES OR<br>         VIAS WITHIN THE KEEP  OUT AREA.<br>(0.50) 3.48 [+0.30]<br>-0.10<br>(0.30)<br>(2X)<br>8 7 6 5<br>���������<br>0.20 [+0.10] 3.96<br>-0.15  [(8X)]<br>3.61<br>**----- End of picture text -----**<br>


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BOTTOM VIEW<br>**----- End of picture text -----**<br>


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