# Power MOSFET, P Channel, 20 V, 56 A, 0.0053 ohm, Power 33, Surface Mount

![Product image](https://novapart.co/image/farnell:2992329/)

**URL**: https://novapart.co/products/FDMC6688P/power-mosfet-p-channel-20-v-56-a-00053-ohm-33
**SKU**: FDMC6688P
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.6770
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 8Pins |
| Channel Type | P Channel |
| Product Range | PowerTrench |
| Power Dissipation | 30W |
| Transistor Mounting | Surface Mount |
| Transistor Polarity | P Channel |
| Power Dissipation Pd | 30W |
| Rds(On) Test Voltage | 4.5V |
| On Resistance Rds(On) | 0.0053ohm |
| Transistor Case Style | Power 33 |
| Drain Source Voltage Vds | 20V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 56A |
| Drain Source On State Resistance | 0.0053ohm |
| Gate Source Threshold Voltage Max | 750mV |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2992329/)

## **Is Now Part of** 

## **To learn more about ON Semiconductor, please visit our website at www.onsemi.com** 

Please note: As part of the Fairchild Semiconductor integration, some of the Fairchild orderable part numbers will need to change in order to meet ON Semiconductor’s system requirements. Since the ON Semiconductor product management systems do not have the ability to manage part nomenclature that utilizes an underscore (_), the underscore (_) in the Fairchild part numbers will be changed to a dash (-). This document may contain device numbers with an underscore (_). Please check the ON Semiconductor website to verify the updated device numbers. The most current and up-to-date ordering information can be found at www.onsemi.com. Please email any questions regarding the system integration to Fairchild_questions@onsemi.com. 

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## **FDMC6688P** 

## **P-Channel PowerTrench[®] MOSFET** 

## **-20 V, -56 A, 6.5 m** Ω 

## **Features** 

Max rDS(on) = 6.5 mΩ at  VGS = -4.5 V, ID = -14 A Max rDS(on) = 9.8 mΩ at  VGS = -2.5 V, ID = -11 A Max rDS(on) = 20 mΩ at  VGS = -1.8 V, ID = -9 A 

## **General Description** 

This  P-Channel  MOSFET  is produced   using   Fairchild Semiconductor’s advanced PowerTrench **[®]** process that has been optimized for rDS(ON), switching performance and ruggedness. 

High performance trench technology for extremely low rDS(on) 

High power and current handling capability in a widely used surface mount package 

Lead-free and RoHS Compliant 

## **Applications** 

Load Switch 

Battery Management 

Power Management Reverse Polarity Protection 

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Pin 1<br>Pin 1 S S S 7 3 D<br>S -4 Lo<br>- G<br>S 2)=4 raLT D<br>D S 3}-4 r-16 D<br>D<br>D<br>D G rf rs D<br>_ Le<br>Top Bottom<br>**----- End of picture text -----**<br>


**Power 33** 

## **MOSFET Maximum Ratings** TA = 25 °C unless otherwise noted 

|**Symbol**||**Parameter**||||**Ratings**|||**Units**|
|---|---|---|---|---|---|---|---|---|---|
|VDS|Drain to Source Voltage|||||-20|||V|
|VGS|Gate to Source Voltage|||||±8|||V|
||Drain Current   -Continuous|TC= 25 °C||= 25 °C||-56||||
|ID|-Continuous|TA= 25 °C||= 25 °C<br> (Note 1a)||-14|||A|
||-Pulsed|||(Note 3)||-226||||
|PD|Power Dissipation<br>Power Dissipation|TC= 25 °C<br>TA= 25 °C||= 25 °C<br> (Note 1a)||30<br>2.3|||W|
|TJ, TSTG|Operatingand Storage Junction Temperature Range|||||-55 to +150|||°C|
|**Thermal Characteristics**||||||||||
|RθJC|Thermal Resistance, Junction to Case|||||3.8|||°C/W|
|RθJA|Thermal Resistance, Junction to Ambient|||(Note 1a)||53||||
|**Package Marking and Ordering Information**||||||||||
|**Device Marking**<br>**Device**||**Package**||**Reel Size**||**Tape Width**||**Quantity**||
|FDMC6688P<br>FDMC6688P||Power 33||13 ’’||12 mm||3000 units||



## **Thermal Characteristics** 

## **Package Marking and Ordering Information** 

www.fairchildsemi.com 

©2014 Fairchild Semiconductor Corporation FDMC6688P Rev.C1 

**1** 

## **Electrical Characteristics** TJ = 25 °C unless otherwise noted 

|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-20<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-16<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -16 V, VGS= 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±8 V, VDS= 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-0.4<br>-0.75<br>-1<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>3<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -4.5 V, ID= -14 A<br>5.3<br>6.5<br>mΩ<br>VGS= -2.5 V, ID= -11 A<br>7<br>9.8<br>VGS= -1.8 V, ID= -9 A<br>10.7<br>20<br>VGS= -4.5 V, ID= -14 A, TJ = 125 °C<br>7.3<br>11<br>gFS<br>Forward Transconductance<br>VDS= -5 V, ID= -14 A<br>80<br>S<br>Ciss<br>Input Capacitance<br>VDS= -10 V, VGS= 0 V,<br>f = 1 MHz<br>4956<br>7435<br>pF<br>Coss<br>Output Capacitance<br>678<br>1020<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>618<br>930<br>pF<br>Rg<br>Gate Resistance<br>4.5<br>Ω<br>~~=~~<br>~~—_~~<br>~~---.~~<br>~~ee~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-20<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-16<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -16 V, VGS= 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±8 V, VDS= 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-0.4<br>-0.75<br>-1<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>3<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -4.5 V, ID= -14 A<br>5.3<br>6.5<br>mΩ<br>VGS= -2.5 V, ID= -11 A<br>7<br>9.8<br>VGS= -1.8 V, ID= -9 A<br>10.7<br>20<br>VGS= -4.5 V, ID= -14 A, TJ = 125 °C<br>7.3<br>11<br>gFS<br>Forward Transconductance<br>VDS= -5 V, ID= -14 A<br>80<br>S<br>Ciss<br>Input Capacitance<br>VDS= -10 V, VGS= 0 V,<br>f = 1 MHz<br>4956<br>7435<br>pF<br>Coss<br>Output Capacitance<br>678<br>1020<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>618<br>930<br>pF<br>Rg<br>Gate Resistance<br>4.5<br>Ω<br>~~=~~<br>~~—_~~<br>~~---.~~<br>~~ee~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-20<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-16<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -16 V, VGS= 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±8 V, VDS= 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-0.4<br>-0.75<br>-1<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>3<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -4.5 V, ID= -14 A<br>5.3<br>6.5<br>mΩ<br>VGS= -2.5 V, ID= -11 A<br>7<br>9.8<br>VGS= -1.8 V, ID= -9 A<br>10.7<br>20<br>VGS= -4.5 V, ID= -14 A, TJ = 125 °C<br>7.3<br>11<br>gFS<br>Forward Transconductance<br>VDS= -5 V, ID= -14 A<br>80<br>S<br>Ciss<br>Input Capacitance<br>VDS= -10 V, VGS= 0 V,<br>f = 1 MHz<br>4956<br>7435<br>pF<br>Coss<br>Output Capacitance<br>678<br>1020<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>618<br>930<br>pF<br>Rg<br>Gate Resistance<br>4.5<br>Ω<br>~~=~~<br>~~—_~~<br>~~---.~~<br>~~ee~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-20<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-16<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -16 V, VGS= 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±8 V, VDS= 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-0.4<br>-0.75<br>-1<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>3<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -4.5 V, ID= -14 A<br>5.3<br>6.5<br>mΩ<br>VGS= -2.5 V, ID= -11 A<br>7<br>9.8<br>VGS= -1.8 V, ID= -9 A<br>10.7<br>20<br>VGS= -4.5 V, ID= -14 A, TJ = 125 °C<br>7.3<br>11<br>gFS<br>Forward Transconductance<br>VDS= -5 V, ID= -14 A<br>80<br>S<br>Ciss<br>Input Capacitance<br>VDS= -10 V, VGS= 0 V,<br>f = 1 MHz<br>4956<br>7435<br>pF<br>Coss<br>Output Capacitance<br>678<br>1020<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>618<br>930<br>pF<br>Rg<br>Gate Resistance<br>4.5<br>Ω<br>~~=~~<br>~~—_~~<br>~~---.~~<br>~~ee~~<br>~~ee~~|**Off Characteristics**<br>**On Characteristics**<br>**Dynamic Characteristics**<br>**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-20<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>-16<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -16 V, VGS= 0 V<br>-1<br>μA<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±8 V, VDS= 0 V<br>±100<br>nA<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS, ID= -250μA<br>-0.4<br>-0.75<br>-1<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>3<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -4.5 V, ID= -14 A<br>5.3<br>6.5<br>mΩ<br>VGS= -2.5 V, ID= -11 A<br>7<br>9.8<br>VGS= -1.8 V, ID= -9 A<br>10.7<br>20<br>VGS= -4.5 V, ID= -14 A, TJ = 125 °C<br>7.3<br>11<br>gFS<br>Forward Transconductance<br>VDS= -5 V, ID= -14 A<br>80<br>S<br>Ciss<br>Input Capacitance<br>VDS= -10 V, VGS= 0 V,<br>f = 1 MHz<br>4956<br>7435<br>pF<br>Coss<br>Output Capacitance<br>678<br>1020<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>618<br>930<br>pF<br>Rg<br>Gate Resistance<br>4.5<br>Ω<br>~~=~~<br>~~—_~~<br>~~---.~~<br>~~ee~~<br>~~ee~~||
|---|---|---|---|---|---|
|**Switching Characteristics**||||||
|td(on)<br>Turn-On DelayTime|||19<br>35|ns||
|tr<br>Rise Time|VDD= -10 V, ID= -14 A,||33<br>53|ns||
|td(off)<br>Turn-Off DelayTime|VGS= -4.5 V, RGEN= 6Ω||119<br>190|ns||
|tf<br>Fall Time|||68<br>109|ns||
|Qg<br>Total Gate Charge<br>Qgs<br>Gate to Source Charge<br>Qgd<br>Gate to Drain “Miller” Charge|VDD= -10 V, ID= -14 A,<br>VGS= -4.5 V||44<br>61<br>7.4<br>11|nC<br>nC<br>nC||
|**Drain-Source Diode Characteristics**||||||
|VSD<br>Source to Drain Diode  Forward Voltage<br>trr<br>Reverse Recovery Time<br>Qrr<br>Reverse Recovery Charge<br>~~NN~~|VGS= 0 V, IS= -14 A           (Note 2)<br>-0.8<br>-1.2<br>V<br>VGS= 0 V, IS= -2 A             (Note 2)<br>-0.6<br>-1.2<br>IF= -14 A, di/dt = 100 A/μs<br>26<br>41<br>ns<br>10<br>20<br>nC<br>~~SS~~|||||
|Notes**:**||||||
|**1:** RθJAis determined with the device mounted on a 1 in2pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R|pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. R|pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJCis guaranteed by design while  RθJAis determined|||is determined|
|by the user’s board design.||||||
|a. 53 °C/W when mounted  on a|||b. 125 °C/W when mounted on  a|||
|1 in2pad of  2 oz  copper.|pad of  2 oz  copper.||minimum pad of 2 oz copper.|||
||**G**<br>**DF**<br>**DS**<br>**SF**<br>**SS**|||||
|**G**<br>**DF**<br>**DS**<br>**SF**<br>**SS**||||||



- **2:** Pulse Test: Pulse Width < 300 μs, Duty cycle < 2.0 %. 

- **3:** Pulse Id refers to Forward Bias Safe Operation Area. 

©2014 Fairchild Semiconductor Corporation FDMC6688P Rev.C1 

www.fairchildsemi.com 

**2** 

**Typical Characteristics** TJ = 25 °C unless otherwise noted 

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3<br>150<br>VGS = -4.5 V<br>VGS = -3.8 V<br>VGS = -2.5 V<br>2<br>100<br>VGS = -3.5 V VGS = -3.1 V<br>VGS = -3.1 V<br>VGS = -2.5 V 1<br>50 VGS = -3.5 V VGS = -3.8 V VGS = -4.5 V<br>PULSE DURATION = 80  μ s<br>DUTY CYCLE = 0.5% MAX PULSE DURATION = 80  μ s<br>DUTY CYCLE = 0.5% MAX<br>0<br>0 0 50 100 150<br>0.0 0.5 1.0 1.5 2.0 2.5<br>-VDS, DRAIN TO SOURCE VOLTAGE (V) -ID, DRAIN CURRENT (A)<br>Figure 1.  On Region Characteristics Figure 2.  Normalized On-Resistance<br>vs Drain Current and Gate Voltage<br>1.5 50<br>1.4 ID = -14 A PULSE DURATION = 80 DUTY CYCLE = 0.5% MAX μ s<br>VGS = -4.5 V 40<br>1.3 ID = -14 A<br>1.2 30<br>1.1<br>20<br>1.0<br>TJ = 125  [o] C<br>0.9<br>10<br>0.8<br>TJ = 25  [o] C<br>0.7 0<br>-75 -50 -25 0 25 50 75 100 125 150 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5<br>TJ, JUNCTION TEMPERATURE ( [o] C) -VGS, GATE TO SOURCE VOLTAGE (V)<br>Figure 3.  Normalized  On  Resistance                                         Figure 4.   On-Resistance vs  Gate to<br>vs Junction Temperature Source Voltage<br>150 200<br>PULSE DURATION = 80  μ s 100 VGS = 0 V<br>DUTY CYCLE = 0.5% MAX<br>VDS = -5 V 10<br>100 TJ = 150  [o] C<br>1<br>TJ = 25 [ o] C<br>TJ = 150  [o] C 0.1<br>50<br>TJ = -55  [o] C<br>TJ = 25  [o] C 0.01<br>TJ = -55  [o] C<br>0 0.001<br>0 1 2 3 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4<br>-VGS, GATE TO SOURCE VOLTAGE (V) -VSD, BODY DIODE FORWARD VOLTAGE (V)<br>NORMALIZED<br>, DRAIN CURRENT (A)<br>D<br>-I<br>DRAIN TO SOURCE ON-RESISTANCE<br>) Ω<br>(m<br>DRAIN TO<br>NORMALIZED rDS(on),<br>SOURCE ON-RESISTANCE<br> DRAIN TO SOURCE ON-RESISTANCE<br>, DRAIN CURRENT (A)<br>D<br>-I , REVERSE DRAIN CURRENT (A)<br>S<br>-I<br>**----- End of picture text -----**<br>


**Figure 5.  Transfer Characteristics** 

**Figure 6.    Source to Drain  Diode Forward Voltage vs Source Current** 

©2014 Fairchild Semiconductor Corporation FDMC6688P Rev.C1 

www.fairchildsemi.com 

**3** 

**Typical Characteristics** TJ = 25 °C unless otherwise noted 

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4.5 10000<br>ID = -14 A Ciss<br>VDD = -8 V<br>3.0<br>VDD = -10 V Coss<br>1000<br>VDD = -12 V Crss<br>1.5<br>f = 1 MHz<br>VGS = 0 V<br>0.0 100<br>0 20 40 60 0.1 1 10 20<br>Qg, GATE CHARGE (nC) -VDS, DRAIN TO SOURCE VOLTAGE (V)<br>CAPACITANCE (pF)<br>, GATE TO SOURCE VOLTAGE (V)<br>GS<br>-V<br>**----- End of picture text -----**<br>


**Figure 7.  Gate Charge Characteristics** 

## **Figure 8. to Source Voltage** 

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60 500<br>VGS = -4.5 V 10 us<br>R θ JC = 3.8 oC/W 100<br>40<br>100 us<br>VGS = -2.5 V 10<br>THIS AREA IS<br>1 ms<br>LIMITED BY r<br>DS(on)<br>20 10 ms<br>SINGLE PULSE<br>1 TJ = MAX RATED DC<br>R θ JC = 3.8  [o] C/W CURVE BENT TO<br>T C = 25  [o] C MEASURED DATA<br>0 0.1<br>25 50 75 100 125 150 0.1 1 10 100<br>TC, CASE TEMPERATURE (oC) -VDS, DRAIN to SOURCE VOLTAGE (V)<br>Figure 9.  Maximum Continuous Drain                                  Figure 10.  Forward Bias Safe<br>Current vs Case Temperature Operating Area<br>10000<br>SINGLE PULSE<br>R θ JC  = 3.8  [o] C/W<br>1000 TC = 25  [o] C<br>100<br>10<br>10-5 10-4 10-3 10-2 10-1 1<br>t, PULSE WIDTH (sec)<br>DRAIN CURRENT (A)<br>-I, D , DRAIN CURRENT (A)-ID<br>, PEAK TRANSIENT POWER (W)<br>(PK)<br>P<br>**----- End of picture text -----**<br>


**Figure 11.  Single Pulse Maximum Power Dissipation** 

©2014 Fairchild Semiconductor Corporation FDMC6688P Rev.C1 

www.fairchildsemi.com 

**4** 

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Typical Characteristics  TJ = 25 °C unless otherwise noted<br>2<br>DUTY CYCLE-DESCENDING ORDER<br>1<br>P DM<br>D = 0.5<br>      0.2<br>0.1       0.1 t1<br>      0.05<br>      0.02 t2<br>      0.01 NOTES:<br>Z θ JC(t) = r(t) x R θ JC<br>0.01 SINGLE PULSE RPeak T Dut θ JC y  = 3.8   Cy J = P cle [o] , C/W  D = t DM x Z 1 / t θ JC 2 (t) + TC<br>0.005<br>10-5 10-4 10-3 10-2 10-1 1<br>t, RECTANGULAR PULSE DURATION (sec)<br>Figure 12.  Junction-to-Case Transient Thermal Response Curve<br>THERMAL RESISTANCE<br>r(t), NORMALIZED EFFECTIVE TRANSIENT<br>**----- End of picture text -----**<br>


©2014 Fairchild Semiconductor Corporation FDMC6688P Rev.C1 

www.fairchildsemi.com 

**5** 

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3.40<br>A<br>3.20<br>PKG<br>CL<br>B<br>8 5<br>3.40<br>PKG<br>[C] L 3.20<br>1 4<br>PIN 1<br>INDICATOR<br>0.10 C A B 1.95<br>0.37<br>0.65<br>0.27 [ (8X)]<br>0.60<br>1 4 0.40<br>PKG LC<br>1.99<br>1.79<br>8 5<br>(0.34)<br>(0.33) TYP<br>(0.52 TYP) (2.27)<br>**----- End of picture text -----**<br>


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2.37 MIN<br>SYM<br>[C] L<br>(0.45) 8 5<br>2.15 MIN<br>(0.40)<br>PKG<br>CL<br>(0.65)<br>0.70 MIN<br>1 4<br>0.65 0.42 MIN<br>1.95 (8X)<br>**----- End of picture text -----**<br>


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SEE<br>DETAIL A<br>**----- End of picture text -----**<br>


LAND PATTERN RECOMMENDATION 

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0.10 C<br>0.80<br>0.70<br>0.08 C 0.05<br>C<br>0.00<br>0.25<br>SEATING<br>0.15<br>PLANE<br>SCALE: 2X<br>**----- End of picture text -----**<br>


## NOTES: UNLESS OTHERWISE SPECIFIED 

- A)  PACKAGE STANDARD REFERENCE: JEDEC MO-240, ISSUE A, VAR. BA, 

- B)  ALL DIMENSIONS ARE IN MILLIMETERS. 

- C)  DIMENSIONS DO NOT INCLUDE BURRS OR MOLD FLASH. MOLD FLASH OR BURRS DOES NOT EXCEED 0.10MM. 

- D)  DIMENSIONING AND TOLERANCING PER ASME Y14.5M-2009. 

- E)  DRAWING FILE NAME: MKT-PQFN08SREV1 

**==> picture [103 x 52] intentionally omitted <==**

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---

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