# Power MOSFET, P Channel, 30 V, 18 A, 0.014 ohm, MLP, Surface Mount

![Product image](https://novapart.co/image/farnell:3368745/)

**URL**: https://novapart.co/products/FDMC4435BZ-F126/power-mosfet-p-channel-30-v-18-a-0014-ohm-mlp
**SKU**: FDMC4435BZ-F126
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.3290
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 8Pins |
| Channel Type | P Channel |
| Product Range | PowerTrench |
| Power Dissipation | 31W |
| Transistor Mounting | Surface Mount |
| Transistor Polarity | P Channel |
| Power Dissipation Pd | 31W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.014ohm |
| Transistor Case Style | MLP |
| Drain Source Voltage Vds | 30V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 18A |
| Drain Source On State Resistance | 0.014ohm |
| Gate Source Threshold Voltage Max | 1.8V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:3368745/)

## **FDMC4435BZ** 

## **P-Channel Power Trench[®] MOSFET** 

## **-30 V, -18 A, 20 m** Ω 

## **Features** 

Max rDS(on) = 20 mΩ at VGS = -10 V, ID = -8.5 A 

Max rDS(on) = 37 mΩ at VGS = -4.5 V, ID = -6.3 A 

Extended VGSS range (-25 V) for battery applications 

High performance trench technology for extremely low rDS(on) High power and current handling capability 

HBM ESD protection level >7 kV typical (Note 4) 

100% UIL Tested 

Termination is Lead-free and RoHS Compliant 

## **General Description** 

This  P-Channel  MOSFET  is produced   using   ON Semiconductor’s advanced Power Trench **[®]** process that has been especially tailored to minimize the on-state resistance. This device is  well  suited  for  Power  Management and load switching applications common in Notebook Computers and Portable Battery Packs. 

## **Applications** 

High side in DC - DC Buck Converters 

Notebook battery power management 

Load switch in Notebook 

|**Top**||**Bottom**||||||||||||
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|**D**<br>**D**<br>**D**<br>**D**<br>**S**<br>**S**<br>**S**<br>**G**<br>Pin 1<br>~~@~~>|||||**D**<br>**D**<br>**D**<br>**D**|**5**<br>**6**<br>**7**<br>**8**<br>.||||**4**<br>**3**<br>**2**<br>**1**||**G**<br>**S**<br>**S**<br>**S**||
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|**MLP 3.3x3.3**||||||||||||||
|**MOSFET Maximum Ratings  **TA= 25 °C unless otherwise noted||= 25 °C unless otherwise noted||||||||||||
|**Symbol**||**Parameter**||||||**Ratings**||||**Units**||
|VDS<br>Drain to Source Voltage||||||||-30||||V||
|VGS<br>Gate to Source Voltage||||||||±25||||V||
|Drain Current   -Continuous|Drain Current   -Continuous|Drain Current   -Continuous<br>TC = 25 °C||= 25 °C|= 25 °C|||-18||||||
|ID<br>-Continuous||TA= 25 °C||= 25 °C|= 25 °C<br>(Note 1a)|||-8.5||||A||
|-Pulsed||||||||-50||||||
|EAS<br>Single Pulse Avalanche Energy|||||(Note 3)|||32||||mJ||
|PD<br>Power Dissipation<br>Power Dissipation||TC= 25 °C<br>TA= 25 °C||= 25 °C<br>= 25 °C|= 25 °C<br>(Note 1a)|||31<br>2.3||||W||
|TJ, TSTG<br>Operatingand Storage Junction Tem||e Junction Temperature Range||||||-55 to +150||||°C||
|**Thermal Characteristics**||||||||||||||
|**Package Marking and Ordering Information**<br>RθJC<br>Thermal Resistance, Junction to Case<br>4<br>°C/W<br>RθJA<br>Thermal Resistance, Junction to Ambient<br> (Note 1a)<br>53<br>~~ee~~<br>~~ee ae~~||||||||||||||
|**Device Marking**<br>**Device**<br>**Package**<br>**Reel Size**<br>**Tape Width**<br>**Quantity**<br>FDMC4435BZ<br>FDMC4435BZ<br>MLP 3.3X3.3<br>13 ’’<br>12 mm<br>3000 units<br>~~ee~~||||||||||||||



©2010 Semiconductor Components Industries, LLC. **1** October-2017, Rev.3 

Publication Order Number: FDMC4435BZ/D 

## **Electrical Characteristics** TJ = 25 °C unless otherwise noted 

|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= -250μA, VGS= 0 V<br>-30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= -250μA, referenced to 25 °C<br>21<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= -24 V,<br>-1<br>μA<br>VGS = 0 V,<br>TJ= 125 °C<br>-100<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±25 V, VDS = 0 V<br>±10<br>μA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= -250μA<br>-1.0<br>-1.8<br>-3.0<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= -250μA, referenced to 25 °C<br>-5<br>mV/°C<br>rDS(on)<br>Static Drain to Source On Resistance<br>VGS= -10 V,  ID= -8.5 A<br>14<br>20<br>mΩ<br>VGS= -4.5 V,  ID= -6.3 A<br>21<br>37<br>VGS= -10 V,  ID= -8.5 A,<br>TJ= 125 °C<br>20<br>29<br>gFS<br>Forward Transconductance<br>VDD= -5 V,  ID= -8.5 A<br>25<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS= -15 V, VGS= 0 V,<br>f = 1 MHz<br>1535<br>2040<br>pF<br>Coss<br>Output Capacitance<br>310<br>410<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>280<br>420<br>pF<br>~~a~~<br>~~— |~~<br>~~ee~~<br>~~ee~~<br>~~ee eee~~<br>~~eeDG~~<br>~~I~~|
|---|---|---|---|---|---|---|---|---|
|Rg<br>Gate Resistance||f = 1 MHz|||4||Ω||
|**Switching Characteristics**|||||||||
|td(on)<br>Turn-On DelayTime<br>tr<br>Rise Time<br>td(off)<br>Turn-Off DelayTime<br>tf<br>Fall Time<br>Qg<br>Total Gate Charge<br>Qg<br>Total Gate Charge<br>Qgs<br>Gate to Source Charge<br>Qgd<br>Gate to Drain “Miller” Charge<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~ee~~||VDD= -15 V, ID= -8.5 A,<br>VGS= -10 V, RGEN= 6Ω<br>10<br>20<br>9<br>18<br>35<br>56<br>19<br>34<br>VGS= 0 V to -10 V<br>VDD= -15 V,<br>ID= -8.5 A<br>38<br>53<br>VGS= 0 V to -4.5 V<br>20<br>28<br>4.3<br>11<br>~~ee ee ee~~<br>~~ee ee ee~~<br>~~ee ee ee~~<br>~~ee eee ee~~<br>~~ee ee ee ~~<br>~~ee ee ee~~<br>~~ee ee ee~~<br>~~ee~~<br>~~ee ee ~~||||<br>|ns<br>ns<br>ns<br>ns<br>nC<br>nC<br>nC<br>nC<br>~~ee~~<br>~~ee~~<br>~~ee~~<br>~~ee~~<br> ~~eee~~<br>~~ee~~<br>~~ee~~<br> ~~eee~~||
|**Drain-Source Diode Characteristics**|||||||||
|VSD<br>Source to Drain Diode  Forward Voltage|VGS = 0 V, IS = -8.5A<br>VGS = 0 V, IS = -1.9 A|||= -8.5A(Note 2)<br>= -1.9 A(Note 2)|0.86<br>1.5<br>0.74<br>1.2||V||
|trr<br>Reverse RecoveryTime<br>Qrr<br>Reverse RecoveryCharge|IF= -8.5 A, di/dt = 100 A/μs||||26<br>40<br>12<br>20||ns<br>nC||



NOTES: 

1. RθJA is determined with the device mounted on a 1 in[2] pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by the user's board design. 

a. 53 °C/W when mounted on a 1 in[2 ] pad of  2 oz  copper 

b.125 °C/W when mounted on a minimum pad of  2 oz  copper 

2. Pulse Test: Pulse Width < 30 0 μs, Duty cycle < 2.0 %. 

3. Starting TJ = 25[o] C; P-ch: L = 1mH, IAS = -8A, VDD = -27V, VGS = -10V. 

4. The diode connected between the gate and source servers only as protection against ESD. No gate overvoltage rating is implied. 

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**2** 

**Typical Characteristics** TJ = 25°C unless otherwise noted 

**==> picture [463 x 557] intentionally omitted <==**

**----- Start of picture text -----**<br>
50 4.0<br>VGS = -4.5V 3.5 PULSE DURATION = 80 DUTY CYCLE = 0.5%MAX μ s<br>40 V V GSGS =   =  -10V -5V 3.0 VGS = -3.5V<br>30 VGS = -4V<br>2.5<br>VGS = -4V<br>2.0 V GS  = -4.5V<br>20<br>1.5<br>10 VGS = -3.5V VGS =  -5V<br>PULSE DURATION = 80 μ s 1.0<br>DUTY CYCLE = 0.5%MAX VGS = -10V<br>0 0.5<br>0 1 2 3 4 0 10 20 30 40 50<br>-VDS, DRAIN TO SOURCE VOLTAGE (V) -ID, DRAIN CURRENT(A)<br>Figure 1.  On-Region Characteristics Figure 2.  Normalized On-Resistance<br>vs Drain Current and Gate Voltage<br>1.6 60<br> ID = -8.5A PULSE DURATION = 80 μ s<br>1.4 VGS = -10V 50 DUTY CYCLE = 0.5%MAX<br>ID = -8.5A<br>1.2 40<br>1.0 30 T J  = 125 [o] C<br>0.8 20<br>TJ = 25 [o] C<br>0.6 10<br>-75 -50 -25 0 25 50 75 100 125 150 2 4 6 8 10<br>TJ, JUNCTION TEMPERATURE ( [o] C) -VGS, GATE TO SOURCE VOLTAGE (V)<br>Figure 3.  Normalized  On- Resistance              Figure 4.   On-Resistance vs  Gate to<br>vs Junction Temperature Source Voltage<br>50 50<br>PULSE DURATION = 80 μ s V GS  = 0V<br>DUTY CYCLE = 0.5%MAX 10<br>40<br>VDS = -5V TJ = 150 [o] C<br>1<br>30<br>TJ = 25 [o] C<br>0.1<br>20<br>TJ = 150 [o] C TJ = 25 [o] C<br>10 0.01 TJ = -55 [o] C<br>TJ = -55 [o] C<br>0 0.001<br>1 2 3 4 5 0.0 0.2 0.4 0.6 0.8 1.0 1.2 1.4 1.6<br>-VGS, GATE TO SOURCE VOLTAGE (V) -VSD, BODY DIODE FORWARD VOLTAGE (V)<br>NORMALIZED<br>DRAIN CURRENT (A)<br>,<br>D<br>-I<br>DRAIN TO SOURCE ON-RESISTANCE<br>)<br>Ω<br>m<br>(<br>, DRAIN TO<br>NORMALIZED<br>rDS(on)<br>SOURCE ON-RESISTANCE<br> DRAIN TO SOURCE ON-RESISTANCE<br>, DRAIN CURRENT (A)<br>D<br>-I , REVERSE DRAIN CURRENT (A)<br>S<br>-I<br>**----- End of picture text -----**<br>


**Figure 5.  Transfer Characteristics** 

**Figure 6.    Source to Drain  Diode Forward Voltage vs Source Current** 

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**3** 

**Typical Characteristics** TJ = 25°C unless otherwise noted 

**==> picture [467 x 566] intentionally omitted <==**

**----- Start of picture text -----**<br>
10 10000<br>ID = -8.5A<br>8 VDD = -10V Ciss<br>1000<br>6<br>VDD = -15V Coss<br>4<br>VDD = -20V 100 Crss<br>2 f = 1MHz<br>VGS = 0V<br>0 10<br>0 10 20 30 40 0.1 1 10 30<br>Qg, GATE CHARGE(nC) -VDS, DRAIN TO SOURCE VOLTAGE (V)<br>Figure 7.  Gate Charge Characteristics Figure 8.  Capacitance   vs  Drain<br>to Source Voltage<br>20 40<br>VGS = -10V<br>10<br>30<br>VGS = -4.5V<br>T J  = 25 [o] C<br>20<br>10<br>TJ = 125 [o] C Limited by Package<br>R θ JC = 4oC/W<br>1 0<br>0.001 0.01 0.1 1 10 100 25 50 75 100 125 150<br>tAV, TIME IN AVALANCHE(ms) TC, Ambient TEMPERATURE (oC)<br>Figure 9. Unclamped Inductive   Figure 10.  Maximum Continuous Drain<br>Switching Capability Current  vs Case  Temperature<br>100 10-4<br>V DS  = 0V<br>10 10-5<br>100us<br>TJ = 125 [o] C<br>1ms<br>1 THIS AREA IS  10ms 10-6<br>LIMITED BY rDS(on) 100ms<br>0.1 SINGLE PULSE TRJ θ JA= MAX RATED= 125 [o] C/W 1 10sDC s 10-7 TJ = 25 [o] C<br>T A = 25 [o] C<br>0.01 10-8<br>0.01 0.1 1 10 100 0 5 10 15 20 25 30<br>-VDS, DRAIN TO SOURCE VOLTAGE (V) -VGS, GATE TO SOURCE VOLTAGE(V)<br>Figure 11.    Forward  Bias  Safe       Forward  Bias  Safe      Figure 12.  Igss vs Vgss<br>CAPACITANCE (pF)<br>, GATE TO SOURCE VOLTAGE(V)<br>GS<br>-V<br>DRAIN CURRENT (A)<br>,<br>I- D<br>, AVALANCHE CURRENT(A)<br>AS<br>-I<br>, DRAIN CURRENT (A)<br>D<br> -I<br>GATE LEAKAGE CURRENT(A)<br>g,<br>-I<br>**----- End of picture text -----**<br>


**Figure 11.    Forward  Bias  Safe       Forward  Bias  Safe Operating Area** 

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**Typical Characteristics** TJ = 25°C unless otherwise noted 

**==> picture [470 x 399] intentionally omitted <==**

**----- Start of picture text -----**<br>
100<br>V GS  = -10V<br>10 SINGLE PULSE<br>R θ JA = 125 [o] C/W<br>T A  = 25 [o] C<br>1<br>0.5<br>10-3 10-2 10-1 1 10 100 1000<br>t, PULSE WIDTH (sec)<br>Figure 13.  Single  Pulse  Maximum  Power  Dissipation<br>2<br>DUTY CYCLE-DESCENDING ORDER<br>1<br>D = 0.5<br>   0.2<br>   0.1 P DM<br>   0.05<br>   0.02<br>0.1    0.01 t 1<br>t2<br>NOTES:<br>Z θJA (t) = r(t) x R θJA<br>SINGLE PULSE R θJA  = 125 °C/W<br>Peak T J  = P DM  x Z θJA (t) + T A<br>Duty Cycle, D = t1 / t2<br>0.01<br>10-3 10-2 10-1 1 10 100 1000<br>t, RECTANGULAR PULSE DURATION (sec)<br>Figure 14.  Transient Thermal Response Curve<br>, PEAK TRANSIENT POWER (W)<br>(PK)<br>P<br>THERMAL RESISTANCE<br>r(t), NORMALIZED EFFECTIVE TRANSIENT<br>**----- End of picture text -----**<br>


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## **Dimensional Outline and Pad Layout** 

**==> picture [171 x 112] intentionally omitted <==**

**==> picture [42 x 32] intentionally omitted <==**

**==> picture [83 x 119] intentionally omitted <==**

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## **Dimensional Outline and Pad Layout** 

**==> picture [167 x 109] intentionally omitted <==**

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