# Dual MOSFET, N Channel, 30 V, 4.8 A, 0.032 ohm

![Product image](https://novapart.co/image/farnell:2822534/)

**URL**: https://novapart.co/products/FDMB3800N/dual-mosfet-n-channel-30-v-48-a-0032-ohm
**SKU**: FDMB3800N
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Dual MOSFETs
**Price**: €0.3720
**Stock**: 10+

## Description

Transistor Polarity:Dual N Channel; Continuous Drain Current Id:4.8A; Drain Source Voltage Vds:30V; On Resistance Rds(on):0.032ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltag

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (25-Jun-2025) |
| No. Of Pins | 8Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Transistor Case Style | µFET |
| Operating Temperature Max | 150°C |
| Power Dissipation N Channel | 1.6W |
| Power Dissipation P Channel | - |
| Drain Source Voltage Vds N Channel | 30V |
| Drain Source Voltage Vds P Channel | - |
| Continuous Drain Current Id N Channel | 4.8A |
| Continuous Drain Current Id P Channel | - |
| Drain Source On State Resistance N Channel | 0.032ohm |
| Drain Source On State Resistance P Channel | - |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2822534/)

## **FDMB3800N Dual N-Channel PowerTrench[®] MOSFET** 

## **30V, 4.8A, 40m** Ω 

## **Features** 

Max rDS(on) = 40mΩ at VGS = 10V, ID = 4.8A Max rDS(on) = 51mΩ at VGS = 4.5V, ID = 4.3A Fast switching speed Low gate Charge High performance trench technology for extremely low rDS(on) High power and current handling capability. RoHS Compliant 

## **General Description** 

These N-Channel Logic Level MOSFETs are produced using ON Semiconductor's advanced PowerTrench process that has been especially tailored to minimize the on-state resistance and yet maintain superior switching performance. 

These devices are well suited for low voltage and battery powered applications where low in-line power loss and fast switching are required. 

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**MicroFET 3X1.9** 

**MOSFET Maximum Ratings** TA = 25°C unless otherwise noted 

|**MOSFET Maximum Ratings**|**MOSFET Maximum Ratings  **TA = 25°C unless otherwise notedA = 25°C unless otherwise noted= 25°C unless otherwise noted|||
|---|---|---|---|
|**Symbol**|**Parameter**|**Ratings**|**Units**|
|VDS|Drain to Source Voltage|30|V|
|VGS|Gate to Source Voltage|±20|V|
|ID|Drain  Current<br>-Continuous<br>TA= 25°C<br> (Note 1a)|4.8|A|
||-Pulsed|9||
|PD|Power Dissipation<br>TA= 25°C<br>Note 1a)|1.6|W|
||Power Dissipation<br>TA= 25°C<br> (Note 1b)|0.75||
|TJ, TSTG|Operatingand Storage Junction Temperature Range|-55 to +150|°C|



**Thermal Characteristics** 

RθJA Thermal Resistance, Junction to Ambient (Note 1a) 80 °C/W ~~se~~ RθJA Thermal Resistance, Junction to Ambient (Note 1b) 165 ~~_~~ **Package Marking and Ordering Information Device Marking Device Package Reel Size Tape Width Quantity** 3800 FDMB3800N MicroFET3X1.9 7’’ 8mm 3000 units ~~eeee ee ee~~ 

©2012 Semiconductor Components Industries, LLC. **1** October-2017, Rev.3 

Publication Order Number: FDMB3800N/D 

**Electrical Characteristics** TJ = 25°C unless otherwise noted 

|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|**Symbol**<br>**Parameter**<br>**Test Conditions**<br>**Min**<br>**Typ**<br>**Max**<br>**Units**<br>**Off Characteristics**<br>BVDSS<br>Drain to Source Breakdown Voltage<br>ID= 250μA, VGS= 0V<br>30<br>V<br>ΔBVDSS<br>ΔTJ<br>Breakdown Voltage Temperature<br>Coefficient<br>ID= 250μA, referenced to 25°C<br>24<br>mV/°C<br>IDSS<br>Zero Gate Voltage Drain Current<br>VDS= 24V,<br>1<br>μA<br>VGS= 0V<br>TJ= 55°C<br>10<br>IGSS<br>Gate to Source Leakage Current<br>VGS= ±20V, VDS= 0V<br>±100<br>nA<br>**On Characteristics**<br>VGS(th)<br>Gate to Source Threshold Voltage<br>VGS= VDS,  ID= 250μA<br>1<br>1.9<br>3<br>V<br>ΔVGS(th)<br>ΔTJ<br>Gate to Source Threshold Voltage<br>Temperature Coefficient<br>ID= 250μA, referenced to 25°C<br>-4<br>mV/°C<br>rDS(on)<br>Drain to Source On Resistance<br>VGS= 10V,  ID= 4.8A<br>32<br>40<br>mΩ<br>VGS= 4.5V,   ID= 4.3A<br>41<br>51<br>VGS= 10V,  ID= 4.8A, TJ= 125°C<br>43<br>61<br>gFS<br>Forward Transconductance<br>VDS= 5V,  ID= 4.8A<br>14<br>S<br>**Dynamic Characteristics**<br>Ciss<br>Input Capacitance<br>VDS=15V, VGS= 0V,<br>f = 1MHz<br>350<br>465<br>pF<br>Coss<br>Output Capacitance<br>90<br>120<br>pF<br>Crss<br>Reverse Transfer Capacitance<br>40<br>60<br>pF<br>Rg<br>Gate Resistance<br>f = 1MHz<br>3<br>Ω<br>~~a~~<br>~~BO~~<br>~~I GO~~<br>~~— fo ee~~<br>~~ee~~<br>~~ee ee~~<br>~~a~~|
|---|---|---|---|---|---|---|---|
|**Switching Characteristics**||||||||
|td(on)<br>Turn-On DelayTime<br>tr<br>Rise Time<br>td(off)<br>Turn-Off DelayTime|VDD= 15V, ID= 1A<br>VGS= 10V, RGEN= 6Ω|||8<br>5<br>21|16<br>10<br>34||ns<br>ns<br>ns|
|tf<br>Fall Time||||2|10||ns|
|Qg(TOT)<br>Total Gate Charge at 5V|VGS= 0V to 5V VDD= 15V|||4|5.6||nC|
|Qgs<br>Gate to Source Gate Charge|ID= 7.5A|||1.0|||nC|
|Qgd<br>Gate to Drain “Miller” Charge||||1.5|||nC|
|**Drain-Source Diode Characteristics**||||||||
|IS<br>Maximum Continuous Drain - Source Diode Forward Current|||||1.25||A|
|VSD<br>Source to Drain Diode  Forward Voltage|VGS = 0V, IS = 1.25A(Note 2)|||0.8|1.2||V|
|trr<br>Reverse RecoveryTime<br>Qrr<br>Reverse RecoveryCharge|IF= 4.8A, di/dt = 100A/μs|||17<br>7|||ns<br>nC|



**Notes:** 

- **1:** RθJA is determined with the device mounted on a 1in[2] pad 2 oz copper pad on a 1.5 x 1.5 in. board of FR-4 material. RθJC is guaranteed by design while RθCA is determined by the user's board design. 

a. 80°C/W when mounted  on b. 165°C/W when mounted on  a a 1 in[2 ] pad of  2 oz  copper minimum pad of 2 oz copper 

**2:** Pulse Test: Pulse Width < 300μs, Duty cycle < 2.0%. 

**www.onsemi.com** 

**2** 

## **Typical Characteristics** TJ = 25°C unless otherwise noted 

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10<br>2.8<br>VGS = 10V 4.5V<br>2.6<br>6.0V 3.5V<br>8 2.4 VGS = 3.0V<br>2.2<br>6 2<br>1.8<br>3.0V 3.5V<br>4 1.6<br>4.0V 4.5V 6.0V<br>1.4<br>2 1.2<br>2.5V<br>1<br>10V<br>0 0.8<br>0 0.25 0.5 0.75 1 1.25 0 2 4 6 8 10<br>VDS, DRAIN-SOURCE VOLTAGE (V) ID, DRAIN CURRENT (A)<br>Figure 1.  On Region Characteristics Figure 2.  Normalized On - Resistance<br>vs Drain Current and Gate Voltage<br>1.6 0.102<br>ID = 4.8A ID = 2.4A<br>VGS = 10V 0.092<br>1.4<br>0.082<br>1.2 0.072<br>0.062<br>1 TJ = 125 [o] C<br>0.052<br>0.042<br>0.8 TJ = 25 [o] C<br>0.032<br>0.6 0.022<br>-50 -25 0 25 50 75 100 125 150 2 3 4 5 6 7 8 9 10<br>TJ, JUNCTION TEMPERATURE ( [o] C) VGS, GATE TO SOURCE VOLTAGE (V)<br>Figure 3.  Normalized  On -  Resistance      Figure 4.   On- Resistance vs  Gate to<br>vs Junction Temperature Source Voltage<br>15 10<br>VDS = 5V TJ = -55 [o] C 125 [o] C25 [o] C V GS  = 0V<br>12 1<br>T J  = 125 [o] C<br>9 0.1<br>25 [o] C<br>6 0.01 -55 [o] C<br>3 0.001<br>0 0.0001<br>1.5 2 2.5 3 3.5 4 0 0.2 0.4 0.6 0.8 1 1.2<br>VGS, GATE TO SOURCE VOLTAGE (V) VSD, BODY DIODE FORWARD VOLTAGE (V)<br>NORMALIZED<br>, DRAIN CURRENT (A)ID<br>DRAIN-SOURCE ON-RESISTANCE<br>NORMALIZED<br> DRAIN-SOURCE ON-RESISTANCE<br>DRAIN TO SOURCE ON-RESISTANCE (OHM)<br>, DRAIN CURRENT (A)ID<br>, REVERSE DRAIN CURRENT (A)IS<br>**----- End of picture text -----**<br>


**Figure 5.  Transfer Characteristics** 

**Figure 6.    Source to Drain  Diode Forward Voltage vs Source Current** 

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**Typical Characteristics** TJ = 25°C unless otherwise noted 

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10 600<br>f = 1MHz<br>ID = 4.8A VDS = 10V 15V VGS = 0 V<br>500<br>8<br>20V<br>400 C iss<br>6<br>300<br>4<br>200<br>Coss<br>2<br>100<br>Crss<br>0 0<br>0 1 2 3 4 5 6 7 8 0 4 8 12 16 20<br>Qg, GATE CHARGE (nC) VDS, DRAIN TO SOURCE VOLTAGE (V)<br>Figure 7.  Gate Charge Characteristics Figure 8.  Capacitance vs Drain<br>to Source Voltage<br>100 6<br>5<br>r DS(on)  LIMIT<br>10<br>100us 4 VGS = 10V<br>1ms<br>1 3 V GS  = 4.5V<br>10ms<br>V GS  = 10V 100ms 2 RθJA = 80°C/W<br>0.1 SINGLE PULSE<br>RθJA = 165 [o] C/W 1s 1<br>TJ = 25 [o] C 10sDC<br>0.01 0<br>0.1 1 10 100 25 50 75 100 125 150<br>VDS, DRAIN-SOURCE VOLTAGE (V) TA, AMBIENT TEMPERATURE ( [o] C)<br>Figure 9. Forward Bias Safe     Figure 10.  Maximum Continuous Drain<br>Operating Area  Current  vs Ambient Temperature<br>180<br>SINGLE PULSE<br>150 RθJA = 165 ° C/W<br>TA= 25°C<br>120<br>90<br>60<br>30<br>0<br>0.0001 0.001 0.01 0.1 1 10 100 1000<br>t, PULSE WIDTH (s)<br>Figure 11.  Single  Pulse Maximum Power  Dissipation<br>CAPACITANCE (pF)<br>, GATE-SOURCE VOLTAGE (V)<br>GS<br>V<br>, DRAIN CURRENT (A)ID , DRAIN CURRENT (A)ID<br>P(pk), PEAK TRANSIENT POWER (W)<br>**----- End of picture text -----**<br>


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Typical Characteristics  TJ = 25°C unless otherwise noted<br>1<br>D = 0.5<br>      0.2<br>      0.1<br>0.1       0.05<br>      0.02<br>      0.01 P(pk)<br>t1<br>0.01 t 2<br>Peak TJ = TA + PDM *RθJA*ZθJA<br>Duty Cycle, D = t1 / t2<br>SINGLE PULSE<br>0.001<br>0.0001 0.001 0.01 0.1 1 10 100 1000<br>t, RECTANGULAR PULSE DURATION (s)<br>Figure 12.  Transient Thermal Response Curve<br>, NORMALIZED THERMAL IMPEDANCE<br>θJA<br>Z<br>**----- End of picture text -----**<br>


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