# Power MOSFET, N Channel, 150 V, 21 A, 0.058 ohm, TO-252AA, Surface Mount

![Product image](https://novapart.co/image/farnell:2454151RL/)

**URL**: https://novapart.co/products/FDD2582/power-mosfet-n-channel-150-v-21-a-0058-ohm-to
**SKU**: FDD2582
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.4130
**Stock**: 1000+
**Lead Time**: 141 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:21A; Drain Source Voltage Vds:150V; On Resistance Rds(on):0.058ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:4V;

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | Lead (25-Jun-2025) |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 95W |
| Transistor Mounting | Surface Mount |
| Transistor Polarity | N Channel |
| Power Dissipation Pd | 95W |
| Rds(On) Test Voltage | 10V |
| On Resistance Rds(On) | 0.058ohm |
| Transistor Case Style | TO-252AA |
| Drain Source Voltage Vds | 150V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 21A |
| Drain Source On State Resistance | 0.058ohm |
| Automotive Qualification Standard | - |
| Gate Source Threshold Voltage Max | 4V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2454151RL/)

## **Is Now Part of** 

**To learn more about ON Semiconductor, please visit our website at www.onsemi.com** 

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March 2015<br>FDD2582<br>N-Channel PowerTrench [®]  MOSFET<br>**----- End of picture text -----**<br>


## **150V, 21A, 66m** Ω 

## **Features Applications** 

- rDS(ON) = 58mΩ (Typ.), VGS = 10V, ID = 7A 

- Qg(tot) = 19nC (Typ.), VGS = 10V 

- Low Miller Charge 

   - DC/DC converters and Off-Line UPS 

   - Distributed Power Architectures and VRMs 

   - Primary Switch for 24V and 48V Systems 

- Low QRR[Body Diode] 

- UIS Capability (Single Pulse and Repetitive Pulse) 

- Qualified to AEC Q101 

Formerly developmental type 82855 

- High Voltage Synchronous Rectifier 

- Direct Injection / Diesel Injection System 

- 42V Automotive Load Control 

- Electronic Valve Train System 

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DRAIN<br>(FLANGE) D<br>GATE<br>G<br>SOURCE<br>TO-252AA<br>S<br>FDD SERIES<br>MOSFET Maximum Ratings TC = 25°C unless otherwise noted<br>**----- End of picture text -----**<br>


|**MOSFET Maximum Ratings  **TC = 25°C unless otherwise notedC = 25°C unless otherwise noted= 25°C unless otherwise noted|||
|---|---|---|
|**Symbol**<br>**Parameter**|**Ratings**|**Units**|
|VDSS<br>Drain to Source Voltage|150|V|
|VGS<br>Gate to Source Voltage|±20|V|
|Drain Current|||
|ID<br>Continuous(TC= 25oC, VGS= 10V)<br>Continuous(TC= 100oC, VGS= 10V)|21<br>15|A|
|Continuous(Tamb= 25oC, VGS= 10V, RθJA= 52oC/W)|3.7|A|
|Pulsed|Figure 4|A|
|EAS<br>Single Pulse Avalanche Energy (Note 1)|59|mJ|
|PD<br>Power dissipation<br>Derate above 25oC|95<br>0.63|W<br>W/oC|
|TJ, TSTG<br>Operatingand Storage Temperature|-55 to 175|oC|
|**Thermal Characteristics**|||
|RθJC<br>Thermal Resistance Junction to Case TO-252<br>1.58<br>oC/W<br>RθJA<br>Thermal Resistance Junction to Ambient  TO-252<br>100<br>oC/W<br>RθJA<br>Thermal Resistance Junction to Ambient TO-252, 1in2copper pad area<br>52<br>oC/W<br>~~————_——————~~|||
|**This product has been designed to meet the extreme test conditions and environment demanded by the automotive industry. For a**|||
|**copy of the requirements, see AEC Q101 at: http://www.aecouncil.com/**|||
|**Reliability data can be found at: http://www.fairchildsemi.com/products/discrete/reliability/index.html.**|||
|**All Fairchild Semiconductor products are manufactured, assembled and tested under ISO9000 and QS9000 quality systems**|||
|**certification.**|||



FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

|**Package Marking and Ordering Information**|**Package Marking and Ordering Information**|**Package Marking and Ordering Information**|**Package Marking and Ordering Information**|**Package Marking and Ordering Information**|**Package Marking and Ordering Information**|**Package Marking and Ordering Information**|||||
|---|---|---|---|---|---|---|---|---|---|---|
|**Device Marking**||**Device**|**Package**||**Reel Size**||**Tape Width**||**Quantity**||
|FDD2582||FDD2582|TO-252AA||330mm||16mm||2500 units||
|**Electrical Characteristics**TC= 25°C unless otherwise noted|||||||||||
|**Symbol**|**Parameter**|||**Test Conditions**|||**Min**|**Typ**|**Max**|**Units**|
|**Off Characteristics**|||||||||||
|BVDSS|Drain to Source Breakdown Voltage|||ID= 250µA, VGS||= 0V|150|-|-|V|
|IDSS|Zero Gate Voltage Drain Current|||VDS= 120V<br>VGS= 0V|||-|-|1|µA|
|||||||TC= 150oC|-|-|250||
|IGSS|Gate to Source Leakage Current|||VGS=±20V|||-|-|±100|nA|
|**On Characteristics**|||||||||||
|VGS(TH)|Gate to Source Threshold Voltage|||VGS= VDS, ID= 250µA|||2|-|4|V|
|rDS(ON)|Drain to Source On Resistance|||ID= 7A, VGS= 10V|||-|0.058|0.066|Ω|
|||||ID= 4A, VGS= 6V,|||-|0.066|0.099||
|||||ID= 7A, VGS= 10V,<br>TC= 175oC|||-|0.151|0.172||
|**Dynamic Characteristics**|||||||||||
|CISS|Input Capacitance|||VDS= 25V, VGS= 0V,<br>f = 1MHz|||-|1295|-|pF|
|COSS|Output Capacitance||||||-|145|-|pF|
|CRSS|Reverse Transfer Capacitance||||||-|30|-|pF|
|Qg(TOT)|Total Gate Charge at 10V|||VGS= 0V to 10V|||-|19|25|nC|
|Qg(TH)|Threshold Gate Charge|||VGS= 0V to 2V|||-|2.4|3.2|nC|
|Qgs|Gate to Source Gate Charge||||||-|6.2|-|nC|
|Qgs2|Gate Charge Threshold to Plateau||||||-|3.8|-|nC|
|Qgd|Gate to Drain “Miller” Charge||||||-|4.2|-|nC|
|**Resistive Switching Characteristics**(VGS=||||10V)|||||||
|tON|Turn-On Time|||VDD= 75V, ID= 7A<br>VGS= 10V, RGS= 16Ω|||-|-|41|ns|
|td(ON)|Turn-On Delay Time||||||-|8|-|ns|
|tr|Rise Time||||||-|19|-|ns|
|td(OFF)|Turn-Off Delay Time||||||-|32|-|ns|
|tf|Fall Time||||||-|19|-|ns|
|tOFF|Turn-Off Time||||||-|-|77|ns|
|**Drain-Source Diode Characteristics**|||||||||||
|VSD|Source to Drain Diode Voltage|||ISD= 7A|||-|-|1.25|V|
|||||ISD= 4A|||-|-|1.0|V|
|trr|Reverse RecoveryTime|||ISD= 7A, dISD/dt = 100A/µs|||-|-|67|ns|
|QRR|Reverse Recovered Charge|||ISD= 7A, dISD/dt = 100A/µs|||-|-|134|nC|



**Notes:** 

**1:** Starting TJ = 25°C, L = 1.17 mH, IAS = 10A. 

FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

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Typical Characteristics  TC = 25°C unless otherwise noted<br>1.2 25<br>VGS = 10V<br>1.0<br>20<br>0.8<br>15<br>0.6<br>10<br>0.4<br>0.2 5<br>0 0<br>0 25 50 75 100 125 150 175 25 50 75 100 125 150 175<br>TC , CASE TEMPERATURE ( [o] C) TC, CASE TEMPERATURE ( [o] C)<br>Figure 1.  Normalized Power Dissipation vs  Figure 2.  Maximum Continuous Drain Current vs<br>Ambient Temperature Case Temperature<br>2<br>DUTY CYCLE - DESCENDING ORDER<br>1 0.5<br>0.2<br>0.1<br>0.05<br>0.02<br>0.01<br>PDM<br>0.1<br>t1<br>t2<br>NOTES:<br>SINGLE PULSE DUTY FACTOR: D = t 1 /t 2<br>PEAK TJ = PDM x Z θ JC x R θ JC + TC<br>0.01<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t, RECTANGULAR PULSE DURATION (s)<br>Figure 3.  Normalized Maximum Transient Thermal Impedance<br>300<br>TRANSCONDUCTANCE TC = 25 [o] C<br>MAY LIMIT CURRENT FOR TEMPERATURES<br>IN THIS REGION ABOVE 25 [o] C DERATE PEAK<br>CURRENT AS FOLLOWS:<br>100 I = I25  175 - TC<br>150<br>VGS = 10V<br>20<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t, PULSE WIDTH (s)<br>Figure 4.  Peak Current Capability<br>, DRAIN CURRENT (A)<br>ID<br>POWER DISSIPATION MULTIPLIER<br>, NORMALIZED<br>ZJC θ<br>THERMAL IMPEDANCE<br>, PEAK CURRENT (A)<br>IDM<br>**----- End of picture text -----**<br>


FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

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Typical Characteristics  TC = 25°C unless otherwise noted<br>**----- End of picture text -----**<br>


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200 100<br>10 µ s If R = 0<br>100 t AV  = (L)(I AS )/(1.3*RATED BV DSS  - V DD )<br>If R  ≠  0<br>100 µ s tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1]<br>10 1ms<br>OPERATION IN THIS 10ms 10 STARTING TJ = 25 [o] C<br>AREA MAY BE<br>1 LIMITED BY rDS(ON)<br>SINGLE PULSE DC<br>T J  = MAX RATED STARTING TJ = 150 [o] C<br>T C  = 25 [o] C<br>0.1 1<br>1 10 100 300 0.001 0.01 0.1 1 10<br>VDS, DRAIN TO SOURCE VOLTAGE (V) tAV, TIME IN AVALANCHE (ms)<br>Figure 5. Forward Bias Safe Operating Area NOTE: Refer to Fairchild Application Notes AN7514 and AN7515<br>Figure 6. Unclamped Inductive Switching<br>Capability<br>50 50<br>PULSE DURATION = 80 µ s VGS = 10V<br>DUTY CYCLE = 0.5% MAX<br>40 V DD  = 15V 40 PULSE DURATION = 80 µ s VGS = 7V<br>DUTY CYCLE = 0.5% MAX<br> TC = 25 [o] C<br>30 30<br> TJ = 175 [o] C VGS = 6V<br>20 20<br> TJ = 25 [o] C  TJ = -55 [o] C<br>VGS = 5V<br>10 10<br>0 0<br>3.5 4.0 4.5 5.0 5.5 6.0 6.5 7.0 0 1 2 3 4 5<br>VGS , GATE TO SOURCE VOLTAGE (V) VDS , DRAIN TO SOURCE VOLTAGE (V)<br>Figure 7.  Transfer Characteristics Figure 8.  Saturation Characteristics<br>90 3.0<br>PULSE DURATION = 80DUTY CYCLE = 0.5% MAX µ s PULSE DURATION = 80 µ s<br>DUTY CYCLE = 0.5% MAX<br>2.5<br>80<br>VGS = 6V 2.0<br>70<br>1.5<br>60 VGS = 10V<br>1.0<br>VGS = 10V, ID = 21A<br>50 0.5<br>0 5 10 15 20 25 -80 -40 0 40 80 120 160 200<br>ID, DRAIN CURRENT (A) TJ, JUNCTION TEMPERATURE ( [o] C)<br>Figure 9.  Drain to Source On Resistance vs Drain  Figure 10.  Normalized Drain to Source On<br>Current Resistance vs Junction Temperature<br>, DRAIN CURRENT (A)<br>ID , AVALANCHE CURRENT (A)IAS<br>, DRAIN CURRENT (A) , DRAIN CURRENT (A)<br>ID ID<br>) Ω<br>ON RESISTANCE<br>NORMALIZED DRAIN TO SOURCE<br>DRAIN TO SOURCE ON RESISTANCE (m<br>**----- End of picture text -----**<br>


FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

**Typical Characteristics** TC = 25°C unless otherwise noted 

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1.2 1.2<br>VGS = VDS, ID = 250 µ A  ID = 250 µ A<br>1.0<br>1.1<br>0.8<br>1.0<br>0.6<br>0.4 0.9<br>-80 -40 0 40 80 120 160 200 -80 -40 0 40 80 120 160 200<br>TJ, JUNCTION TEMPERATURE ( [o] C) TJ, JUNCTION TEMPERATURE ( [o] C)<br>Figure 11.  Normalized Gate Threshold Voltage vs  Figure 12.  Normalized Drain to Source<br>Junction Temperature Breakdown Voltage vs Junction Temperature<br>2000 10<br>VDD = 75V<br>1000<br>CISS  =  CGS + CGD 8<br>COSS  ≅  CDS + CGD<br>6<br>100 C RSS  =  C GD<br>4<br>WAVEFORMS IN<br>2 DESCENDING ORDER:<br>ID = 21A<br>VGS = 0V, f = 1MHz ID = 7A<br>10 0<br>0.1 1 10 150 0 5 10 15 20<br>VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC)<br>NORMALIZED GATE<br>THRESHOLD VOLTAGE BREAKDOWN VOLTAGE<br>NORMALIZED DRAIN TO SOURCE<br>C, CAPACITANCE (pF)<br>, GATE TO SOURCE VOLTAGE (V)<br>GS<br>V<br>**----- End of picture text -----**<br>


**Figure 11.  Normalized Gate Threshold Voltage vs Figure 12.  Normalized Drain to Source Junction Temperature Breakdown Voltage vs Junction Temperature** 

**Figure 13.  Capacitance vs Drain to Source Figure 14.  Gate Charge Waveforms for Constant Voltage Gate Currents** 

FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

## **Test Circuits and Waveforms** 

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VDS BVDSS<br>tP<br>L VDS<br>IAS<br>VARY tP TO OBTAIN + VDD<br>REQUIRED PEAK IAS RG VDD<br>VGS -<br>DUT<br>tP<br>0V IAS 0<br>0.01 Ω<br>tAV<br>**----- End of picture text -----**<br>


**Figure 15.  Unclamped Energy Test Circuit** 

**Figure 16.  Unclamped Energy Waveforms** 

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VDS<br>L<br>VGS +<br>VDD<br>-<br>DUT<br>Ig(REF)<br>**----- End of picture text -----**<br>


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VDD Qg(TOT)<br>VDS<br>VGS = 10V<br>VGS<br>VGS = 2V<br>0 Qgs2<br>Qg(TH)<br>Qgs Qgd<br>Ig(REF)<br>0<br>**----- End of picture text -----**<br>


**Figure 17.  Gate Charge Test Circuit** 

**Figure 18.  Gate Charge Waveforms** 

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VDS tON tOFF<br>td(ON) td(OFF)<br>RL tr tf<br>VDS<br>90% 90%<br>VGS +<br>VDD 10% 10%<br>- 0<br>DUT 90%<br>RGS<br>VGS 50% 50%<br>PULSE WIDTH<br>VGS 0 10%<br>**----- End of picture text -----**<br>


**Figure 19.  Switching Time Test Circuit Figure 20.  Switching Time Waveforms** 

FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

## _**Thermal Resistance vs. Mounting Pad Area**_ 

The max imum r ated j unction t emperature, T JM, an d t he thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application.  T herefore t he a pplication’s amb ient temperature, T A ([o] C), and thermal resistance R θJA ([o] C/W) must be reviewed to ensure t hat T JM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. 

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In us ing su rface mount de vices suc h as t he TO-252 package, the environment in which it is applied will have a significant in fluence o n t he p art’s cur rent and max imum power dissipation ratings. Precise determination of  PDM is complex and influenced by many factors: 

1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 

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125<br>R θ JA = 33.32+ 23.84/(0.268+Area) EQ.2<br>100 R θ JA = 33.32+ 154/(1.73+Area) EQ.3<br>75<br>50<br>25<br>0.01 0.1 1 10<br>(0.0645) (0.645) (6.45) (64.5)<br>AREA, TOP COPPER AREA in [2]  (cm [2] )<br>oC/W)(RJA  θ<br>**----- End of picture text -----**<br>


**Figure 21.  Thermal Resistance vs Mounting Pad Area** 

2. The number of copper layers and t he thickness of t he board. 

3. The use of external heat sinks. 

4. The use of thermal vias. 

5. Air flow and board orientation. 

6. F or no n s teady st ate ap plications, t he pu lse w idth, t he duty cycle and the transient thermal response of the part, the board and the environment they are in. 

Fairchild p rovides t hermal information to as sist t he designer’s preliminary ap plication ev aluation. F igure 21 defines t he R θJA f or t he de vice as a  f unction of t he t op copper ( component si de) ar ea. T his is  f or a h orizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction t emperature o r p ower di ssipation. P ulse applications ca n be ev aluated us ing t he F airchild device Spice t hermal model or m anually u tilizing t he no rmalized maximum transient thermal impedance curve. 

Thermal resistances co rresponding to ot her co pper areas can be  obtained f rom F igure 21 or  by  calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. 

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FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

## _**PSPICE Electrical Model**_ 

.SUBCKT FDD2582  2 1 3 ; rev July 2002 Ca  12  8 4e-10 Cb  15  14 4.6e-10 Cin  6  8 1.24e-9 

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LDRAIN<br>DPLCAP 5 DRAIN<br>2<br>10<br>RLDRAIN<br>RSLC1<br>51 DBREAK<br>RSLC2<br>515 ESLC 11<br>ESG +- 68 EVTHRES RDRAIN50 16 EBREAK +-1718 DBODY<br>LGATE EVTEMP + 198 - 21 MWEAK<br>GATE1 9RGATE20+ 1822 - 6 MMED<br>RLGATE MSTRO<br>LSOURCE<br>CIN 8 7 SOURCE3<br>RSOURCE<br>RLSOURCE<br>S1A S2A<br>12 13 14 15 17 RBREAK 18<br>8 13<br>S1B S2B RVTEMP<br>CA 13+ CB+ 14 IT -19<br>EGS 68 EDS 58 + VBAT<br>- - 8<br>22<br>RVTHRES<br>+<br>-<br>**----- End of picture text -----**<br>


Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD 

Ebreak 11 7 17 18 160.4 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 

It 8 17 1 

Lgate 1 9 4.88e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 2.24e-9 

RLgate 1 9 48.8 RLdrain 2 5 10 RLsource 3 7 22.4 

Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD 

Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 37e-3 Rgate 9 20 1.8 RSLC1 5 51 RSLCMOD 1.0e-6 RSLC2 5 50 1.0e3 Rsource 8 7 RsourceMOD 11.9e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD 

Vbat 22 19 DC 1 

ESLC 51 50  VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*42),2.5))} 

.MODEL DbodyMOD D (IS=2.3E-12 RS=5.3e-3 TRS1=2.2e-3 TRS2=4.5e-7 + CJO=8.8e-10 M=0.64 TT=3.8e-8 XTI=4.2) .MODEL DbreakMOD D (RS=0.4 TRS1=1.4e-3 TRS2=-5e-5) .MODEL DplcapMOD D (CJO=2.75e-10 IS=1.0e-30 N=10 M=0.67) 

.MODEL MmedMOD NMOS (VTO=3.76 KP=2.7 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.64) .MODEL MstroMOD NMOS (VTO=4.25 KP=30 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MweakMOD NMOS (VTO=3.2 KP=0.068 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=16.4 RS=0.1) 

.MODEL RbreakMOD RES (TC1=1.1e-3 TC2=-1.1e-8) .MODEL RdrainMOD RES (TC1=1.0e-2 TC2=2.6e-5) .MODEL RSLCMOD RES (TC1=2.7e-3 TC2=2.0e-6) .MODEL RsourceMOD RES (TC1=1.0e-3 TC2=1.0e-6) .MODEL RvthresMOD RES (TC1=-3.9e-3 TC2=-1.7e-5) .MODEL RvtempMOD RES (TC1=-3.7e-3 TC2=1.9e-6) 

.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-5.0 VOFF=-2.0) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2.0 VOFF=-5.0) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.4 VOFF=0.3) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=0.3 VOFF=-0.4) 

.ENDS 

Note: For further discussion of the PSPICE model, consult **A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options** ; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. 

FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

## _**SABER Electrical Model**_ 

REV July 2002 ttemplate FDD2582 n2,n1,n3 electrical n2,n1,n3 { var i iscl 

dp..model dbodymod =  (isl=2.3e-12,rs=5.3e-3,trs1=2.2e-3,trs2=4.5e-7,cjo=8.8e-10,m=0.64,tt=3.8e-8,xti=4.2) dp..model dbreakmod = (rs=0.4,trs1=1.4e-3,trs2=-5.0e-5) 

dp..model dplcapmod =  (cjo=2.75e-10,isl=10.0e-30,nl=10,m=0.67) 

m..model mmedmod = (type=_n,vto=3.76,kp=2.7,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=4.25,kp=30,is=1e-30, tox=1) 

**==> picture [428 x 272] intentionally omitted <==**

**----- Start of picture text -----**<br>
m..model mweakmod = (type=_n,vto=3.2,kp=0.068,is=1e-30, tox=1,rs=0.1)<br>sw_vcsp..model s1amod =  (ron=1e-5,roff=0.1,von=-5.0,voff=-2.0)<br>sw_vcsp..model s1bmod =  (ron=1e-5,roff=0.1,von=-2.0,voff=-5.0) DPLCAP 5 LDRAIN DRAIN<br>sw_vcsp..model s2amod =  (ron=1e-5,roff=0.1,von=-0.4,voff=0.3) 2<br>sw_vcsp..model s2bmod =  (ron=1e-5,roff=0.1,von=0.3,voff=-0.4) 10<br>c.ca n12 n8 = 4e-10 RSLC1 RLDRAIN<br>c.cb n15 n14 = 4.6e-10 51<br>c.cin n6 n8 = 1.24e-9 RSLC2<br>ISCL<br>dp.dbody n7 n5 = model=dbodymoddp.dbreak n5 n11 = model=dbreakmod - 50 DBREAK<br>dp.dplcap n10 n5 = model=dplcapmod ESG + 68 EVTHRES RDRAIN16 11 DBODY<br>spe.ebreak n11 n7 n17 n18 = 160.4spe.eds n14 n8 n5 n8 = 1spe.egs n13 n8 n6 n8 = 1spe.esg n6 n10 n6 n8 = 1spe.evthres n6 n21 n19 n8 = 1spe.evtemp n20 n6 n18 n22 = 1 GATE1 RLGATELGATE 9RGATE20+EVTEMP1822 - 6 + 198 CIN- MSTRO21 8 MMED MWEAKEBREAK+-1718 7 LSOURCE SOURCE3<br>i.it n8 n17 = 1 RSOURCE<br>RLSOURCE<br>l.lgate n1 n9 = 4.88e-9l.ldrain n2 n5 = 1.0e-9 12S1A13 14S2A 15 17 RBREAK 18<br>8 13<br>l.lsource n3 n7 = 2.24e-9<br>S1B S2B RVTEMP<br>res.rlgate n1 n9 = 48.8res.rldrain n2 n5 = 10 CA 13+ CB+ 14 IT -19<br>res.rlsource n3 n7 = 22.4 EGS 68 EDS 58 + VBAT<br>m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u - - 8 22<br>m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u  RVTHRES<br>**----- End of picture text -----**<br>


m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u 

res.rbreak n17 n18  = 1, tc1=1.1e-3,tc2=-1.1e-8 res.rdrain n50 n16  = 37e-3, tc1=1.0e-2,tc2=2.6e-5 res.rgate n9 n20 = 1.8 res.rslc1 n5 n51  = 1.0e-6, tc1=2.7e-3,tc2=2.0e-6 res.rslc2 n5 n50 = 1.0e3 res.rsource n8 n7  = 11.9e-3, tc1=1.0e-3,tc2=1.0e-6 res.rvthres n22 n8  = 1, tc1=-3.9e-3,tc2=-1.7e-5 res.rvtemp n18 n19  = 1, tc1=-3.7e-3,tc2=1.9e-6 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod 

v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/42))** 2.5)) } } 

FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

|**_SPICE Thermal Model_**<br>REV 19 July 2002<br>FDD2582<br>CTHERM1 TH 6 1.6e-3<br>CTHERM2 6 5 4.5e-3<br>CTHERM3 5 4 5.0e-3<br>CTHERM4 4 3 8.0e-3<br>CTHERM5 3 2 8.2e-3<br>CTHERM6 2 TL 4.7e-2<br>RTHERM1 TH 6 3.3e-2<br>RTHERM2 6 5 7.9e-2<br>RTHERM3 5 4 9.5e-2<br>RTHERM4 4 3 1.4e-1<br>RTHERM5 3 2 2.9e-1<br>RTHERM6 2 TL 6.7e-1<br>**_SABER Thermal Model_**<br>SABER thermal model FDD2582<br>template thermal_model th tl<br>thermal_c th, tl<br>{<br>ctherm.ctherm1 th 6 =1.6e-3<br>ctherm.ctherm2 6 5 =4.5e-3<br>ctherm.ctherm3 5 4 =5.0e-3<br>ctherm.ctherm4 4 3 =8.0e-3<br>ctherm.ctherm5 3 2 =8.2e-3<br>ctherm.ctherm6 2 tl =4.7e-2<br>rrtherm.rtherm1 th 6 =3.3e-2<br>rtherm.rtherm2 6 5 =7.9e-2<br>rtherm.rtherm3 5 4 =9.5e-2<br>rtherm.rtherm4 4 3 =1.4e-1<br>rtherm.rtherm5 3 2 =2.9e-1<br>rtherm.rtherm6 2 tl =6.7e-1<br>}<br>**RTHERM4**<br>**RTHERM6**<br>**RTHERM5**<br>**RTHERM3**<br>**RTHERM2**<br>**RTHERM1**|**CTHERM4**<br>**CTHERM6**<br>**CTHERM5**<br>**CTHERM3**<br>**CTHERM2**<br>**CTHERM1**<br>**tl**<br>**2**<br>**3**<br>**4**<br>**5**<br>**6**<br>**th**<br>**JUNCTION**<br>**CASE**|
|---|---|



FDD2582  Rev. 1.2 

©2002 Fairchild Semiconductor Corporation 

**==> picture [37 x 58] intentionally omitted <==**

**==> picture [37 x 54] intentionally omitted <==**

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