# Power MOSFET, N Channel, 30 V, 40 A, 4700 µohm, TO-263 (D2PAK), Surface Mount

![Product image](https://novapart.co/image/farnell:1504972/)

**URL**: https://novapart.co/products/FDB8874/power-mosfet-n-channel-30-v-40-a-4700-ohm-to-263
**SKU**: FDB8874
**Manufacturer**: ONSEMI
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.4760
**Stock**: 10+

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:40A; Drain Source Voltage Vds:30V; On Resistance Rds(on):0.0047ohm; Rds(on) Test Voltage Vgs:10V; Threshold Voltage Vgs:2.5V; Power Dissipatio

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| No. Of Pins | 3Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 110W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TO-263 (D2PAK) |
| Drain Source Voltage Vds | 30V |
| Operating Temperature Max | 175°C |
| Continuous Drain Current Id | 40A |
| Drain Source On State Resistance | 4700µohm |
| Gate Source Threshold Voltage Max | 2.5V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:1504972/)

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November 2004<br>**----- End of picture text -----**<br>


## **FDB8874** 

**N-Channel PowerTrench[®] MOSFET 30V, 121A, 4.7m** Ω 

## **General  Description Features** 

|**30V, 121A, 4.7m**Ω<br>**General  Description**|**Features**|**Features**|**Features**|**Features**|**Features**|**Features**|**Features**|**Features**||||
|---|---|---|---|---|---|---|---|---|---|---|---|
|This N-Channel MOSFET has been designed specifically to|• rDS(ON)= 4.7mΩ, VGS= 10V, ID= 40A|||||||||||
|improve the overall efficiency of DC/DC converters using||||||||||||
|either synchronous or conventional switching PWM|• rDS(ON)= 6.0mΩ, VGS= 4.5V, ID= 40A|||||||||||
|controllers.  It has been optimized for low gate charge, low<br>rDS(ON)and fast switching speed.|• High performance trench technology for extremely low<br>rDS(ON)||||High performance trench technology for extremely low|High performance trench technology for extremely low||High performance trench technology for extremely low|High performance trench technology for extremely low|||
||• Low gate charge||Low gate charge|||||||||
|**Applications**|• High power and current handling capability|||||||||||
|• DC/DC converters||||||||||||
|**GATE**<br>.<br>><br>a~~n~~||||**G**|||**D**|||||
|**SOURCE**<br>**DRAIN**||||||||||||
|**TO-263AB**<br>**(FLANGE)**|||||||**S**|||||
|FDB SERIES||||||||||||
|**MOSFET Maximum Ratings  **TC= 25°C unless otherwise noted||||||||||||
|**Symbol**<br>**Parameter**|||||||**Ratings**||||**Units**|
|VDSS<br>Drain to Source Voltage|||||||30||||V|
|VGS<br>Gate to Source Voltage|||||||±20||||V|
|Drain Current||||||||||||
|Continuous (TC= 25oC, VGS= 10V) (Note 1)|||||||121||||A|
|ID<br>Continuous (TC= 25oC, VGS= 4.5V) (Note 1)|||||||107||||A|
|Continuous (Tamb= 25oC, VGS= 10V, with RθJA= 43oC/W)|||||||21||||A|
|Pulsed|||||||Figure 4||||A|
|EAS<br>Single Pulse Avalanche Energy (Note 2)|||||||105||||mJ|
|PD<br>Power dissipation<br>Derate above 25oC|||||||110<br>0.73||||W<br>W/oC|
|TJ, TSTG<br>Operating and Storage Temperature|||||||-55 to 175||||oC|
|**Thermal Characteristics**||||||||||||
|RθJC<br>Thermal Resistance Junction to Case TO-263|||||||1.36||||oC/W|
|RθJA<br>Thermal Resistance Junction to Ambient TO-263 ( Note 3)|Thermal Resistance Junction to Ambient TO-263 ( Note 3)||Thermal Resistance Junction to Ambient TO-263 ( Note 3)||||62||||oC/W|
|RθJA<br>Thermal Resistance Junction to Ambient TO-263, 1in2copper pad area|||||||43||||oC/W|
|**Package Marking and Ordering Information**||||||||||||
|**Device Marking**<br>**Device**<br>**Package**|||**Reel Size**||||**Tape Width**||**Quantity**|||
|FDB8874<br>FDB8874<br>TO-263AB|||330mm||||24mm||800 units|800 units||
|FDB8874<br>FDB8874_NL (Note 4)<br>TO-263AB|||330mm||||24mm||800 units|800 units||



- High performance trench technology for extremely low rDS(ON) 

©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

|**Electrical Characteristics**TC= 25°C unless otherwise noted|**Electrical Characteristics**TC= 25°C unless otherwise noted|**Electrical Characteristics**TC= 25°C unless otherwise noted|**Electrical Characteristics**TC= 25°C unless otherwise noted|||||
|---|---|---|---|---|---|---|---|
|**Symbol**|**Parameter**|**Test Conditions**||**Min**|**Typ**|**Max**|**Units**|
|**Off Characteristics**||||||||
|BVDSS|Drain to Source Breakdown Voltage|ID= 250µA, VGS|= 0V|30|-|-|V|
|IDSS|Zero Gate Voltage Drain Current|VDS= 24V<br>VGS= 0V||-|-|1|µA|
||||TC= 150oC|-|-|250||
|IGSS|Gate to Source Leakage Current|VGS=±20V||-|-|±100|nA|
|**On Characteristics**||||||||
|VGS(TH)|Gate to Source Threshold Voltage|VGS= VDS, ID=|250µA|1.2|-|2.5|V|
|rDS(ON)|Drain to Source On Resistance|ID= 40A, VGS= 10V||-|0.0033|0.0047|Ω|
|||ID= 40A, VGS= 4.5V||-|0.0041|0.0060||
|||ID= 40A, VGS= 10V,<br>TJ= 175oC||-|0.0062|0.0080||
|**Dynamic Characteristics**||||||||
|CISS|Input Capacitance|VDS= 15V, VGS= 0V,<br>f = 1MHz||-|3130|-|pF|
|COSS|Output Capacitance|||-|590|-|pF|
|CRSS|Reverse Transfer Capacitance|||-|345|-|pF|
|RG|Gate Resistance|VGS= 0.5V, f = 1MHz||-|1.9|-|Ω|
|Qg(TOT)|Total Gate Charge at 10V|VGS= 0V to 10V||-|56|72|nC|
|Qg(5)|Total Gate Charge at 5V|VGS= 0V to 5V||-|30|38|nC|
|Qg(TH)|Threshold Gate Charge|VGS= 0V to 1V||-|3.0|4.0|nC|
|Qgs|Gate to Source Gate Charge|||-|9.0|-|nC|
|Qgs2|Gate Charge Threshold to Plateau|||-|6.0|-|nC|
|Qgd|Gate to Drain “Miller” Charge|||-|11|-|nC|
|**Switching Characteristics**(VGS= 10V)||||||||
|tON|Turn-On Time|VDD= 15V, ID= 40A<br>VGS= 10V, RGS= 4.7Ω||-|-|217|ns|
|td(ON)|Turn-On Delay Time|||-|10|-|ns|
|tr|Rise Time|||-|135|-|ns|
|td(OFF)|Turn-Off Delay Time|||-|45|-|ns|
|tf|Fall Time|||-|34|-|ns|
|tOFF|Turn-Off Time|||-|-|118|ns|
|**Drain-Source Diode Characteristics**||||||||
|VSD|Source to Drain Diode Voltage|ISD= 40A||-|-|1.25|V|
|||ISD= 20A||-|-|1.0|V|
|trr|Reverse RecoveryTime|ISD= 40A, dISD/dt = 100A/µs||-|-|32|ns|
|QRR|Reverse Recovered Charge|ISD= 40A, dISD/dt = 100A/µs||-|-|18|nC|



**Notes:** 

- **1:** Package current limitation is 80A. 

- **2:** Starting TJ = 25°C, L = 51uH, IAS = 64A, VDD = 27V, VGS = 10V. 

- **3:** Pulse width = 100s. 

- **4:** FDB8874_NL is lead free product. FDB8874_NL marking will appear on the reel label. 

©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

## **Typical Characteristics** TC = 25°C unless otherwise noted 

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1.2<br>125<br>CURRENT LIMITED<br>1.0 BY PACKAGE<br>100<br>0.8<br>75<br>0.6 VGS = 4.5V VGS = 10V<br>50<br>0.4<br>0.2 25<br>0 0<br>0 25 50 75 100 125 150 175 25 50 75 100 125 150 175<br>TC, CASE TEMPERATURE ( [o] C) TC, CASE TEMPERATURE ( [o] C)<br>Figure 1.  Normalized Power Dissipation vs Case  Figure 2.  Maximum Continuous Drain Current vs<br>Temperature Case Temperature<br>2<br>DUTY CYCLE - DESCENDING ORDER<br>1 0.5<br>0.2<br>0.1<br>0.05<br>0.02<br>0.01<br>PDM<br>0.1<br>t 1<br>t 2<br>NOTES:<br>DUTY FACTOR: D = t 1 /t 2<br>SINGLE PULSE PEAK TJ = PDM x Z θ JC x R θ JC + TC<br>0.01<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t, RECTANGULAR PULSE DURATION (s)<br>Figure 3.  Normalized Maximum Transient Thermal Impedance<br>1000<br>TRANSCONDUCTANCE TC = 25 [o] C<br>MAY LIMIT CURRENT FOR TEMPERATURES<br>IN THIS REGION ABOVE 25 [o] C DERATE PEAK<br>CURRENT AS FOLLOWS:<br>V GS  = 4.5V I = I25  175 - TC<br>150<br>VGS = 10V<br>100<br>50<br>10 [-5] 10 [-4] 10 [-3] 10 [-2] 10 [-1] 10 [0] 10 [1]<br>t, PULSE WIDTH (s)<br>Figure 4.  Peak Current Capability<br>, DRAIN CURRENT (A)<br>ID<br>POWER DISSIPATION MULTIPLIER<br>, NORMALIZED<br>ZJC θ<br>THERMAL IMPEDANCE<br>, PEAK CURRENT (A)<br>IDM<br>**----- End of picture text -----**<br>


**Figure 1.  Normalized Power Dissipation vs Case Figure 2.  Maximum Continuous Drain Current vs Temperature Case Temperature** 

©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

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Typical Characteristics  TC = 25°C unless otherwise noted<br>1000 500<br>If R = 0<br>10 µ s tIf R AV  = (L)(I  ≠  0 AS )/(1.3*RATED BV DSS  - V DD )<br>tAV = (L/R)ln[(IAS*R)/(1.3*RATED BVDSS - VDD) +1]<br>100 100<br>100 µ s<br>STARTING T J  = 25 [o] C<br>10<br>OPERATION IN THIS<br>AREA MAY BE<br>LIMITED BY r DS(ON) 10<br>1ms<br>1<br>SINGLE PULSE 10ms STARTING T J = 150 [o] C<br>TJ = MAX RATED DC<br>TC = 25 [o] C<br>0.1 1<br>1 10 60 0.01 0.1 1 10 100<br>VDS, DRAIN TO SOURCE VOLTAGE (V) tAV, TIME IN AVALANCHE (ms)<br>Figure 5.  Forward Bias Safe Operating Area NOTE: Refer to Fairchild Application Notes AN7514 and AN7515<br>Figure 6.  Unclamped Inductive Switching<br>Capability<br>160 160<br>PULSE DURATION = 80 µ s<br>DUTY CYCLE = 0.5% MAX VGS = 5V<br>VDD = 15V VGS = 4V<br>120 120<br>VGS = 10V<br>80 80<br> TJ = 25 [o] C<br>VGS = 3V<br>40 40<br> TJ = 175 [o] C T J = -55 [o] C  TC =  25 [o] C<br>PULSE DURATION = 80 µ s<br>DUTY CYCLE = 0.5% MAX<br>0 0<br>0 0.2 0.4 0.6 0.8 1.0<br>2.0 2.5 3.0 3.5 4.0<br>VGS, GATE TO SOURCE VOLTAGE (V) VDS, DRAIN TO SOURCE VOLTAGE (V)<br>Figure 7.  Transfer Characteristics Figure 8.  Saturation Characteristics<br>12 1.8<br>PULSE DURATION = 80 µ s  PULSE DURATION = 80 µ s<br>ID = 40A DUTY CYCLE = 0.5% MAX DUTY CYCLE = 0.5% MAX<br>1.6<br>10<br>1.4<br>8<br>1.2<br>6<br>1.0<br>ID = 1A<br>4<br>0.8<br>VGS = 10V, ID = 40A<br>2 0.6<br>2 4 6 8 10 -80 -40 0 40 80 120 160 200<br>VGS, GATE TO SOURCE VOLTAGE (V) TJ, JUNCTION TEMPERATURE ( [o] C)<br>Figure 9.  Drain to Source On Resistance vs Gate  Figure 10.  Normalized Drain to Source On<br>Voltage and Drain Current Resistance vs Junction Temperature<br>, DRAIN CURRENT (A)<br>ID , AVALANCHE CURRENT (A)<br>IAS<br>, DRAIN CURRENT (A)ID , DRAIN CURRENT (A)ID<br>) Ω<br>, DRAIN TO SOURCE<br>ON RESISTANCE (m ON RESISTANCE<br>rDS(ON)<br>NORMALIZED DRAIN TO SOURCE<br>**----- End of picture text -----**<br>


©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

**Typical Characteristics** TC = 25°C unless otherwise noted 

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1.2 1.10<br>VGS = VDS, ID = 250 µ A  ID = 250 µ A<br>1.0 1.05<br>0.8 1.00<br>0.6 0.95<br>0.4 0.90<br>-80 -40 0 40 80 120 160 200 -80 -40 0 40 80 120 160 200<br>TJ, JUNCTION TEMPERATURE ( [o] C) TJ, JUNCTION TEMPERATURE ( [o] C)<br>Figure 11.  Normalized Gate Threshold Voltage vs  Figure 12.  Normalized Drain to Source<br>Junction Temperature Breakdown Voltage vs Junction Temperature<br>5000 10<br>VDD = 15V<br>CISS  =  CGS + CGD 8<br>COSS  ≅  CDS + CGD<br>1000 6<br>CRSS  =  CGD<br>4<br>WAVEFORMS IN<br>2 DESCENDING ORDER:<br>ID = 40A<br>VGS = 0V, f = 1MHz ID = 1A<br>100 0<br>0.1 1 10 30 0 10 20 30 40 50 60<br>VDS, DRAIN TO SOURCE VOLTAGE (V) Qg, GATE CHARGE (nC)<br>NORMALIZED GATE THRESHOLD VOLTAGE BREAKDOWN VOLTAGE<br>NORMALIZED DRAIN TO SOURCE<br>C, CAPACITANCE (pF)<br>, GATE TO SOURCE VOLTAGE (V)<br>GS<br>V<br>**----- End of picture text -----**<br>


**Figure 11.  Normalized Gate Threshold Voltage vs Junction Temperature** 

**Figure 13.  Capacitance vs Drain to Source Figure 14.  Gate Charge Waveforms for Constant Voltage Gate Current** 

©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

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Test Circuits and Waveforms<br>VDS<br>BVDSS<br>L tP<br>VDS<br>REQUIRED PEAK IVARY tP TO OBTAINAS RG + VDD IAS VDD<br>VGS -<br>DUT<br>tP<br>0V IAS<br>0.01 Ω 0<br>tAV<br>Figure 15.  Unclamped Energy Test Circuit Figure 16.  Unclamped Energy Waveforms<br>**----- End of picture text -----**<br>


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VDS<br>VDD Qg(TOT)<br>L VDS VGS<br>VGS = 10V<br>VGS + Qg(5)<br>VDD Qgs2 VGS = 5V<br>-<br>DUT<br>Ig(REF) VGS = 1V<br>0<br>Qg(TH)<br>Qgs Qgd<br>Ig(REF)<br>0<br>Figure 17.  Gate Charge Test Circuit Figure 18.  Gate Charge Waveforms<br>**----- End of picture text -----**<br>


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VDS tON tOFF<br>td(ON) td(OFF)<br>RL tr tf<br>VDS<br>90% 90%<br>VGS +<br>- VDD 0 10% 10%<br>DUT 90%<br>RGS<br>VGS 50% 50%<br>PULSE WIDTH<br>VGS 10%<br>0<br>Figure 19.  Switching Time Test Circuit Figure 20.  Switching Time Waveforms<br>**----- End of picture text -----**<br>


©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

## _**Thermal Resistance vs. Mounting Pad Area**_ 

The maximum rated junction temperature, TJM, and the thermal resistance of the heat dissipating path determines the maximum allowable device power dissipation, PDM, in an application. Therefore the application’s ambient temperature, TA ([o] C), and thermal resistance RθJA ([o] C/W) must be reviewed to ensure that TJM is never exceeded. Equation 1 mathematically represents the relationship and serves as the basis for establishing the rating of the part. 

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In using surface mount devices such as the TO-263 package, the environment in which it is applied will have a significant influence on the part’s current and maximum power dissipation ratings. Precise determination of PDM is complex and influenced by many factors: 

1. Mounting pad area onto which the device is attached and whether there is copper on one side or both sides of the board. 

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**----- Start of picture text -----**<br>
80<br>R θ JA = 26.51+ 19.84/(0.262+Area) EQ.2<br>R θ JA = 26.51+ 128/(1.69+Area) EQ.3<br>60<br>40<br>20<br>0.1 1 10<br>(0.645) (6.45) (64.5)<br>AREA, TOP COPPER AREA in [2]  (cm [2] )<br>Figure 21.  Thermal Resistance vs Mounting<br>Pad Area<br>oC/W)(RJA  θ<br>**----- End of picture text -----**<br>


2. The number of copper layers and the thickness of the board. 

3. The use of external heat sinks. 

4. The use of thermal vias. 

5. Air flow and board orientation. 

6. For non steady state applications, the pulse width, the duty cycle and the transient thermal response of the part, the board and the environment they are in. 

Fairchild provides thermal information to assist the designer’s preliminary application evaluation. Figure 21 defines the RθJA for the device as a function of the top copper (component side) area. This is for a horizontally positioned FR-4 board with 1oz copper after 1000 seconds of steady state power with no air flow. This graph provides the necessary information for calculation of the steady state junction temperature or power dissipation. Pulse applications can be evaluated using the Fairchild device Spice thermal model or manually utilizing the normalized maximum transient thermal impedance curve. 

Thermal resistances corresponding to other copper areas can be obtained from Figure 21 or by calculation using Equation 2 or 3. Equation 2 is used for copper area defined in inches square and equation 3 is for area in centimeters square. The area, in square inches or square centimeters is the top copper area including the gate and source pads. 

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©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

## _**PSPICE Electrical Model**_ 

.SUBCKT FDB8874  2 1 3 ; rev May 2004 Ca 12 8 2.3e-9 Cb 15 14 2.25e-9 Cin 6 8 2.9e-9 

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LDRAIN<br>DPLCAP 5 DRAIN<br>2<br>10<br>RLDRAIN<br>RSLC1<br>51 DBREAK<br>RSLC2<br>515 ESLC 11<br>ESG +- 68 EVTHRES RDRAIN50 16 EBREAK +-1718 DBODY<br>LGATE EVTEMP + 198 - 21 MWEAK<br>GATE RGATE + 18 - 6<br>1 9 20 22 MMED<br>RLGATE MSTRO<br>LSOURCE<br>CIN 8 7 SOURCE3<br>RSOURCE<br>RLSOURCE<br>S1A S2A<br>12 13 14 15 17 RBREAK 18<br>8 13<br>S1B S2B RVTEMP<br>CA 13+ CB+ 14 IT -19<br>EGS 68 EDS 58 + VBAT<br>- - 8<br>22<br>RVTHRES<br>+<br>-<br>**----- End of picture text -----**<br>


Dbody 7 5 DbodyMOD Dbreak 5 11 DbreakMOD Dplcap 10 5 DplcapMOD 

Ebreak 11 7 17 18 33.3 Eds 14 8 5 8 1 Egs 13 8 6 8 1 Esg 6 10 6 8 1 Evthres 6 21 19 8 1 Evtemp 20 6 18 22 1 

It 8 17 1 

Lgate 1 9 8.5e-9 Ldrain 2 5 1.0e-9 Lsource 3 7 2.7e-9 

RLgate 1 9 85 RLdrain 2 5 10 RLsource 3 7 27 

Mmed 16 6 8 8 MmedMOD Mstro 16 6 8 8 MstroMOD Mweak 16 21 8 8 MweakMOD 

Rbreak 17 18 RbreakMOD 1 Rdrain 50 16 RdrainMOD 1.3e-3 Rgate 9 20 1.9 RSLC1 5 51 RSLCMOD 1e-6 RSLC2 5 50 1e3 Rsource 8 7 RsourceMOD 1.7e-3 Rvthres 22 8 RvthresMOD 1 Rvtemp 18 19 RvtempMOD 1 S1a 6 12 13 8 S1AMOD S1b 13 12 13 8 S1BMOD S2a 6 15 14 13 S2AMOD S2b 13 15 14 13 S2BMOD 

Vbat 22 19 DC 1 

ESLC 51 50  VALUE={(V(5,51)/ABS(V(5,51)))*(PWR(V(5,51)/(1e-6*500),10))} 

.MODEL DbodyMOD D (IS=4.1E-12 IKF=10 N=1.01 RS=2e-3 TRS1=8e-4 TRS2=2e-7 + CJO=1.22e-9 M=0.57 TT=3e-12 XTI=3) .MODEL DbreakMOD D (RS=8e-2 TRS1=1e-3 TRS2=-8.9e-6) .MODEL DplcapMOD D (CJO=1.12e-9 IS=1e-30 N=10 M=0.42) 

.MODEL MmedMOD NMOS (VTO=2 KP=9 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=1.9) .MODEL MstroMOD NMOS (VTO=2.5 KP=390 IS=1e-30 N=10 TOX=1 L=1u W=1u) .MODEL MweakMOD NMOS (VTO=1.72 KP=0.05 IS=1e-30 N=10 TOX=1 L=1u W=1u RG=19 RS=0.1) 

.MODEL RbreakMOD RES (TC1=8.3e-4 TC2=-8e-7) .MODEL RdrainMOD RES (TC1=7.5e-3 TC2=6e-6) .MODEL RSLCMOD RES (TC1=1e-4 TC2=1e-6) .MODEL RsourceMOD RES (TC1=1e-4 TC2=2.5e-6) .MODEL RvthresMOD RES (TC1=-2.4e-3 TC2=-8e-6) .MODEL RvtempMOD RES (TC1=-1.8e-3 TC2=2e-7) 

.MODEL S1AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-4 VOFF=-3) .MODEL S1BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-3 VOFF=-4) .MODEL S2AMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-2 VOFF=-0.5) .MODEL S2BMOD VSWITCH (RON=1e-5 ROFF=0.1 VON=-0.5 VOFF=-2) .ENDS 

Note: For further discussion of the PSPICE model, consult **A New PSPICE Sub-Circuit for the Power MOSFET Featuring Global Temperature Options** ; IEEE Power Electronics Specialist Conference Records, 1991, written by William J. Hepp and C. Frank Wheatley. 

©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

## _**SABER Electrical Model**_ 

rev May 2004 template FDB8874 n2,n1,n3 electrical n2,n1,n3 { var i iscl 

dp..model dbodymod =  (isl=4.1e-12,ikf=10,nl=1.01,rs=2e-3,trs1=8e-4,trs2=2e-7,cjo=1.22e-9,m=0.57,tt=3e-12,xti=3) dp..model dbreakmod = (rs=8e-2,trs1=1e-3,trs2=-8.9e-6) 

dp..model dplcapmod =  (cjo=1.12e-9,isl=10e-30,nl=10,m=0.42) m..model mmedmod = (type=_n,vto=2,kp=9,is=1e-30, tox=1) m..model mstrongmod = (type=_n,vto=2.5,kp=390,is=1e-30, tox=1) m..model mweakmod = (type=_n,vto=1.72,kp=0.05,is=1e-30, tox=1,rs=0.1) sw_vcsp..model s1amod =  (ron=1e-5,roff=0.1,von=-4,voff=-3) sw_vcsp..model s1bmod =  (ron=1e-5,roff=0.1,von=-3,voff=-4) sw_vcsp..model s2amod =  (ron=1e-5,roff=0.1,von=-2,voff=-0.5) sw_vcsp..model s2bmod =  (ron=1e-5,roff=0.1,von=-0.5,voff=-2) **10** c.ca n12 n8 = 2.3e-9 c.cb n15 n14 = 2.25e-9 c.cin n6 n8 = 2.9e-9 

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LDRAIN<br>DPLCAP 5 DRAIN<br>2<br>10<br>RLDRAIN<br>RSLC1<br>51<br>RSLC2<br>ISCL<br>- 50 DBREAK<br>ESG + 68 EVTHRES RDRAIN16 11 DBODY<br>LGATE EVTEMP + 198 - 21 MWEAK<br>GATE1 9RGATE20+ 1822 - 6 MMED EBREAK+<br>RLGATE MSTRO 17<br>CIN 8 -18 7 LSOURCE SOURCE3<br>RSOURCE<br>RLSOURCE<br>**----- End of picture text -----**<br>


dp.dbody n7 n5 = model=dbodymod dp.dbreak n5 n11 = model=dbreakmod dp.dplcap n10 n5 = model=dplcapmod 

spe.ebreak n11 n7 n17 n18 = 33.3 spe.eds n14 n8 n5 n8 = 1 spe.egs n13 n8 n6 n8 = 1 spe.esg n6 n10 n6 n8 = 1 spe.evthres n6 n21 n19 n8 = 1 spe.evtemp n20 n6 n18 n22 = 1 

i.it n8 n17 = 1 

**==> picture [216 x 87] intentionally omitted <==**

**----- Start of picture text -----**<br>
S1A S2A<br>12 13 14 15 17 RBREAK 18<br>8 13<br>S1B S2B RVTEMP<br>CA 13+ CB+ 14 IT -19<br>EGS 68 EDS 58 + VBAT<br>- - 8<br>22<br>RVTHRES<br>**----- End of picture text -----**<br>


l.lgate n1 n9 = 8.5e-9 l.ldrain n2 n5 = 1.0e-9 l.lsource n3 n7 = 2.7e-9 

res.rlgate n1 n9 = 85 res.rldrain n2 n5 = 10 res.rlsource n3 n7 = 27 

m.mmed n16 n6 n8 n8 = model=mmedmod, l=1u, w=1u m.mstrong n16 n6 n8 n8 = model=mstrongmod, l=1u, w=1u m.mweak n16 n21 n8 n8 = model=mweakmod, l=1u, w=1u 

res.rbreak n17 n18  = 1, tc1=8.3e-4,tc2=-8e-7 res.rdrain n50 n16  = 1.3e-3, tc1=7.5e-3,tc2=6e-6 res.rgate n9 n20 = 1.9 res.rslc1 n5 n51  = 1e-6, tc1=1e-4,tc2=1e-6 res.rslc2 n5 n50 = 1e3 res.rsource n8 n7  = 1.7e-3, tc1=1e-4,tc2=2.5e-6 res.rvthres n22 n8  = 1, tc1=-2.4e-3,tc2=-8e-6 res.rvtemp n18 n19  = 1, tc1=-1.8e-3,tc2=2e-7 sw_vcsp.s1a n6 n12 n13 n8 = model=s1amod sw_vcsp.s1b n13 n12 n13 n8 = model=s1bmod sw_vcsp.s2a n6 n15 n14 n13 = model=s2amod sw_vcsp.s2b n13 n15 n14 n13 = model=s2bmod 

v.vbat n22 n19 = dc=1 equations { i (n51->n50) +=iscl iscl: v(n51,n50) = ((v(n5,n51)/(1e-9+abs(v(n5,n51))))*((abs(v(n5,n51)*1e6/500))** 10)) } } 

©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

|**_PSPICE Thermal Model_**<br>REV 23 May 2004<br>FDB8874T<br>CTHERM1 TH 6 1.9e-3<br>CTHERM2 6 5 2.8e-3<br>CTHERM3 5 4 3.5e-3<br>CTHERM4 4 3 3.6e-3<br>CTHERM5 3 2 4.0e-3<br>CTHERM6 2 TL 1.6e-2<br>RTHERM1 TH 6 3.8e-2<br>RTHERM2 6 5 5.0e-2<br>RTHERM3 5 4 1.0e-1<br>RTHERM4 4 3 1.8e-1<br>RTHERM5 3 2 3.5e-1<br>RTHERM6 2 TL 3.7e-1<br>**_SABER Thermal Model_**<br>SABER thermal model FDB8874T<br>template thermal_model th tl<br>thermal_c th, tl<br>{<br>ctherm.ctherm1 th 6 =1.9e-3<br>ctherm.ctherm2 6 5 =2.8e-3<br>ctherm.ctherm3 5 4 =3.5e-3<br>ctherm.ctherm4 4 3 =3.6e-3<br>ctherm.ctherm5 3 2 =4.0e-3<br>ctherm.ctherm6 2 tl =1.6e-2<br>rtherm.rtherm1 th 6 =3.8e-2<br>rtherm.rtherm2 6 5 =5.0e-2<br>rtherm.rtherm3 5 4 =1.0e-1<br>rtherm.rtherm4 4 3 =1.8e-1<br>rtherm.rtherm5 3 2 =3.5e-1<br>rtherm.rtherm6 2 tl =3.7e-1<br>}<br>**RTHERM4**<br>**RTHERM6**<br>**RTHERM5**<br>**RTHERM3**<br>**RTHERM2**<br>**RTHERM1**|**CTHERM4**<br>**CTHERM6**<br>**CTHERM5**<br>**CTHERM3**<br>**CTHERM2**<br>**CTHERM1**<br>**tl**<br>**2**<br>**3**<br>**4**<br>**5**<br>**6**<br>**th**<br>**JUNCTION**<br>**CASE**|
|---|---|



©2004 Fairchild Semiconductor Corporation 

FDB8874 Rev. A2 

## **TRADEMARKS** 

The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not intended to be an exhaustive list of all such trademarks. 

|ACEx™|FAST|ISOPLANAR™|Power247™|Stealth™|
|---|---|---|---|---|
|ActiveArray™|<br>FASTr™|LittleFET™|PowerEdge™|SuperFET™|
|<br>Bottomless™|FPS™|MICROCOUPLER™|PowerSaver™|SuperSOT™-3|
|CoolFET™|FRFET™|MicroFET™|PowerTrench|SuperSOT™-6|
|_CROSSVOLT_™|GlobalOptoisolator™|MicroPak™|QFET|SuperSOT™-8|
|DOME™|GTO™|MICROWIRE™|QS™|SyncFET™|
|EcoSPARK™|HiSeC™|MSX™|QT Optoelectronics™|TinyLogic|
|E2CMOS™|I2C™|MSXPro™|Quiet Series™|TINYOPTO™|
|EnSigna™|_i-Lo_™|OCX™|RapidConfigure™|TruTranslation™|
|ImpliedDisconnect™<br>FACT™<br>FACT Quiet Series™||OCXPro™<br>OPTOLOGIC|RapidConnect™<br>µSerDes™|UHC™<br>UltraFET|
|Across the board. Around the world.™||OPTOPLANAR™|SILENT SWITCHER|UniFET™|
|The Power Franchise||PACMAN™|SMART START™|VCX™|
|Programmable Active Droop™||POP™|SPM™||



## **DISCLAIMER** 

FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS. 

## **LIFE SUPPORT POLICY** 

FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION. As used herein: 

1. Life support devices or systems are devices or 2. A critical component is any component of a life systems which, (a) are intended for surgical implant into support device or system whose failure to perform can the body, or (b) support or sustain life, or (c) whose be reasonably expected to cause the failure of the life failure to perform when properly used in accordance support device or system, or to affect its safety or with instructions for use provided in the labeling, can be effectiveness. reasonably expected to result in significant injury to the user. 

## **PRODUCT STATUS DEFINITIONS** 

## **Definition of Terms** 

|**Definition of Terms**|||
|---|---|---|
|**Datasheet Identification**|**Product Status**|**Definition**|
|Advance Information|Formative or<br>In Design|This datasheet contains the design specifications for<br>product development. Specifications may change in<br>any manner without notice.|
|Preliminary|First Production|This datasheet contains preliminary data, and<br>supplementary data will be published at a later date.<br>Fairchild Semiconductor reserves the right to make<br>changes at any time without notice in order to improve<br>design.|
|No Identification Needed|Full Production|This datasheet contains final specifications. Fairchild<br>Semiconductor reserves the right to make changes at<br>any time without notice in order to improve design.|
|Obsolete|Not In Production|This datasheet contains specifications on a product<br>that has been discontinued by Fairchild semiconductor.<br>The datasheet is printed for reference information only.|



Rev. I14 



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---

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