# Power MOSFET, N Channel, 25 V, 40 A, 1800 µohm, TSDSON, Surface Mount

![Product image](https://novapart.co/image/farnell:2480780RL/)

**URL**: https://novapart.co/products/BSZ018NE2LSIATMA1/power-mosfet-n-channel-25-v-40-a-1800-ohm-tsdson
**SKU**: BSZ018NE2LSIATMA1
**Manufacturer**: INFINEON
**Category**: Semiconductors - Discretes || FETs || Single MOSFETs
**Price**: €0.5460
**Stock**: 1000+
**Lead Time**: 2 days (indicative)

## Description

Transistor Polarity:N Channel; Continuous Drain Current Id:40A; Drain Source Voltage Vds:25V; On Resistance Rds(on):0.0015ohm; Available until stocks are exhausted Alternative available

## Specifications

| Parameter | Value |
|---|---|
| Msl | MSL 1 - Unlimited |
| Svhc | No SVHC (21-Jan-2025) |
| No. Of Pins | 8Pins |
| Channel Type | N Channel |
| Product Range | - |
| Qualification | - |
| Power Dissipation | 69W |
| Transistor Mounting | Surface Mount |
| Rds(On) Test Voltage | 10V |
| Transistor Case Style | TSDSON |
| Drain Source Voltage Vds | 25V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 40A |
| Drain Source On State Resistance | 1800µohm |
| Gate Source Threshold Voltage Max | 2V |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:2480780RL/)

**BSZ018NE2LSI** 

## **OptiMOS[TM] Power-MOSFET** 

## **Product Summary** 

## **Features** 

- Optimized for high performance Buck converter 

- Monolithic integrated Schottky like diode 

- Very low on-resistance _R_ DS(on) @ _V_ GS=4.5 V 

- 100% avalanche tested 

- N-channel 

- Qualified according to JEDEC[1)] for target applications 

|_V_DS||||25||V||
|---|---|---|---|---|---|---|---|
|||||||||
|_R_DS(on),max||||1.8||mW|W|
|_I_D||||40||A||
|||||||||
|||||||||
|_Q_OSS||||23||nC||
|_Q_G(0V..10V)||||36||nC||
|||||||||
||PG-TSDSON-8|||||||
||(fused leads)|||||||



- Pb-free lead  plating; RoHS compliant 

- Halogen-free according to IEC61249-2-21 

**Type Package Marking** BSZ018NE2LSI PG-TSDSON-8 (fused leads) 018NE2I ~~————~}~~ **Maximum ratings,** at _T_ j=25 °C, unless otherwise specified 

|**Maximum ratings,**at_T_j=25 °C, unless otherwise specified=25 °C, unless otherwise specified<br>~~————~}~~|j=25 °C, unless otherwise specified=25 °C, unless otherwise specified<br>~~————~}~~|j=25 °C, unless otherwise specified=25 °C, unless otherwise specified<br>~~————~}~~|~~————~}~~ ge|ge|
|---|---|---|---|---|
|**Parameter**|**Symbol **|**Conditions**|**Unit**<br>**Value**|**Unit**|
|Continuous drain current|_I_D|_V_GS=10 V,_T_C=25 °C|40<br>A|A|
|||_V_GS=10 V,_T_C=100 °C|40||
|||_V_GS=4.5 V,_T_C=25 °C|40||
|||_V_GS=4.5 V,<br>_T_C=100 °C|40||
|||_V_GS=4.5 V,_T_A=25 °C,<br>_R_thJA=60 K/W2)|22||
|Pulsed drain current3)|_I_D,pulse|_T_C=25 °C|160||
|Avalanche current, single pulse4)|_I_AS|_T_C=25 °C|20||
|Avalanche energy, single pulse|_E_AS|_I_D=20 A,_R_GS=25W|80<br>mJ|mJ|
|Gate source voltage|_V_GS||±20<br>V|V|



## 1) J-STD20 and JESD22 

- 2) Device on 40 mm x 40 mm x 1.5 mm epoxy PCB FR4 with 6 cm2 (one layer, 70 µm thick) copper area for drain connection. PCB is vertical in still air. 

- 3) See figure 3 for more detailed information 

Rev. 2.1 

page 1 

2013-04-25 

**BSZ018NE2LSI** 

**Maximum ratings,** at _T_ j=25 °C, unless otherwise specified 

|**Parameter**|**Symbol Conditions**<br>**Value**|**Unit**|
|---|---|---|
|Power dissipation|_P_tot<br>_T_C=25 °C<br>69|W|
||_T_A=25 °C,<br>_R_thJA=60 K/W2)<br>2.1||
|Operating and storage temperature|_T_j,_T_stg<br>-55 ... 150|°C|
|IEC climatic category; DIN IEC 68-1|55/150/56||
|**Parameter**<br>**Symbol Conditions**<br>**Unit**<br>**min.**<br>**typ.**<br>**max.**<br>**Values**<br>~~ee~~<br>~~ee~~|||
|**Thermal characteristics**|||
|Thermal resistance, junction - case<br>_R_thJC<br>-<br>-<br>1.8<br>K/W<br>Device on PCB<br>_R_thJA<br>6 cm2cooling area2)<br>-<br>-<br>60<br>~~ee~~|||
|**Electrical characteristics,**at_T_j=25 °C, unless otherwise specified|=25 °C, unless otherwise specified||
|**Static characteristics**|||
|Drain-source breakdown voltage<br>Breakdown voltage temperature<br>coefficient<br>Gate threshold voltage|_V_(BR)DSS _V_GS=0 V,_I_D=10 mA<br>25<br>-<br>-<br>d_V_(BR)DSS<br>/d_T_j<br>_I_D=10 mA, referenced<br>to 25 °C<br>-<br>15<br>-<br>_V_GS(th)<br>_V_DS=_V_GS,_I_D=250 µA<br>1.2<br>-<br>2.0<br>~~oonee~~|V<br>mV/K<br>V|
|Zero gate voltage drain current<br>Gate-source leakage current<br>Drain-source on-state resistance<br>Gate resistance|_I_DSS<br>_V_DS=20 V,_V_GS=0 V,<br>_T_j=25 °C<br>-<br>-<br>0.5<br>_V_DS=20 V,_V_GS=0 V,<br>_T_j=125 °C<br>-<br>2<br>-<br>_I_GSS<br>_V_GS=20 V,_V_DS=0 V<br>-<br>10<br>100<br>_R_DS(on)<br>_V_GS=4.5 V,_I_D=20 A<br>-<br>2.0<br>2.5<br>_V_GS=10 V,_I_D=20 A<br>-<br>1.5<br>1.8<br>_R_G<br>0.4<br>0.8<br>1.6<br>~~paaeee~~<br>~~-_} ff~~<br>~~a~~|mA<br>nA<br>mW<br>W|
|Transconductance|_g_fs<br>|_V_DS|>2|_I_D|_R_DS(on)max,<br>_I_D=20 A<br>50<br>100<br>-<br>~~CT~~|S|



Rev. 2.1 

page 2 

2013-04-25 

**BSZ018NE2LSI** 

|**BSZ018NE2LSI**|**BSZ018NE2LSI**|**BSZ018NE2LSI**|**BSZ018NE2LSI**|**BSZ018NE2LSI**|**BSZ018NE2LSI**|**BSZ018NE2LSI**|
|---|---|---|---|---|---|---|
|**Parameter**<br>**Symbol Conditions**<br>**Unit**<br>**min.**<br>**typ.**<br>**max.**<br>**Values**<br>~~ee~~|||||||
|**Dynamic characteristics**|||||||
|Input capacitance|_C_iss||-|2500|3325|pF|
|Output capacitance|_C_oss|_V_GS=0 V,_V_DS=12 V,<br>_f_=1 MHz|-|1100|1463||
|Reverse transfer capacitance|Crss||-|110|-||
|Turn-on delay time|_t_d(on)||-|5.2|-|ns|
|Rise time|_t_r|_V_DD=12 V,_V_GS=10 V,|-|4.8|-||
|Turn-off delay time|_t_d(off)|_I_D=30 A,_R_G,ext=1.6W|-|25|-||
|Fall time|_t_f||-|3.6|-||
|**Gate Charge Characteristics**5)|||||||
|Gate to source charge<br>Gate charge at threshold<br>Gate to drain charge<br>Switching charge<br>Gate charge total<br>Gate plateau voltage<br>Gate charge total<br>Gate charge total, sync. FET<br>Output charge|_Q_gs<br>-<br>6.3<br>8.4<br>_Q_g(th)<br>-<br>4.1<br>-<br>_Q_gd<br>-<br>4.3<br>6.5<br>_Q_sw<br>-<br>6.6<br>-<br>_Q_g<br>-<br>17<br>23<br>_V_plateau<br>2.5<br>_Q_g<br>_V_DD=12 V,_I_D=30 A,<br>_V_GS=0 to 10 V<br>-<br>36<br>48<br>_Q_g(sync)<br>_V_DS=0.1 V,<br>_V_GS=0 to 4.5 V<br>-<br>15<br>-<br>_Q_oss<br>_V_DD=12 V,_V_GS=0 V<br>-<br>23<br>31<br>_V_DD=12 V,_I_D=30 A,<br>_V_GS=0 to 4.5 V<br>~~ast~~<br>~~ee~~<br>~~a~~<br>~~or~~<br>~~pf fT~~<br>~~pf~~<br>~~| tT~~<br>~~a~~<br>~~ee ee ee~~|||||nC<br>V<br>nC|
|**Reverse Diode**|||||||
|Diode continuous forward current|_I_S||-|-|40|A|
|||_T_C=25 °C|||||
|Diode pulse current|_I_S,pulse||-|-|160||
|Diode forward voltage|_V_SD|_V_GS=0 V,_I_F=7 A,<br>_T_j=25 °C|-|0.55|0.7|V|
|Reverse recovery charge|_Q_rr|_V_R=15 V,_I_F=7 A,<br>d_i_F/d_t_=400 A/µs|-|5|-|nC|



- 4) See figure 13 for more detailed information 

5) See figure 16 for gate charge parameter definition 

Rev. 2.1 

page 3 

2013-04-25 

**BSZ018NE2LSI** 

## **1 Power dissipation** 

_P_ tot=f( _T_ C) 

## **2 Drain current** 

_I_ D=f( _T_ C); _V_ GS≥10 V 

**==> picture [467 x 611] intentionally omitted <==**

**----- Start of picture text -----**<br>
80  50<br>70<br>40<br>60<br>50<br>30<br>40<br>20<br>30<br>20<br>10<br>10<br>0  All 0<br>0  40  80  120  160  0  40  80  120  160<br>T C [°C]  T C [°C]<br>3 Safe operating area 4 Max. transient thermal impedance<br>=f( V  DS); );  T  C=25 °C; =25 °C;  D  =0 Z  thJC=f( t  p)<br>parameter:  t  p parameter:  D  = t  p/ T<br>10 [3 ] 10 [1 ]<br>limited by on-state<br>resistance<br>1 µs<br>10 [2 ] 10 µs  10 [0 ] 0.5<br>100 µs<br>0.2<br>1 ms<br>0.1<br>10 ms<br>0.05<br>10 [1 ] 10 [-1 ]<br>DC  0.02<br>0.01<br>single pulse<br>10 [0 ] 10 [-2 ]<br>10 [-1 ] 10 [-3 ]<br>10 [-1 ] 10 [0 ] 10 [1 ] 10 [2 ] 10 [-6 ] 10 [-5 ] 10 [-4 ] 10 [-3 ] 10 [-2 ] 10 [-1 ] 10 [0 ]<br>V DS [V]  t p [s]<br> [W]<br> [A]<br>P tot I D<br> [A]   [K/W]<br>I D<br>thJC<br>Z<br>**----- End of picture text -----**<br>


## **3 Safe operating area** 

_I_ D=f( _V_ DS); ); _T_ C=25 °C; =25 °C; _D_ =0 parameter: _t_ p 

Rev. 2.1 

page 4 

2013-04-25 

**BSZ018NE2LSI** 

## **5 Typ. output characteristics** 

_I_ D=f( _V_ DS); _T_ j=25 °C 

parameter: _V_ GS 

## **6 Typ. drain-source on resistance** 

_R_ DS(on)=f( _I_ D); _T_ j=25 °C parameter: _V_ GS 

**==> picture [464 x 266] intentionally omitted <==**

**----- Start of picture text -----**<br>
300  3<br>10 V  4.5 V<br>5 V  4 V  3.5 V<br>3.5 V  2.5<br>4 V<br>200  2  4.5 V<br>5 V<br>3.2 V  7 V<br>8 V<br>1.5  10 V<br>3 V<br>100  1<br>2.8 V<br>0.5<br>0  0<br>0  1  2  3  0  10  20  30  40  50<br>V DS [V]  I D [A]<br>]<br>W<br> [m<br> [A]<br>I D DS(on)<br>R<br>**----- End of picture text -----**<br>


**7 Typ. transfer characteristics 8 Typ. forward transconductance** _I_ D=f( _V_ GS); | _V_ DS|>2| _I_ D| _R_ DS(on)max _g_ fs=f( _I_ D); _T_ j=25 °C parameter: _T_ j 

**==> picture [477 x 301] intentionally omitted <==**

**----- Start of picture text -----**<br>
300  400<br>250<br>320<br>200<br>240<br>150<br>160<br>100<br>80<br>50  150 °C<br>25 °C<br>J<br>0  ue 0<br>0  1  2  3  4  5  0  40  80  120  160<br>V GS [V]  I D [A]<br>page 5 2013-04-25<br> [A]   [S]<br>I D g fs<br>**----- End of picture text -----**<br>


Rev. 2.1 

**BSZ018NE2LSI** 

## **9 Drain-source on-state resistance** 

_R_ DS(on)=f( _T_ j); _I_ D=20 A; _V_ GS=10 V 

## **10 Typ. gate threshold voltage** 

_V_ GS(th)=f( _T_ j); _V_ GS= _V_ DS; _I_ D=10 mA 

**==> picture [466 x 610] intentionally omitted <==**

**----- Start of picture text -----**<br>
3  2.5<br>2.5<br>2<br>10 mA<br>2<br>1.5<br>1.5  typ<br>1<br>1<br>0.5<br>0.5<br>0  0<br>-60  -20  20  60  100  140  180  -60  -20  20  60  100  140  180<br>T j [°C]  T j [°C]  [°C] °C] C]<br>11 Typ. capacitances 12 Forward characteristics of reverse diode<br> =f( V  DS); );  V  GS=0 V; =0 V;  f  =1 MHz I  F=f( V  SD)<br>parameter:  T  j<br>10 [4 ] 10000  10 [3 ]<br>Ciss<br>10 [2 ]<br>Coss<br>150 °C<br>10 [3 ] 1000  -55 °C<br>25 °C<br>125 °C<br>10 [1 ]<br>Crss<br>10 [2 ] 100<br>10 [0 ]<br>10 [1 ] 10  L L 10 [-1 ] if<br>0  5  10  15  20  25  0  0.4  0.8  1.2<br>V DS [V]  V SD [V]<br>]<br>W<br>[m  [V]<br>DS(on) GS(th)<br>R V<br>C  [pF]   [A]  I F<br>**----- End of picture text -----**<br>


**==> picture [228 x 267] intentionally omitted <==**

**----- Start of picture text -----**<br>
2.5<br>2<br>10 mA<br>1.5<br>1<br>0.5<br>0<br>-60  -20  20  60  100  140  180<br>T j [°C]  [°C] °C] C]<br> [V]<br>GS(th)<br>V<br>**----- End of picture text -----**<br>


## **11 Typ. capacitances** 

_C_ =f( _V_ DS); ); _V_ GS=0 V; =0 V; _f_ =1 MHz 

Rev. 2.1 

page 6 

2013-04-25 

**BSZ018NE2LSI** 

## **13 Avalanche characteristics** 

_I_ AS=f( _t_ AV); _R_ GS=25 W parameter: _T_ j(start) 

**==> picture [230 x 610] intentionally omitted <==**

**----- Start of picture text -----**<br>
100<br>25 °C<br>100 °C<br>10<br>125 °C<br>1<br>1  10  100  1000<br>t AV [µs]<br>15 Typ. drain-source leakage current<br> DSS=f(=f( V DS DS  );  V  GS=0 V=0 V<br>parameter:  T  j<br>10 [-2 ]<br>10 [-3 ]<br>125 °C<br>100 °C<br>10 [-4 ]<br>75 °C<br>10 [-5 ]<br>25 °C<br>10 [-6 ]<br>0  5  10  15  20<br>V sd [V]<br> [A]<br>I AV<br> [A]<br>I DSS<br>**----- End of picture text -----**<br>


## **15 Typ. drain-source leakage current** 

_I_ DSS=f(=f( _V DS DS_ ); _V_ GS=0 V=0 V parameter: _T_ j 

## **14 Typ. gate charge** 

_V_ GS=f( _Q_ gate); _I_ D=30 A pulsed parameter: _V_ DD 

**==> picture [226 x 579] intentionally omitted <==**

**----- Start of picture text -----**<br>
12<br>12 V<br>10  5 V<br>20 V<br>8<br>6<br>4<br>2<br>0<br>0  10  20  30  40<br>Q gate [nC]<br>16 Gate charge waveforms<br>V  GS<br>Q g<br>V  gs(th)<br>Q  g(th) Q  sw Q gate<br>Q  gs Q  gd<br> [V]<br>GS<br>V<br>**----- End of picture text -----**<br>


## **16 Gate charge waveforms** 

Rev. 2.1 

2013-04-25 

page 7 

**BSZ018NE2LSI** 

**Package Outline** 

## **PG-TSDSON-8 (fused leads)** 

Rev. 2.1 

page 8 

2013-04-25 

**BSZ018NE2LSI** 

## Published by 

Infineon Technologies AG 81726 Munich, Germany © 2011 Infineon Technologies AG All Rights Reserved. 

## Legal Disclaimer 

The information given in this document shall in no event be regarded as a guarantee of conditions or characteristics. With respect to any examples or hints given herein, any typical values stated herein and/or any information regarding the application of the device, Infineon Technologies hereby disclaims any and all warranties and liabilities of any kind, including without limitation, warranties of non-infringement of intellectual property rights of any third party. 

## Information 

For further information on technology, delivery terms and conditions and prices, please contact the nearest Infineon Technologies Office (www.infineon.com). 

## Warnings 

Due to technical requirements, components may contain dangerous substances. For information on the types in question, please contact the nearest Infineon Technologies Office. Infineon Technologies components may be used in life-support devices or systems only with the express written approval of Infineon Technologies, if a failure of such components can reasonably be expected to cause the failure of that life-support device or system or to affect the safety or effectiveness of that device or system. Life support devices or systems are intended to be implanted in the human body or to support and/or maintain and sustain and/or protect human life. If they fail, it is reasonable to assume that the health of the user or other persons may be endangered. 

Rev. 2.1 

page 9 

2013-04-25 



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- [Supplier page](https://es.farnell.com/infineon/bsz018ne2lsiatma1/mosfet-n-ch-25v-40a-tsdson-8/dp/2480780RL)
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