# RF FET Transistor, 5 V, 120 mA, 725 mW, 450 MHz, 6 GHz, SOT-343

![Product image](https://novapart.co/image/farnell:1056824/)

**URL**: https://novapart.co/products/ATF-54143-TR1G/rf-fet-transistor-5-v-120-ma-725-mw-450-mhz-6-ghz
**SKU**: ATF-54143-TR1G
**Manufacturer**: BROADCOM
**Category**: Semiconductors - Discretes || FETs || RF FETs
**Price**: €1.4800
**Stock**: 10+

## Specifications

| Parameter | Value |
|---|---|
| No. Of Pins | 4Pins |
| Channel Type | N Channel |
| Power Dissipation | 725mW |
| Rf Transistor Case | SOT-343 |
| Transistor Mounting | Surface Mount |
| Power Dissipation Pd | 725mW |
| Transistor Case Style | SOT-343 |
| Operating Frequency Max | 6GHz |
| Operating Frequency Min | 450MHz |
| Drain Source Voltage Vds | 5V |
| Operating Temperature Max | 150°C |
| Continuous Drain Current Id | 120mA |

## Datasheet

📄 [Download PDF](https://novapart.co/datasheet/farnell:1056824/)

## **Agilent ATF-54143 Low Noise Enhancement Mode Pseudomorphic HEMT in a Surface Mount Plastic Package** 

Data Sheet 

## **Description** 

Agilent Technologies’s ATF-54143 is a high dynamic range, low noise, E-PHEMT housed in a 4-lead SC-70 (SOT-343) surface mount plastic package. 

The combination of high gain, high linearity and low noise makes the ATF-54143 ideal for cellular/PCS base stations, MMDS, and other systems in the 450 MHz to 6 GHz frequency range. 

## **Surface Mount Package SOT-343** 

## **Pin Connections and Package Marking** 

**==> picture [137 x 36] intentionally omitted <==**

**----- Start of picture text -----**<br>
DRAIN SOURCE<br>SOURCE 4Fx GATE<br>**----- End of picture text -----**<br>


## **Features** 

- High linearity performance 

- Enhancement Mode Technology[[1]] 

- Low noise figure 

- Excellent uniformity in product specifications 

- 800 micron gate width 

- Low cost surface mount small plastic package SOT-343 (4 lead SC70) 

- Tape-and-Reel packaging option available 

- Lead-free option available. 

## **Specifications** 

- 2 GHz; 3V, 60 mA (Typ.) 

## **Note:** 

Top View. Package marking provides orientation and identification 

“4F”  = Device Code “x”    = Date code character identifies month of manufacture. 

- 36.2 dBm output 3[rd] order intercept 

- 20.4 dBm output power at 1 dB gain compression 

- 0.5 dB noise figure 

- 16.6 dB associated gain 

## **Applications** 

- Low noise amplifier for cellular/PCS base stations 

- LNA for WLAN, WLL/RLL and MMDS applications 

**Attention: Observe precautions for handling electrostatic sensitive devices.** 

**ESD Machine Model (Class A) ESD Human Body Model (Class 1A) Refer to Agilent Application Note A004R: Electrostatic Discharge Damage and Control.** 

- General purpose discrete E-PHEMT for other ultra low noise applications 

## **Note:** 

1. Enhancement mode technology requires positive Vgs, thereby eliminating the need for the negative gate voltage associated with conventional depletion mode devices. 

**ATF-54143 Absolute Maximum Ratings[[1]]** 

||||**Absolute**|
|---|---|---|---|
|**Symbol**|**Parameter**|**Units**|**Maximum**|
|VDS|Drain - Source Voltage[2]|V|5|
|VGS|Gate - Source Voltage[2]|V|-5 to 1|
|VGD|Gate Drain Voltage[2]|V|-5 to 1|
|IDS|Drain Current [2]|mA|120|
|Pdiss|Total Power Dissipation [3]|mW|725|
|Pin max.|RF Input Power|dBm|13[5]|
|IGS|Gate Source Current|mA|2[5]|
|TCH|Channel Temperature|°C|150|
|TSTG|Storage Temperature|°C|-65 to 150|
|θjc|Thermal Resistance [4]|°C/W|162|



## **Notes:** 

1. Operation of this device in excess of any one of these parameters may cause permanent damage. 

2. Assumes DC quiescent conditions. 

3. Source lead temperature is 25°C. Derate 

- 6.2 mW/°C for TL > 33°C. 

4. Thermal resistance measured using 

- 150°C Liquid Crystal Measurement method. 

5. The device can handle +13 dBm RF Input Power provided IGS is limited to 2 mA. IGS at P1dB drive level is bias circuit dependent. See application section for additional information. 

**==> picture [146 x 143] intentionally omitted <==**

**----- Start of picture text -----**<br>
120<br>0.7V<br>100<br>0.6V<br>80<br>60<br>0.5V<br>40<br>20 0.4V<br>0.3V<br>0<br>0 1 2 3 4 5 6 7<br>VDS (V)<br> (mA)<br>IDS<br>**----- End of picture text -----**<br>


**Figure 1. Typical I-V Curves. (VGS = 0.1 V per step)** 

## **Product Consistency Distribution Charts[[6, 7]]** 

**==> picture [465 x 166] intentionally omitted <==**

**----- Start of picture text -----**<br>
160 200 160<br>Cpk = 0.77 Cpk = 1.35 Cpk = 1.67<br>Stdev = 1.41 Stdev = 0.4 Stdev = 0.073<br>160<br>120 120<br>120<br>-3 Std -3 Std +3 Std +3 Std<br>80 80<br>80<br>40 40<br>40<br>0 0 0<br>30 32 34 36 38 40 42 14 15 16 17 18 19 0.25 0.45 0.65 0.85 1.05<br>OIP3 (dBm) GAIN (dB) NF (dB)<br>Figure 2. OIP3 @ 2 GHz, 3 V, 60 mA. Figure 3. Gain @ 2 GHz, 3 V, 60 mA. Figure 4. NF @ 2 GHz, 3 V, 60 mA.<br>LSL = 33.0, Nominal = 36.575 USL = 18.5, LSL = 15, Nominal = 16.6 USL = 0.9, Nominal = 0.49<br>**----- End of picture text -----**<br>


## **Notes:** 

6. Distribution data sample size is 450 samples taken from 9 different wafers. Future wafers allocated to this product may have nominal values anywhere between the upper and lower limits. 

7. Measurements made on production test board. This circuit represents a trade-off between an optimal noise match and a realizeable match based on production test equipment. Circuit losses have been de-embedded from actual measurements. 

**2** 

## **ATF-54143 Electrical Specifications** 

TA = 25°C, RF parameters measured in a test circuit for a typical device 

|**Symbol**|**Parameter and Test**|**Condition**||**Units**|**Min.**|**Typ.[2]**|**Max.**|
|---|---|---|---|---|---|---|---|
|Vgs|Operational Gate Voltage||Vds = 3V, Ids = 60 mA|V|0.4|0.59|0.75|
|Vth|Threshold Voltage||Vds = 3V, Ids = 4 mA|V|0.18|0.38|0.52|
|Idss|Saturated Drain Current||Vds = 3V, Vgs = 0V|µA|—|1|5|
|Gm|Transconductance||Vds = 3V, gm =∆Idss/∆Vgs;|mmho|230|410|560|
||||∆Vgs = 0.75-0.7 = 0.05V|||||
|Igss|Gate Leakage Current||Vgd = Vgs = -3V|µA|—|—|200|
|NF|Noise Figure[1]|f = 2 GHz|Vds = 3V, Ids = 60 mA|dB|—|0.5|0.9|
|||f = 900 MHz|Vds = 3V, Ids = 60 mA|dB|—|0.3|—|
|Ga|Associated Gain [1]|f = 2 GHz|Vds = 3V, Ids = 60 mA|dB|15|16.6|18.5|
|||f = 900 MHz|Vds = 3V, Ids = 60 mA|dB|—|23.4|—|
|OIP3|Output 3rdOrder|f = 2 GHz|Vds = 3V, Ids = 60 mA|dBm|33|36.2|—|
||Intercept Point[1]|f = 900 MHz|Vds = 3V, Ids = 60 mA|dBm|—|35.5|—|
|P1dB|1dB Compressed|f = 2 GHz|Vds = 3V, Ids = 60 mA|dBm|—|20.4|—|
||Output Power [1]|f = 900 MHz|Vds = 3V, Ids = 60 mA|dBm|—|18.4|—|
|**Notes:**||||||||



1. Measurements obtained using production test board described in Figure 5. 

2. Typical values measured from a sample size of 450 parts from 9 wafers. 

**==> picture [464 x 60] intentionally omitted <==**

**----- Start of picture text -----**<br>
Input 50 Ohm Input Output 50 Ohm Output<br>Transmission Matching Circuit Matching Circuit Transmission<br>Line Including Γ_mag = 0.30 DUT Γ_mag = 0.035 Line Including<br>Gate Bias T Γ_ang = 150° Γ_ang = -71° Drain Bias T<br>(0.3 dB loss) (0.3 dB loss) (0.4 dB loss) (0.3 dB loss)<br>**----- End of picture text -----**<br>


**Figure 5. Block diagram of 2 GHz production test board used for Noise Figure, Associated Gain, P1dB, and OIP3 measurements. This circuit represents a trade-off between an optimal noise match and associated impedance matching circuit losses. Circuit losses have been de-embedded from actual measurements.** 

**3** 

## **ATF-54143 Typical Performance Curves** 

**==> picture [480 x 515] intentionally omitted <==**

**----- Start of picture text -----**<br>
0.7 0.6 19<br>18<br>0.5<br>0.6<br>17<br>0.4<br>0.5<br>16<br>0.3<br>15<br>0.4<br>0.2<br>14<br>0.3 3V4V 0.1 3V4V 13 3V4V<br>0.2 0 12<br>0 20 40 60 80 100 0 20 40 60 80 100 0 20 40 60 80 100<br>Ids (mA) Ids (mA) Ids (mA)<br>Figure 6.  Fmin vs. Ids and Vds Tuned for  Figure 7.  Fmin vs. Ids and Vds Tuned for  Figure 8.  Gain vs. Ids and Vds Tuned for<br>Max OIP3 and Fmin at 2 GHz. Max OIP3 and Min NF at 900 MHz. Max OIP3 and Fmin at 2 GHz.<br>25 42 40<br>24 37<br>35<br>23<br>32<br>30<br>22<br>27<br>21<br>25<br>22<br>20<br>19 3V 17 3V4V 20 3V4V<br>4V<br>18 12 15<br>0 20 40 60 80 100 0 20 40 60 80 100 0 20 40 60 80 100<br>Ids (mA) Ids (mA) Ids (mA)<br>Figure 9.  Gain vs. Ids and Vds Tuned for  Figure 10.  OIP3 vs. Ids and Vds Tuned for  Figure 11.  OIP3 vs. Ids and Vds Tuned for<br>Max OIP3 and Fmin at 900 MHz. Max OIP3 and Fmin at 2 GHz. Max OIP3 and Fmin at 900 MHz.<br>24 23 35<br>22 25 ° C<br>22 30 -40 ° C<br>21 85 ° C<br>20 25<br>20<br>18 19 20<br>18<br>16 15<br>3V<br>3V 17 4V<br>14 10<br>4V 16<br>12 15 5<br>0 20 40 60 80 100 0 20 40 60 80 100 0 1 2 3 4 5 6<br>Idq (mA) [[1]] Idq (mA) [[1]] FREQUENCY (GHz)<br>Fmin (dB) Fmin (dB) GAIN (dB)<br>GAIN (dB) OIP3 (dBm) OIP3 (dBm)<br>P1dB (dBm) P1dB (dBm) GAIN (dB)<br>**----- End of picture text -----**<br>


**Figure 12.  P1dB vs. Idq and Vds Tuned for Max OIP3 and Fmin at 2 GHz.** 

**Figure 13.  P1dB vs. Idq and Vds Tuned for Max OIP3 and Fmin at 900 MHz.** 

**==> picture [140 x 17] intentionally omitted <==**

**----- Start of picture text -----**<br>
Figure 14.  Gain vs. Frequency and Temp<br>Tuned for Max OIP3 and Fmin at 3V, 60 mA.<br>**----- End of picture text -----**<br>


## **Notes:** 

1. Idq represents the quiescent drain current without RF drive applied. Under low values of Ids, the application of RF drive will cause Id to increase substantially as P1dB is approached. 

2. Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are 

based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements a true Fmin is calculated. Refer to the noise parameter application section for more information. 

**4** 

## **ATF-54143 Typical Performance Curves,** continued 

**==> picture [476 x 143] intentionally omitted <==**

**----- Start of picture text -----**<br>
2 45 21<br>25 ° C<br>-40 ° C 40 20.5<br>85 ° C<br>1.5 20<br>35<br>19.5<br>30<br>1.0 19<br>25<br>18.5<br>20<br>0.5 15 25-4085 °° CC ° C 17.518 8525-40 °° CC ° C<br>0 10 17<br>0 1 2 3 4 5 6 0 1 2 3 4 5 6 0 1 2 3 4 5 6<br>FREQUENCY (GHz) FREQUENCY (GHz) FREQUENCY (GHz)<br>Fmin (dB) OIP3 (dBm) P1dB (dBm)<br>**----- End of picture text -----**<br>


**Figure 15.  Fmin[[2]] vs. Frequency and Temp Figure 16.  OIP3 vs. Frequency and Temp Tuned for Max OIP3 and Fmin at 3V, 60 mA. Tuned for Max OIP3 and Fmin at 3V, 60 mA.** 

**Figure 17.  P1dB vs. Frequency and Temp Tuned for Max OIP3 and Fmin at 3V, 60 mA.** 

**==> picture [142 x 168] intentionally omitted <==**

**----- Start of picture text -----**<br>
1.4<br>1.2<br>1.0<br>0.8<br>0.6<br>0.4 60 mA<br>40 mA<br>0.2 80 mA<br>0<br>0 1 2 3 4 5 6 7<br>FREQUENCY (GHz)<br>Figure 18.  Fmin [[1]]  vs. Frequency and Ids<br>at 3V.<br>Fmin (dB)<br>**----- End of picture text -----**<br>


**ATF-54143 Reflection Coefficient Parameters tuned for Maximum Output IP3, VDS = 3V, IDS = 60 mA** 

|**Freq**|Γ**Out_Mag.[1]**|Γ**Out_Ang.[1]**|**OIP3**|**P1dB**|
|---|---|---|---|---|
|**(GHz)**|**(Mag)**|**(Degrees)**|**(dBm)**|**(dBm)**|
|0.9|0.017|115|35.54|18.4|
|2.0|0.026|-85|36.23|20.38|
|3.9|0.013|173|37.54|20.28|
|5.8|0.025|102|35.75|18.09|



**Note:** 

1. Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements a true Fmin is calculated. Refer to the noise parameter application section for more information. 

**Note:** 

1. Gamma out is the reflection coefficient of the matching circuit presented to the output of the device. 

**5** 

**ATF-54143 Typical Scattering Parameters,** VDS = 3V, IDS = 40 mA 

|**Freq.**||**S11**|||**S21**|||**S12**|||**S22**||**MSG/MAG**|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|**GHz**|**Mag.**||**Ang.**|**dB**|**Mag.**|**Ang.**|**Mag.**||**Ang.**|**Mag.**||**Ang.**|**dB**|
|0.1|0.99||-17.6|27.99|25.09|168.5|0.009||80.2|0.59||-12.8|34.45|
|0.5|0.83||-76.9|25.47|18.77|130.1|0.036||52.4|0.44||-54.6|27.17|
|0.9|0.72||-114|22.52|13.37|108|0.047||40.4|0.33||-78.7|24.54|
|1.0|0.70||-120.6|21.86|12.39|103.9|0.049||38.7|0.31||-83.2|24.03|
|1.5|0.65||-146.5|19.09|9.01|87.4|0.057||33.3|0.24||-99.5|21.99|
|1.9|0.63||-162.1|17.38|7.40|76.6|0.063||30.4|0.20||-108.6|20.70|
|2.0|0.62||-165.6|17.00|7.08|74.2|0.065||29.8|0.19||-110.9|20.37|
|2.5|0.61||178.5|15.33|5.84|62.6|0.072||26.6|0.15||-122.6|19.09|
|3.0|0.61||164.2|13.91|4.96|51.5|0.080||22.9|0.12||-137.5|17.92|
|4.0|0.63||138.4|11.59|3.80|31|0.094||14|0.10||176.5|15.33|
|5.0|0.66||116.5|9.65|3.04|11.6|0.106||4.2|0.14||138.4|12.99|
|6.0|0.69||97.9|8.01|2.51|-6.7|0.118||-6.1|0.17||117.6|11.50|
|7.0|0.71||80.8|6.64|2.15|-24.5|0.128||-17.6|0.20||98.6|10.24|
|8.0|0.72||62.6|5.38|1.86|-42.5|0.134||-29.3|0.22||73.4|8.83|
|9.0|0.76||45.2|4.20|1.62|-60.8|0.145||-40.6|0.27||52.8|8.17|
|10.0|0.83||28.2|2.84|1.39|-79.8|0.150||-56.1|0.37||38.3|8.57|
|11.0|0.85||13.9|1.42|1.18|-96.9|0.149||-69.3|0.45||25.8|7.47|
|12.0|0.88||-0.5|0.23|1.03|-112.4|0.150||-81.6|0.51||12.7|7.50|
|13.0|0.89||-15.1|-0.86|0.91|-129.7|0.149||-95.7|0.54||-4.1|6.60|
|14.0|0.87||-31.6|-2.18|0.78|-148|0.143||-110.3|0.61||-20.1|4.57|
|15.0|0.88||-46.1|-3.85|0.64|-164.8|0.132||-124|0.65||-34.9|3.47|
|16.0|0.87||-54.8|-5.61|0.52|-178.4|0.121||-134.6|0.70||-45.6|2.04|
|17.0|0.87||-62.8|-7.09|0.44|170.1|0.116||-144.1|0.73||-55.9|1.05|
|18.0|0.92||-73.6|-8.34|0.38|156.1|0.109||-157.4|0.76||-68.7|1.90|



**Typical Noise Parameters,** VDS = 3V, IDS = 40 mA 

|**Freq**|**Fmin**|Γ**opt**|Γ**opt**|**Rn/50**|**Ga**|
|---|---|---|---|---|---|
|**GHz**|**dB**|**Mag.**|**Ang.**||**dB**|
|0.5|0.17|0.34|34.80|0.04|27.83|
|0.9|0.22|0.32|53.00|0.04|23.57|
|1.0|0.24|0.32|60.50|0.04|22.93|
|1.9|0.42|0.29|108.10|0.04|18.35|
|2.0|0.45|0.29|111.10|0.04|17.91|
|2.4|0.51|0.30|136.00|0.04|16.39|
|3.0|0.59|0.32|169.90|0.05|15.40|
|3.9|0.69|0.34|-151.60|0.05|13.26|
|5.0|0.90|0.45|-119.50|0.09|11.89|
|5.8|1.14|0.50|-101.60|0.16|10.95|
|6.0|1.17|0.52|-99.60|0.18|10.64|
|7.0|1.24|0.58|-79.50|0.33|9.61|
|8.0|1.57|0.60|-57.90|0.56|8.36|
|9.0|1.64|0.69|-39.70|0.87|7.77|
|10.0|1.8|0.80|-22.20|1.34|7.68|



**==> picture [143 x 168] intentionally omitted <==**

**----- Start of picture text -----**<br>
40<br>35<br>30<br>25 MSG<br>20<br>15 MAG<br>10<br>5<br>0 S21<br>-5<br>10<br>-15<br>0 5 10 15 20<br>FREQUENCY (GHz)<br>Figure 19.  MSG/MAG and |S21| [2]  vs.<br>Frequency at 3V, 40 mA.<br> (dB)<br>21<br>MSG/MAG and S<br>**----- End of picture text -----**<br>


## **Notes:** 

1. Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements a true Fmin is calculated. Refer to the noise parameter application section for more information. 

2. S and noise parameters are measured on a microstrip line made on 0.025 inch thick alumina carrier. The input reference plane is at the end of the gate lead. The output reference plane is at the end of the drain lead. The parameters include the effect of four plated through via holes connecting source landing pads on top of the test carrier to the microstrip ground plane on the bottom side of the carrier. Two 0.020 inch diameter via holes are placed within 0.010 inch from each source lead contact point, one via on each side of that point. 

**6** 

**ATF-54143 Typical Scattering Parameters,** VDS = 3V, IDS = 60 mA 

|**Freq.**||**S11**|||**S21**|||**S12**|||**S22**||**MSG/MAG**|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|**GHz**|**Mag.**||**Ang.**|**dB**|**Mag.**|**Ang.**|**Mag.**||**Ang.**|**Mag.**||**Ang.**|**dB**|
|0.1|0.99||-18.9|28.84|27.66|167.6|0.01||80.0|0.54||-14.0|34.42|
|0.5|0.81||-80.8|26.04|20.05|128.0|0.03||52.4|0.40||-58.8|28.25|
|0.9|0.71||-117.9|22.93|14.01|106.2|0.04||41.8|0.29||-83.8|25.44|
|1.0|0.69||-124.4|22.24|12.94|102.2|0.05||40.4|0.27||-88.5|24.13|
|1.5|0.64||-149.8|19.40|9.34|86.1|0.05||36.1|0.21||-105.2|22.71|
|1.9|0.62||-164.9|17.66|7.64|75.6|0.06||33.8|0.17||-114.7|21.05|
|2.0|0.62||-168.3|17.28|7.31|73.3|0.06||33.3|0.17||-117.0|20.86|
|2.5|0.60||176.2|15.58|6.01|61.8|0.07||30.1|0.13||-129.7|19.34|
|3.0|0.60||162.3|14.15|5.10|51.0|0.08||26.5|0.11||-146.5|18. 04|
|4.0|0.62||137.1|11.81|3.90|30.8|0.09||17.1|0.10||165.2|1 4.87|
|5.0|0.66||115.5|9.87|3.11|11.7|0.11||6.8|0.14||131.5|13.27|
|6.0|0.69||97.2|8.22|2.58|-6.4|0.12||-3.9|0.18||112.4|11.72|
|7.0|0.70||80.2|6.85|2.20|-24.0|0.13||-15.8|0.20||94.3|10.22|
|8.0|0.72||62.2|5.58|1.90|-41.8|0.14||-28.0|0.23||70.1|9.02|
|9.0|0.76||45.0|4.40|1.66|-59.9|0.15||-39.6|0.29||50.6|8.38|
|10.0|0.83||28.4|3.06|1.42|-78.7|0.15||-55.1|0.38||36.8|8.71|
|11.0|0.85||13.9|1.60|1.20|-95.8|0.15||-68.6|0.46||24.4|7.55|
|12.0|0.88||-0.2|0.43|1.05|-111.1|0.15||-80.9|0.51||11.3|7.55|
|13.0|0.89||-14.6|-0.65|0.93|-128.0|0.15||-94.9|0.55||-5.2|6.70|
|14.0|0.88||-30.6|-1.98|0.80|-146.1|0.14||-109.3|0.61||-20.8|5.01|
|15.0|0.88||-45.0|-3.62|0.66|-162.7|0.13||-122.9|0.66||-35.0|3.73|
|16.0|0.88||-54.5|-5.37|0.54|-176.6|0.12||-133.7|0.70||-45.8|2.54|
|17.0|0.88||-62.5|-6.83|0.46|171.9|0.12||-143.2|0.73||-56.1|1.57|
|18.0|0.92||-73.4|-8.01|0.40|157.9|0.11||-156.3|0.76||-68.4|2.22|



**Typical Noise Parameters,** VDS = 3V, IDS = 60 mA 

|**Freq**|**Fmin**|Γ**opt**|Γ**opt**|**Rn/50**|**Ga**|
|---|---|---|---|---|---|
|**GHz**|**dB**|**Mag.**|**Ang.**||**dB**|
|0.5|0.15|0.34|42.3|0.04|28.50|
|0.9|0.20|0.32|62.8|0.04|24.18|
|1.0|0.22|0.32|67.6|0.04|23.47|
|1.9|0.42|0.27|116.3|0.04|18.67|
|2.0|0.45|0.27|120.1|0.04|18.29|
|2.4|0.52|0.26|145.8|0.04|16.65|
|3.0|0.59|0.29|178.0|0.05|15.56|
|3.9|0.70|0.36|-145.4|0.05|13.53|
|5.0|0.93|0.47|-116.0|0.10|12.13|
|5.8|1.16|0.52|-98.9|0.18|11.10|
|6.0|1.19|0.55|-96.5|0.20|10.95|
|7.0|1.26|0.60|-77.1|0.37|9.73|
|8.0|1.63|0.62|-56.1|0.62|8.56|
|9.0|1.69|0.70|-38.5|0.95|7.97|
|10.0|1.73|0.79|-21.5|1.45|7.76|



**==> picture [143 x 167] intentionally omitted <==**

**----- Start of picture text -----**<br>
40<br>35<br>30<br>25 MSG<br>20<br>15 MAG<br>10<br>5<br>S21<br>0<br>-5<br>10<br>-15<br>0 5 10 15 20<br>FREQUENCY (GHz)<br>Figure 20.  MSG/MAG and |S21| [2]  vs.<br>Frequency at 3V, 60 mA.<br> (dB)<br>21<br>MSG/MAG and S<br>**----- End of picture text -----**<br>


## **Notes:** 

1. Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements a true Fmin is calculated. Refer to the noise parameter application section for more information. 

2. S and noise parameters are measured on a microstrip line made on 0.025 inch thick alumina carrier. The input reference plane is at the end of the gate lead. The output reference plane is at the end of the drain lead. The parameters include the effect of four plated through via holes connecting source landing pads on top of the test carrier to the microstrip ground plane on the bottom side of the carrier. Two 0.020 inch diameter via holes are placed within 0.010 inch from each source lead contact point, one via on each side of that point. 

**7** 

**ATF-54143 Typical Scattering Parameters,** VDS = 3V, IDS = 80 mA 

|**Freq.**||**S11**|||**S21**|||**S12**|||**S22**||**MSG/MAG**|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|**GHz**|**Mag.**||**Ang.**|**dB**|**Mag.**|**Ang.**|**Mag.**||**Ang.**|**Mag.**||**Ang.**|**dB**|
|0.1|0.98||-20.4|28.32|26.05|167.1|0.01||79.4|0.26||-27.6|34.16|
|0.5|0.80||-85.9|25.32|18.45|126.8|0.04||53.3|0.29||-104.9|26.64|
|0.9|0.72||-123.4|22.10|12.73|105.2|0.05||43.9|0.30||-138.8|24.06|
|1.0|0.70||-129.9|21.40|11.75|101.3|0.05||42.7|0.30||-144.3|23.71|
|1.5|0.66||-154.6|18.55|8.46|85.4|0.06||38.6|0.30||-165.0|21.49|
|1.9|0.65||-169.5|16.81|6.92|74.9|0.07||35.7|0.29||-177.6|19.95|
|2.0|0.64||-172.8|16.42|6.62|72.6|0.07||35.0|0.29||179.4|19.76|
|2.5|0.64||172.1|14.69|5.42|61.1|0.09||30.6|0.29||164.4|17.80|
|3.0|0.63||158.5|13.24|4.59|50.1|0.10||25.5|0.29||150.2|16.62|
|4.0|0.66||133.8|10.81|3.47|29.9|0.12||13.4|0.33||126.1|14.61|
|5.0|0.69||112.5|8.74|2.74|11.1|0.13||1.2|0.39||107.8|12.03|
|6.0|0.72||94.3|7.03|2.25|-6.5|0.14||-11.3|0.42||91.8|10.52|
|7.0|0.73||77.4|5.63|1.91|-23.5|0.15||-24.5|0.44||75.5|9.12|
|8.0|0.74||59.4|4.26|1.63|-41.1|0.16||-38.1|0.47||55.5|7.78|
|9.0|0.78||42.1|2.98|1.41|-58.7|0.17||-51.1|0.52||37.8|7.12|
|10.0|0.84||25.6|1.51|1.19|-76.4|0.16||-66.8|0.59||24.0|6.96|
|11.0|0.86||11.4|0.00|1.00|-92.0|0.16||-79.8|0.64||11.8|6.11|
|12.0|0.88||-2.6|-1.15|0.88|-105.9|0.16||-91.7|0.68||-0.8|5.67|
|13.0|0.89||-17.0|-2.18|0.78|-121.7|0.15||-105.6|0.70||-16.7|5.08|
|14.0|0.87||-33.3|-3.48|0.67|-138.7|0.14||-119.5|0.73||-31.7|3.67|
|15.0|0.87||-47.3|-5.02|0.56|-153.9|0.13||-132.3|0.76||-44.9|2.65|
|16.0|0.86||-55.6|-6.65|0.47|-165.9|0.12||-141.7|0.78||-54.9|1.48|
|17.0|0.86||-63.4|-7.92|0.40|-175.9|0.11||-150.4|0.79||-64.2|0.49|
|18.0|0.91||-74.2|-8.92|0.36|171.2|0.10||-163.0|0.81||-76.2|1.29|



**Typical Noise Parameters,** VDS = 3V, IDS = 80 mA 

|**Freq**|**Fmin**|Γ**opt**|Γ**opt**|**Rn/50**|**Ga**|
|---|---|---|---|---|---|
|**GHz**|**dB**|**Mag.**|**Ang.**||**dB**|
|0.5|0.19|0.23|66.9|0.04|27.93|
|0.9|0.24|0.24|84.3|0.04|24.13|
|1.0|0.25|0.25|87.3|0.04|23.30|
|1.9|0.43|0.28|134.8|0.04|18.55|
|2.0|0.42|0.29|138.8|0.04|18.15|
|2.4|0.51|0.30|159.5|0.03|16.44|
|3.0|0.61|0.35|-173|0.03|15.13|
|3.9|0.70|0.41|-141.6|0.06|12.97|
|5.0|0.94|0.52|-113.5|0.13|11.42|
|5.8|1.20|0.56|-97.1|0.23|10.48|
|6.0|1.26|0.58|-94.8|0.26|10.11|
|7.0|1.34|0.62|-75.8|0.46|8.86|
|8.0|1.74|0.63|-55.5|0.76|7.59|
|9.0|1.82|0.71|-37.7|1.17|6.97|
|10.0|1.94|0.79|-20.8|1.74|6.65|



**==> picture [143 x 143] intentionally omitted <==**

**----- Start of picture text -----**<br>
40<br>35<br>30<br>MSG<br>25<br>20<br>15<br>MAG<br>10<br>S21<br>5<br>0<br>-5<br>10<br>-15<br>0 5 10 15 20<br>FREQUENCY (GHz)<br> (dB)<br>21<br>MSG/MAG and S<br>**----- End of picture text -----**<br>


**Figure 21.  MSG/MAG and |S21|[2] vs. Frequency at 3V, 80 mA.** 

## **Notes:** 

1. Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements a true Fmin is calculated. Refer to the noise parameter application section for more information. 

2. S and noise parameters are measured on a microstrip line made on 0.025 inch thick alumina carrier. The input reference plane is at the end of the gate lead. The output reference plane is at the end of the drain lead. The parameters include the effect of four plated through via holes connecting source landing pads on top of the test carrier to the microstrip ground plane on the bottom side of the carrier. Two 0.020 inch diameter via holes are placed within 0.010 inch from each source lead contact point, one via on each side of that point. 

**8** 

**ATF-54143 Typical Scattering Parameters,** VDS = 4V, IDS = 60 mA 

|**Freq.**||**S11**|||**S21**|||**S12**|||**S22**||**MSG/MAG**|
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|**GHz**|**Mag.**||**Ang.**|**dB**|**Mag.**|**Ang.**|**Mag.**||**Ang.**|**Mag.**||**Ang.**|**dB**|
|0.1|0.99||-18.6|28.88|27.80|167.8|0.01||80.1|0.58||-12.6|34.44|
|0.5|0.81||-80.2|26.11|20.22|128.3|0.03||52.4|0.42||-52.3|28.29|
|0.9|0.71||-117.3|23.01|14.15|106.4|0.04||41.7|0.31||-73.3|25.49|
|1.0|0.69||-123.8|22.33|13.07|102.4|0.04||40.2|0.29||-76.9|25.14|
|1.5|0.64||-149.2|19.49|9.43|86.2|0.05||36.1|0.22||-89.4|22.76|
|1.9|0.62||-164.5|17.75|7.72|75.7|0.06||34.0|0.18||-95.5|21.09|
|2.0|0.61||-167.8|17.36|7.38|73.3|0.06||33.5|0.18||-97.0|20.90|
|2.5|0.60||176.6|15.66|6.07|61.9|0.07||30.7|0.14||-104.0|19.38|
|3.0|0.60||162.6|14.23|5.15|51.1|0.07||27.3|0.11||-113.4|18.67|
|4.0|0.62||137.4|11.91|3.94|30.9|0.09||18.7|0.07||-154.7|15.46|
|5.0|0.65||115.9|10.00|3.16|11.7|0.10||9.0|0.09||152.5|13.20|
|6.0|0.68||97.6|8.36|2.62|-6.6|0.11||-1.4|0.12||127.9|11.73|
|7.0|0.70||80.6|7.01|2.24|-24.3|0.12||-12.9|0.15||106.9|10.47|
|8.0|0.72||62.6|5.76|1.94|-42.3|0.13||-24.7|0.17||78.9|9.31|
|9.0|0.76||45.4|4.60|1.70|-60.5|0.14||-36.1|0.23||56.8|8.69|
|10.0|0.83||28.5|3.28|1.46|-79.6|0.15||-51.8|0.32||42.1|9.88|
|11.0|0.86||14.1|1.87|1.24|-97.0|0.15||-65.4|0.41||29.4|9.17|
|12.0|0.88||-0.4|0.69|1.08|-112.8|0.15||-78.0|0.47||16.0|8.57|
|13.0|0.90||-14.9|-0.39|0.96|-130.2|0.15||-92.2|0.51||-1.1|8.06|
|14.0|0.87||-31.4|-1.72|0.82|-148.8|0.15||-107.3|0.58||-17.6|4.90|
|15.0|0.88||-46.0|-3.38|0.68|-166.0|0.14||-121.2|0.63||-32.6|3.86|
|16.0|0.88||-54.8|-5.17|0.55|179.8|0.13||-132.2|0.69||-43.7|2.65|
|17.0|0.87||-62.8|-6.73|0.46|168.4|0.12||-142.3|0.72||-54.2|1.33|
|18.0|0.92||-73.7|-7.93|0.40|154.3|0.11||-155.6|0.75||-67.2|2.26|



**Typical Noise Parameters,** VDS = 4V, IDS = 60 mA 

|**Freq**|**Fmin**|Γ**opt**|Γ**opt**|**Rn/50**|**Ga**|
|---|---|---|---|---|---|
|**GHz**|**dB**|**Mag.**|**Ang.**||**dB**|
|0.5|0.17|0.33|34.30|0.03|28.02|
|0.9|0.25|0.31|60.30|0.04|24.12|
|1.0|0.27|0.31|68.10|0.04|23.43|
|1.9|0.45|0.27|115.00|0.04|18.72|
|2.0|0.49|0.27|119.80|0.04|18.35|
|2.4|0.56|0.26|143.50|0.04|16.71|
|3.0|0.63|0.28|176.80|0.04|15.58|
|3.9|0.73|0.35|-145.90|0.05|13.62|
|5.0|0.96|0.47|-116.20|0.11|12.25|
|5.8|1.20|0.52|-98.80|0.19|11.23|
|6.0|1.23|0.54|-96.90|0.21|11.02|
|7.0|1.33|0.60|-77.40|0.38|9.94|
|8.0|1.66|0.63|-56.20|0.64|8.81|
|9.0|1.71|0.71|-38.60|0.99|8.22|
|10.0|1.85|0.82|-21.30|1.51|8.12|



**==> picture [143 x 167] intentionally omitted <==**

**----- Start of picture text -----**<br>
40<br>35<br>30<br>25 MSG<br>20<br>15 MAG<br>MSG<br>10<br>S21 MAG<br>5<br>0<br>-5<br>10<br>-15<br>0 5 10 15 20<br>FREQUENCY (GHz)<br>Figure 22.  MSG/MAG and |S21| [2]  vs.<br>Frequency at 4V, 60 mA.<br> (dB)<br>21<br>MSG/MAG and S<br>**----- End of picture text -----**<br>


## **Notes:** 

1. Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements a true Fmin is calculated. Refer to the noise parameter application section for more information. 

2. S and noise parameters are measured on a microstrip line made on 0.025 inch thick alumina carrier. The input reference plane is at the end of the gate lead. The output reference plane is at the end of the drain lead. The parameters include the effect of four plated through via holes connecting source landing pads on top of the test carrier to the microstrip ground plane on the bottom side of the carrier. Two 0.020 inch diameter via holes are placed within 0.010 inch from each source lead contact point, one via on each side of that point. 

**9** 

## **ATF-54143 Applications Information** 

## **Introduction** 

Agilent Technologies’s ATF-54143 is a low noise enhancement mode PHEMT designed for use in low cost commercial applications in the VHF through 6 GHz frequency range. As opposed to a typical depletion mode PHEMT where the gate must be made negative with respect to the source for proper operation, an enhancement mode PHEMT requires that the gate be made more positive than the source for normal operation. Therefore a negative power supply voltage is not required for an enhancement mode device. Biasing an enhancement mode PHEMT is much like biasing the typical bipolar junction transistor. Instead of a 0.7V base to emitter voltage, the ATF-54143 enhancement mode PHEMT requires about a 0.6V potential between the gate and source for a nominal drain current of 60 mA. 

## **Matching Networks** 

The techniques for impedance matching an enhancement mode device are very similar to those for matching a depletion mode device. The only difference is in the method of supplying gate bias. S and Noise Parameters for various bias conditions are listed in this data sheet. The circuit shown in Figure 1 shows a typical LNA circuit normally used for 900 and 1900 MHz applications (Consult the Agilent Technologies website for application notes covering specific applications). High pass impedance matching networks consisting of L1/C1 and L4/C4 provide the appropriate match for noise figure, gain, S11 and S22. The high pass structure also provides low frequency gain reduction which can be beneficial from the standpoint of improving out-of-band rejection at lower frequencies. 

**==> picture [155 x 113] intentionally omitted <==**

**----- Start of picture text -----**<br>
INPUT C1 C4 OUTPUT<br>Q1 Zo<br>Zo<br>L1 L4<br>L2 L3<br>R5 C2 C5<br>R4<br>C3<br>R6 C7 C6<br>Q2 Vdd<br>R7 R3<br>R1 R2<br>**----- End of picture text -----**<br>


**Figure 1.  Typical ATF-54143 LNA with Passive Biasing.** 

Capacitors C2 and C5 provide a low impedance in-band RF bypass for the matching networks. Resistors R3 and R4 provide a very important low frequency termination for the device. The resistive termination improves low frequency stability. Capacitors C3 and C6 provide the low frequency RF bypass for resistors R3 and R4. Their value should be chosen carefully as C3 and C6 also provide a termination for low frequency mixing products. These mixing products are as a result of two or more inband signals mixing and producing third order in-band distortion products. The low frequency or difference mixing products are bypassed by C3 and C6. For best suppression of third order distortion products based on the CDMA 1.25 MHz signal spacing, C3 and C6 should be 0.1 µF in value. Smaller values of capacitance will not suppress the generation of the 1.25 MHz difference signal and as a result will show up as poorer two tone IP3 results. 

## **Bias Networks** 

One of the major advantages of the enhancement mode technology is that it allows the designer to be able to dc ground the source leads and then merely apply a positive voltage on the gate to set the desired amount of quiescent drain current Id. 

Whereas a depletion mode PHEMT pulls maximum drain current when Vgs = 0V, an enhancement mode PHEMT pulls only a small amount of leakage current when Vgs= 0V. Only when Vgs is increased above Vto, the device threshold voltage, will drain current start to flow. At a Vds of 3V and a nominal Vgs of 0.6V, the drain current Id will be approximately 60 mA. The data sheet suggests a minimum and maximum  V over which the gs desired amount of drain current will be achieved. It is also important to note that if the gate terminal is left open circuited, the device will pull some amount of drain current due to leakage current creating a voltage differential between the gate and source terminals. 

## **Passive Biasing** 

Passive biasing of the ATF-54143 is accomplished by the use of a voltage divider consisting of R1 and R2. The voltage for the divider is derived from the drain voltage which provides a form of voltage feedback through the use of R3 to help keep drain current constant. Resistor R5 (approximately 10kΩ) provides current limiting for the gate of enhancement mode devices such as the ATF-54143. This is especially important when the device is driven to P1dB or PSAT. 

Resistor R3 is calculated based on desired Vds, Ids  and available power supply voltage. 

**==> picture [92 x 26] intentionally omitted <==**

VDD is the power supply voltage. Vds is the device drain to source voltage. 

Ids is the desired drain current. IBB is the current flowing through the R1/R2 resistor voltage divider network. 

**10** 

The values of resistors R1 and R2 are calculated with the following formulas 

**==> picture [316 x 116] intentionally omitted <==**

**----- Start of picture text -----**<br>
INPUT C1 C4 OUTPUT<br>Q1 Zo<br>are calculated with the following Zo<br>formulas L1 L4<br>L2 L3<br>R1 =           I [  V][gs] BB p   (2) R5 C2 R4C5<br>C3<br>R6 C7 C6<br>R2 = [  (V][ds][ – V][gs][) R1   ]   (3) R7 Q2 R3 Vdd<br>         V p<br>gs R1 R2<br>**----- End of picture text -----**<br>


## Example Circuit 

**Figure 2. Typical ATF-54143 LNA with Active Biasing.** 

VDD = 5V Vds = 3V Ids = 60 mA V = 0.59V gs 

An active bias scheme is shown in Figure 2. R1 and R2 provide a constant voltage source at the base of  a PNP transistor at Q2. The constant voltage at the base of Q2 is raised by 0.7 volts at the emitter. The constant emitter voltage plus the regulated VDD supply are present across resistor R3. Constant voltage across R3 provides a constant current supply for the drain current. Resistors R1 and R2 are used to set the desired Vds. The combined series value of these resistors also sets the amount of extra current consumed by the bias network. The equations that describe the circuit’s operation are as follows. 

Choose IBB to be at least 10X the normal expected gate leakage current. IBB was chosen to be 2 mA for this example. Using equations (1), (2), and (3) the resistors are calculated as follows 

R1 = 295Ω R2 = 1205Ω R3 = 32.3Ω 

## **Active Biasing** 

Active biasing provides a means of keeping the quiescent bias point constant over temperature and constant over lot to lot variations in device dc performance. The advantage of the active biasing of an enhancement mode PHEMT versus a depletion mode PHEMT is that a negative power source is not required. The techniques of active biasing an enhancement mode device are very similar to those used to bias a bipolar junction transistor. 

**==> picture [120 x 130] intentionally omitted <==**

and rearranging equation  (5) provides the following formula 

**==> picture [150 x 40] intentionally omitted <==**

Example Circuit VDD = 5V Vds = 3V Ids = 60 mA R4 = 10Ω VBE = 0.7V 

Equation (1) calculates the required voltage at the emitter of the PNP transistor based on desired Vds and Ids through resistor R4 to be 3.6V. Equation (2) calculates the value of resistor R3 which determines the drain current Ids. In the example R3=23.3Ω. Equation (3) calculates the voltage required at the junction of resistors R1 and R2. This voltage plus the step-up of the base emitter junction determines the regulated Vds. Equations (4) and (5) are solved simultaneously to determine the value of resistors R1 and R2. In the example R1=1450Ω and R2=1050Ω. R7 is chosen to be 1kΩ. This resistor keeps a small amount of current flowing through Q2 to help maintain bias stability. R6 is chosen to be 10kΩ. This value of resistance is necessary to limit Q1 gate current in the presence of high RF drive level (especially when Q1 is driven to P1dB gain compression point). 

Rearranging equation (4) provides the following formula 

**==> picture [126 x 24] intentionally omitted <==**

**11** 

**ATF-54143 Die Model** 

**==> picture [58 x 64] intentionally omitted <==**

Advanced_Curtice2_Model MESFETM1 

NFET=yes Rf= Crf=0.1 F N= PFET=no Gscap=2 Gsfwd= Fnc=1 MHz Vto=0.3 Cgs=1.73 pF Gsrev= R=0.08 Beta=0.9 Cgd=0.255 pF Gdfwd= P=0.2 Lambda=82e-3 Gdcap=2 Gdrev= C=0.1 Alpha=13 Fc=0.65 R1= Taumdl=no Tau= Tnom=16.85 Rgd=0.25 Ohm R2= wVgfwd= Idstc= Rd=1.0125 Ohm Vbi=0.8 wBvgs= Ucrit=-0.72 Rg=1.0 Ohm Vbr= wBvgd= Vgexp=1.91 Rs=0.3375 Ohm Vjr= wBvds= Gamds=1e-4 Ld= Is= wldsmax= Vtotc= Lg=0.18 nH Ir= wPmax= Betatce= Ls= Imax= AllParams= Rgs=0.25 Ohm Cds=0.27 pF Xti= Rc=250 Ohm Eg= 

## **ATF-54143 curtice ADS Model** 

**==> picture [411 x 250] intentionally omitted <==**

**----- Start of picture text -----**<br>
INSIDE Package<br>Var VAR<br>Egn VAR1<br>K=5 TLINP TLINP<br>Z2=85 TL1 TL2<br>Z1=30 Z=Z2/2 Ohm Z=Z2/2 Ohm<br>L=20 0 mil L=20 0 mil<br>K=K K=K<br>GATE CC1C=0.13 pF A=0.0000F=1 GHzTanD=0.001 GaAsFETFET1Mode1=MESFETM1 A=0.0000F=1 GHzTanD=0.001 SOURCE<br>Mode=Nonlinear<br>PortGNum=1 TLINPTL4Z=Z1 OhmL=15 mil TLINPTL3Z=Z2 OhmL=25 mil LL1L=0.477 nHR=0.001 LL6L=0.175 nHR=0.001 TLINPTL7Z=Z2/2 OhmL=5.0 mil TLINPTL8Z=Z1 OhmL=15.0 mil PortS2Num=4<br>K=1 K=K C K=K K=1<br>A=0.000 A=0.000 C2 A=0.0000 A=0.0000<br>F=1 GHz F=1 GHz C=0.159 pF F=1 GHz F=1 GHz<br>TanD=0.001 TanD=0.001 TanD=0.001 TanD=0.001 DRAIN<br>SOURCE L<br>L7 TLINP TLINP Port<br>PortS1Num=2 TLINPTL10Z=Z1 Ohm TLINPTL9Z=Z2 Ohm LL4L=0.4 nHR=0.001 MSUBMSub L=0.746 nHR=0.001 TL5Z=Z2 OhmL=26.0 milK=K TL6Z=Z1 OhmL=15.0 milK=1 DNum=3<br>L=15 mil L=10.0 mil MSub1 A=0.0000 A=0.0000<br>K=1 K=K H=25.0 mil F=1 GHz F=1 GHz<br>A=0.000 A=0.000 Er=9.6 TanD=0.001 TanD=0.001<br>F=1 GHz F=1 GHz Mur=1<br>TanD=0.001 TanD=0.001 Cond=1.0E+50<br>Hu=3.9e+034 mil<br>T=0.15 mil<br>TanD=0<br>Rough=0 mil<br>**----- End of picture text -----**<br>


**12** 

## **Designing with S and Noise** 

## **Parameters and the Non-Linear Model** 

The non-linear model describing the ATF-54143 includes both the die and associated package model. The package model includes the effect of the pins but does not include the effect of the additional source inductance associated with grounding the source leads through the printed circuit board. The device S and Noise Parameters do include the effect of 0.020 inch thickness printed circuit board vias. When comparing simulation results between the measured S param- 

eters and the simulated nonlinear model, be sure to include the effect of the printed circuit board to get an accurate comparison. This is shown schematically in Figure 3. 

## **For Further Information** 

The information presented here is an introduction to the use of the ATF-54143 enhancement mode PHEMT. More detailed application circuit information is available from Agilent Technologies. Consult the web page or your local Agilent Technologies sales representative. 

**==> picture [329 x 184] intentionally omitted <==**

**----- Start of picture text -----**<br>
VIA2<br>V3<br>D=20.0 mil<br>H=25.0 mil<br>VIA2 T=0.15 mil<br>V1 DRAIN SOURCE Rho=1.0<br>D=20.0 mil W=40.0 mil<br>H=25.0 mil<br>T=0.15 mil<br>Rho=1.0 ATF-54143<br>W=40.0 mil<br>VIA2 MSub<br>V4<br>D=20.0 mil MSUB<br>SOURCE GATE H=25.0 mil MSub1<br>VIA2 T=0.15 mil H=25.0 mil<br>V2 Rho=1.0 Er=9.6<br>D=20.0 mil W=40.0 mil Mur=1<br>H=25.0 mil Cond=1.0E+50<br>T=0.15 mil Hu=3.9e+034 mil<br>Rho=1.0 T=0.15 mil<br>W=40.0 mil TanD=0<br>Rough=0 mil<br>**----- End of picture text -----**<br>


**Figure 3. Adding Vias to the ATF-54143 Non-Linear Model for Comparison to Measured S and Noise Parameters.** 

**13** 

## **Noise Parameter Applications Information** 

Fmin values at 2 GHz and higher are based on measurements while the Fmins below 2 GHz have been extrapolated. The Fmin values are based on a set of 16 noise figure measurements made at 16 different impedances using an ATN NP5 test system. From these measurements, a true Fmin is calculated. Fmin represents the true minimum noise figure of the device when the device is presented with an impedance matching network that transforms the source impedance, typically 50Ω, to an impedance represented by the reflection coefficient Go. The designer must design a matching network that will present Go to the device with minimal associated circuit losses. The noise figure of the completed amplifier is equal to the noise figure of the device plus the losses of the matching network preceding the device. The noise figure of the device is equal to Fmin only when the device is presented with Go. 

If the reflection coefficient of the matching network is other than Go, then the noise figure of the device will be greater than Fmin based on the following equation. 

NF = Fmin + 4 Rn         |Γs – Γo |[ 2] Zo   (|1 + Γo|[2] )(1 - |Γs|[2] ) 

Where Rn/Zo is the normalized noise resistance, Γo is the optimum reflection coefficient required to produce Fmin and Γs is the reflection coefficient of the source impedance actually presented to the device. The losses of the matching networks are non-zero and they will also add to the noise figure of the device creating a higher amplifier noise figure. The losses of the matching networks are related to the Q of the components and associated printed circuit board loss. Γo is typically fairly low at higher frequencies and increases as frequency is lowered. Larger gate width devices will typically have a lower Γo as compared to narrower gate width devices. Typically for FETs, the higher Γo usually infers that an impedance 

much higher than 50Ω is required for the device to produce Fmin. At VHF frequencies and even lower L Band frequencies, the required impedance can be in the vicinity of several thousand ohms. Matching to such a high impedance requires very hi-Q components in order to minimize circuit losses. As an example at 900 MHz, when airwwound coils (Q>100) are used for matching networks, the loss can still be up to 0.25 dB which will add directly to the noise figure of the device. Using muiltilayer molded inductors with Qs in the 30 to 50 range results in additional loss over the airwound coil. Losses as high as 0.5 dB or greater add to the typical 0.15 dB Fmin of the device creating an amplifier noise figure of nearly 0.65 dB. A discussion concerning calculated and measured circuit losses and their effect on amplifier noise figure is covered in Agilent Application 1085. 

**14** 

## **Ordering Information** 

|**Part Number**|**No. of Devices**|**Container**|
|---|---|---|
|ATF-54143-TR1|3000|7" Reel|
|ATF-54143-TR2|10000|13" Reel|
|ATF-54143-BLK|100|antistatic bag|
|ATF-54143-TR1G|3000|7” Reel|
|ATF-54143-TR2G|10000|13”Reel|
|ATF-54143-BLKG|100|antistatic bag|



**Note:  For lead-free option, the part number will have the characger "G" at the end.** 

## **Package Dimensions Outline 43 (SO%-343/SC70 4 lead)** 

## **Dimensions** 

|**Symbol**|**Min (mm)**|**Max (mm)**|
|---|---|---|
|E|1.15|1.35|
|D|1.85|2.25|
|HE|1.80|2.40|
|A|0.80|1.10|
|A2|0.80|1.00|
|A1|0.00|0.10|
|b|0.25|0.40|
|b1|0.55|0.70|
|c|0.10|0.20|
|L|0.10|0.46|



## **Note:** 

**1.  All dimensions are in mm.** 

**2.  Dimensions are inclusive of plating.** 

**3.  Dimensions are exclusive of mold flash and metal burr.** 

**4.  All specifications comply with EIAJ SC70.** 

**5.  Die is facing up for mold and facing down for trim/form, i.e., reverse trim/form.** 

**6.  Package surface to be mirror finish.** 

**15** 

## **Recommended PCB Pad Layout for Agilent's SC70 4L/SOT-343 Products** 

## **(dimensions in inches/mm)** 

## **Device Orientation** 

**==> picture [391 x 116] intentionally omitted <==**

**----- Start of picture text -----**<br>
REEL<br>TOP VIEW END VIEW<br>Qa || 4 mm<br>CARRIER<br>Ne TAPE  0 6 6¢ 00<br>8 mm<br>71 71 71 71<br>USER<br>FEED  Gi}<br>DIRECTION<br>COVER TAPE<br>**----- End of picture text -----**<br>


**16** 

## **Tape Dimensions and Product Orientation** 

|**Description**||**Symbol**|**Size (mm)**|**Size (inches)**|
|---|---|---|---|---|
|Cavity|Length|Ao|2.40±0.10|0.094±0.004|
||Width|Bo|2.40±0.10|0.094±0.004|
||Depth|Ko|1.20±0.10|0.047±0.004|
||Pitch|P|4.00±0.10|0.157±0.004|
||Bottom Hole Diameter|D1|1.00 + 0.25|0.039 + 0.010|
|Perforlation|Diameter|D|1.50 + 0.10|0.061 + 0.002|
||Pitch|PO|4.00±0.10|0.157±0.004|
||Position|E|1.75±0.10|0.069±0.004|
|Carrier Tape|Width|W|8.00 + 0.30 - 0.10|0.315 + 0.012|
||Thickness|t1|0.254±0.02|0.0100±0.0008|
|Cover Tape|Width|C|5.40±0.010|0.205 + 0.004|
||Thickness|Tt|0.062±0.001|0.0025±0.0004|
|Distance|Cavity to Perforation|F|3.50±0.05|0.138±0.002|
||(Width Direction)||||
||Cavity to Perforation|P2|2.00±0.05|0.079±0.002|
||(Length Direction)||||



For product information and a complete list of Agilent contacts and distributors, please go to our web site. 

## **www.agilent.com/semiconductors** 

E-mail: SemiconductorSupport@agilent.com Data subject to change. Copyright © 2004-2005 Agilent Technologies, Inc. Obsoletes 5989-1922EN September 15, 2005 5989-3751EN 



## Links

- [View this product on Novapart](https://novapart.co/products/ATF-54143-TR1G/rf-fet-transistor-5-v-120-ma-725-mw-450-mhz-6-ghz)
- [Request a quote for this part](https://novapart.co/quote/)
- [Supplier page](https://es.farnell.com/en-ES/broadcom/atf-54143-tr1g/mosfet-rf-hemt-sot-343/dp/1056824)
---

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